TWM356910U - Pogo pin connector - Google Patents

Pogo pin connector Download PDF

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Publication number
TWM356910U
TWM356910U TW97222415U TW97222415U TWM356910U TW M356910 U TWM356910 U TW M356910U TW 97222415 U TW97222415 U TW 97222415U TW 97222415 U TW97222415 U TW 97222415U TW M356910 U TWM356910 U TW M356910U
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TW
Taiwan
Prior art keywords
probe
sleeve
slot
assembly
elastic body
Prior art date
Application number
TW97222415U
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Chinese (zh)
Inventor
Te-Hung Yin
Yung-Yi Chen
Shu-Fang Li
Jui-Pin Lin
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Cheng Uei Prec Ind Co Ltd
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Application filed by Cheng Uei Prec Ind Co Ltd filed Critical Cheng Uei Prec Ind Co Ltd
Priority to TW97222415U priority Critical patent/TWM356910U/en
Publication of TWM356910U publication Critical patent/TWM356910U/en

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Description

M356910 五、新型說明: 【新型所屬之技術領域】 本創作涉及一種探針連接器,尤其涉及一種具較佳電性連 接效果的探針連接器。 【先前技術】 按,探針連接器是一種主要應用於行動電話等電子產品中 的電子零組件,係用以感應電池或智慧卡(SIM卡)等可拆式 電子元件之金屬接點,使電池或智慧卡於裝設後可為電子產品 所啟用。 既有之探針連接器包括—絕緣本體,絕緣本體内設置有多 個探針。探針通常具有一圓形的套管套管内可滑動地裝設有 一探碩,套管之底部與探頭之間裝設有一彈簧,該彈簧將探頭 之接觸端抵頂至套管外部。探針所達成之電性連接係通過探頭 與套S之内壁實現的’當探頭由於受外力作用而被壓入套管 時’探頭抵靠在套管之内壁上,從而實現電性連接。該等探針 連接盗在中華民國新型專利第M241848號、M332850號等文 獻中皆已有揭示。 為保證探針連接器之電性連接穩定,業内通常將探針之探 =底面設計為-斜面。當探頭被壓下時,該斜面向一侧壓縮 彈簧,並藉由彈簧所產生的反彈力而將探頭向一側抵 罪在套管的内壁上。 准上述方案中’探針之探頭與套管内壁之間的接觸並不 二:探針連接11在使用過程中受到震動時,探頭與套管的 發生接觸不良而造成瞬斷,影響電路的連接。 【新型内容】 本創作之目的係提供-種純佳電性連接效果的探針連 M356910 接器。 為達成上述目的’本創作提供之探針連接器包括一絕緣本 體'至少1針及至少—第二彈性體。該絕緣本體内開設有相 對應探針及第二彈性體的組裝孔及組裝槽,且組裝槽與組襄孔 相連通。該組裝孔内收容—探針,該組裝槽内組裝有一第二彈 性體。探針包##管’套管之側壁上貫穿開設有—開槽,且 套管内設有一探頭及-第-彈性體。第二彈性體至少具有-彈 性臂’該彈性臂上形成有_抵頂部,該抵頂部透過所述探針之 套管的開槽伸入套管内部。 如上所述,本創作探針連接器之第二彈性體的抵頂部透過 套g之開槽伸人探針内部,當探針被下壓時,第二彈性體將探 頭向側抵頂於套管的内壁上,從而使探頭與套管之内壁穩定 接觸,實現保證電性連接穩定的效果。 【實施方式】 為詳細說明本創作之技術内容、所達成的目的及功效,以 下兹舉實施例並配合圖式詳予說明。 請參閱第—圖’本創作之探針連接器1包括-絕緣本體 10 ’絕緣本體1G組裝有至少—探針2()及至少—第二彈性體 30 ° 絕緣本體10呈立體矩形,其上對應每一探針開設有一 組裝孔u,所述組裳孔u前後貫穿該絕緣本體ι〇。絕緣本體 ίο上對應所述組裝孔u開設有組裝槽12,所述組裝槽12開 設於對應的組裝孔Η之一側,且與該組裝孔u相互連通。特 別地S本創作探針連接器1設置多個探針20時,絕緣本體 ίο上亦開設有多個組裝孔u,所述組裝槽12則較佳地開設於 兩相鄰組裝孔11之間,且與其兩側的組裝孔U分別連通。 M356910 請參閱第二圖,所述探針20分別包括一套管21、一探頭 22及一第一彈性體23。 所述套管21包括一圓柱狀的筒體211及一與所述筒體211 一體結構的底座216。筒體211的内部開設有一收容腔212, 收容腔212在筒體211的上端形成一與外部空間連通的開口 213。筒體211的下端封閉,且筒體211的側壁上縱向開設有 一開槽214,該開槽214貫穿筒體211的側壁並與所述收容腔 212連通。筒體211的下部向周圓凸出而形成所述底座216。 所述探頭22具有一圓柱形的擋止部221及由擋止部221 之前端延伸形成的圓柱形之接觸部226。該擋止部221的底面 為一斜面,且其直徑大於所述套管21前端之開口 213的直徑。 該接觸部226的直徑小於所述開口 213的直徑,從而能透過該 開口 213伸出。組裝時,探頭22裝設在套管21的收容腔212 内並可在收容腔212内自由滑動,其接觸部226可藉由該開口 213伸出於套管21外部。 所述第一彈性體23具有一第一端231及一與第一端231 相對的第二端232,該第一彈性體23在所述第一端231與第 二端232相對運動時能產生一彈性力。該第一彈性體23設置 於套管21之收容腔212内,其第一端231抵接於收容腔212 的底壁,其第二端232抵接於探頭22之擋止部221的底面上。 探頭22的接觸部226藉由第一彈性體23之彈性力的抵頂而透 過開口 213伸出於套管21外部,探頭22的擋止部221卡嵌於 該開口 213内側。所述第一彈性體23在本實施例中係採用一 壓縮彈簧為之。 請再參閱第一圖,探針20組裝於絕緣本體10之組裝孔 11中,其底座216從對應之組裝孔11之一端露出而電性連接 一電子元件(圖未示)。探針20之探頭22藉由組裝孔11之另 M356910 -端:=體10,供與另一電子元件(圖未示)抵接。 明^閱第-圖,本實施例所採用的第二彈性體為一 =形性臂31 ’且彈性臂31的末端向-侧呈弧形彎 部32’該抵頂部32的末端自由延伸形成-卡 组裝# 12内卫裝時’該第一彈性體3〇設置於絕緣本體1〇的 212中,伸入一相鄰之探針20的收容腔 止二= 分別卡持在對應開槽214的外緣上,防 止所述抵頂部32過度伸入該收容腔212。 較佳=扭Γ為本創作探針連接器1之第二彈性體3°的- 別固ΐ二 效方案,如在每一探針20的開槽214處分 j 缺料元件,並㈣__元㈣-部分伸入探 ^收容財,亦可達賴本㈣例所㈣簧之相_技術效 226 =_,本創作探針連接111之探頭22的接觸部 並壓:所述第向一:=時2;探=管_ 由於本實施例之探頭22的擋止部 底面為-斜面,第一彈性體23被該斜面下壓時產生一反 ,該反彈力的推抵仙使探頭22向—紹 =:觸隨著探頭22的繼續向下滑動,探頭二 及所述第二彈性體3〇的抵頂部32,並 縮所通抵頂部32並㈣該第二彈性體3Q的雜臂Μ mu卩產生—反彈力,該反彈力的方向與所述第一馳 生之彈性力方向相同,從而增強探頭22與套管2】 之内壁的抵觸力,進而進—步保證本創作探針連㈣ 之電性連料穩定,能有效防止瞬斷現象的發生。所實現 需要才曰出的疋’本創作並非僅僅適用於探頭的底面為斜面 M356910 的探針。如第四圖所示,在本創作的另一實施例中,探針連接 器Γ之探頭22’的底面開設一凹槽222,以固定兮笛3 么禾一彈性體 23’的第二端232’。該實施方案亦可達到加強本創作探針連接 器之電連接效果的目的。此外,探針連接器之探頭的底面為一 平面式設計時,亦可等效達成本創作之效果。 ‘” 綜上所述,本創作探針連接器丨之第二彈性體3〇的抵頂 部32透過套管21之開槽214伸入探針2〇之收容腔a]中。 當探針20之探頭22被外力下壓時,所述第二彈性體3〇的抵M356910 V. New description: [New technical field] The present invention relates to a probe connector, and more particularly to a probe connector having a better electrical connection effect. [Prior Art] Press, the probe connector is an electronic component mainly used in electronic products such as mobile phones, and is used for sensing metal contacts of detachable electronic components such as batteries or smart cards (SIM cards). The battery or smart card can be activated for electronics after installation. The existing probe connector includes an insulating body, and a plurality of probes are disposed in the insulating body. The probe typically has a circular sleeve that is slidably mounted with a probe between the bottom of the sleeve and the probe, the spring abutting the contact end of the probe against the outside of the sleeve. The electrical connection achieved by the probe is achieved by the probe and the inner wall of the sleeve S. When the probe is pressed into the sleeve due to an external force, the probe abuts against the inner wall of the sleeve to achieve an electrical connection. These probes have been disclosed in the Republic of China new patents Nos. M241848 and M332850. In order to ensure the stable electrical connection of the probe connector, the probe is usually designed to be a beveled surface. When the probe is depressed, the oblique side compresses the spring on one side and the probe is biased to one side on the inner wall of the sleeve by the repulsive force generated by the spring. In the above scheme, the contact between the probe of the probe and the inner wall of the sleeve is not the same: when the probe connection 11 is vibrated during use, the probe and the sleeve are in poor contact, causing a short circuit, which affects the connection of the circuit. . [New Content] The purpose of this creation is to provide a probe with a pure electrical connection effect and a M356910 connector. To achieve the above objectives, the probe connector provided by the present invention comprises an insulating body 'at least 1 pin and at least - a second elastomer. The insulating body has an assembly hole and an assembly groove corresponding to the probe and the second elastic body, and the assembly groove communicates with the group bore. The assembly hole houses a probe, and a second elastic body is assembled in the assembly groove. The side wall of the probe package ##管' sleeve is opened and slotted, and a probe and a -elastomer are disposed in the sleeve. The second elastomer has at least an -elastic arm. The resilient arm is formed with a yoke top that extends through the slot of the sleeve of the probe into the interior of the sleeve. As described above, the abutting top of the second elastic body of the present probe connector penetrates the inside of the probe through the slot of the sleeve g. When the probe is pressed down, the second elastic body abuts the probe to the side. The inner wall of the tube ensures stable contact between the probe and the inner wall of the sleeve to ensure the stability of the electrical connection. [Embodiment] The technical contents, the objects and effects achieved by the present invention will be described in detail below with reference to the embodiments. Please refer to FIG. 1 'The probe connector 1 of the present invention includes an insulative body 10'. The insulative housing 1G is assembled with at least a probe 2 () and at least a second elastic body 30 °. The insulative housing 10 has a three-dimensional rectangular shape. An assembly hole u is formed corresponding to each of the probes, and the group of the skirt holes u penetrates the insulating body ι before and after. The assembly body 12 is provided with an assembly groove 12 corresponding to the assembly hole u. The assembly groove 12 is disposed on one side of the corresponding assembly hole and communicates with the assembly hole u. In particular, when the plurality of probes 20 are provided in the S probe connector 1 , a plurality of assembly holes u are also formed in the insulative housing ί , and the assembly slots 12 are preferably opened between the two adjacent assembly holes 11 . And connected to the assembly holes U on both sides thereof. M356910 Referring to the second figure, the probes 20 respectively include a sleeve 21, a probe 22 and a first elastic body 23. The sleeve 21 includes a cylindrical barrel 211 and a base 216 integrally formed with the barrel 211. A receiving cavity 212 is defined in the interior of the cylinder 211. The receiving cavity 212 forms an opening 213 communicating with the external space at the upper end of the cylindrical body 211. The lower end of the cylinder 211 is closed, and a slot 214 is defined in the longitudinal direction of the side wall of the cylinder 211. The slot 214 extends through the side wall of the cylinder 211 and communicates with the receiving cavity 212. The lower portion of the cylinder 211 protrudes toward the circumference to form the base 216. The probe 22 has a cylindrical stop portion 221 and a cylindrical contact portion 226 formed by the front end of the stop portion 221 . The bottom surface of the stopper portion 221 is a sloped surface and has a diameter larger than the diameter of the opening 213 of the front end of the sleeve 21. The contact portion 226 has a diameter smaller than the diameter of the opening 213 so as to be able to protrude through the opening 213. When assembled, the probe 22 is mounted in the receiving cavity 212 of the sleeve 21 and is slidable in the receiving cavity 212. The contact portion 226 can protrude from the outside of the sleeve 21 through the opening 213. The first elastic body 23 has a first end 231 and a second end 232 opposite to the first end 231. The first elastic body 23 can be generated when the first end 231 and the second end 232 move relative to each other. An elastic force. The first elastic body 23 is disposed in the receiving cavity 212 of the sleeve 21 , and the first end 231 abuts against the bottom wall of the receiving cavity 212 , and the second end 232 abuts against the bottom surface of the stopping portion 221 of the probe 22 . . The contact portion 226 of the probe 22 protrudes outside the sleeve 21 through the opening 213 by the elastic force of the first elastic body 23, and the stopper portion 221 of the probe 22 is fitted inside the opening 213. The first elastic body 23 is a compression spring in this embodiment. Referring to the first figure, the probe 20 is assembled in the assembly hole 11 of the insulative housing 10, and the base 216 is exposed from one end of the corresponding assembly hole 11 to be electrically connected to an electronic component (not shown). The probe 22 of the probe 20 is abutted against another electronic component (not shown) by assembling another M356910-end:= body 10 of the hole 11. For example, the second elastic body used in this embodiment is a shape arm 31' and the end of the elastic arm 31 has an arc-shaped curved portion 32' which extends freely to the end of the top portion 32. - Card assembly #12 When the inner body is mounted, the first elastic body 3 is disposed in the 212 of the insulating body 1 , and extends into the receiving cavity of an adjacent probe 20 to be held in the corresponding slot. The outer edge of the 214 prevents the abutting top 32 from excessively extending into the receiving cavity 212. Preferably, the twisting is a second embodiment of the second elastomer of the probe connector 1 of 3°, such as a missing component at the slot 214 of each probe 20, and (iv) __ yuan (4) - Partially into the exploration and containment money, or Dalai Ben (4) Example (4) Spring phase _ technical effect 226 = _, the contact portion of the probe 22 of the present probe connection 111 and pressure: the first direction: = 2; probe = tube _ Since the bottom surface of the stopper portion of the probe 22 of the present embodiment is a sloped surface, when the first elastic body 23 is pressed down by the slope, a reverse is generated, and the rebound force is pushed to make the probe 22 - Shao =: as the probe 22 continues to slide down, the probe 2 and the second elastic body 3 〇 against the top 32, and shrinks to the top 32 and (d) the second elastic body 3Q Mu卩 generates a rebound force, the direction of the rebound force is the same as the direction of the first elastic force, thereby enhancing the resistance of the probe 22 to the inner wall of the sleeve 2, and further ensuring the creation of the probe (4) The electrical material is stable and can effectively prevent the occurrence of a momentary break. The realization of the need to extract the 疋 'this creation is not only applicable to the probe with the bevel M356910 on the underside. As shown in the fourth figure, in another embodiment of the present invention, a groove 222 is defined in the bottom surface of the probe 22' of the probe connector to fix the second end of the elastic body 23'. 232'. This embodiment can also achieve the purpose of enhancing the electrical connection effect of the inventive probe connector. In addition, when the bottom surface of the probe of the probe connector is a flat design, the effect of the creation can be equivalently achieved. In summary, the abutting top 32 of the second elastomer 3〇 of the present probe connector extends through the slot 214 of the sleeve 21 into the receiving cavity a] of the probe 2〇. When the probe 22 is pressed by an external force, the second elastic body 3

頂部32將探頭μ向一側抵頂於套管η之内壁上,從而達到 探頭22與套管21㈣穩定抵接之目的,實鶴證電性連接穩 定的效果。 本創作之探針連接器」藉由上述揭露之構造,可以達到 所述目的及功效’且本創作之中請合乎專利之要件故依法提 =申請。惟’以上所揭露者,僅為本創作之較佳實施例,自不 、此限定本創作之權利範圍。本創作之亦可有其他修飾或變 化’皆應涵蓋在以下本案之申請專利範圍内。、 【圖式簡單說明】 第一圖係本創作探針連接器之—剖視圖。 第一圖所示探針連接器之探針的分解圖。 第時的示意圖。 糸本創作另一實施例的剖視圖。 【主要疋件符號說明】 探針連接器 1,1, 組裝孔 11 探針 20 筒體 211 絕緣本體 10 組裝槽 12 套管 21 收容腔 212 M356910 開口 213 開槽 214 底座 216 探頭 22,22, 擋止部 221 凹槽 22V 接觸部 226 第一彈性體 23,23, 第一端 231 第二端 232 , 232, 第二彈性體 30 抵頂部 32 彈性臂 31 卡持部 33The top portion 32 abuts the probe μ to the inner wall of the sleeve η to achieve a stable contact between the probe 22 and the sleeve 21 (4), and the electrical connection of the crane is stable. The probe connector of the present invention can achieve the purpose and effect by the above disclosed structure, and the patent is required to comply with the requirements of the patent. However, the above disclosure is only a preferred embodiment of the present invention, and does not limit the scope of the present invention. Any other modifications or variations of this creation may be covered by the scope of the patent application below. [Simplified description of the drawings] The first figure is a cross-sectional view of the present probe connector. An exploded view of the probe of the probe connector shown in the first figure. The schematic diagram of the first time. A cross-sectional view of another embodiment of the present invention. [Description of main components] Probe connector 1,1, Assembly hole 11 Probe 20 Cylinder 211 Insulation body 10 Assembly slot 12 Sleeve 21 Containment cavity 212 M356910 Opening 213 Slot 214 Base 216 Probe 22, 22, Block Stop portion 221 groove 22V contact portion 226 first elastic body 23, 23, first end 231 second end 232, 232, second elastic body 30 abutting top 32 elastic arm 31 holding portion 33

Claims (1)

M356910 六、申請專利範圍: 1. 一種探針連接器,包括: 一絕緣本體,絕緣本體内開設有至少一組裝孔及至少一組 裝槽,且組裝槽與組裝孔相連通; 至少一探針,組裝於所述組裝孔内,該探針包括一套管, 套管之側壁貫穿開設有一開槽,且套管内裝設有一探頭及一第 一彈性體;以及 至少一第二彈性體,組裝於一組裝槽内,該第二彈性體至 少具有一彈性臂,該彈性臂上設有一抵頂部,該抵頂部透過所 述探針之套管的開槽伸入套管内部。 2. 如申請專利範圍第1項所述之探針連接器,其中所述探 針之探頭的底面為一斜面。 3. 如申請專利範圍第1項所述之探針連接器,其中所述探 針之探頭的底面凹設有一凹槽,用以組裝所述第一彈性體之一 端。 4. 如申請專利範圍第1項所述之探針連接器,其中所述第 二彈性體之抵頂部的末端形成有一卡持部,該卡持部卡持在所 述開槽的外緣上。 5. 如申請專利範圍第1項所述之探針連接器,其中所述絕 緣本體之組裝孔可設有複數個,在相鄰之兩組裝孔之間即設有 所述組裝槽;所述第二彈性體為一扭簧,該扭簧之兩彈性臂的 末端分別向一側彎折形成所述抵頂部,該兩抵頂部分別伸入一 相鄰之探針的套管内。 6. 如申請專利範圍第5項所述之探針連接器,其中所述扭 簧之兩抵頂部的末端分別延伸形成有一卡持部,該兩卡持部分 別卡持在一相鄰之探針的開槽外緣上。 M356910 7.如申請專利範圍第1項所述之探針連接器,其中所述組 裝孔係貫穿該絕緣本體開設,所述探針之套管的下部向周圈凸 出而形成一底座,該底座露出於組裝孔外部。M356910 VI. Patent Application Range: 1. A probe connector comprising: an insulative housing having at least one assembly hole and at least one assembly slot in the insulating body, and the assembly slot is in communication with the assembly hole; at least one probe, Assembly in the assembly hole, the probe includes a sleeve, a sidewall of the sleeve is formed through the slot, and the sleeve is provided with a probe and a first elastic body; and at least a second elastic body is assembled In an assembly slot, the second elastic body has at least one elastic arm, and the elastic arm is provided with an abutting top, and the abutting top extends through the slot of the sleeve of the probe into the sleeve. 2. The probe connector of claim 1, wherein the probe has a bevel on a bottom surface thereof. 3. The probe connector of claim 1, wherein the probe has a recess on a bottom surface thereof for assembling one end of the first elastic body. 4. The probe connector of claim 1, wherein a distal end of the second elastic body is formed with a catch portion that is retained on an outer edge of the slot . 5. The probe connector of claim 1, wherein the assembly hole of the insulative housing may be provided in plurality, and the assembly slot is disposed between two adjacent assembly holes; The second elastic body is a torsion spring, and the ends of the two elastic arms of the torsion spring are respectively bent to one side to form the abutting top, and the two abutting tops respectively extend into the sleeves of an adjacent probe. 6. The probe connector of claim 5, wherein the two ends of the torsion springs respectively extend to form a latching portion, and the two latching portions are respectively clamped to an adjacent probe. The slot is on the outer edge of the slot. The probe connector of claim 1, wherein the assembly hole is opened through the insulating body, and a lower portion of the sleeve of the probe protrudes toward the circumference to form a base. The base is exposed outside the assembly hole.
TW97222415U 2008-12-15 2008-12-15 Pogo pin connector TWM356910U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97222415U TWM356910U (en) 2008-12-15 2008-12-15 Pogo pin connector

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Application Number Priority Date Filing Date Title
TW97222415U TWM356910U (en) 2008-12-15 2008-12-15 Pogo pin connector

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI666452B (en) * 2017-03-30 2019-07-21 日商日本發條股份有限公司 Contact probe and probe unit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI666452B (en) * 2017-03-30 2019-07-21 日商日本發條股份有限公司 Contact probe and probe unit
US11346859B2 (en) 2017-03-30 2022-05-31 Nhk Spring Co., Ltd. Contact probe and probe unit
US11874300B2 (en) 2017-03-30 2024-01-16 Nhk Spring Co., Ltd. Contact probe and probe unit

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