JP2018036129A - Probe pin - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a probe pin which can be miniaturized.SOLUTION: The probe pin comprises: a coil spring (20); a first plunger (30) which has a first body part (31) penetrating the coil spring (20) and having both ends exposed to the outside of the coil spring (20) in response to at least compression of the coil spring, a first contact part (32) provided in one end of the first body part (31), a first contact point part (33) provided in the other end of the first body part (31), and a holding stopper (34) holding the coil spring (20) stopped; and a second plunger (40) which has a second body part (41), a second contact part (42) provided in one end of the second body part (41) and brought into contact with the coil spring (20) to hold the coil spring (20) stopped and brought into contact with the first contact part (32) in response to compression of the coil spring (20), and a second contact point part (43) provided in the other end of the second body part (41).SELECTED DRAWING: Figure 2

Description

  The present invention relates to a probe pin.

  In an electronic component module such as a camera or a liquid crystal panel, a continuity test and an operation characteristic test are generally performed in the manufacturing process. In these inspections, probe pins are used to connect the inspection device with an electrode portion such as an FPC contact electrode or a mounted board-to-board connector for connection to a main board installed in an electronic component module. Is done.

  As such a probe pin, there exists a thing described in patent document 1, for example. The probe pin includes a coil spring, and a first plunger and a second plunger which are connected inside the coil spring and are slidable relative to each other.

Japanese Patent Laying-Open No. 2015-40734

  In recent years, along with miniaturization of electronic component modules, miniaturization of probe pins used for inspection is also required.

  When connecting two plungers inside a coil spring like the probe pin, it is necessary to use a coil spring in which the two plungers can be slidably disposed. However, with such a probe pin, it is difficult to make it smaller than a certain size due to the processing accuracy of the plunger and the processing limit of the coil spring, and it may be difficult to reduce the size.

  Accordingly, an object of the present invention is to provide a probe pin that can be reduced in size.

The probe pin of the present invention is
A coil spring that expands and contracts along the center line;
A first main body portion that penetrates the coil spring along the center line and at least both ends of the coil spring are exposed to the outside when the coil spring contracts; and one end portion of the first main body portion. The first contact portion, the first contact portion provided at the other end of the first main body portion, and the end of the coil spring closer to the first contact portion and coming out of the coil spring. A first plunger having a retaining portion for retaining and retaining;
A second body portion extending along the center line and disposed in series with the first body portion of the first plunger, and provided at one end of the second body portion and the first of the coil spring. A second contact portion that contacts the first contact portion of the first plunger when the coil spring contracts and contacts the end portion on the side close to the contact portion, and at least when the coil spring contracts; A second plunger having a second contact portion provided at the other end portion of the second main body portion and electrically connected to the first contact portion of the first plunger;
With
The first plunger and the second plunger are slidably disposed along the center line while the coil spring expands and contracts between the retainer holding portion and the second contact portion. Yes.

  According to the probe pin of the present invention, the first plunger penetrates the coil spring along the center line, and at least both ends of the first plunger are exposed to the outside of the coil spring when the coil spring contracts; And a second body having a first contact portion provided at one end of the first body portion, wherein the second plunger extends along the center line and is arranged in series with the first body portion of the first plunger. And the first end of the second main body and the end close to the first contact portion of the coil spring to contact and hold the coil spring, and at least when the coil spring contracts, And a second contact portion that contacts the first contact portion of one plunger. That is, since the first plunger and the second plunger are configured to be connected outside the coil spring, the coil spring is smaller than the probe pin in which the first plunger and the second plunger are connected inside the coil spring. The probe pin can be downsized.

The perspective view of the test | inspection unit which accommodated the probe pin of 1st Embodiment of this invention. The perspective view of the probe pin of 1st Embodiment of this invention. The disassembled perspective view of the probe pin of FIG. The enlarged view of the probe pin of FIG. Sectional drawing along the VV line of FIG. 1 which accommodated the probe pin of FIG. 2 of a reset state. Sectional drawing along the VV line of FIG. 1 which accommodated the probe pin of FIG. 2 of the operation state. Sectional drawing along the VII-VII line of FIG. 5 of the housing | casing of the test | inspection unit of FIG. Sectional drawing along the VIII-VIII line of FIG. 5 of the housing | casing of the test | inspection unit of FIG. Sectional drawing along the IX-IX line of FIG. 5 of the housing | casing of the test | inspection unit of FIG. FIG. 5 is a cross-sectional view taken along line VV in FIG. 1 showing another example of the probe pin in FIG. 2. The perspective view of the probe pin of 2nd Embodiment of this invention. The perspective view seen from the direction different from FIG. 11 of the probe pin of FIG.

  Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings. In the following description, terms indicating specific directions or positions (for example, terms including “up”, “down”, “right”, “left”) are used as necessary. Is for facilitating understanding of the invention with reference to the drawings, and the technical scope of the present invention is not limited by the meaning of these terms. Further, the following description is merely illustrative in nature and is not intended to limit the present invention, its application, or its use. Furthermore, the drawings are schematic, and the ratios of dimensions and the like do not necessarily match the actual ones.

(First embodiment)
For example, as shown in FIG. 1, the probe pin 10 according to the first embodiment of the present invention is used in a state of being accommodated in a housing 2 and constitutes an inspection unit 1 together with the housing 2. As an example, the inspection unit 1 accommodates three probe pins 10.

  As shown in FIG. 2, each probe pin 10 includes a coil spring 20, a first plunger 30, and a second plunger 40. Each of the 1st plunger 30 and the 2nd plunger 40 is formed, for example by the electroforming method, and has electroconductivity. Further, each of the first plunger 30 and the second plunger 40 is formed in an elongated thin plate shape, each plate surface is orthogonal, and is disposed so as to be relatively slidable along the center line CL of the coil spring 20. ing.

  As shown in FIG. 2, the coil spring 20 is configured to expand and contract along its center line CL.

  As shown in FIG. 3, the first plunger 30 is provided in an elongated plate-like first main body portion 31 and an upper end portion (the upper end portion in FIG. 3) of the first main body portion 31 and has a tapered shape. First contact portion 32, a first contact portion 33 having a tapered shape provided at a lower end portion (lower end portion in FIG. 3) of first body portion 31, and first contact portion 33 of first body portion 31. And a retainer holding portion 34 provided near the first contact portion 33 that is intermediate between the first contact portion 32 and the first contact portion 33.

  As shown in FIG. 2, the first main body portion 31 penetrates the coil spring 20 along the center line of the coil spring 20, and both end portions thereof are exposed to the outside of the coil spring 20. The upper end portion of the first main body 31 forms a first contact portion 32 by chamfering both corners in the width direction of the plate surface. Further, the lower end portion of the first main body portion 31 protrudes in a substantially triangular shape in the plan view and constitutes a first contact portion 33.

  As shown in FIG. 2, the retaining holder 34 protrudes in the lateral direction from both side surfaces extending in the longitudinal direction of the first main body 31. Each retaining member 34 comes into contact with the end portion 21 of the coil spring 20 on the side close to the first contact portion 33 and retains the coil spring 20. Further, the retaining holder 34 plays a role of stopping the first plunger 30 against the housing 10.

  The width W1 (shown in FIG. 3) of the retaining holder 34 of the first plunger 30 is configured to be equal to or smaller than the outer diameter of the coil spring 20 and larger than the inner diameter of the coil spring 20. Has been.

  As shown in FIG. 2, the second plunger 40 includes an elongated plate-like second main body portion 41, a second contact portion 42 provided at the lower end portion of the second main body portion 41, and the upper end of the second main body portion 41. And a second contact part 43 provided in the part.

  As shown in FIG. 2, the second main body portion 41 extends along the center line CL of the coil spring 20 and is disposed in series with the first main body portion 31 of the first plunger 30. The length of the second body portion 41 in the longitudinal direction is shorter than the first body portion 31 of the first plunger 30. A pair of leg portions 44 and 45 are provided at the lower end portion of the second main body portion 41 to constitute a second contact portion 42. In addition, the upper end portion of the second main body portion 41 protrudes in a substantially V shape in a plan view, and constitutes a second contact portion 43.

  As shown in FIG. 2, the second contact portion 42 includes a pair of leg portions 44 that extend downward from the lower end portion of the second main body portion 41 along the center line Cl of the coil spring 20 and can be bent in directions away from each other. 45. The pair of leg portions 44 and 45 are configured such that the distance L0 between their outer surfaces is larger than the width W2 of the second main body portion 41.

  The distance L0 between the outer surfaces of the pair of leg portions 44 and 45 is configured to be the same as or smaller than the outer diameter of the coil spring 20 and larger than the inner diameter of the coil spring 20.

  As shown in FIG. 3, a pair of projecting portions 441 and 451 projecting in directions approaching each other are provided on the opposing surfaces of the tip portions of the pair of leg portions 44 and 45. As shown in FIG. 4, the pair of projecting portions 441 and 451 are chamfered and curved in an arc shape, and the shortest distance L1 between the opposing surfaces in a state where no external force acts on the pair of leg portions 44 and 45 is the first. It is provided so as to be equal to the plate thickness W3 of the first plunger 30 or smaller than the plate thickness W3 of the first plunger 30. Thereby, the 1st contact part 32 of the 1st plunger 30 is clamped by the pair of protrusion parts 441 and 451 of a pair of leg parts 44 and 45 so that sliding is possible on both the front and back of a board surface.

  Further, as shown in FIG. 4, recesses 443 and 453 disposed adjacent to the protrusions 441 and 451 on the second main body 41 side are provided on the opposing surfaces of the tip portions of the pair of leg portions 44 and 45. It has been. By providing the recesses 443 and 453, the pair of projecting portions 441 and 451 at the distal ends of the pair of leg portions 44 and 45 are easily bent.

  It should be noted that the pair of leg portions 44 and 45 have distances L2 and L3 in the vicinity of the second body portion 41 side excluding a portion where the projecting portions 441 and 451 are provided, so that the first plunger 30 The distance between the opposing surfaces of the pair of projecting portions 441 and 451 in a state where the one contact portion 32 is sandwiched, that is, the plate thickness W3 of the first plunger 30 is configured to be larger. Thereby, when the 1st plunger 30 and the 2nd plunger 40 move relatively along the centerline CL of the coil spring 20, the 1st contact part 32 of the 1st plunger 30 is an opposing surface of a pair of leg parts 44 and 45. Thus, the relative movement between the first plunger 30 and the second plunger 40 is made smooth.

  As shown in FIG. 4, flat contact surfaces 442 and 452 are provided on the distal end surfaces of the respective distal end portions of the pair of leg portions 44 and 45. At least one of the contact surfaces 442 and 452 is in contact with the end 22 of the coil spring 20 on the side close to the first contact portion 32 of the first plunger 30, and the coil together with the retainer holding portion 34 of the first plunger 30. The spring 20 is in a position for retaining it.

  As shown in FIG. 2, the contact portion 32 is exposed from the other end portion 22 of the coil spring 20 with the lower end portion 21 in contact with the retaining holder 34 of the main body portion 31 of the first plunger 30. It has such a natural length. That is, even when the coil spring 20 is not contracted, the coil spring 20 is positioned between the contact retaining surfaces 442 and 452 of the pair of leg portions 44 and 45 of the first plunger 30 and the pair of leg portions 44 and 45 of the second plunger 40. Are combined.

  Further, when the coil spring 20 is accommodated in the housing 2 together with the first plunger 30 and the second plunger 40, both end portions 21 and 22 thereof are provided with a retaining holder 34 and a second plunger of the first plunger 30 described later. The spring length is adjusted so that it is retained by the second contact portion 42 of 40 and is always compressed. That is, the probe pin 10 is accommodated in the housing 2 with the first contact portion 32 of the first plunger 30 exposed to the outside of the coil spring 20.

  Next, the inspection unit 1 in which the three probe pins 10 are accommodated in the housing 2 will be described with reference to FIGS.

  5 shows a state where no force is applied to the first contact portion 33 and the second contact portion 43 of the probe pin 10 (returned state), and FIG. 6 shows the first contact portion 33 of the probe pin 10 and A state (operation state) in which force is applied to the second contact portion 43 is shown. Moreover, in FIGS. 7-9, only the housing 2 is shown and the probe pin 10 is abbreviate | omitted.

  As shown in FIG. 5, the housing 2 has three accommodating portions 3 that are arranged at intervals along the longitudinal direction of the housing 2. In each accommodating part 3, one probe pin 10 is accommodated, and the first contact part 33 and the second contact part 43 at both ends thereof can be exposed to the outside from each accommodating part 3. Each probe pin 10 is supported by the corresponding accommodating portion 3 so that the first plunger 30 and the second plunger 40 are relatively movable along the center line CL in a state where the coil spring 20 is always compressed. ing.

  The housing 2 includes a first housing 50, a second housing 60, and a third housing 70 that are stacked in three layers in the thickness direction. Each accommodating portion 3 is formed so as to penetrate the first housing 50, the second housing 60, and the third housing 70, but the hole shapes constituting each accommodating portion 3 are different as follows. .

  The first housing 50 has three first through holes 51 extending in the vertical direction of FIG. As shown in FIG. 7, each first through hole 51 has a vertical direction (in FIG. 5) rather than a horizontal direction in FIG. 7 (the horizontal direction in FIG. 5) when viewed along the center line CL of the coil spring 20. The first contact portion 33 side portion of the first main body portion 31 of the first plunger 30 is inserted so as to be movable in the vertical direction in FIG. 5.

  The second housing 60 has three second through holes 61 extending in the vertical direction of FIG. As shown in FIG. 8, each second through hole 61 has a substantially circular shape when viewed along the center line CL of the coil spring 20, and its lower end is connected to the first through hole 51. Yes. In addition, each second through hole 61 can expand and contract the coil spring 20 in a state where the first contact portion 32 side portion is located inside the retaining portion 34 of the first main body portion 31 of the first plunger 30. The pair of leg portions 44 and 45 of the second plunger 40 are accommodated so as to be movable in the vertical direction of FIG.

  The third housing 70 has three third through holes extending in the vertical direction in FIG. As shown in FIG. 9, each third through hole has a rectangular shape extending in the left-right direction in FIG. 9 (left-right direction in FIG. 5) when viewed along the center line CL of the coil spring 20. The narrow portion 71 and the wide portion 72 are divided into two stages in the vertical direction (vertical direction in FIG. 5). The narrow portion 71 is inserted so that the main body portion 41 of the second plunger 40 can move in the vertical direction of FIG. 5. The wide portion 72 is connected to the narrow portion 71 and the second through hole 61, and has a length in the longitudinal direction that is substantially the same as the diameter of the second through hole 61. A part of the pair of leg portions 44 and 45 is accommodated in the wide portion 72. A step portion is formed at the boundary between the narrow portion 71 and the wide portion 72.

  Thus, the 1st through-hole 51, the 2nd through-hole 61, and the 3rd through-holes 71 and 72 comprise one accommodating part 3. FIG. The accommodating portion 3 prevents the probe pin 10 from coming off by the first through hole 51 and the third through holes 71 and 72 while allowing the probe pin 10 to move in the direction of the center line CL of the coil spring 20. .

  Next, the operation of the probe pin 10 accommodated in the housing 2 will be described.

  In the inspection unit 1 in the return state shown in FIG. 5, each probe pin 10 has the first contact portion 32 of the first plunger 30 by the pair of leg portions 44 and 45 of the second plunger 40 in the corresponding accommodating portion 3. It is housed in a sandwiched state.

  At this time, in each probe pin 10, the retaining holder 34 of the first plunger 30 abuts on the first housing 50, and the pair of legs 44 and 45 of the second plunger 40 are the narrow portions 71 of the third housing 70. Is supported by the housing 2 in contact with the step portion at the boundary between the wide portion 72 and the wide portion 72. Further, the coil spring 20 is retained by the retaining surface 34 of the first plunger 30 and the contact surfaces 442 and 452 of the pair of leg portions 44 and 45 of the second plunger 40 and is always compressed. That is, the first plunger 30 is always urged downward in FIG. 5 by the coil spring 20, and the second plunger 40 is always urged upward in FIG.

  A force is applied to the first contact portion 33 and the second contact portion 43 of each probe pin 10 to push the first plunger 30 and the second plunger 40 into the housing 2. Then, the retaining holder 34 of the first plunger 30 presses the coil spring 20 upward in FIG. 5, and the contact surfaces 442 and 452 of the pair of legs 44 and 45 of the second plunger 40 push the coil spring 20 in FIG. 5. Press downwards. Thus, the coil spring 20 is further compressed along the inner wall of the second through hole 61 until the first contact portion 33 and the second contact portion 43 are generally accommodated in the housing 2 as shown in FIG. Is done.

  At this time, the pair of projecting portions 441 and 451 of the pair of leg portions 44 and 45 are in contact with the first contact portion 32 of the first plunger 30 on the plate surface of the first main body portion 31 of the first plunger 30. Slide.

  Moreover, in the test | inspection unit 1 of the operation state shown in FIG. 6, if the force applied to the 1st contact part 33 and the 2nd contact part 43 of each probe pin 10 is released, the 1st plunger 30 and the 2nd plunger 40 will be Due to the urging force of the coil spring 20, the return state shown in FIG.

  In the probe pin 10 of the first embodiment, the first plunger 30 penetrates the coil spring 20 along the center line CL of the coil spring 20 and both ends are outside the coil spring 20 when the coil spring 20 contracts. The first body portion 31 exposed to the first body portion 31 and the first contact portion 32 provided at one end of the first body portion 31, and the second plunger 40 extends along the center line CL of the coil spring 20. A second main body portion 41 arranged in series with the first main body portion 31 of the first plunger 30 and an end on the side close to the first contact portion 32 of the coil spring 20 provided at one end portion of the second main body portion 41. And a second contact portion 42 that contacts the first contact portion 32 of the first plunger 30 when the coil spring 20 contracts. That is, since the first plunger 30 and the second plunger 40 are configured to be connected to the outside of the coil spring 20, the first plunger 30 and the second plunger 40 are compared with the probe pin that is connected to the inside of the coil spring. Thus, the coil spring 20 can be reduced in size, and as a result, the probe pin 10 can be reduced in size.

  The second contact portion 42 of the second plunger 40 has a pair of leg portions 44 and 45 that extend along the center line CL and can be bent in a direction away from each other, and the first contact portion 32 of the first plunger 30. Is slidably held between the pair of leg portions 44 and 45. Thereby, the contact reliability between the 1st plunger 30 and the 2nd plunger 40 can be improved.

  A pair of projecting portions 441 and 451 projecting in a direction approaching each other and chamfered are provided on the opposing surfaces of the tip portions of the pair of leg portions 44 and 45. Thereby, the contact reliability between the 1st plunger 30 and the 2nd plunger 40 can further be improved.

  Further, the inspection unit 1 can accommodate the probe pin 10 and the probe pin 10 and supports the first plunger 30 and the second plunger 40 so as to be relatively movable along the center line CL of the coil spring 20. And a housing 2 having a portion 3. By reducing the size of the probe pin 10, the arrangement interval of the probe pins 10 can be narrowed, whereby the inspection unit 1 capable of arranging the probe pins 10 at a narrow pitch can be obtained.

  In addition, the 2nd contact part 42 of the 2nd plunger 40 is not restricted to comprising with a pair of leg parts 44 and 45. FIG. The second contact portion 42 contacts the first contact portion 32 of the first plunger 30 and also contacts the end portion 21 of the coil spring 20 on the side close to the first contact portion 32 to prevent the coil spring 20 from coming off. For example, only one of the pair of leg portions 44 and 45 may be used.

  Although a pair of protrusion parts 441 and 451 were provided in the opposing surface of each front-end | tip part of a pair of leg parts 44 and 45, it is not restricted to this. As long as the contact reliability between the first plunger 30 and the second plunger 40 can be ensured, the pair of protrusions 441 and 451 may be omitted.

  The pair of leg portions 44 and 45 are configured such that the facing distances L2 and L3 of the portion excluding the portion where the pair of projecting portions 441 and 451 are provided are larger than the plate thickness W3 of the first plunger 30. However, it is not limited to this. If the first plunger 30 and the second plunger 40 are relatively slidable along the center line CL of the coil spring 20, this configuration may be omitted.

  The housing 2 of the inspection unit 1 is not limited to being configured by the first housing 50, the second housing 60, and the third housing 70. The housing 2 may be composed of two housings or may be composed of four or more housings.

  Further, the shapes and structures of the first housing 50, the second housing 60, and the third housing 70 can be arbitrarily changed according to the design of the probe pin 10 or the inspection unit 1 or the like. For example, the first housing 50 is configured to have a first through hole 51 configured by a narrow portion capable of accommodating the first main body portion 31 of the first plunger 30 and a wide portion capable of accommodating the coil spring 20. May be. Further, the first housing 50 may be configured such that the first through hole 51 of the first housing 50 has a substantially circular shape when viewed along the center line CL of the coil spring 20.

  The first and second plungers 30 and 40 are not limited to electroforming, and any manufacturing method can be adopted if possible.

  The natural length of the coil spring 20 can be appropriately changed according to the design of the probe pin 10 and the inspection unit 1 or the like. That is, the probe pin 10 of the first embodiment is accommodated in the accommodating portion 3 of the housing 2 in a state where the contact portion 32 of the first plunger 30 is exposed to the outside of the coil spring 20, but is not limited thereto. For example, as shown in FIG. 10, the probe pin 10 may be accommodated in the accommodating portion 3 of the housing 2 in a state where the first contact portion 32 of the first plunger 30 is positioned inside the coil spring 20. In this case, when the coil spring 20 is contracted by applying a force to the first contact portion 33 and the second contact portion 43 of each probe pin 10, as shown by the dotted line in FIG. 10, the contact portion of the first plunger 30. 32 is exposed to the outside of the coil spring 20 and contacts the pair of leg portions 44 and 45 of the second contact portion 42 of the second plunger 40.

(Second Embodiment)
As shown in FIGS. 11 and 12, the probe pin 110 according to the second embodiment of the present invention includes an arm portion 80 extending from the first contact portion 32 along the second plunger 40 to the first plunger 30 and the arm. The probe of the first embodiment is provided in that the engagement claw 81 extending from the portion 80 toward the second plunger 40 is provided, and the second plunger 40 is provided with a slit 82 with which the engagement claw 81 can be engaged. It is different from the pin 10. In the second embodiment, the same parts as those in the first embodiment are denoted by the same reference numerals, description thereof is omitted, and differences from the first embodiment will be described.

  As shown in FIGS. 11 and 12, the arm portion 80 extends from one end in the width direction of the first contact portion 32 of the first plunger 30 along the plate surfaces of the pair of leg portions 44 and 45 of the second plunger 40. ing. When viewed along the center line CL of the coil spring 20, the arm portion 80 is provided so that the outer surface thereof is the same as the outer surface of the coil spring 20 or on the inner side of the outer surface of the coil spring 20. ing.

  As shown in FIGS. 11 and 12, the engaging claw portion 81 is provided at the upper end portion of the arm portion 80 and extends from the arm portion 80 toward the second plunger 40. A locking portion 83 extending toward the first plunger 30 along the second plunger 40 is provided on the lower surface (the lower surface in FIG. 11) of the distal end of the engagement claw portion 81.

  The slit 82 is formed by a pair of leg portions 44, 45 and a connecting portion 46 that is provided between the pair of leg portions 44, 45 and connects the pair of leg portions 44, 45. The slit 82 has a width with which the engagement claw portion 81 can be engaged and a length with which the first plunger 30 and the second plunger 40 can slide relative to each other along the center line CL of the coil spring 20. doing.

  As described above, in the probe pin 110 of the second embodiment, the first plunger 30 extends from the first contact portion 32 along the second plunger 40 to the second plunger 40. The second plunger 40 has a slit 82 with which the engagement claw 81 can be engaged. Thereby, when the probe pin 110 is assembled, it is possible to prevent the probe pin 110 from falling apart. For example, the probe pin 110 can be easily accommodated in the housing portion of the housing.

  As mentioned above, although various embodiment in this invention was described in detail with reference to drawings, finally the various aspect of this invention is demonstrated.

The probe pin of the first aspect of the present invention is
A coil spring that expands and contracts along the center line;
A first body part that penetrates the coil spring along the center line and whose both ends are exposed to the outside of the coil spring; a first contact part provided at one end of the first body part; A first contact portion provided at the other end portion of the one main body portion, a retaining portion for retaining the coil spring in contact with an end portion of the coil spring close to the first contact portion, and retaining the coil spring; A first plunger having
A second body portion extending along the center line and disposed in series with the first body portion of the first plunger; provided at one end of the second body portion; and the first plunger of the first plunger. A second contact portion that contacts one contact portion and an end portion of the coil spring that is close to the first contact portion and prevents the coil spring from coming off; and is provided at the other end portion of the second body portion; A second contact portion having a second contact portion electrically connected to the first contact of the first plunger;
With
The first plunger and the second plunger are slidably disposed along the center line while the coil spring expands and contracts between the retainer holding portion and the second contact portion. Yes.

  According to the probe pin of the first aspect, the first plunger penetrates the coil spring along the center line, and both end portions are exposed to the outside of the coil spring, and one end portion of the first body portion. A second main body portion disposed in series with the first main body portion of the first plunger, the second plunger extending along the center line, and the second main body portion of the second main body portion. And a second contact portion that is provided at one end portion and that contacts the first contact portion of the first plunger and the end portion of the coil spring close to the first contact portion, and holds the coil spring in place. That is, since the first plunger and the second plunger are configured to be connected outside the coil spring, the coil spring is smaller than the probe pin in which the first plunger and the second plunger are connected inside the coil spring. The probe pin can be downsized.

In the probe pin of the second aspect of the present invention,
The second contact portion of the second plunger has a pair of legs extending along the center line and capable of bending in directions away from each other;
The first contact portion of the first plunger is slidably held by the pair of leg portions.

  According to the probe pin of the second aspect, the contact reliability between the first plunger and the second plunger can be improved.

In the probe pin of the third aspect of the present invention,
A pair of projecting portions projecting in a direction approaching each other and chamfered are provided on the opposing surfaces of the tip portions of the pair of leg portions.

  According to the probe pin of the third aspect, the contact reliability between the first plunger and the second plunger can be further increased.

In the probe pin of the fourth aspect of the present invention,
The pair of leg portions are configured such that a distance between facing portions excluding a portion where the pair of projecting portions is provided is larger than a distance between facing portions of the pair of projecting portions.

  According to the probe pin of the fourth aspect, when the first plunger and the second plunger move relative to each other along the center line of the coil spring, the first contact portion of the first plunger contacts the opposing surfaces of the pair of leg portions. Thus, the relative movement between the first plunger and the second plunger can be performed smoothly.

In the probe pin of the fifth aspect of the present invention,
The first plunger has an arm portion extending along the second plunger from the first contact portion, and an engaging claw portion extending from the arm portion toward the second plunger,
The second plunger has a slit that can engage the engaging claw portion.

  According to the probe pin of the fifth aspect, it is possible to prevent the probe pins from falling apart when the probe pins are assembled. For example, the probe pins can be easily accommodated in the accommodating portion of the housing.

In the inspection unit according to the sixth aspect of the present invention,
A housing having a housing portion capable of housing the probe pin and supporting the first plunger and the second plunger so as to be relatively movable along the center line;
Is provided.

  According to the inspection unit of the sixth aspect, by reducing the size of the probe pin 10, the arrangement interval of the probe pins 10 can be reduced, thereby obtaining an inspection unit capable of arranging the probe pins at a narrow pitch. Can do.

In the inspection unit according to the seventh aspect of the present invention,
The probe pin is positioned in the accommodating portion in a state where the first contact portion of the first plunger is exposed to the outside of the coil spring.

In the inspection unit according to the eighth aspect of the present invention,
The probe pin is positioned in the accommodating portion in a state where the first contact portion of the first plunger is located inside the coil spring.

  According to the inspection unit of the seventh aspect and the eighth aspect, since the probe pin can be positioned in the housing portion in any manner, an inspection unit capable of arranging the probe pin at a narrow pitch can be easily obtained.

  In addition, it can be made to show the effect which each has by combining arbitrary embodiment or modification of the said various embodiment or modification suitably. In addition, combinations of the embodiments, combinations of the examples, or combinations of the embodiments and examples are possible, and combinations of features in different embodiments or examples are also possible.

  The probe pin of the present invention can be applied to, for example, an inspection unit used for inspecting a liquid crystal panel having a male connector as a terminal.

DESCRIPTION OF SYMBOLS 1 Test | inspection unit 2 Housing 3 Housing | casing part 10,110 Probe pin 20 Coil spring 30 1st plunger 31 1st main-body part 32 1st contact part 33 1st contact part 34 Retaining prevention part 40 2nd plunger 41 2nd main-body part 42 Second contact portion 43 Second contact portions 44, 45 Leg portions 441, 451 Protruding portions 442, 452 Contact surfaces 443, 453 Recess 50 First housing 51 First through hole 60 Second housing 61 Second through hole 70 Third housing 71 Narrow part 72 Wide part 80 Arm part 81 Engaging claw part 82 Slit 83 Locking part W1 Width of the first plunger retaining part W2 Width of the second main body part of the second plunger W3 Thickness of the first plunger L0 Distance between the outer surfaces of the pair of leg portions L1 Distance between the opposing surfaces of the pair of leg portions L2, L3 Of the portion excluding the portion where the protruding portions of the pair of leg portions are provided Direction between the distance

Claims (8)

A coil spring that expands and contracts along the center line;
A first main body portion that penetrates the coil spring along the center line and at least both ends of the coil spring are exposed to the outside when the coil spring contracts; and one end portion of the first main body portion. The first contact portion, the first contact portion provided at the other end of the first main body portion, and the end of the coil spring closer to the first contact portion and coming out of the coil spring. A first plunger having a retaining portion for retaining and retaining;
A second body portion extending along the center line and disposed in series with the first body portion of the first plunger, and provided at one end of the second body portion and the first of the coil spring. A second contact portion that contacts the first contact portion of the first plunger when the coil spring contracts and contacts the end portion on the side close to the contact portion, and at least when the coil spring contracts; A second plunger having a second contact portion provided at the other end portion of the second main body portion and electrically connected to the first contact portion of the first plunger;
With
The first plunger and the second plunger are slidably disposed along the center line while the coil spring expands and contracts between the retainer holding portion and the second contact portion. The probe pin. The second contact portion of the second plunger has a pair of legs extending along the center line and capable of bending in directions away from each other;
The probe pin according to claim 1, wherein the first contact portion of the first plunger is slidably sandwiched between the pair of leg portions.   3. The probe pin according to claim 2, wherein a pair of projecting portions projecting in a direction approaching each other and chamfered are provided on opposing surfaces of the tip portions of the pair of leg portions.   The pair of leg portions are configured such that a distance between facing portions excluding a portion where the pair of projecting portions is provided is larger than a distance between facing portions of the pair of projecting portions. Probe pins as described in 1. The first plunger has an arm portion extending along the second plunger from the first contact portion, and an engaging claw portion extending from the arm portion toward the second plunger,
The probe pin according to any one of claims 1 to 4, wherein the second plunger has a slit capable of engaging the engaging claw portion. A probe pin according to any one of claims 1 to 5;
A housing having a housing portion capable of housing the probe pin and supporting the first plunger and the second plunger so as to be relatively movable along the center line;
Inspection unit equipped with.   The inspection unit according to claim 6, wherein the probe pin is positioned in the housing portion in a state where the first contact portion of the first plunger is exposed to the outside of the coil spring.   The inspection unit according to claim 6, wherein the probe pin is positioned in the housing portion in a state where the first contact portion of the first plunger is located inside the coil spring.

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