SG11201911734SA - Contact element system - Google Patents

Contact element system

Info

Publication number
SG11201911734SA
SG11201911734SA SG11201911734SA SG11201911734SA SG11201911734SA SG 11201911734S A SG11201911734S A SG 11201911734SA SG 11201911734S A SG11201911734S A SG 11201911734SA SG 11201911734S A SG11201911734S A SG 11201911734SA SG 11201911734S A SG11201911734S A SG 11201911734SA
Authority
SG
Singapore
Prior art keywords
contact element
element system
contact
Prior art date
Application number
SG11201911734SA
Other languages
English (en)
Inventor
Gunther Böhm
Matthias Schnaithmann
Achim Weiland
Original Assignee
Feinmetall Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetall Gmbh filed Critical Feinmetall Gmbh
Publication of SG11201911734SA publication Critical patent/SG11201911734SA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/0675—Needle-like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
SG11201911734SA 2017-06-06 2018-06-05 Contact element system SG11201911734SA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102017209510.5A DE102017209510A1 (de) 2017-06-06 2017-06-06 Kontaktelementsystem
PCT/EP2018/064683 WO2018224458A1 (de) 2017-06-06 2018-06-05 Kontaktelementsystem

Publications (1)

Publication Number Publication Date
SG11201911734SA true SG11201911734SA (en) 2020-01-30

Family

ID=62620832

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201911734SA SG11201911734SA (en) 2017-06-06 2018-06-05 Contact element system

Country Status (7)

Country Link
US (1) US11519937B2 (zh)
EP (1) EP3635413B1 (zh)
CN (1) CN110709710B (zh)
DE (1) DE102017209510A1 (zh)
SG (1) SG11201911734SA (zh)
TW (1) TWI695549B (zh)
WO (1) WO2018224458A1 (zh)

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TWI745182B (zh) * 2020-11-30 2021-11-01 中華精測科技股份有限公司 探針卡裝置及雙臂式探針
TWI817426B (zh) * 2022-03-31 2023-10-01 中華精測科技股份有限公司 模組化垂直式探針卡的探針頭
TWI805298B (zh) * 2022-03-31 2023-06-11 中華精測科技股份有限公司 多針形垂直式探針卡
TWI802353B (zh) * 2022-03-31 2023-05-11 中華精測科技股份有限公司 探針頭及其柵欄狀探針
TWI831328B (zh) * 2022-08-15 2024-02-01 思達科技股份有限公司 探針陣列及探針結構

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Also Published As

Publication number Publication date
US20200166541A1 (en) 2020-05-28
EP3635413A1 (de) 2020-04-15
TWI695549B (zh) 2020-06-01
WO2018224458A1 (de) 2018-12-13
DE102017209510A1 (de) 2018-12-06
CN110709710A (zh) 2020-01-17
CN110709710B (zh) 2022-03-29
US11519937B2 (en) 2022-12-06
EP3635413B1 (de) 2023-08-23
TW201904136A (zh) 2019-01-16

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