SG11201601292RA - Polishing composition and method for producing same - Google Patents
Polishing composition and method for producing sameInfo
- Publication number
- SG11201601292RA SG11201601292RA SG11201601292RA SG11201601292RA SG11201601292RA SG 11201601292R A SG11201601292R A SG 11201601292RA SG 11201601292R A SG11201601292R A SG 11201601292RA SG 11201601292R A SG11201601292R A SG 11201601292RA SG 11201601292R A SG11201601292R A SG 11201601292RA
- Authority
- SG
- Singapore
- Prior art keywords
- polishing composition
- producing same
- producing
- same
- polishing
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000005498 polishing Methods 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/04—Aqueous dispersions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1436—Composite particles, e.g. coated particles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Composite Materials (AREA)
- Dispersion Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013204468A JP5857310B2 (ja) | 2013-09-30 | 2013-09-30 | 研磨用組成物およびその製造方法 |
PCT/JP2014/075124 WO2015046164A1 (ja) | 2013-09-30 | 2014-09-22 | 研磨用組成物およびその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201601292RA true SG11201601292RA (en) | 2016-03-30 |
Family
ID=52743300
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201601292RA SG11201601292RA (en) | 2013-09-30 | 2014-09-22 | Polishing composition and method for producing same |
Country Status (8)
Country | Link |
---|---|
US (1) | US9944838B2 (zh) |
EP (1) | EP3053978B1 (zh) |
JP (1) | JP5857310B2 (zh) |
KR (1) | KR102326750B1 (zh) |
CN (1) | CN105612236B (zh) |
SG (1) | SG11201601292RA (zh) |
TW (1) | TWI618740B (zh) |
WO (1) | WO2015046164A1 (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5920840B2 (ja) * | 2013-09-30 | 2016-05-18 | 株式会社フジミインコーポレーテッド | 研磨用組成物およびその製造方法 |
JP6524799B2 (ja) * | 2015-05-27 | 2019-06-05 | 日立化成株式会社 | サファイア用研磨液、貯蔵液及び研磨方法 |
JP2017005050A (ja) | 2015-06-08 | 2017-01-05 | 信越化学工業株式会社 | 研磨組成物及びその製造方法並びに研磨方法 |
JP6678076B2 (ja) * | 2016-06-30 | 2020-04-08 | 花王株式会社 | シリコンウェーハ用研磨液組成物 |
CN106947396B (zh) * | 2017-03-23 | 2019-02-26 | 河南联合精密材料股份有限公司 | 研磨液用悬浮体系、研磨液及其制备方法 |
JP6879798B2 (ja) * | 2017-03-30 | 2021-06-02 | 株式会社フジミインコーポレーテッド | 研磨用組成物および研磨方法 |
WO2019187969A1 (ja) * | 2018-03-30 | 2019-10-03 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
JP6929239B2 (ja) * | 2018-03-30 | 2021-09-01 | 株式会社フジミインコーポレーテッド | 研磨用組成物および研磨方法 |
JP7349352B2 (ja) * | 2019-12-27 | 2023-09-22 | グローバルウェーハズ・ジャパン株式会社 | シリコンウェーハの研磨方法 |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3996314B2 (ja) | 1999-03-26 | 2007-10-24 | 三洋化成工業株式会社 | 研磨用砥粒分散剤および研磨用スラリー |
JP4394234B2 (ja) * | 2000-01-20 | 2010-01-06 | 日鉱金属株式会社 | 銅電気めっき液及び銅電気めっき方法 |
JP2001240850A (ja) | 2000-02-29 | 2001-09-04 | Sanyo Chem Ind Ltd | 研磨用砥粒分散剤および研磨用スラリー |
JP2001300285A (ja) * | 2000-04-18 | 2001-10-30 | Sanyo Chem Ind Ltd | 研磨用砥粒分散剤及び研磨用スラリー |
JP4076012B2 (ja) * | 2002-04-10 | 2008-04-16 | 株式会社日本触媒 | 化学機械研磨用水系分散体 |
JP2005093785A (ja) * | 2003-09-18 | 2005-04-07 | Toshiba Corp | Cmp用スラリー、研磨方法、および半導体装置の製造方法 |
WO2006035779A1 (ja) * | 2004-09-28 | 2006-04-06 | Hitachi Chemical Co., Ltd. | Cmp研磨剤及び基板の研磨方法 |
CN101107279B (zh) * | 2005-03-29 | 2011-06-01 | 佳能株式会社 | 电荷控制树脂和调色剂 |
CN100570827C (zh) * | 2005-04-14 | 2009-12-16 | 三井化学株式会社 | 研磨材料浆及使用该浆料的研磨材料 |
US20090093118A1 (en) | 2005-04-14 | 2009-04-09 | Showa Denko K.K. | Polishing composition |
TW200714697A (en) * | 2005-08-24 | 2007-04-16 | Jsr Corp | Aqueous dispersion for chemical mechanical polish, kit for formulating the aqueous dispersion, chemical mechanical polishing method and method for producing semiconductor device |
EP2075824A4 (en) * | 2006-07-28 | 2011-05-04 | Showa Denko Kk | POLISHING COMPOSITION |
US20100221918A1 (en) | 2007-09-03 | 2010-09-02 | Jsr Corporation | Aqueous dispersion for chemical mechanical polishing and method for preparing the same, kit for preparing aqueous dispersion for chemical mechanical polishing, and chemical mechanical polishing method for semiconductor device |
JP2009070904A (ja) * | 2007-09-11 | 2009-04-02 | Mitsui Chemicals Inc | 研磨用組成物 |
JP2009087981A (ja) * | 2007-09-27 | 2009-04-23 | Fujifilm Corp | 研磨液及び研磨方法 |
US8506359B2 (en) * | 2008-02-06 | 2013-08-13 | Jsr Corporation | Aqueous dispersion for chemical mechanical polishing and chemical mechanical polishing method |
JP2010016344A (ja) * | 2008-02-18 | 2010-01-21 | Jsr Corp | 化学機械研磨用水系分散体およびその製造方法、ならびに化学機械研磨方法 |
KR20100123678A (ko) * | 2008-02-18 | 2010-11-24 | 제이에스알 가부시끼가이샤 | 화학 기계 연마용 수계 분산체 및 화학 기계 연마 방법 |
US8741008B2 (en) * | 2008-02-18 | 2014-06-03 | Jsr Corporation | Aqueous dispersion for chemical mechanical polishing and chemical mechanical polishing method |
JP5940270B2 (ja) * | 2010-12-09 | 2016-06-29 | 花王株式会社 | 研磨液組成物 |
CN103620747B (zh) * | 2011-06-14 | 2017-07-28 | 福吉米株式会社 | 研磨用组合物 |
JP5638562B2 (ja) | 2012-03-27 | 2014-12-10 | 株式会社東芝 | 太陽熱利用発電プラントおよびその運転方法 |
EP2858096B1 (en) | 2012-05-25 | 2017-01-11 | Nissan Chemical Industries, Ltd. | Polishing solution composition for wafers |
US8457880B1 (en) * | 2012-11-28 | 2013-06-04 | Cambridge Mobile Telematics | Telematics using personal mobile devices |
CN104798181B (zh) * | 2012-11-30 | 2016-08-24 | 霓达哈斯股份有限公司 | 研磨组合物 |
JP6351944B2 (ja) * | 2013-09-26 | 2018-07-04 | Ntn株式会社 | ステアリング装置 |
-
2013
- 2013-09-30 JP JP2013204468A patent/JP5857310B2/ja active Active
-
2014
- 2014-09-22 CN CN201480053942.4A patent/CN105612236B/zh active Active
- 2014-09-22 WO PCT/JP2014/075124 patent/WO2015046164A1/ja active Application Filing
- 2014-09-22 KR KR1020167004829A patent/KR102326750B1/ko active IP Right Grant
- 2014-09-22 SG SG11201601292RA patent/SG11201601292RA/en unknown
- 2014-09-22 EP EP14848277.1A patent/EP3053978B1/en active Active
- 2014-09-22 US US14/917,728 patent/US9944838B2/en active Active
- 2014-09-26 TW TW103133563A patent/TWI618740B/zh active
Also Published As
Publication number | Publication date |
---|---|
CN105612236A (zh) | 2016-05-25 |
JP2015067774A (ja) | 2015-04-13 |
US20160215188A1 (en) | 2016-07-28 |
EP3053978A1 (en) | 2016-08-10 |
EP3053978B1 (en) | 2019-11-06 |
KR102326750B1 (ko) | 2021-11-17 |
US9944838B2 (en) | 2018-04-17 |
JP5857310B2 (ja) | 2016-02-10 |
EP3053978A4 (en) | 2017-03-22 |
TW201529680A (zh) | 2015-08-01 |
KR20160065079A (ko) | 2016-06-08 |
WO2015046164A1 (ja) | 2015-04-02 |
TWI618740B (zh) | 2018-03-21 |
CN105612236B (zh) | 2018-04-13 |
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