SG11202001687YA - Interface element for a testing apparatus of electronic devices and corresponding manufacturing method - Google Patents

Interface element for a testing apparatus of electronic devices and corresponding manufacturing method

Info

Publication number
SG11202001687YA
SG11202001687YA SG11202001687YA SG11202001687YA SG11202001687YA SG 11202001687Y A SG11202001687Y A SG 11202001687YA SG 11202001687Y A SG11202001687Y A SG 11202001687YA SG 11202001687Y A SG11202001687Y A SG 11202001687YA SG 11202001687Y A SG11202001687Y A SG 11202001687YA
Authority
SG
Singapore
Prior art keywords
electronic devices
interface element
testing apparatus
corresponding manufacturing
manufacturing
Prior art date
Application number
SG11202001687YA
Other languages
English (en)
Inventor
Roberto Crippa
Riccardo Vettori
Original Assignee
Technoprobe Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technoprobe Spa filed Critical Technoprobe Spa
Publication of SG11202001687YA publication Critical patent/SG11202001687YA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
SG11202001687YA 2017-09-07 2018-08-29 Interface element for a testing apparatus of electronic devices and corresponding manufacturing method SG11202001687YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT102017000100522A IT201700100522A1 (it) 2017-09-07 2017-09-07 Elemento di interfaccia per un’apparecchiatura di test di dispositivi elettronici e relativo metodo di fabbricazione
PCT/EP2018/073187 WO2019048299A1 (en) 2017-09-07 2018-08-29 INTERFACE MEMBER FOR ELECTRONIC DEVICE TESTING APPARATUS AND METHOD FOR MANUFACTURING THE SAME

Publications (1)

Publication Number Publication Date
SG11202001687YA true SG11202001687YA (en) 2020-03-30

Family

ID=61024852

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202001687YA SG11202001687YA (en) 2017-09-07 2018-08-29 Interface element for a testing apparatus of electronic devices and corresponding manufacturing method

Country Status (10)

Country Link
US (1) US11293941B2 (zh)
EP (1) EP3679381A1 (zh)
JP (1) JP2020533571A (zh)
KR (1) KR102608053B1 (zh)
CN (1) CN111051897B (zh)
IT (1) IT201700100522A1 (zh)
PH (1) PH12020500440A1 (zh)
SG (1) SG11202001687YA (zh)
TW (1) TWI717632B (zh)
WO (1) WO2019048299A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI638168B (zh) * 2018-04-03 2018-10-11 中華精測科技股份有限公司 探針卡裝置及探針座

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1187229A1 (ru) * 1982-12-20 1985-10-23 Akopyan Robert A Электрический соединитель
JP3400051B2 (ja) * 1993-11-10 2003-04-28 ザ ウィタカー コーポレーション 異方性導電膜、その製造方法及びそれを使用するコネクタ
JP3640268B2 (ja) * 1995-10-06 2005-04-20 ザ ウィタカー コーポレーション コネクタ及びコネクタ製造方法
US5785538A (en) * 1995-11-27 1998-07-28 International Business Machines Corporation High density test probe with rigid surface structure
US5892245A (en) * 1996-11-11 1999-04-06 Emulation Technology, Inc. Ball grid array package emulator
EP1061608A3 (en) * 1999-05-10 2002-10-02 Hirose Electric Co., Ltd. Board to board electrical connectors
JP3350479B2 (ja) * 1999-05-10 2002-11-25 ヒロセ電機株式会社 中間電気コネクタ
US6524115B1 (en) * 1999-08-20 2003-02-25 3M Innovative Properties Company Compliant interconnect assembly
TW498707B (en) * 1999-11-26 2002-08-11 Matsushita Electric Ind Co Ltd Wiring substrate and production method thereof
US7083436B2 (en) * 2001-03-06 2006-08-01 International Business Machines Corporation Particle distribution interposer and method of manufacture thereof
JP3616031B2 (ja) * 2001-05-10 2005-02-02 富士通株式会社 異方導電性シート、その製造方法、電子装置及び動作試験用検査装置
JP4607417B2 (ja) * 2001-11-15 2011-01-05 株式会社フジクラ 両面接点コネクタ
US6574114B1 (en) * 2002-05-02 2003-06-03 3M Innovative Properties Company Low contact force, dual fraction particulate interconnect
CN100493291C (zh) * 2002-10-24 2009-05-27 国际商业机器公司 内插件及其制造方法
JP2004172588A (ja) * 2002-10-28 2004-06-17 Jsr Corp シート状コネクターおよびその製造方法並びにプローブ装置
JP3753145B2 (ja) * 2003-04-21 2006-03-08 Ｊｓｒ株式会社 異方導電性シートおよびその製造方法、アダプター装置およびその製造方法並びに回路装置の電気的検査装置
US6994570B2 (en) * 2004-01-28 2006-02-07 International Business Machines Corporation High performance interposer for a chip package using deformable button contacts
KR100968184B1 (ko) * 2004-12-16 2010-07-05 인터내셔널 비지네스 머신즈 코포레이션 금속화 엘라스토머 전기 접점
US7442049B2 (en) * 2005-02-09 2008-10-28 International Business Machines Corporation Electrical connecting device and method of forming same
TWI406449B (zh) * 2005-02-16 2013-08-21 Jsr Corp Composite conductive sheet and manufacturing method thereof, electrical inspection device for an electrically conductive connector, a connector device, and a circuit device
US7825512B2 (en) * 2005-09-12 2010-11-02 Hewlett-Packard Development Company, L.P. Electronic package with compliant electrically-conductive ball interconnect
CN101467051B (zh) * 2006-06-08 2012-03-28 日本发条株式会社 探针卡
US7759951B2 (en) * 2007-05-29 2010-07-20 Touchdown Technologies, Inc. Semiconductor testing device with elastomer interposer
JP2009074823A (ja) * 2007-09-19 2009-04-09 Ngk Spark Plug Co Ltd 電子部品検査装置用配線基板およびその製造方法
KR100952712B1 (ko) * 2007-12-27 2010-04-13 주식회사 아이에스시테크놀러지 판형 도전입자를 포함한 실리콘 콘택터
KR100978549B1 (ko) * 2007-12-28 2010-08-27 티에스씨멤시스(주) 프로브 구조물 및 프로브 구조물 제조 방법
CN101971037A (zh) * 2008-03-14 2011-02-09 富士胶片株式会社 探针卡
JP5253972B2 (ja) * 2008-04-28 2013-07-31 富士フイルム株式会社 構造体およびその製造方法
JP4555362B2 (ja) * 2008-06-02 2010-09-29 株式会社アドバンテスト プローブ、電子部品試験装置及びプローブの製造方法
US20100276188A1 (en) * 2009-05-04 2010-11-04 Russell James V Method and apparatus for improving power gain and loss for interconect configurations
JP5448675B2 (ja) * 2009-09-25 2014-03-19 パナソニック株式会社 プローブカード及びそれを用いた半導体ウェーハの検査方法
TWI534432B (zh) * 2010-09-07 2016-05-21 瓊斯科技國際公司 用於微電路測試器之電氣傳導針腳
US8832933B2 (en) * 2011-09-15 2014-09-16 Taiwan Semiconductor Manufacturing Co., Ltd. Method of fabricating a semiconductor test probe head
US8917106B2 (en) * 2011-11-09 2014-12-23 Advantest America, Inc. Fine pitch microelectronic contact array and method of making same
KR101215375B1 (ko) * 2011-11-25 2012-12-26 (주)기가레인 컨택트 필름, 상기 컨택트 필름의 제조방법, 프로브 유닛 및 ｌｃｄ 패널 검사장치
US9263817B2 (en) * 2013-06-12 2016-02-16 Ironwood Electronics, Inc. Adapter apparatus with suspended conductive elastomer interconnect
US9459285B2 (en) * 2013-07-10 2016-10-04 Globalfoundries Inc. Test probe coated with conductive elastomer for testing of backdrilled plated through holes in printed circuit board assembly
KR101544844B1 (ko) * 2014-02-28 2015-08-20 김형익 와이어드 러버 컨택트 및 그 제조방법
WO2015132747A1 (en) * 2014-03-06 2015-09-11 Technoprobe S.P.A. High-planarity probe card for a testing apparatus for electronic devices
KR101706331B1 (ko) * 2014-10-17 2017-02-15 주식회사 아이에스시 검사용 소켓
JP2016178121A (ja) * 2015-03-18 2016-10-06 タツタ電線株式会社 ストレッチャブルケーブルおよびストレッチャブル回路基板
WO2016156003A1 (en) * 2015-03-31 2016-10-06 Technoprobe S.P.A. Vertical contact probe and corresponding testing head with vertical contact probes, particularly for high frequency applications
JP6918518B2 (ja) * 2017-02-27 2021-08-11 デクセリアルズ株式会社 電気特性の検査冶具

Also Published As

Publication number Publication date
US20200200795A1 (en) 2020-06-25
KR20200051007A (ko) 2020-05-12
WO2019048299A1 (en) 2019-03-14
TW201930892A (zh) 2019-08-01
JP2020533571A (ja) 2020-11-19
KR102608053B1 (ko) 2023-11-29
CN111051897A (zh) 2020-04-21
EP3679381A1 (en) 2020-07-15
TWI717632B (zh) 2021-02-01
CN111051897B (zh) 2023-01-24
IT201700100522A1 (it) 2019-03-07
US11293941B2 (en) 2022-04-05
PH12020500440A1 (en) 2021-01-25

Similar Documents

Publication Publication Date Title
IL263435A (en) A method of making a heater for an electronic inhalation device
EP3442011A4 (en) METHOD AND APPARATUS FOR MANUFACTURING ELECTRONIC DEVICE USING A DEVICE CHIP
SG11201802020WA (en) Device and method for self-adjustment of a component-handling device for electronic components
SG10201706446VA (en) An Apparatus and Method for Transferring Electronic Devices
IL263447A (en) Electronic inhaler vaporizer and method of creating a vaporizer
IL265925A (en) Manufacturing method and apparatus for electronic component and such electronic component
SG11202113246XA (en) Method for manufacturing electronic device
GB2549250B (en) Apparatus and method for manufacturing plurality of electronic circuits
SG11202009374YA (en) Method for manufacturing electronic device
PL3490891T3 (pl) Sposób i urządzenie do wytwarzania kapsułki wypełnionej płynem
ZA201603730B (en) A portable electronic test device and a method of using same
SG11201908298YA (en) Integrated circuit device and method of manufacturing integrated circuit device
SG11202109903XA (en) Method for manufacturing electronic device
ZA201907870B (en) Desalination device and method of manufacturing such a device
HK1253704A1 (zh) 用於測試流體的電特性的測試設備和方法
EP3625579C0 (fr) Appareil de test et procede de test d'un circuit integre
GB2563600B (en) Apparatus and method for manufacturing plurality of electronic circuits
SG11201909546SA (en) Device comprising an electronic unit, set comprising a device of this kind, associated use, and method for utilizing a set of this kind
SG11202001687YA (en) Interface element for a testing apparatus of electronic devices and corresponding manufacturing method
GB2566029B (en) Methods and apparatus for manufacturing a plurality of electronic circuits
GB201511299D0 (en) Test device and method of using a test device
FI20175176A (fi) Menetelmä ja laitteisto elektronisen laitteen kunnon määrittämiseksi
GB201701317D0 (en) A receiving device and a method of manufacturing a receiving device
IL278199B1 (en) Integrated circuit device and method for its manufacture
GB2587223B (en) Electronic device and associated method of manufacture