SG11201908966RA - Contact probe and probe unit - Google Patents

Contact probe and probe unit

Info

Publication number
SG11201908966RA
SG11201908966RA SG11201908966RA SG11201908966RA SG 11201908966R A SG11201908966R A SG 11201908966RA SG 11201908966R A SG11201908966R A SG 11201908966RA SG 11201908966R A SG11201908966R A SG 11201908966RA
Authority
SG
Singapore
Prior art keywords
contact
probe
contact member
spring member
unit
Prior art date
Application number
Other languages
English (en)
Inventor
Kazuya Souma
Tsukasa Sakaguchi
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of SG11201908966RA publication Critical patent/SG11201908966RA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/06738Geometry aspects related to tip portion

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
SG11201908966R 2017-03-30 2018-03-29 Contact probe and probe unit SG11201908966RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017069272 2017-03-30
PCT/JP2018/013367 WO2018181776A1 (ja) 2017-03-30 2018-03-29 コンタクトプローブおよびプローブユニット

Publications (1)

Publication Number Publication Date
SG11201908966RA true SG11201908966RA (en) 2019-10-30

Family

ID=63676651

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201908966R SG11201908966RA (en) 2017-03-30 2018-03-29 Contact probe and probe unit

Country Status (7)

Country Link
US (2) US11346859B2 (ja)
JP (1) JP6647451B2 (ja)
CN (1) CN110462408B (ja)
PH (1) PH12019502217A1 (ja)
SG (1) SG11201908966RA (ja)
TW (1) TWI666452B (ja)
WO (1) WO2018181776A1 (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113614899B (zh) 2019-03-13 2023-10-24 日本发条株式会社 接触式探针及信号传送方法
JP7134904B2 (ja) * 2019-03-13 2022-09-12 日本発條株式会社 コンタクトプローブおよび信号伝送方法
CN112129975A (zh) * 2019-06-25 2020-12-25 中国探针股份有限公司 电连接组件
KR102259074B1 (ko) * 2020-05-22 2021-06-02 (주)아이윈솔루션 초 고전류용 포고핀
WO2023181906A1 (ja) * 2022-03-25 2023-09-28 株式会社ヨコオ スプリングコネクタ

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60140330D1 (de) * 2000-06-16 2009-12-10 Nhk Spring Co Ltd Mikrokontaktprüfnadel
JP3673153B2 (ja) * 2000-08-10 2005-07-20 タイコエレクトロニクスアンプ株式会社 スプリングコンタクト
EP1326308B1 (en) * 2000-09-22 2008-03-05 Shin-Etsu Polymer Co., Ltd. Spring element, press-clamped connector, and holder with probe for electro-acoustic component
JPWO2003005042A1 (ja) 2001-07-02 2004-10-28 日本発条株式会社 導電性接触子
US6781390B2 (en) * 2001-07-20 2004-08-24 Nhk Spring Co., Ltd. Conductive coil contact member
TWI233489B (en) * 2003-01-21 2005-06-01 Leeno Ind Inc Contact apparatus and test PCB including the contact apparatus used for testing microwave device, and manufacturing method of the test PCB
JP2004247170A (ja) * 2003-02-13 2004-09-02 Smk Corp 押圧式スプリングコネクタ
JP2005069805A (ja) * 2003-08-22 2005-03-17 Jst Mfg Co Ltd コンタクトプローブおよびそれを用いたコンタクトアセンブリ
JP5486760B2 (ja) * 2006-07-04 2014-05-07 株式会社エンプラス コンタクトピン及び電気部品用ソケット
JP2008130283A (ja) * 2006-11-17 2008-06-05 Shin Etsu Polymer Co Ltd 圧接挟持型コネクタ
TWM356909U (en) 2008-12-15 2009-05-11 Cheng Uei Prec Ind Co Ltd Pogo pin
TWM356910U (en) 2008-12-15 2009-05-11 Cheng Uei Prec Ind Co Ltd Pogo pin connector
JP5378273B2 (ja) * 2010-03-12 2013-12-25 株式会社アドバンテスト コンタクトプローブ及びソケット、チューブ状プランジャの製造方法、並びにコンタクトプローブの製造方法
WO2011162362A1 (ja) 2010-06-25 2011-12-29 日本発條株式会社 コンタクトプローブおよびプローブユニット
WO2012093479A1 (ja) * 2011-01-06 2012-07-12 株式会社クローバーテクノロジー プローブピン-ソケット組立体
JP5083430B2 (ja) 2011-03-29 2012-11-28 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
JP6328925B2 (ja) * 2013-12-24 2018-05-23 株式会社エンプラス コンタクトプローブ及び電気部品用ソケット
TWM500367U (zh) 2014-12-23 2015-05-01 Cheng Uei Prec Ind Co Ltd 探針連接器
KR101717353B1 (ko) * 2015-07-14 2017-03-27 구철환 탐침 구조체 및 탐침 구조체 체결용 어셈블리

Also Published As

Publication number Publication date
US20210223287A1 (en) 2021-07-22
CN110462408B (zh) 2022-04-12
CN110462408A (zh) 2019-11-15
JP6647451B2 (ja) 2020-02-14
US11874300B2 (en) 2024-01-16
PH12019502217A1 (en) 2020-07-06
TW201840986A (zh) 2018-11-16
US11346859B2 (en) 2022-05-31
JPWO2018181776A1 (ja) 2019-11-14
US20220252640A1 (en) 2022-08-11
TWI666452B (zh) 2019-07-21
WO2018181776A1 (ja) 2018-10-04

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