SG11201509685WA - A surface feature manager - Google Patents

A surface feature manager

Info

Publication number
SG11201509685WA
SG11201509685WA SG11201509685WA SG11201509685WA SG11201509685WA SG 11201509685W A SG11201509685W A SG 11201509685WA SG 11201509685W A SG11201509685W A SG 11201509685WA SG 11201509685W A SG11201509685W A SG 11201509685WA SG 11201509685W A SG11201509685W A SG 11201509685WA
Authority
SG
Singapore
Prior art keywords
surface feature
feature manager
manager
feature
Prior art date
Application number
SG11201509685WA
Other languages
English (en)
Inventor
Joachim Ahner
David Tung
Original Assignee
Seagate Technology Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seagate Technology Llc filed Critical Seagate Technology Llc
Publication of SG11201509685WA publication Critical patent/SG11201509685WA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Cleaning In General (AREA)
SG11201509685WA 2013-05-30 2014-05-30 A surface feature manager SG11201509685WA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361829131P 2013-05-30 2013-05-30
US14/194,417 US9274064B2 (en) 2013-05-30 2014-02-28 Surface feature manager
PCT/US2014/040187 WO2014194177A1 (en) 2013-05-30 2014-05-30 A surface feature manager

Publications (1)

Publication Number Publication Date
SG11201509685WA true SG11201509685WA (en) 2015-12-30

Family

ID=51984745

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201509685WA SG11201509685WA (en) 2013-05-30 2014-05-30 A surface feature manager

Country Status (6)

Country Link
US (2) US9274064B2 (zh)
CN (1) CN105358961A (zh)
MY (1) MY178540A (zh)
SG (1) SG11201509685WA (zh)
TW (1) TWI633295B (zh)
WO (1) WO2014194177A1 (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013169980A1 (en) 2012-05-09 2013-11-14 Seagate Technology Llc Surface features mapping
US9212900B2 (en) 2012-08-11 2015-12-15 Seagate Technology Llc Surface features characterization
US9297759B2 (en) 2012-10-05 2016-03-29 Seagate Technology Llc Classification of surface features using fluorescence
US9297751B2 (en) 2012-10-05 2016-03-29 Seagate Technology Llc Chemical characterization of surface features
US9377394B2 (en) 2012-10-16 2016-06-28 Seagate Technology Llc Distinguishing foreign surface features from native surface features
US9217714B2 (en) 2012-12-06 2015-12-22 Seagate Technology Llc Reflective surfaces for surface features of an article
US9513215B2 (en) * 2013-05-30 2016-12-06 Seagate Technology Llc Surface features by azimuthal angle
US9201019B2 (en) * 2013-05-30 2015-12-01 Seagate Technology Llc Article edge inspection
US9217715B2 (en) * 2013-05-30 2015-12-22 Seagate Technology Llc Apparatuses and methods for magnetic features of articles
JP2016206109A (ja) * 2015-04-27 2016-12-08 株式会社日立ハイテクファインシステムズ 磁気ディスク検査装置及び磁気ディスク検査方法
TWI779357B (zh) * 2020-09-23 2022-10-01 南亞科技股份有限公司 偵測物品表面缺陷的方法及其系統

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Also Published As

Publication number Publication date
MY178540A (en) 2020-10-15
TW201514466A (zh) 2015-04-16
US20140354981A1 (en) 2014-12-04
TWI633295B (zh) 2018-08-21
US9488594B2 (en) 2016-11-08
WO2014194177A1 (en) 2014-12-04
US20160139060A1 (en) 2016-05-19
CN105358961A (zh) 2016-02-24
US9274064B2 (en) 2016-03-01

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