CN116577358B - Painting and calligraphy cultural relic pigment imaging method based on X-ray K-absorption edge and application thereof - Google Patents

Painting and calligraphy cultural relic pigment imaging method based on X-ray K-absorption edge and application thereof Download PDF

Info

Publication number
CN116577358B
CN116577358B CN202310564166.5A CN202310564166A CN116577358B CN 116577358 B CN116577358 B CN 116577358B CN 202310564166 A CN202310564166 A CN 202310564166A CN 116577358 B CN116577358 B CN 116577358B
Authority
CN
China
Prior art keywords
ray
painting
interest
calligraphy
absorption edge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202310564166.5A
Other languages
Chinese (zh)
Other versions
CN116577358A (en
Inventor
潘仁奇
沈炜
丁帅斌
岳晓光
沈锴
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hangzhou Yuming Electronic Technology Co ltd
Original Assignee
Hangzhou Yuming Electronic Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hangzhou Yuming Electronic Technology Co ltd filed Critical Hangzhou Yuming Electronic Technology Co ltd
Priority to CN202310564166.5A priority Critical patent/CN116577358B/en
Publication of CN116577358A publication Critical patent/CN116577358A/en
Application granted granted Critical
Publication of CN116577358B publication Critical patent/CN116577358B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/03Investigating materials by wave or particle radiation by transmission
    • G01N2223/04Investigating materials by wave or particle radiation by transmission and measuring absorption
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30Computing systems specially adapted for manufacturing

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The application provides a painting and calligraphy cultural relic pigment imaging method based on an X-ray K-absorption edge and application thereof, comprising the following steps of S00, irradiating a painting and calligraphy cultural relic to be detected through X-rays, and carrying out scanning transmission measurement; s10, measuring and acquiring the transmittance of X-rays at the edges and the lower edges of the K-absorption edge; s20, repeating the steps S00-S10 until the scanning measurement of the whole area of the painting and calligraphy cultural relics to be detected is completed; s30, calculating the area density of the element of interest of each scanning point position according to the scanning measurement result, the element of interest to be detected and the energy value corresponding to the K-absorption edge of each element of interest; and S40, displaying the distribution condition of the interested elements to be detected on the painting and calligraphy cultural relics in a picture form according to the surface density of the interested elements of each scanning point position. The method has the advantages of high imaging speed, small noise and high image resolution.

Description

Painting and calligraphy cultural relic pigment imaging method based on X-ray K-absorption edge and application thereof
Technical Field
The application relates to the technical field of X rays, in particular to a painting and calligraphy cultural relic pigment imaging method based on an X ray K-absorption edge and application thereof.
Background
The painting and calligraphy relics are precious historical cultural heritage and are the manifestations of human spirit civilization. Cultural relics protection workers often use various modern techniques to detect painting and calligraphy cultural relics to understand their internal structure and composition, as well as the manufacturing process. Knowing the pigment types and distribution of the painting and calligraphy cultural relics is particularly important for protecting the cultural relics. Knowing the pigment types of the painting and calligraphy can help the cultural relics protector to master the components of the painting and calligraphy cultural relics, so that different repairing and preserving methods can be adopted conveniently. In addition, the components of the pigment can help the relics expert to identify the authenticity of the relics. If modern chemical components are found in the pigment of ancient painting and calligraphy relics, the artwork is highly probable to be a fake. The distribution of pigment on paper may be different from the distribution of surface color because of the possible overlapping phenomenon of pigment. The pigment overall distribution condition of the painting and calligraphy can help the relics expert to obtain information different from the surface color. In addition, the inner layers of the painting and calligraphy sometimes hide rich information because artists sometimes draw a lighter colored layer of paint on the canvas as a draft and then draw with thick paint. A few special cases are where the artist reuses the canvas, in which case the picture presented on the surface of the canvas is actually hidden behind the picture. For cultural relic protection and repair, it is indispensable to be able to quickly obtain the distribution of elements on a two-dimensional plane of a calligraphy and painting cultural relic.
Because the X-ray can penetrate most cultural relics, information which cannot be found by visible light can be obtained, and the X-ray is often used for nondestructive detection of the cultural relics since the birth of the cultural relics. Although relics workers widely use X-ray radiographic imaging techniques to detect painting and calligraphy relics, traditional X-ray radiographic imaging has certain limitations. All substances in the painting and calligraphy relics can contribute to the absorption of X rays, the absorption of the painting and calligraphy relics to the X rays is mainly contributed by heavy metal elements in pigments, and information of elements with lower atomic numbers can be covered by the heavy metal elements. The main chemical component of common pigments in painting and calligraphy, for example, the main component of vermilion pigment is mercuric sulfide (HgS), and the main component of zinc white is zinc oxide (ZnO).
The traditional X-ray transmission imaging technology can not realize the distribution imaging of single elements in the painting and calligraphy, and can not image certain single pigment distribution. The metal elements contained in the painting and calligraphy can be detected by utilizing an X-Ray Fluorescence (XRF) technology. With the development of analytical instruments and data processing software in recent years, the scientific community has developed a wide area X-ray fluorescence Scanning imaging technique (Scanning Macro X-Ray Fluorescence Imaging, abbreviated as MA-XRF). Imaging can be performed for a single element using MA-XRF, but the image resolution of MA-XRF imaging is limited by the width of the X-ray beam stream. MA-XRF imaging can only be detected point by point, and imaging speed is slow. In addition, MA-XRF imaging requires separation of monoenergetic X-rays by lattice diffraction techniques or acquisition of monoenergetic X-ray sources using synchrotron radiation sources, which is complex to operate and difficult to popularize in museums.
Currently, the mainstream scheme is X-ray fluorescence analysis (XRF) technology, which realizes qualitative and quantitative analysis of element components of a sample to be detected by exciting the element components.
Wide area X-ray fluorescence scanning imaging (MA-XRF) is performed by scanning the region to be measured point by point based on XRF, so as to obtain distribution image information of a single element. Generally, MA-XRF uses an X-ray source spot greater than 100.MA-XRF directs high energy X-rays onto the cultural relics, and pigments on the cultural relics excite characteristic X-rays of the metallic elements due to the inclusion of the metallic elements. Characteristic X-rays originate from photons emitted by an atom's internal electrons when they transit from a higher energy orbit to a lower energy orbit, the energy of the radiated photons being exactly equal to the energy difference between the two orbitals. Thus, the X-rays emitted when an atom is excited reflect the structural features of the interior of the atom, each element having its own specific characteristic X-rays. MA-XRF uses characteristic X-rays excited when a painting is irradiated with X-rays to analyze elements contained in painting and calligraphy pigments. The specific method for MA-XRF detection is as follows: and (3) the X-rays emitted by the X-ray tube are incident into the painting and calligraphy sample to be detected, and characteristic X-rays of all elements in the sample are excited. X-rays with different wavelengths are separated by utilizing the spectroscopic crystal and the Bragg diffraction principle. And recording the X-ray photons with the specific wavelength after the crystal is split by using an X-ray detector. Then, according to the intensity of the X-ray with the specific wavelength recorded by the detector, the distribution condition of the element corresponding to the wavelength is calculated and imaged. A schematic representation of the MA-XRF imaging technique is shown in FIG. 1.
Because the characteristic X-rays of stimulated radiation can be emitted in all directions, MA-XRF can only scan a sample point by point in order to avoid mutual interference between different detection points, and therefore the imaging speed is low. MA-XRF uses a large spot X-ray source, however, an excessive X-ray beam size can affect the resolution of the image, and in addition, the X-ray source's spectrum is a continuum spectrum that may contain the energy of the detected elemental characteristic X-rays, so that for characteristic X-ray detection, the continuum spectrum of the X-ray source can interfere with the characteristic X-ray detection, which can reduce the resolution of the image.
Obtaining the monoenergetic characteristic X-ray corresponding to the element requires adopting a spectroscope to separate the X-ray with specific energy, which increases the difficulty of technical operation. When MA-XRF is used for quantitative analysis, standard samples are required to be used for calibration measurement in advance, so that the standard samples of each pigment are required to be measured in advance when MA-XRF is used for quantitative analysis.
Therefore, a need exists for a painting and calligraphy cultural relic pigment imaging method based on an X-ray K-absorption edge for realizing rapid imaging of painting and calligraphy pigment and an application thereof, so as to solve the defects in the prior art.
Disclosure of Invention
The embodiment of the application provides a painting and calligraphy cultural relic pigment imaging method based on an X-ray K-absorption edge and application thereof, aiming at the problems of low imaging speed, high technical difficulty and the like in the prior art.
The core technology of the invention mainly adopts high-energy resolution X-ray detection to image painting and calligraphy pigment distribution by using the X-ray K-absorption edge fixed by each element, thereby helping cultural relics collectors and cultural relics repairmen to know the distribution condition of various pigments on painting and calligraphy. When X-rays irradiate on the painting and calligraphy cultural relics, X-ray photons interact with substances on the painting and calligraphy, part of the X-rays are absorbed by the painting and calligraphy, and the intensity of the X-rays is attenuated. The ability of a substance to attenuate X-rays is typically expressed in terms of the linear attenuation coefficient or mass attenuation coefficient of the substance. The mass attenuation coefficient multiplied by the density of the substance is the linear attenuation coefficient of the substance. Experimental and theoretical values of the mass attenuation coefficients of the various elements are now known and can be queried at the NIST website or calculated using XCOM software. By utilizing the characteristic that each element has a specific K-absorption edge and combining with a high-precision energy-resolved X-ray detector, pigment distribution imaging with high spatial resolution can be realized quickly.
In a first aspect, the present application provides a method for imaging painting and calligraphy cultural relics pigment based on an X-ray K-absorption edge, the method comprising the steps of:
s00, irradiating the painting and calligraphy cultural relics to be detected by X rays, and performing scanning transmission measurement;
the X-ray emitted by part of the X-ray tube passes through the painting and calligraphy cultural relics to be checked and then reaches the detector, the X-ray detector is used for detecting the X-ray and recording the intensity of the X-ray, and the data of each pixel point corresponds to one scanning point in the painting and calligraphy cultural relics.
S10, measuring the transmittance of X-rays at the edge and the lower edge of the K-absorption edge;
s20, moving an objective table for carrying the painting and calligraphy cultural relics to be detected, irradiating X-rays to the next scanning position of the painting and calligraphy cultural relics to be detected, and repeating the steps S00-S10 until the scanning measurement of the whole area of the painting and calligraphy cultural relics to be detected is completed;
s30, calculating the area density of the element of interest of each scanning point position according to the scanning measurement result, the element of interest to be detected and the energy value corresponding to the K-absorption edge of each element of interest;
the energy value corresponding to the K-absorption edge of each element of interest is known data, and the area density is defined as the product of the density and the thickness of the element of interest;
and S40, displaying the distribution condition of the interested elements to be detected on the painting and calligraphy cultural relics in a picture form according to the surface density of the interested elements of each scanning point position.
Further, in step S00, the X-ray detector is a silicon semiconductor detector array.
Further, in step S00, the silicon semiconductor detector array includes 100×100 detector units, and a size of each detector unit is 100×100 μm.
Further, in the step S30, the specific calculation step of the area density of the element of interest of each scan point location is as follows:
performing X-ray projection transmittance measurement twice under X-rays with different energies;
one of which takes an energy value higher than the K-absorption edge of the element of interest and the other takes an energy value lower than the K-absorption edge of the element of interest, and both energy values can be approximately equal to the same energy value;
separating the contribution of the interested element to the transmissivity from the painting and calligraphy to be detected, and calculating the surface density of the interested element according to the energy of the X-ray, the mass attenuation coefficient of the interested element and the transmissivity of the X-ray photon at each scanning point;
where the transmittance is a function of energy, the transmittance is proportional to the mass attenuation coefficient of the element of interest, and the transmittance is proportional to the areal density of the element of interest.
Further, the transmittance of the two measurements is expressed as:
wherein,for energy E 1 X-rays of (2)Transmittance of +.>For energy E 2 I represents the intensity of X-rays after passing through the painting and calligraphy relics, I 0 Represents the original intensity of X-ray, C A Representing the areal density of the element of interest, C R Representing the effective areal density of the remaining part of the elements, < >>Representing the therapeutic attenuation coefficient of the element of interest.
Further, combining the two transmittances, the areal densities of the following elements of interest were obtained:
the effective areal density of the remaining elements is thus:
further, takeAccording to C A And C R Is given by the formula:
in a second aspect, the present application provides a painting and calligraphy cultural relic pigment imaging device based on an X-ray K-absorption edge, comprising:
the silicon semiconductor detector array is used for scanning transmission measurement by irradiating the painting and calligraphy cultural relics to be detected through X rays; the X-ray emitted by a part of the X-ray tube of the silicon semiconductor detector array passes through the painting and calligraphy relics to be inspected and then reaches the detector, the X-ray detector is utilized to detect the X-ray and record the intensity of the X-ray, and the data of each detector unit corresponds to one scanning point in the painting and calligraphy relics (namely, one scanning point is called a pixel point, one pixel point corresponds to one detector unit, namely, each scanning point corresponds to one detector unit, and each detector unit scans one point); for measuring the transmittance of the acquired X-rays at the edges and the lower edges of the K-absorption edge;
the control end is used for acquiring and determining the element of interest to be detected and the energy value corresponding to the element of interest; the method comprises the steps of calculating the area density of the interested element of each scanning point position according to a scanning measurement result, the interested element to be detected and the energy value corresponding to the K-absorption edge of each interested element; the energy value corresponding to the K-absorption edge of each element of interest is known data, and the area density is defined as the product of the density and the thickness of the element of interest;
and the output module is used for displaying the distribution condition of the interested elements to be detected on the painting and calligraphy cultural relics in a picture form according to the surface density of the interested elements of each scanning point position.
In a third aspect, the present application provides an electronic device, including a memory, in which a computer program is stored, and a processor configured to run the computer program to perform the above-described X-ray K-absorbing edge-based painting and calligraphy cultural relic pigment imaging method.
In a fourth aspect, the present application provides a readable storage medium having stored therein a computer program comprising program code for controlling a process to perform a process comprising a painting and calligraphy cultural relic pigment imaging method based on an X-ray K-absorbing edge as described above.
The main contributions and innovation points of the invention are as follows: 1. compared with the prior art, the method has the advantages that the characteristics of a plurality of detector units are utilized by the X-ray detector array, and meanwhile, as mutual interference does not exist between each detection point of the K-absorption edge subtraction and X-ray perspective method adopted by the scheme, simultaneous multi-point detection can be performed by using the large-area array detector array, so that the detection rate can be greatly improved, a museum and a collector can be helped to know the distribution condition of pigment on a canvas, and standard samples are not required to be calibrated when quantitative analysis of pigment surface density distribution is performed, so that the method is suitable for quantitative analysis;
2. compared with the prior art, the method simplifies the area density of the element of interest to be only related to the transmissivity and the mass attenuation coefficient of the element, and provides possibility for detecting the area density distribution of a single element. Meanwhile, the scheme is used for realizing the distributed imaging of single elements, thereby helping relics and experts to identify the creation ages of the painting and calligraphy relics and providing clues for identifying the authenticity of the relics.
The details of one or more embodiments of the application are set forth in the accompanying drawings and the description below to provide a more thorough understanding of the other features, objects, and advantages of the application.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute an undue limitation to the application. In the drawings:
FIG. 1 is a flow of a painting and calligraphy cultural relic pigment imaging method based on an X-ray K-absorption edge according to an embodiment of the application;
FIG. 2 is a K-absorption edge of elemental cadmium;
fig. 3 is a schematic diagram of a hardware structure of an electronic device according to an embodiment of the present application.
Detailed Description
Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with one or more embodiments of the present specification. Rather, they are merely examples of apparatus and methods consistent with aspects of one or more embodiments of the present description as detailed in the accompanying claims.
It should be noted that: in other embodiments, the steps of the corresponding method are not necessarily performed in the order shown and described in this specification. In some other embodiments, the method may include more or fewer steps than described in this specification. Furthermore, individual steps described in this specification, in other embodiments, may be described as being split into multiple steps; while various steps described in this specification may be combined into a single step in other embodiments.
In the conventional MA-XRF method, if multiple points are detected at the same time, interference among different detection points causes imaging difficulty, so that only point-by-point detection is possible, and the detection speed of MA-XRF is limited. MA-XRF uses large spots, which reduces the image resolution of the image, while the present solution uses a detector array of small-width X-ray beam streams and small-size detector elements, which is higher in resolution. When MA-XRF is used for quantitative analysis, a standard sample is required to be used for calibration test in advance, so that the operation is complex and is not beneficial to large-scale quantitative analysis.
When X-rays irradiate on the painting and calligraphy cultural relics, X-ray photons interact with substances on the painting and calligraphy, part of the X-rays are absorbed by the painting and calligraphy, and the intensity of the X-rays is attenuated. The ability of a substance to attenuate X-rays is typically expressed in terms of the linear attenuation coefficient or mass attenuation coefficient of the substance. The mass attenuation coefficient multiplied by the density of the substance is the linear attenuation coefficient of the substance. Experimental and theoretical values of the mass attenuation coefficients of the various elements are now known and can be queried at the NIST website or calculated using XCOM software. Based on the above, the invention solves the problems existing in the prior art based on the K-absorption edge subtraction and the X-ray perspective method.
Example 1
The application aims at providing a painting and calligraphy cultural relic pigment imaging method based on an X-ray K-absorption edge, and specifically, referring to FIG. 1, the method comprises the following steps:
s00, irradiating the painting and calligraphy cultural relics to be detected by X rays, and performing scanning transmission measurement;
wherein, the X-ray emitted by part of the X-ray tube passes through the painting and calligraphy cultural relics to be checked and then reaches the detector. And detecting X-rays by using an X-ray detector and recording the intensity of the X-rays, wherein the data of each detector unit corresponds to one scanning point in the painting and calligraphy cultural relics.
Preferably, the X-ray detector array is a silicon semiconductorThe detector array (existing equipment, including X-ray tube, pre-and post-collimators, silicon detector array, electronics readout chip, movable stage) comprises 100X 100 detector units. And because the K-absorption edge subtraction and the X-ray perspective method adopted by the scheme have no mutual interference between every detection point, the large-area array detector array can be used for simultaneous multi-point detection, and the detection rate can be greatly improved. The silicon material has small average ionization energy and more electron hole pairs generated by unit energy, and can be used as a wafer body of a high-precision X-ray detector. The size of each detection unit is aboutTherefore, the imaging has high spatial resolution, and pigment distribution imaging with high spatial resolution can be realized.
Common elements in the painting and calligraphy pigment and energy corresponding to the K-absorption edge are shown in Table 1:
TABLE 1
Pigments for painting and calligraphy generally contain metallic elements whose K-absorption edge energy is generally in the range of 5 to 90 KeV, and the K-absorption edge energy of each element is a fixed value, and is related to the internal structure of atoms. Therefore, by utilizing the characteristic that each element has a specific K-absorption edge and combining with a high-precision energy-resolved X-ray detector, pigment distribution imaging with high spatial resolution can be realized quickly.
The absorption edge occurs in the mass attenuation coefficient of the element, and the reason for this phenomenon is that when the energy of an incident photon is exactly equal to the binding energy of an orbit atom of the element, electrons of the layer are changed into free electrons from the binding of the atom, and resonance absorption of the energy by the atom is excited, so that the attenuation coefficient is suddenly increased. If the energy of the incident X-ray photon is less than the binding energy of the electrons of the element K layer, the photon can only interact with the electrons of the L layer and its outer layer, since the electron energy of the outer layer is lower and can be excited.
When the energy of an incident X-ray photon is equal to or slightly greater than the binding energy of the K-layer electron, the number of electrons capable of interacting with the incident X-ray photon increases abruptly, thus resulting in an abrupt increase in the mass attenuation coefficient of the element. The energy location at which the mass attenuation coefficient increases abruptly due to the K-layer electrons is called the K-absorption edge, and the energy location at which it is due to the L-layer electrons is called the L-absorption edge. As fig. 2 is the mass attenuation coefficient of elemental cadmium (Cd), it is known from fig. 2 that a sudden increase in the mass attenuation coefficient of cadmium occurs at 27 keV. The position of the K-absorption edge of each element is fixed, and different elements have different K-absorption edges, or the position of the K-absorption edge can reflect the type of the element.
S10, measuring and acquiring the transmittance of X-rays at the edges and the lower edges of the K-absorption edge;
when X-rays emitted by the X-ray tube are irradiated on the painting and calligraphy cultural relics, part of the X-rays interact with the painting and calligraphy materials to be scattered or absorbed, and the other part of X-ray photons which do not interact with the painting and calligraphy materials reach the detector to be recorded by the detector. If using mathematical symbolsRepresenting the original intensity of X-rays, symbolized by +.>Representing the intensity of the X-rays after passing through the object. Transmittance of X-ray photons with energy E +.>The method comprises the following steps:
wherein,the mass attenuation coefficient, density and thickness of each element contained in the painting and calligraphy are respectively represented. Because the energy of the X-ray photons generated by the X-ray tube is continuously changed and the mass attenuation coefficient of the substance at different energiesDifferent, so the transmittance is energy +.>Is a function of (2).
From the formula expression of the transmissivity, the transmissivity of the painting and the X-ray is proportional to the mass attenuation coefficient of the element in the painting and the density is proportional to the product of the thickness. For convenience, the product of the density and thickness of an element is defined as the areal density of the element, where the symbol is usedRepresents the areal density, and therefore has an areal density +.>
S20, moving an objective table carrying the painting and calligraphy cultural relics to be detected, irradiating the next scanning position of the painting and calligraphy cultural relics to be detected with X-rays, and repeating the steps S00-S10 until the scanning measurement of the whole area of the painting and calligraphy cultural relics to be detected is completed;
s30, calculating the area density of the element of interest of each scanning point position according to the scanning measurement result, the element of interest to be detected and the energy value corresponding to the K-absorption edge of each element of interest;
the energy value corresponding to the K-absorption edge of each element of interest is known data, and the areal density is the product of the density and the thickness of the element of interest.
In this embodiment, in order to image a single element of interest (pigment), the contribution of the element of interest to the transmittance needs to be separated from the rest of the painting. Symbolically byRepresenting the mass attenuation coefficient of the element of interest and the mass attenuation coefficient of the remaining material, respectively. All elements of the detected painting and calligraphy, except the element of interest, contribute to the X-ray attenuation in the same way as the X-ray attenuation>In (I)>Only the mass attenuation coefficient of the element of interest to be imaged is represented. If use symbol->Andrepresenting the areal density of the element of interest and the effective areal density of the remaining elements, respectively, the transmittance +.>Can be expressed as:
is a contribution of the element of interest, +.>Is the contribution of the remaining elements. In order to separate the element of interest from the remaining elements, to achieve distributed imaging of a single element, it is necessary to add +.>And->Two X-ray projection transmittance measurements were made.
Two energies are respectively taken near the K-absorption edge of the element to be imaged, one energy is slightly lower than the K-absorption edge, and the other energy is slightly higher than the K-absorption edge, as shown in figure 2, the two energies are respectively marked with symbolsAnd->It is shown that the former slightly higher and slightly lower values, respectively, are preferred in this embodimentChosen to be 1.0 keV, this value depends on the energy measurement accuracy of the detector. Energy is +.>Andthe transmittance at the time is expressed as:
,
wherein,for energy E 1 X-ray transmittance of>For energy E 2 I represents the intensity of X-rays after passing through the painting and calligraphy relics, I 0 Represents the original intensity of X-ray, C A Representing the areal density of the element of interest, C R Representing the effective areal density of the remaining part of the elements, < >>Representing the therapeutic attenuation coefficient of the element of interest.
The energy is the above energyAnd->The surface density of the element of interest and the surface density of the remainder can be calculated separately by combining the equations of the transmittance. The areal density of the element of interest is:
and the effective densities of the remaining elements except the element of interest are:
thus, the surface density of the element of interest and the effective surface density of the remaining elements can be rapidly calculated.
Since the mass attenuation coefficient of the element of interest will be abrupt near the K-absorption edge, but the mass attenuation coefficient of the remaining elements will be continuously and smoothly varied near the K-absorption edge, if energy is appliedAnd energy->The mass attenuation coefficient of the remaining elements can be approximately considered to have no significant change, i.e. & gt>. Substituting this relationship into the above surface density expression of the element of interest, there are:
thus, inTo the approximation of (a) the areal density of the element of interest depends only on its own energy +.>And energy->Mass attenuation coefficient and projection transmittance at the time +.>And->. Mass attenuation coefficient->Andis a fixed coefficient, can be obtained by public data query, transmissivity +.>And->It can be obtained by experimental measurement.
In the present element of interest areal density expression, the mass attenuation coefficients of the unknown remaining elements are eliminated. By the above-described K-absorption edge subtraction method, the areal density of the element of interest is expressed as an amount independent of the mass attenuation coefficient or density of other elements in the painting and calligraphy material, because the mass attenuation coefficient and density of the remaining elements are hardly obtained at the time of measurement. Simplifying the areal density of the element of interest to be related only to the transmissivity and its own mass attenuation coefficient provides the possibility to detect the areal density distribution of a single element.
Can be directly used in qualitative analysisThis difference is imaged.
Because of Is a known constant, independent of spatial position, and does not affect the proportion of pigment relative thickness distribution.
And S40, displaying the distribution condition of the interested elements to be detected on the painting and calligraphy cultural relics in a picture form according to the surface density of the interested elements of each scanning point position.
Example two
Based on the same conception, the application also provides a painting and calligraphy cultural relic pigment imaging device based on an X-ray K-absorption edge, which comprises:
the silicon semiconductor detector array is used for scanning transmission measurement by irradiating the painting and calligraphy cultural relics to be detected through X rays; each detector unit of the silicon semiconductor detector array is used for measuring one point of the painting and calligraphy cultural relics independently, and one scanning position comprises a plurality of scanning points of the detector units; for measuring the transmittance of the acquired X-rays at the edges and the lower edges of the K-absorption edge;
the control end (can be a computer) is used for acquiring and determining the element of interest to be detected and the energy value corresponding to the element of interest; the method comprises the steps of calculating the area density of the interested element of each scanning point position according to a scanning measurement result, the interested element to be detected and the energy value corresponding to the K-absorption edge of each interested element; the energy value corresponding to the K-absorption edge of each element of interest is known data, and the surface density is the product of the density and the thickness of the element of interest;
and the output module is used for displaying the distribution condition of the interested elements to be detected on the painting and calligraphy cultural relics in a picture form according to the surface density of the interested elements of each scanning point position.
In this embodiment, the general operation flow is as follows:
s1, determining an element of interest to be detected, and inquiring through an NIST website to obtain an energy value corresponding to the K-absorption edge of the element of interest.
S2, setting an energy threshold of the silicon semiconductor detector, so that energy is respectively located at the upper edge and the lower edge of the K-absorption edge.
S3, placing the painting and calligraphy cultural relics to be detected on a movable objective table between the X-ray source and the silicon detector array, and keeping a stable state.
S4, placing a front collimator in front of the X-ray source and a rear collimator in front of the silicon detector array to reduce the influence of scattered photons.
S5, turning on an X-ray light source, and irradiating X-rays onto the painting and calligraphy cultural relics to be detected to perform scanning transmission measurement.
S6, measuring the transmittance of X-rays at the edge and the lower edge of the K-absorption edge.
And S7, moving the objective table, aligning the X-ray to another position of the painting and calligraphy relics, and repeating the steps S5 and S6 until the whole area of the painting and calligraphy relics is scanned.
S8, exporting data, and utilizing a formula on a computerThe areal density of the element of interest at each point is calculated.
S9, displaying the distribution condition of the interested elements to be detected on the painting and calligraphy cultural relics in a picture mode on a computer display screen.
Example III
This embodiment also provides an electronic device, referring to fig. 3, comprising a memory 404 and a processor 402, the memory 404 having stored therein a computer program, the processor 402 being arranged to run the computer program to perform the steps of any of the method embodiments described above.
In particular, the processor 402 may include a Central Processing Unit (CPU), or an Application Specific Integrated Circuit (ASIC), or may be configured to implement one or more integrated circuits of embodiments of the present application.
The memory 404 may include, among other things, mass storage 404 for data or instructions. By way of example, and not limitation, memory 404 may comprise a Hard Disk Drive (HDD), floppy disk drive, solid State Drive (SSD), flash memory, optical disk, magneto-optical disk, tape, or Universal Serial Bus (USB) drive, or a combination of two or more of these. Memory 404 may include removable or non-removable (or fixed) media, where appropriate. Memory 404 may be internal or external to the data processing apparatus, where appropriate. In a particular embodiment, the memory 404 is a Non-Volatile (Non-Volatile) memory. In particular embodiments, memory 404 includes Read-only memory (ROM) and Random Access Memory (RAM). Where appropriate, the ROM may be a mask-programmed ROM, a Programmable ROM (PROM), an Erasable PROM (EPROM), an Electrically Erasable PROM (EEPROM), an electrically rewritable ROM (EAROM) or FLASH memory (FLASH) or a combination of two or more of these. The RAM may be Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM) where appropriate, and the DRAM may be fast page mode dynamic random access memory 404 (FPMDRAM), extended Data Output Dynamic Random Access Memory (EDODRAM), synchronous Dynamic Random Access Memory (SDRAM), or the like.
Memory 404 may be used to store or cache various data files that need to be processed and/or used for communication, as well as possible computer program instructions for execution by processor 402.
The processor 402 reads and executes the computer program instructions stored in the memory 404 to implement any of the X-ray K-absorption edge based painting and calligraphy cultural relic pigment imaging methods in the above embodiments.
Optionally, the electronic apparatus may further include a transmission device 406 and an input/output device 408, where the transmission device 406 is connected to the processor 402 and the input/output device 408 is connected to the processor 402.
The transmission device 406 may be used to receive or transmit data via a network. Specific examples of the network described above may include a wired or wireless network provided by a communication provider of the electronic device. In one example, the transmission device includes a network adapter (Network Interface Controller, simply referred to as NIC) that can connect to other network devices through the base station to communicate with the internet. In one example, the transmission device 406 may be a Radio Frequency (RF) module, which is configured to communicate with the internet wirelessly.
The input-output device 408 is used to input or output information. In this embodiment, the input information may be a detection command, and the output information may be a distribution of the element of interest to be detected on the painting and calligraphy cultural relics, and the like.
Example IV
The present embodiment also provides a readable storage medium having stored therein a computer program comprising program code for controlling a process to perform the process, the process comprising the X-ray K-absorption edge based painting and calligraphy cultural relic pigment imaging method according to the first embodiment.
It should be noted that, specific examples in this embodiment may refer to examples described in the foregoing embodiments and alternative implementations, and this embodiment is not repeated herein.
In general, the various embodiments may be implemented in hardware or special purpose circuits, software, logic or any combination thereof. Some aspects of the invention may be implemented in hardware, while other aspects may be implemented in firmware or software which may be executed by a controller, microprocessor or other computing device, although the invention is not limited thereto. While various aspects of the invention may be illustrated and described as block diagrams, flow charts, or using some other pictorial representation, it is well understood that these blocks, apparatus, systems, techniques or methods described herein may be implemented in, as non-limiting examples, hardware, software, firmware, special purpose circuits or logic, general purpose hardware or controller or other computing devices, or some combination thereof.
Embodiments of the invention may be implemented by computer software executable by a data processor of a mobile device, such as in a processor entity, or by hardware, or by a combination of software and hardware. Computer software or programs (also referred to as program products) including software routines, applets, and/or macros can be stored in any apparatus-readable data storage medium and they include program instructions for performing particular tasks. The computer program product may include one or more computer-executable components configured to perform embodiments when the program is run. The one or more computer-executable components may be at least one software code or a portion thereof. In addition, in this regard, it should be noted that any blocks of the logic flows as illustrated may represent program steps, or interconnected logic circuits, blocks and functions, or a combination of program steps and logic circuits, blocks and functions. The software may be stored on a physical medium such as a memory chip or memory block implemented within a processor, a magnetic medium such as a hard disk or floppy disk, and an optical medium such as, for example, a DVD and its data variants, a CD, etc. The physical medium is a non-transitory medium.
It should be understood by those skilled in the art that the technical features of the above embodiments may be combined in any manner, and for brevity, all of the possible combinations of the technical features of the above embodiments are not described, however, they should be considered as being within the scope of the description provided herein, as long as there is no contradiction between the combinations of the technical features.
The foregoing examples merely represent several embodiments of the present application, the description of which is more specific and detailed and which should not be construed as limiting the scope of the present application in any way. It should be noted that variations and modifications can be made by those skilled in the art without departing from the spirit of the present application, which falls within the scope of the present application. Accordingly, the scope of protection of the present application shall be subject to the appended claims.

Claims (6)

1. The painting and calligraphy cultural relic pigment imaging method based on the X-ray K-absorption edge is characterized by comprising the following steps of:
s00, irradiating the painting and calligraphy cultural relics to be detected by X rays, and performing scanning transmission measurement;
the X-ray emitted by part of the X-ray tube passes through the painting and calligraphy cultural relics to be inspected and then reaches the detector, the X-ray detector is utilized to detect the X-ray and record the intensity of the X-ray, and the data of each detector unit corresponds to one scanning point in the painting and calligraphy cultural relics;
s10, measuring the transmittance of X-rays at the edge and the lower edge of the K-absorption edge;
s20, moving an objective table carrying the painting and calligraphy cultural relics to be detected, irradiating X-rays to the next scanning position of the painting and calligraphy cultural relics to be detected, and repeating the steps S00-S10 until the scanning measurement of the whole area of the painting and calligraphy cultural relics to be detected is completed;
s30, calculating the area density of the element of interest of each scanning point position according to the scanning measurement result, the element of interest to be detected and the energy value corresponding to the K-absorption edge of each element of interest;
the energy value corresponding to the K-absorption edge of each element of interest is known data, and the surface density is defined as the product of the density and the thickness of the element of interest;
the specific calculation steps of the area density of the interested element of each scanning point position are as follows:
performing X-ray projection transmittance measurement twice under X-rays with different energies;
one of which takes an energy value higher than the K-absorption edge of the element of interest and the other takes an energy value lower than the K-absorption edge of the element of interest, and both energy values can be approximately equal to the same energy value;
separating the contribution of the interested element to the transmissivity from the painting and calligraphy to be detected, and calculating the surface density of the interested element according to the energy of the X-ray, the mass attenuation coefficient of the interested element and the transmissivity of the X-ray photon at each scanning point;
the transmittance of the two measurements is expressed as:
wherein the method comprises the steps of,For energy E 1 X-ray transmittance of>For energy E 2 I represents the intensity of X-rays after passing through the painting and calligraphy relics, I 0 Represents the original intensity of X-ray, C A Representing the areal density of the element of interest, C R Representing the effective areal density of the remaining part of the elements, < >>Therapeutic attenuation coefficient representing the element of interest, +.>Representing the mass attenuation coefficient of the remaining portion of material;
combining the two transmittances, the areal densities of the following elements of interest were obtained:
the effective areal density of the remaining elements is thus:
taking outAccording to C A And C R Is given by the formula:
wherein the method comprises the steps of Is a known constant, independent of spatial position;
and S40, displaying the distribution condition of the interested elements to be detected on the painting and calligraphy cultural relics in a picture form according to the surface density of the interested elements of each scanning point position.
2. The method for imaging paint of painting and calligraphy cultural relics based on an X-ray K-absorbing side according to claim 1, wherein in step S00, the X-ray detector is a silicon semiconductor detector array.
3. The X-ray K-absorbing edge based painting and calligraphy relic pigment imaging method according to claim 2, wherein in step S00, the silicon semiconductor detector array comprises 100X 100 detector units, and each detector unit has a size of 100 μιτι X100 μιτι.
4. Painting and calligraphy cultural relic pigment imaging device based on X-ray K-absorption edge, which is characterized by comprising:
the silicon semiconductor detector array is used for scanning transmission measurement by irradiating the painting and calligraphy cultural relics to be detected through X rays; the X-ray emitted by a part of the X-ray tube of the silicon semiconductor detector array passes through the painting and calligraphy cultural relics to be inspected and then reaches the detector, the X-ray detector is utilized to detect the X-ray and record the intensity of the X-ray, and the data of each pixel point corresponds to one scanning point in the painting and calligraphy cultural relics; for measuring the transmittance of the acquired X-rays at the edges and the lower edges of the K-absorption edge;
the control end is used for acquiring and determining the element of interest to be detected and the energy value corresponding to the element of interest; the method comprises the steps of calculating the area density of the interested element of each scanning point position according to a scanning measurement result, the interested element to be detected and the energy value corresponding to the K-absorption edge of each interested element; the energy value corresponding to the K-absorption edge of each element of interest is known data, and the area density is defined as the product of the density and the thickness of the element of interest;
the specific calculation steps of the area density of the interested element of each scanning point position are as follows:
performing X-ray projection transmittance measurement twice under X-rays with different energies;
one of which takes an energy value higher than the K-absorption edge of the element of interest and the other takes an energy value lower than the K-absorption edge of the element of interest, and both energy values can be approximately equal to the same energy value;
separating the contribution of the interested element to the transmissivity from the painting and calligraphy to be detected, and calculating the surface density of the interested element according to the energy of the X-ray, the mass attenuation coefficient of the interested element and the transmissivity of the X-ray photon at each scanning point;
the transmittance of the two measurements is expressed as:
wherein,for energy E 1 X-ray transmittance of>For energy E 2 I represents the intensity of X-rays after passing through the painting and calligraphy relics, I 0 Represents the original intensity of X-ray, C A Representing the areal density of the element of interest, C R Representing the effective areal density of the remaining part of the elements, < >>Therapeutic attenuation coefficient representing the element of interest, +.>Representing the mass attenuation coefficient of the remaining portion of material;
combining the two transmittances, the areal densities of the following elements of interest were obtained:
the effective areal density of the remaining elements is thus:
taking outAccording to C A And C R Is given by the formula:
wherein the method comprises the steps of Is a known constant, independent of spatial position;
and the output module is used for displaying the distribution condition of the interested elements to be detected on the painting and calligraphy cultural relics in a picture form according to the surface density of the interested elements of each scanning point position.
5. An electronic device comprising a memory and a processor, wherein the memory has stored therein a computer program, the processor being arranged to run the computer program to perform the X-ray K-absorbing edge based painting and calligraphy cultural relic pigment imaging method according to any one of claims 1 to 3.
6. A readable storage medium, characterized in that the readable storage medium has stored therein a computer program comprising program code for controlling a process to perform a process comprising the X-ray K-absorbing edge based painting and calligraphy cultural relic pigment imaging method according to any one of claims 1 to 3.
CN202310564166.5A 2023-05-18 2023-05-18 Painting and calligraphy cultural relic pigment imaging method based on X-ray K-absorption edge and application thereof Active CN116577358B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310564166.5A CN116577358B (en) 2023-05-18 2023-05-18 Painting and calligraphy cultural relic pigment imaging method based on X-ray K-absorption edge and application thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310564166.5A CN116577358B (en) 2023-05-18 2023-05-18 Painting and calligraphy cultural relic pigment imaging method based on X-ray K-absorption edge and application thereof

Publications (2)

Publication Number Publication Date
CN116577358A CN116577358A (en) 2023-08-11
CN116577358B true CN116577358B (en) 2024-01-23

Family

ID=87542813

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310564166.5A Active CN116577358B (en) 2023-05-18 2023-05-18 Painting and calligraphy cultural relic pigment imaging method based on X-ray K-absorption edge and application thereof

Country Status (1)

Country Link
CN (1) CN116577358B (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6353456A (en) * 1986-08-25 1988-03-07 Hitachi Ltd Monochromic x ray image measuring apparatus
JPH01147446A (en) * 1987-12-04 1989-06-09 Hitachi Ltd Energy differential image photographing system
US6507631B1 (en) * 1999-12-22 2003-01-14 Tetsuo Takuno X-ray three-dimensional imaging method and apparatus
CN101868183A (en) * 2007-11-23 2010-10-20 皇家飞利浦电子股份有限公司 Medical x-ray examination apparatus for performing k-edge imaging
CN108169254A (en) * 2016-12-07 2018-06-15 清华大学 Check equipment and inspection method
CN115993102A (en) * 2023-03-24 2023-04-21 杭州宇称电子技术有限公司 Overlap thickness detection method and device based on single photon detector and application thereof

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6909771B2 (en) * 2002-11-22 2005-06-21 Board Of Regents, The University Of Texas System Three component x-ray bone densitometry
EP2377467A1 (en) * 2010-04-08 2011-10-19 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement System and method for determining the composition of an object
DE102019128842A1 (en) * 2019-10-25 2021-04-29 Universität Hamburg Method, device and marker substance kit for multiparametric X-ray fluorescence imaging
EP3839886A1 (en) * 2019-12-18 2021-06-23 Vito NV A method and system for performing characterization of one or more materials

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6353456A (en) * 1986-08-25 1988-03-07 Hitachi Ltd Monochromic x ray image measuring apparatus
JPH01147446A (en) * 1987-12-04 1989-06-09 Hitachi Ltd Energy differential image photographing system
US6507631B1 (en) * 1999-12-22 2003-01-14 Tetsuo Takuno X-ray three-dimensional imaging method and apparatus
CN101868183A (en) * 2007-11-23 2010-10-20 皇家飞利浦电子股份有限公司 Medical x-ray examination apparatus for performing k-edge imaging
CN108169254A (en) * 2016-12-07 2018-06-15 清华大学 Check equipment and inspection method
CN115993102A (en) * 2023-03-24 2023-04-21 杭州宇称电子技术有限公司 Overlap thickness detection method and device based on single photon detector and application thereof

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
"基于软X射线谱学显微双能衬度图像的元素空间分布研究";张祥志 等;《物理学报》;第59卷(第7期);第4535-4541页 *
中重核中子共振研究及应用进展;庹先国;刘福乐;王琦标;邓超;石睿;穆克亮;牛江;;核技术(第10期);全文 *
古代纸质文物科学检测技术综述;阎春生;黄晨;韩松涛;韩秀丽;应超男;杜远东;;中国光学(第05期);全文 *
基于X射线相干衍射成像的元素分布成像;祝江威;许子健;刘海岗;张祥志;郭智;王勇;邰仁忠;;核技术(第04期);全文 *
基于软X射线谱学显微双能衬度图像的元素空间分布研究;张祥志;许子健;甄香君;王勇;郭智;严睿;常睿;周冉冉;邰仁忠;;物理学报(第07期);全文 *
广域X射线荧光扫描成像技术――一种新型的文物分析方法;段佩权;曲亮;;中国文物科学研究(第03期);全文 *

Also Published As

Publication number Publication date
CN116577358A (en) 2023-08-11

Similar Documents

Publication Publication Date Title
CN109716115B (en) X-ray spectrometer and method of use
Mantouvalou et al. Quantification for 3D micro X-ray fluorescence
US20110249788A1 (en) System and method for determining the composition of an object
Dreier et al. Spectral correction algorithm for multispectral CdTe x-ray detectors
Acquafredda XRF technique
JP2008309807A (en) Method of determining background corrected count of radiation quantum in x-ray energy spectrum
JP2019045514A (en) Spectral image data processing device and two-dimensional spectroscopic device
Pessanha et al. Comparison of standard‐based and standardless methods of quantification used in X‐ray fluorescence analysis: Application to the exoskeleton of clams
Romano et al. A new X-ray pinhole camera for energy dispersive X-ray fluorescence imaging with high-energy and high-spatial resolution
Alves et al. Mineralogy evaluation and segmentation using dual‐energy microtomography
Bátor et al. A comparison of a track shape analysis-based automated slide scanner system with traditional methods
CN116577358B (en) Painting and calligraphy cultural relic pigment imaging method based on X-ray K-absorption edge and application thereof
JP2005513478A5 (en)
Diego et al. The hybrid SZ power spectrum: combining cluster counts and SZ fluctuations to probe gas physics
CN113330298B (en) System, method and apparatus for correcting transmission deviation of interference filter due to incident angle
Nave et al. Use of phosphor image plates for measuring intensities in vacuum ultraviolet spectra
CN104122279B (en) X-ray microcell absorption spectra measuring method with spatial resolving power
Šmit et al. Parametrization of a tabletop micro‐XRF system
CN104280414B (en) Method for marking mineral elements
JP7128479B2 (en) Alpha-ray emitting nuclide analysis method and analysis apparatus
US6845147B2 (en) Scatter spectra method for x-ray fluorescent analysis with optical components
Wittry Methods of quantitative electron probe analysis
Nakae et al. Mathematical considerations for evaluating X‐ray beam size in micro‐XRF analysis
Rothermel et al. First results on ion micro-tomography at LIPSION
An et al. Full-field X-ray fluorescence imaging with a straight polycapillary X-ray collimator

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant