SG11201508921RA - Probe pin and electronic device using same - Google Patents

Probe pin and electronic device using same

Info

Publication number
SG11201508921RA
SG11201508921RA SG11201508921RA SG11201508921RA SG11201508921RA SG 11201508921R A SG11201508921R A SG 11201508921RA SG 11201508921R A SG11201508921R A SG 11201508921RA SG 11201508921R A SG11201508921R A SG 11201508921RA SG 11201508921R A SG11201508921R A SG 11201508921RA
Authority
SG
Singapore
Prior art keywords
same
electronic device
probe pin
probe
pin
Prior art date
Application number
SG11201508921RA
Inventor
Yoshinobu Hemmi
Takahiro Sakai
Hirotada Teranishi
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Publication of SG11201508921RA publication Critical patent/SG11201508921RA/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/28—Clamped connections, spring connections
    • H01R4/48—Clamped connections, spring connections utilising a spring, clip, or other resilient member
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2464—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point
    • H01R13/2471—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point pin shaped
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
SG11201508921RA 2013-08-21 2014-07-18 Probe pin and electronic device using same SG11201508921RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013171082A JP5985447B2 (en) 2013-08-21 2013-08-21 Probe pin and electronic device using the same
PCT/JP2014/069237 WO2015025662A1 (en) 2013-08-21 2014-07-18 Probe pin and electronic device using same

Publications (1)

Publication Number Publication Date
SG11201508921RA true SG11201508921RA (en) 2015-11-27

Family

ID=52483444

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201508921RA SG11201508921RA (en) 2013-08-21 2014-07-18 Probe pin and electronic device using same

Country Status (8)

Country Link
US (1) US9595773B2 (en)
EP (1) EP3037827B1 (en)
JP (1) JP5985447B2 (en)
KR (1) KR101779686B1 (en)
CN (1) CN105190321B (en)
SG (1) SG11201508921RA (en)
TW (1) TWI569525B (en)
WO (1) WO2015025662A1 (en)

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* Cited by examiner, † Cited by third party
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JP6337633B2 (en) * 2014-06-16 2018-06-06 オムロン株式会社 Probe pin
JP6269337B2 (en) * 2014-06-16 2018-01-31 オムロン株式会社 Probe pin and electronic device using the same
JP6531438B2 (en) * 2015-03-13 2019-06-19 オムロン株式会社 Probe pin and probe unit provided with the same
JP6760364B2 (en) * 2016-04-15 2020-09-23 オムロン株式会社 Probe pin and electronic device using it
JP6515877B2 (en) * 2016-06-17 2019-05-22 オムロン株式会社 Probe pin
JP2018036129A (en) * 2016-08-31 2018-03-08 オムロン株式会社 Probe pin
JP6352510B2 (en) * 2016-09-15 2018-07-04 株式会社Ｓｄｋ Contact device and measuring socket
JP6642359B2 (en) * 2016-09-21 2020-02-05 オムロン株式会社 Probe pin and inspection unit
KR101932509B1 (en) * 2016-12-12 2018-12-26 주식회사 오킨스전자 Fine Pitch Outer Spring Pogo with multi edge contact point, and test socket having the same
KR101920824B1 (en) * 2017-02-02 2018-11-21 리노공업주식회사 A test probe and test socket
JP6892277B2 (en) * 2017-02-10 2021-06-23 株式会社日本マイクロニクス Probes and electrical connections
JP2018151316A (en) * 2017-03-14 2018-09-27 オムロン株式会社 Probe pin and inspection unit
KR101957715B1 (en) * 2017-08-01 2019-07-04 주식회사 오킨스전자 Round type PION pin with improved contact yield
KR101957717B1 (en) * 2017-08-01 2019-07-04 주식회사 오킨스전자 Trapezoidal type PION pin with improved contact yield, and test socket having the same
KR102013137B1 (en) * 2018-02-14 2019-08-22 주식회사 오킨스전자 Test socket pin having elastic piece improved contact characteristic
KR102003244B1 (en) * 2018-02-14 2019-07-24 주식회사 오킨스전자 Method of assembling semiconductor test socket pin using fractured protrusions for temporary fixing coil spring
KR102013138B1 (en) * 2018-02-14 2019-08-22 주식회사 오킨스전자 Test socket pin having elastic piece between a pair of legs
TWI690709B (en) * 2018-08-15 2020-04-11 萬潤科技股份有限公司 Probe module, probe device, and electronic component detection method and equipment using the probe device
JP7274853B2 (en) * 2018-12-03 2023-05-17 株式会社エンプラス contact pins and sockets
KR102126752B1 (en) * 2018-12-19 2020-06-25 주식회사 오킨스전자 device for test pin in which three plungers slide independently by a double coil spring, and the contact characteristics are improved through the rail
KR102126753B1 (en) * 2018-12-19 2020-06-25 주식회사 오킨스전자 device for test pin in which three plungers slide independently by a single coil spring, and the slide operation is controlled using the rail
TWI705248B (en) * 2019-02-15 2020-09-21 萬潤科技股份有限公司 Probe driving method and device
CN110557877B (en) * 2019-09-11 2021-03-12 北京航空航天大学 Langmuir probe, Langmuir probe detection system and Langmuir probe detection method
CN111579834B (en) * 2020-05-18 2023-03-31 武汉精毅通电子技术有限公司 Probe and connector suitable for high-current high-speed signal test
KR102202827B1 (en) * 2020-10-27 2021-01-14 (주) 네스텍코리아 Probe pin and coaxial probe assembly using the same
US11387587B1 (en) * 2021-03-13 2022-07-12 Plastronics Socket Partners, Ltd. Self-retained slider contact pin

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US6685492B2 (en) * 2001-12-27 2004-02-03 Rika Electronics International, Inc. Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition
KR100584225B1 (en) * 2004-10-06 2006-05-29 황동원 Contact for electronic device
US7008270B1 (en) * 2004-11-30 2006-03-07 Delphi Technologies, Inc. Cable connector
EP1889080A2 (en) * 2005-06-10 2008-02-20 Delaware Capital Formation, Inc. Electrical contact probe with compliant internal interconnect
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
JP4857046B2 (en) * 2006-08-02 2012-01-18 株式会社エンプラス Electrical contact and socket for electrical parts
JP4943775B2 (en) * 2006-08-25 2012-05-30 株式会社エンプラス Contact arrangement unit and socket for electrical parts
CN201029131Y (en) * 2007-03-02 2008-02-27 富士康(昆山)电脑接插件有限公司 Electric connector terminal
US7862391B2 (en) * 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
TWM350121U (en) * 2008-06-30 2009-02-01 Hon Hai Prec Ind Co Ltd Electrical contact
JP5166176B2 (en) * 2008-09-04 2013-03-21 スリーエム イノベイティブ プロパティズ カンパニー Socket for electronic devices
TWM366772U (en) * 2009-04-03 2009-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
TWM376001U (en) * 2009-08-05 2010-03-11 Hon Hai Prec Ind Co Ltd Electrical connector
US8808037B2 (en) * 2009-10-12 2014-08-19 Iwin Co., Ltd. Slidable pogo pin
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (en) * 2010-04-09 2012-08-15 山一電機株式会社 Probe pin and IC socket having the same
KR101154519B1 (en) * 2010-05-27 2012-06-13 하이콘 주식회사 Structure of spring contacts
JP5960383B2 (en) * 2010-06-01 2016-08-02 スリーエム イノベイティブ プロパティズ カンパニー Contact holder
TWM398701U (en) * 2010-07-16 2011-02-21 Hon Hai Prec Ind Co Ltd Electrical contact

Also Published As

Publication number Publication date
US20160072202A1 (en) 2016-03-10
US9595773B2 (en) 2017-03-14
EP3037827A4 (en) 2017-03-22
KR20150138289A (en) 2015-12-09
EP3037827B1 (en) 2020-02-05
EP3037827A1 (en) 2016-06-29
JP5985447B2 (en) 2016-09-06
WO2015025662A1 (en) 2015-02-26
TW201509013A (en) 2015-03-01
CN105190321A (en) 2015-12-23
CN105190321B (en) 2018-02-13
TWI569525B (en) 2017-02-01
JP2015040734A (en) 2015-03-02
KR101779686B1 (en) 2017-09-18

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