SG11201806533SA - Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications - Google Patents

Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications

Info

Publication number
SG11201806533SA
SG11201806533SA SG11201806533SA SG11201806533SA SG11201806533SA SG 11201806533S A SG11201806533S A SG 11201806533SA SG 11201806533S A SG11201806533S A SG 11201806533SA SG 11201806533S A SG11201806533S A SG 11201806533SA SG 11201806533S A SG11201806533S A SG 11201806533SA
Authority
SG
Singapore
Prior art keywords
international
enclosure
measurement parameters
california
pct
Prior art date
Application number
SG11201806533SA
Other languages
English (en)
Inventor
Mei Sun
Vaibhaw Vishal
Original Assignee
Kla Tencor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kla Tencor Corp filed Critical Kla Tencor Corp
Publication of SG11201806533SA publication Critical patent/SG11201806533SA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/02—Means for indicating or recording specially adapted for thermometers
    • G01K1/026—Means for indicating or recording specially adapted for thermometers arrangements for monitoring a plurality of temperatures, e.g. by multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/20—Compensating for effects of temperature changes other than those to be measured, e.g. changes in ambient temperature
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K13/00—Thermometers specially adapted for specific purposes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/02—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning
    • G01L9/025—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning with temperature compensating means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67098—Apparatus for thermal treatment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Automation & Control Theory (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
SG11201806533SA 2016-02-02 2017-01-30 Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications SG11201806533SA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662290153P 2016-02-02 2016-02-02
US15/277,753 US11150140B2 (en) 2016-02-02 2016-09-27 Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications
PCT/US2017/015648 WO2017136282A1 (en) 2016-02-02 2017-01-30 Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications

Publications (1)

Publication Number Publication Date
SG11201806533SA true SG11201806533SA (en) 2018-08-30

Family

ID=59387482

Family Applications (3)

Application Number Title Priority Date Filing Date
SG10202007387PA SG10202007387PA (en) 2016-02-02 2017-01-30 Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications
SG11201806533SA SG11201806533SA (en) 2016-02-02 2017-01-30 Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications
SG10201913252WA SG10201913252WA (en) 2016-02-02 2017-01-31 Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications

Family Applications Before (1)

Application Number Title Priority Date Filing Date
SG10202007387PA SG10202007387PA (en) 2016-02-02 2017-01-30 Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG10201913252WA SG10201913252WA (en) 2016-02-02 2017-01-31 Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications

Country Status (7)

Country Link
US (1) US11150140B2 (zh)
JP (1) JP6944460B2 (zh)
KR (1) KR20180101616A (zh)
CN (1) CN108604559B (zh)
SG (3) SG10202007387PA (zh)
TW (1) TWI731929B (zh)
WO (1) WO2017136282A1 (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10460966B2 (en) 2016-06-15 2019-10-29 Kla-Tencor Corporation Encapsulated instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications
US10900843B2 (en) * 2018-06-05 2021-01-26 Kla Corporation In-situ temperature sensing substrate, system, and method
US11315811B2 (en) 2018-09-06 2022-04-26 Kla Corporation Process temperature measurement device fabrication techniques and methods of calibration and data interpolation of the same
US11668601B2 (en) 2020-02-24 2023-06-06 Kla Corporation Instrumented substrate apparatus
US20220223441A1 (en) * 2021-01-08 2022-07-14 Kla Corporation Process condition sensing apparatus
US11688614B2 (en) * 2021-04-28 2023-06-27 Kla Corporation Mitigating thermal expansion mismatch in temperature probe construction apparatus and method

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EP1311825B1 (en) * 2000-06-29 2006-10-18 Semiconductor Diagnostics, Inc. Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages
JP2002071469A (ja) * 2000-09-04 2002-03-08 Nikon Corp 温度測定装置および温度調節器
JP3888080B2 (ja) * 2001-04-24 2007-02-28 日亜化学工業株式会社 半導体レーザ素子
US20030115978A1 (en) * 2001-12-20 2003-06-26 Moehnke Stephanie J. Apparatus and method for monitoring environment within a container
US7757574B2 (en) * 2002-01-24 2010-07-20 Kla-Tencor Corporation Process condition sensing wafer and data analysis system
US7151366B2 (en) 2002-12-03 2006-12-19 Sensarray Corporation Integrated process condition sensing wafer and data analysis system
SG115733A1 (en) * 2004-03-12 2005-10-28 Semiconductor Energy Lab Thin film transistor, semiconductor device, and method for manufacturing the same
DE102004034192A1 (de) 2004-07-14 2006-02-09 Heraeus Sensor Technology Gmbh Hochtemperaturstabiler Sensor
TWI405281B (zh) * 2005-12-13 2013-08-11 Sensarray Corp 製程條件感應晶圓及資料分析系統
JP5314616B2 (ja) * 2010-02-08 2013-10-16 富士フイルム株式会社 半導体素子用基板の製造方法
TWI551803B (zh) * 2010-06-15 2016-10-01 拜歐菲樂Ｉｐ有限責任公司 低溫熱力閥裝置、含有該低溫熱力閥裝置之系統及使用該低溫熱力閥裝置之方法
JP2012163525A (ja) * 2011-02-09 2012-08-30 Sumitomo Heavy Ind Ltd 温度測定器、成膜装置、及び成膜基板製造方法
JP5950530B2 (ja) * 2011-10-03 2016-07-13 株式会社日立国際電気 基板処理装置及び半導体装置の製造方法
US9140613B2 (en) * 2012-03-16 2015-09-22 Zhejiang Dunan Hetian Metal Co., Ltd. Superheat sensor
US9222842B2 (en) 2013-01-07 2015-12-29 Kla-Tencor Corporation High temperature sensor wafer for in-situ measurements in active plasma
JP6368773B2 (ja) * 2013-04-30 2018-08-01 アプライド マテリアルズ インコーポレイテッドＡｐｐｌｉｅｄ Ｍａｔｅｒｉａｌｓ，Ｉｎｃｏｒｐｏｒａｔｅｄ 空間的に分散されたガス流路を有する流量制御ライナー
JP6057292B2 (ja) * 2013-06-13 2017-01-11 学校法人関西学院 ＳｉＣ半導体素子の製造方法
JP6555260B2 (ja) * 2014-06-17 2019-08-07 ソニー株式会社 発光素子及びその製造方法

Also Published As

Publication number Publication date
WO2017136282A1 (en) 2017-08-10
US11150140B2 (en) 2021-10-19
SG10202007387PA (en) 2020-09-29
CN108604559B (zh) 2023-06-13
JP2019508891A (ja) 2019-03-28
TW201737382A (zh) 2017-10-16
US20170219437A1 (en) 2017-08-03
KR20180101616A (ko) 2018-09-12
TWI731929B (zh) 2021-07-01
CN108604559A (zh) 2018-09-28
SG10201913252WA (en) 2020-03-30
JP6944460B2 (ja) 2021-10-06

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