SG11201508921RA - Probe pin and electronic device using same - Google Patents

Probe pin and electronic device using same

Info

Publication number
SG11201508921RA
SG11201508921RA SG11201508921RA SG11201508921RA SG11201508921RA SG 11201508921R A SG11201508921R A SG 11201508921RA SG 11201508921R A SG11201508921R A SG 11201508921RA SG 11201508921R A SG11201508921R A SG 11201508921RA SG 11201508921R A SG11201508921R A SG 11201508921RA
Authority
SG
Singapore
Prior art keywords
same
electronic device
probe pin
probe
pin
Prior art date
Application number
SG11201508921RA
Other languages
English (en)
Inventor
Yoshinobu Hemmi
Takahiro Sakai
Hirotada Teranishi
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Publication of SG11201508921RA publication Critical patent/SG11201508921RA/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/28—Clamped connections, spring connections
    • H01R4/48—Clamped connections, spring connections utilising a spring, clip, or other resilient member
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2464—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point
    • H01R13/2471—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point pin shaped
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
SG11201508921RA 2013-08-21 2014-07-18 Probe pin and electronic device using same SG11201508921RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013171082A JP5985447B2 (ja) 2013-08-21 2013-08-21 プローブピン、および、これを用いた電子デバイス
PCT/JP2014/069237 WO2015025662A1 (ja) 2013-08-21 2014-07-18 プローブピン、および、これを用いた電子デバイス

Publications (1)

Publication Number Publication Date
SG11201508921RA true SG11201508921RA (en) 2015-11-27

Family

ID=52483444

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201508921RA SG11201508921RA (en) 2013-08-21 2014-07-18 Probe pin and electronic device using same

Country Status (8)

Country Link
US (1) US9595773B2 (ja)
EP (1) EP3037827B1 (ja)
JP (1) JP5985447B2 (ja)
KR (1) KR101779686B1 (ja)
CN (1) CN105190321B (ja)
SG (1) SG11201508921RA (ja)
TW (1) TWI569525B (ja)
WO (1) WO2015025662A1 (ja)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6269337B2 (ja) * 2014-06-16 2018-01-31 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP6337633B2 (ja) * 2014-06-16 2018-06-06 オムロン株式会社 プローブピン
JP6531438B2 (ja) * 2015-03-13 2019-06-19 オムロン株式会社 プローブピン、および、これを備えたプローブユニット
US11187722B2 (en) 2016-04-15 2021-11-30 Omron Corporation Probe pin and electronic device using the same
JP6515877B2 (ja) * 2016-06-17 2019-05-22 オムロン株式会社 プローブピン
JP2018036129A (ja) * 2016-08-31 2018-03-08 オムロン株式会社 プローブピン
JP6352510B2 (ja) * 2016-09-15 2018-07-04 株式会社Ｓｄｋ コンタクト装置および測定用ソケット
JP6642359B2 (ja) * 2016-09-21 2020-02-05 オムロン株式会社 プローブピンおよび検査ユニット
KR101932509B1 (ko) * 2016-12-12 2018-12-26 주식회사 오킨스전자 다 접점 에지 접촉으로 접촉 특성이 개선되는 fosp 핀, 및 이를 포함하는 테스트 소켓
KR101920824B1 (ko) * 2017-02-02 2018-11-21 리노공업주식회사 검사용 프로브 및 소켓
JP6892277B2 (ja) * 2017-02-10 2021-06-23 株式会社日本マイクロニクス プローブ及び電気的接続装置
JP2018151316A (ja) * 2017-03-14 2018-09-27 オムロン株式会社 プローブピンおよび検査ユニット
KR101957717B1 (ko) * 2017-08-01 2019-07-04 주식회사 오킨스전자 사다리꼴 형태로 접촉 수율이 개선되는 ｐｉｏｎ 핀, 및 이를 포함하는 테스트 소켓
KR101957715B1 (ko) * 2017-08-01 2019-07-04 주식회사 오킨스전자 라운드 타입으로 접촉 수율이 개선되는 ｐｉｏｎ 핀
KR102013138B1 (ko) * 2018-02-14 2019-08-22 주식회사 오킨스전자 탄성편을 포함하는 반도체 테스트 소켓용 핀
KR102003244B1 (ko) * 2018-02-14 2019-07-24 주식회사 오킨스전자 스프링 가조립용 파단 돌기를 이용한 반도체 테스트 소켓용 핀의 조립 방법
KR102013137B1 (ko) * 2018-02-14 2019-08-22 주식회사 오킨스전자 탄성편을 통하여 보조 핀의 콘택 특성이 개선되는 반도체 테스트 소켓용 핀
TWI690709B (zh) * 2018-08-15 2020-04-11 萬潤科技股份有限公司 探針模組、探針裝置及使用該探針裝置之電子元件檢測方法及設備
JP7274853B2 (ja) * 2018-12-03 2023-05-17 株式会社エンプラス コンタクトピンおよびソケット
KR102126753B1 (ko) * 2018-12-19 2020-06-25 주식회사 오킨스전자 단일 코일 스프링에 의하여 3개의 플런저가 독립적으로 슬라이드 동작하는 테스트 소켓에 있어서, 레일을 통하여 상기 슬라이드 동작이 제어되는 데스트 핀
KR102126752B1 (ko) * 2018-12-19 2020-06-25 주식회사 오킨스전자 이중 코일 스프링에 의하여 3개의 플런저가 독립적으로 슬라이드 동작하는 테스트 소켓에 있어서, 레일을 통하여 콘택 특성이 개선되는 데스트 핀
TWI705248B (zh) * 2019-02-15 2020-09-21 萬潤科技股份有限公司 探針驅動方法及裝置
CN110557877B (zh) * 2019-09-11 2021-03-12 北京航空航天大学 朗缪尔探针、朗缪尔探针检测系统及检测方法
CN111579834B (zh) * 2020-05-18 2023-03-31 武汉精毅通电子技术有限公司 一种适用于大电流高速信号测试的探针及连接器
KR102202827B1 (ko) * 2020-10-27 2021-01-14 (주) 네스텍코리아 프로브 핀 및 이를 적용한 동축 프로브 조립체
US11387587B1 (en) * 2021-03-13 2022-07-12 Plastronics Socket Partners, Ltd. Self-retained slider contact pin

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US6685492B2 (en) * 2001-12-27 2004-02-03 Rika Electronics International, Inc. Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition
KR100584225B1 (ko) 2004-10-06 2006-05-29 황동원 전자장치용 콘택트
US7008270B1 (en) * 2004-11-30 2006-03-07 Delphi Technologies, Inc. Cable connector
EP1889080A2 (en) * 2005-06-10 2008-02-20 Delaware Capital Formation, Inc. Electrical contact probe with compliant internal interconnect
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
JP4857046B2 (ja) * 2006-08-02 2012-01-18 株式会社エンプラス 電気接触子及び電気部品用ソケット
JP4943775B2 (ja) * 2006-08-25 2012-05-30 株式会社エンプラス 接触子配設ユニット及び電気部品用ソケット
CN201029131Y (zh) * 2007-03-02 2008-02-27 富士康(昆山)电脑接插件有限公司 电连接器端子
US7862391B2 (en) * 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
TWM350121U (en) * 2008-06-30 2009-02-01 Hon Hai Prec Ind Co Ltd Electrical contact
JP5166176B2 (ja) * 2008-09-04 2013-03-21 スリーエム イノベイティブ プロパティズ カンパニー 電子デバイス用ソケット
TWM366772U (en) * 2009-04-03 2009-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
TWM376001U (en) * 2009-08-05 2010-03-11 Hon Hai Prec Ind Co Ltd Electrical connector
US8808037B2 (en) * 2009-10-12 2014-08-19 Iwin Co., Ltd. Slidable pogo pin
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるｉｃソケット
KR101154519B1 (ko) * 2010-05-27 2012-06-13 하이콘 주식회사 스프링 콘택트 구조
JP5960383B2 (ja) * 2010-06-01 2016-08-02 スリーエム イノベイティブ プロパティズ カンパニー 接触子ホルダ
TWM398701U (en) * 2010-07-16 2011-02-21 Hon Hai Prec Ind Co Ltd Electrical contact

Also Published As

Publication number Publication date
WO2015025662A1 (ja) 2015-02-26
EP3037827B1 (en) 2020-02-05
TW201509013A (zh) 2015-03-01
JP5985447B2 (ja) 2016-09-06
TWI569525B (zh) 2017-02-01
US9595773B2 (en) 2017-03-14
JP2015040734A (ja) 2015-03-02
EP3037827A1 (en) 2016-06-29
CN105190321B (zh) 2018-02-13
CN105190321A (zh) 2015-12-23
EP3037827A4 (en) 2017-03-22
US20160072202A1 (en) 2016-03-10
KR101779686B1 (ko) 2017-09-18
KR20150138289A (ko) 2015-12-09

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