JP2019207245A - Probe pin - Google Patents

Abstract

To provide a probe pin that can be stably connected to a convex contact point.SOLUTION: A probe pin (10) comprises: an elastic part (20); a first contact part (30) including a pair of leg parts (32, 33) that extend from one end of the elastic part (20) along the longitudinal direction and can be bent in a direction separating from each other, and including a pair of contact point parts (321, 331) that are arranged on the tips of the pair of leg parts (32, 33), urged in a direction along the longitudinal direction by the elastic part (20) via the pair of leg parts (32, 33), and can be in contact with a convex contact point of an inspection object; and a second contact part (40) that is arranged on the other end of the elastic part (20) and electrically connected to the first contact part (30). The pair of leg parts (32, 33) include a gap (34) into which the convex contact point of the inspection object can be inserted, and when the convex contact point is inserted into the gap (34), the pair of contact point parts (321, 331) and the convex contact point can be in contact with each other.SELECTED DRAWING: Figure 4

Description

  The present invention relates to a probe pin.

  In an electronic component module such as a camera or a liquid crystal panel, a continuity test and an operation characteristic test are generally performed in the manufacturing process. In these inspections, probe pins are used to connect FPC contact electrodes for connection to a main body board installed in an electronic component module, or an electrode unit such as a mounted board-to-board connector and an inspection device. Is done.

  As such a probe pin, there exists a thing described in patent document 1, for example. The probe pin is composed of an elastic part that expands and contracts in the longitudinal direction and one contact part provided at each end of the elastic part in the longitudinal direction.

JP 2008-516398 A

  However, since the probe pin is in contact with the inspection object and the inspection device at one contact portion, for example, when the terminal of the inspection object is a convex contact such as a male connector of the board-to-board connector, In some cases, the contact portion of the pin and the convex contact of the inspection object cannot be stably connected, and contact reliability cannot be ensured.

  Then, this invention makes it a subject to provide the probe pin which can be connected to a convex contact stably.

The probe pin of the present invention is
An elastic part that expands and contracts along the longitudinal direction;
A pair of leg portions extending along the longitudinal direction from one end of the elastic portion and capable of bending in a direction away from each other, disposed at the tips of the pair of leg portions and via the pair of leg portions; A first contact portion having a pair of contact portions that are urged by the elastic portion in a direction along the longitudinal direction and that can contact a convex contact of an inspection object;
A second contact portion disposed at the other end of the elastic portion and biased in a direction opposite to a biasing direction of the first contact portion by the elastic portion and electrically connected to the first contact portion;
With
Between the pair of legs, there is a gap into which the convex contact of the inspection object can be inserted,
When the convex contact is inserted into the gap, the pair of contact portions of the pair of leg portions of the first contact portion can contact the convex contact.

  According to the probe pin of the present invention, the pair of contact portions at the tips of the pair of deflectable legs can be stably connected to the convex contact.

The perspective view for demonstrating the use condition of the probe pin of 1st Embodiment of this invention. Sectional drawing along the II-II line of FIG. The perspective view of the probe pin of 1st Embodiment of this invention. The top view of the probe pin of FIG. Sectional drawing which shows the state before contacting the convex contact of the male connector of the probe pin of FIG. Sectional drawing which shows the state which contacted the convex contact of the male connector of the probe pin of FIG. The perspective view which shows the other example of the probe pin of FIG. The top view of the probe pin of 2nd Embodiment of this invention. Sectional drawing which shows the state which contacted the convex contact of the male connector of the probe pin of FIG. The top view which shows the other example of the probe pin of FIG. The front view of the probe pin of 3rd Embodiment of this invention. Sectional drawing which shows the state which contacted the convex contact of the male connector of the probe pin of FIG. The front view of the probe pin of 4th Embodiment of this invention. Sectional drawing which shows the state which contacted the convex contact of the male connector of the probe pin of FIG.

  Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings. In the following description, terms indicating specific directions or positions (for example, terms including “up”, “down”, “right”, “left”) are used as necessary. Is for facilitating understanding of the invention with reference to the drawings, and the technical scope of the present invention is not limited by the meaning of these terms. Further, the following description is merely illustrative in nature and is not intended to limit the present invention, its application, or its use. Furthermore, the drawings are schematic, and the ratios of dimensions and the like do not necessarily match the actual ones.

(First embodiment)
The probe pin 10 according to the first embodiment of the present invention is used in a state of being accommodated in a socket 1 attached to a substrate 90 of an inspection apparatus, for example, as shown in FIG. ing. In the socket 1, as shown in FIG. 2, a plurality of pairs of storage portions 2 are provided symmetrically with respect to the center line CL 0, and probe pins 10 are stored in the storage portions 2.

  Each storage portion 2 includes a groove portion 3 in which the probe pin 10 can be stored, and a through-hole 4 provided in the bottom surface of the groove portion 3. As shown in FIG. 1, the storage portion 2 extends along the center line CL 0 of the socket 1. Are arranged at regular intervals.

  As shown in FIG. 3, the probe pin 10 includes an elastic portion 20 and first and second contact portions 30 and 40 provided at both ends of the elastic portion 20 in the longitudinal direction. The probe pin 10 is a thin plate and has conductivity, and is integrally formed by, for example, an electroforming method.

  In the following description, the width direction of the plate surface of the probe pin 10 is the X direction, the plate thickness direction of the probe pin 10 orthogonal to the X direction is the Y direction, and the longitudinal direction of the elastic portion 20 orthogonal to the XY direction is the Z direction. And

  As shown in FIG. 4, the elastic portion 20 has a meandering shape in which straight portions 21 and curved portions 22 are alternately continued along the Z direction, and extends and contracts along the Z direction.

  The straight line portion 21 is parallel to the X direction in the no-load state shown in FIG. The bending portion 22 includes a first bending portion 221 located on the right side in the X direction and a second bending portion 222 located on the left side in the X direction, and the first bending portion 221 adjacent to the longitudinal direction of the elastic portion 20. A straight line L1 that is a tangent line connecting the vertices of the elastic part 20 and a straight line L2 that is a tangent line connecting the vertices of the second bending part 222 adjacent to each other in the longitudinal direction of the elastic part 20 are parallel to the X direction.

  Further, a through hole 23 that penetrates in the plate thickness direction (Y direction) and extends along a meandering shape is formed in the intermediate portion in the width direction of each linear portion 21 of the elastic portion 20 and the intermediate portion in the width direction of each curved portion 22. Is provided. Thereby, the spring property of the elastic part 20 is improved.

  As shown in FIG. 4, the first contact portion 30 includes a support portion 31 connected to the lower end in the Z direction of the elastic portion 20 and a pair of legs that extend downward from the support portion 31 in the Z direction and can be bent. Parts 32 and 33 and a pair of contact parts 321 and 331 disposed at the tips of the pair of leg parts 32 and 33 so as to be in contact with the convex contact of the inspection object. The pair of contact portions 321 and 331 can be biased downward in the Z direction by the elastic portion 20 via the pair of leg portions 32 and 33.

  The support portion 31 has a substantially rectangular shape in a plan view along the Y direction. When the probe pin 10 is stored in the storage portion 2 of the socket 1, the support portion 31 comes into contact with the groove portion 3 of the storage portion 2 and the probe pin 10. Support. The support portion 31 is a tangent line connecting the straight line L1 that is a tangent line connecting the second curved portions 222 adjacent in the longitudinal direction of the elastic portion 20 and the first curved portion 221 adjacent in the longitudinal direction of the elastic portion 20. The width W2 is substantially the same as the width W1 which is the shortest distance between the straight line L2.

  The lower end of the elastic part 20 in the Z direction is connected to the left side of the support part 31 in the X direction and the upper side in the Z direction. A pair of leg portions 32 and 33 are connected to the left side of the support portion 31 in the X direction and the lower side in the Z direction. That is, the center line CL1 in the X direction extending in the Z direction of the elastic part 20 and the center line CL2 in the X direction extending in the Z direction of the pair of leg portions 32 and 33 do not coincide with each other and are shifted from each other. In other words, the elastic portion 20 and the pair of leg portions 32 and 33 are connected via one end portion in the X direction of the support portion 31 that is out of the X-direction center line CL1 extending in the Z direction of the elastic portion 20. .

  Each of the pair of leg portions 32 and 33 extends along the Z direction and is provided symmetrically with respect to the center line CL2 in the X direction. A gap 34 is provided between the pair of leg portions 32 and 33 so as to be deformable in a direction approaching each other and into which the convex contact of the inspection object can be inserted.

  Further, each of the pair of leg portions 32 and 33 can be bent in a direction away from the center line CL2 in the X direction of the pair of leg portions 32 and 33 (that is, in a direction away from each other). That is, the leg portion 32 on the left side in the X direction can be bent toward the left side in the X direction, and the leg portion 33 on the right side in the X direction can be bent toward the right side in the X direction. In other words, when the convex contact of the object to be inspected is inserted into the gap 34 between the pair of leg portions 32 and 33, the pair of contact portions 321 and 331 at the tips of the pair of leg portions 32 and 33 are convex. It is slidable in the direction away from each other while contacting on the contact.

  Each of the pair of contact portions 321 and 331 at the distal ends (lower ends in the Z direction) of the pair of leg portions 32 and 33 is provided with a curved surface 35 that can contact the convex contact. Further, each of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 that face each other is connected to the curved surface 35, and in the urging direction of the elastic portion 20, that is, below the Z direction. An inclined surface 36 having a flat surface or a curved concave surface that is separated from each other as it goes is provided.

  The second contact portion 40 includes a base portion 41 connected to the upper end in the Z direction of the elastic portion 20, and a pair of protrusion portions 42 protruding upward from the base portion 41 in the Z direction. Electrically connected. The second contact portion 40 is urged toward the upper side in the Z direction by the elastic portion 20, that is, in a direction opposite to the urging direction of the first contact portion 30.

  The base 41 has a substantially rectangular shape in plan view along the Y direction. The upper end of the elastic portion 20 in the Z direction is connected to the left side of the base portion 41 in the X direction and the lower side in the Z direction.

  The pair of projecting portions 42 are provided symmetrically with respect to the center line CL1 of the elastic portion 20 in the X direction. Each of the pair of protrusions 42 is curved so that the tip (upper end in the Z direction) protrudes upward in the Z direction, and is provided on the substrate 90 of the inspection apparatus while being housed in the socket 1. The terminal 91 (shown in FIG. 2) is brought into contact.

  Each of the pair of projecting portions 42 is provided with a through hole 43 penetrating in the thickness direction (Y direction). Thereby, each protrusion 42 is elastically deformed when it contacts the terminal 91 of the substrate 90 and presses the terminal 91 by its elastic force, so that the contact reliability between the probe pin 10 and the inspection apparatus is improved. be able to.

  In addition, when the probe pin 10 is accommodated in the socket 1 by providing a pair of protrusions 42 at both ends of the base 41, as shown in FIG. 2, the protrusions 42 of the probe pins 10 adjacent in the Y direction The pitch P1 between them can be reduced. Further, by making the protrusions 42 as a pair, stable contact with the substrate 90 of the inspection apparatus is possible.

  Next, referring to FIGS. 5 and 6, when the two probe pins 10 are stored in the pair of storage portions 2 of the socket 1, they are brought into contact with two adjacent convex contacts 81 of the inspection object 80. Will be described.

  As shown in FIG. 5, when each probe pin 10 is brought closer to the inspection object 80 in a state where the convex contact 81 is positioned between the pair of legs 32 and 33 of each probe pin 10, A portion of the curved surface 35 of each of the pair of contact portions 321 and 331 of the leg portions 32 and 33 that is close to the center line CL2 contacts the convex contact 81.

  When the probe pins 10 are further brought closer to the inspection object 80 and the convex contacts 81 of the inspection object 80 are inserted into the gaps 34, as shown in FIG. The pair of contact portions 321 and 331 are bent in a direction away from the center line CL2 by the inserted inspection object 80, that is, in a direction away from each other. At this time, the convex contact 81 is a curved surface of the pair of contact portions 321 and 331 in a state where the convex contact 81 is in contact with the opposing surfaces (hereinafter referred to as contact surfaces) of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33. It moves while sliding from 35 toward the inclined surface 36.

  On the other hand, when each probe pin 10 is separated from the inspection object 80 and the convex contact 81 of the inspection object 80 is removed from the gap 34, the pair of contact parts 321 and 331 of the pair of leg parts 32 and 33 are It returns to the direction approaching the center line CL2, that is, the direction approaching each other. At this time, each convex contact 81 moves while sliding from the inclined surface 36 toward the curved surface 35 while being in contact with the contact surfaces of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33.

  Thus, in the probe pin 10 of the first embodiment, when the inspection object 80 is inserted into and removed from the probe pin 10, the convex contact 81 is a pair of contacts 321 and 331 of the pair of legs 32 and 33. It moves while sliding in contact with the surface, that is, wiping. For this reason, even if it is a case where the foreign material has adhered on the pair contact surface of the pair contact part 321,331 of a pair of leg part 32,33, or the surface of the convex contact 81, a pair of leg which can bend Since the foreign matter is scraped off by wiping between the pair of contact portions 321 and 331 of the portions 32 and 33 and the convex contact 81, a conduction failure due to the foreign matter can be avoided and contact reliability can be ensured.

  In addition, since there is a gap 84 between the pair of leg portions 32, 33 that can be deformed in a direction away from each other and into which the convex contact 81 of the inspection object 80 can be inserted, the tip of the pair of leg portions 32, 33 The pair of contact portions 321 and 331 can be stably connected to the convex contact 81, and the contact reliability between the probe pin 10 and the inspection object 80 can be ensured.

  Further, each of the pair of leg portions 32 and 33 intersects the Z direction (longitudinal direction) and is away from the center line CL2 extending in the Z direction of the pair of leg portions 32 and 33, that is, a direction approaching each other. Can be bent. Thereby, the distance which the convex contact 81 moves in the state which contacted a pair of leg parts 32 and 33 can be lengthened, and the wiping effect can be heightened.

  Further, the center line CL1 extending in the Z direction (longitudinal direction) of the elastic portion 20 and the center line CL2 extending in the Z direction of the pair of leg portions 32 and 33 do not coincide with each other and are shifted from each other. Therefore, when the two probe pins 10 are housed in the pair of housing portions 2 of the socket 1, the pair of leg portions 32 and 33 are arranged so that the center line CL2 coincides with the center line CL1 of the elastic portion 20. In the state in which the pair of legs 32 and 33 are arranged at the end portions of the support portions 31 of the two probe pins 10 that are close to each other, the pitch between the two convex contacts 81 adjacent to the inspection object 80 is narrowed. The narrow pitch can be dealt with.

  The pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 have inclined surfaces 36 that are separated from each other toward the urging direction of the elastic portion 20 on each of the surfaces facing each other. , 33 has a curved surface 35 at a pair of contact portions 321, 331 at the tip thereof. Thereby, the convex contact 81 of the test object 80 can be smoothly guided to the gap 34 between the pair of leg portions 32 and 33.

  Each of the pair of leg portions 32 and 33 is adjusted when the convex contact 81 of the inspection object 80 is inserted into the gap 34 by adjusting the distance W3 from the support portion 31 to the apex of the curved surface 35. The leg portions 32 and 33 can adjust the amount of deflection. For example, the ratio of the distance W3 to the width W2 of the support portion 31 is set to 1 or more to increase the length of the pair of leg portions 32 and 33, so that the deflection dimension can be increased. A sufficient wiping distance capable of scraping off foreign matter on the contact surfaces of the pair of legs 32 and 33 can be ensured.

  The probe pin 10 has a gap 34 in which the convex contact 81 of the inspection object 80 can be inserted between the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 that can be bent in directions away from each other. When the convex contact 81 is inserted into the gap 34, if the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 and the convex contact 81 can contact with each other, the stable contact can be maintained. it can.

  For example, the pair of leg portions 32 and 33 is not limited to a configuration in which both of the legs 32 and 33 can be bent, and it is sufficient that at least one of them can be bent.

  Further, the curved surface 35 and the inclined surface 36 of the pair of leg portions 32 and 33 may be omitted, or may be provided on either one of the pair of leg portions 32 and 33. Further, only the curved surface 35 may be provided, or only the inclined surface 36 may be provided. However, in order to ensure more stable contact with the convex contact 81, it is better to arrange the curved surface 35 or the inclined surface 36.

  When it is not necessary to deal with the narrow pitch, the probe is so arranged that the center line CL1 extending in the Z direction of the elastic portion 20 and the center line CL2 extending in the Z direction of the pair of leg portions 32 and 33 coincide with each other. The pin 10 may be configured.

  The probe pin 10 is not limited to the case where the elastic portion 20 and the first and second contact portions 30 and 40 are integrally formed. For example, as shown in FIG. 7, the first and second contact portions 130 and 140 may be configured separately.

  In this case, each of the first and second contact portions 130 and 140 is connected so that a part thereof is located inside the coil spring 120 as an elastic body and the plate surfaces are orthogonal to each other. In FIG. 7, the direction along the plate surface of the first contact portion 130 is the Y direction, the direction along the plate surface of the second contact portion 140 is the X direction, and the direction orthogonal to the X direction and the Y direction is Z. The direction.

  The first contact portion 130 has an insertion portion 37 that extends from the support portion 31 in the Z direction and is disposed inside the coil spring 120. The insertion portion 37 is provided with a through hole 38 that penetrates in the plate thickness direction (X direction) and extends along the Z direction.

  The second contact portion 140 has a pair of elastic pieces 44 and 45 that extend downward from the base portion 41 in the Z direction and are disposed inside the coil spring 120. A gap larger than the plate thickness of the first contact portion 130 is provided between the pair of elastic pieces 44 and 45. A protrusion 46 that can be fitted into the through hole 38 of the first contact portion 130 is provided at the tip of one elastic piece 44. The first and second contact portions 130 and 140 are connected by fitting the protrusion 46 into the through hole 38. Further, at the tip of the other elastic piece 45, the first and second contact portions 130 and 140 are connected to the surface between the through hole 38 of the insertion portion 37 and the support portion 31 when the first and second contact portions 130 and 140 are connected. Protrusions 47 that come into contact are provided.

  In the state where the first and second contact portions 130 and 140 are connected, both ends of the coil spring 120 are supported by the support portion 31 of the first contact portion 130 and the base portion 41 of the second contact portion, and are constantly compressed. It has come to be.

(Second Embodiment)
As shown in FIG. 8, the probe pin 110 of the second embodiment is different from that of the first embodiment in that a stopper 50 is provided on each of the opposing surfaces (contact surfaces) of the pair of legs 32 and 33. It is different from the probe pin 10.

  In the second embodiment, the same parts as those in the first embodiment are denoted by the same reference numerals, and the description thereof will be omitted. Differences from the first embodiment will be described.

  Each stopper 50 protrudes in a direction approaching each other (X direction) so as to close the gap 34 from the contact surface of the legs 32 and 33. By providing each stopper 50 in this way, the insertion amount of the convex contact 81 can be regulated as shown in FIG. Thereby, excessive insertion of the convex contact 81 can be prevented, and problems caused by excessive insertion of the convex contact 81 such as breakage of the probe pin 110 can be avoided.

  A protrusion 51 is provided at the lower end of the stopper 50 in the Z direction. As shown in FIG. 9, the protrusion 51 can come into contact with the convex contact 81 when the convex contact 81 is inserted into the gap 34. Thereby, in addition to the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33, the projection 51 of each stopper 50 also comes into contact with the convex contact 81, so that the probe pin 10 and the inspection object 80 are not connected. High contact reliability can be achieved.

  The stopper 50 may be provided on only one of the pair of leg portions 32 and 33 as shown in FIG. In this case, by adjusting the size of the stopper 50, the position where the protrusion 51 and the convex contact 81 come into contact can be adjusted, and the insertion amount of the convex contact 81 can be regulated.

(Third embodiment)
As shown in FIG. 11, the probe pin 210 according to the third embodiment is different from the probe pin 10 according to the first embodiment in that a stopper 60 for connecting the pair of legs 32 and 33 is provided. .

  In the third embodiment, as in the second embodiment, the same parts as those in the first embodiment are denoted by the same reference numerals, and the description thereof is omitted. Differences from the first embodiment will be described.

  The stopper 60 is provided above the inclined surface 36 of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 in the Z direction, and the lower surface in the Z direction is continuous with the inclined surface 36. By providing the stopper 60 in this way, the insertion amount of the convex contact 81 can be regulated as shown in FIG.

  A pair of protrusions 61 are provided on the lower surface of the stopper 60 in the Z direction. As shown in FIG. 12, the protrusion 61 is configured such that when the convex contact 81 is inserted into the gap 34, the pair of protrusions 61 can contact the convex contact 81 in addition to the pair of contact parts 321 and 331. It has become. Thereby, higher contact reliability between the probe pin 210 and the inspection object 80 can be realized.

  In the probe pin 210 of the third embodiment, since the stopper 60 is provided in the vicinity of the distal ends of the pair of legs 32 and 33, the pair of legs 32 and 32 necessary for securing a sufficient wiping distance is provided. The amount of bending of 33 is smaller than that of the probe pin 10 of the first embodiment. For this reason, the magnitude | size of the clearance gap 34 is adjusted and the length of a pair of leg parts 32 and 33 is shortened compared with the probe pin 10 of 1st Embodiment. Thereby, the strength of the first contact portion 30 is increased.

(Fourth embodiment)
As shown in FIG. 13, in the probe pin 310 of the fourth embodiment, the first contact portion 30 has a pair of legs 132 and 133 having different lengths and a connecting portion that connects the pair of legs 132 and 133. 70 and the probe pin 10 of the first embodiment is different in that a pair of contacts are disposed asymmetrically with respect to the center line of the pair of legs 132 and 133.

  In the fourth embodiment, like the second and third embodiments, the same parts as those in the first embodiment are denoted by the same reference numerals, and the description thereof is omitted. Differences from the first embodiment will be described.

  In the pair of legs 132 and 133, the first leg 132 on the left in the X direction has a shorter distance from the support part 31 to the apex of the curved surface 35 than the second leg 133 on the right in the X direction. . In addition, the contact portion 321 of the first leg portion 132 is not provided with the inclined surface 36.

  The connecting portion 70 has a lower surface in the Z direction that is continuous with the inclined surface 36 of the contact portion 331 of the second leg portion 133 and is located above the curved surface 35 of the contact portion 331 of the first leg portion 132 in the Z direction. The second leg portion 133 is provided so as to be continuous with the surface facing the second leg portion 133.

  In the probe pin 310 of the fourth embodiment, when the convex contact 81 is inserted into the gap 34, the portion close to the center line CL2 of the curved surface 35 of the contact portion 331 of the second leg 133 and the convex contact 81 are formed. Contact. Further, when the convex contact 81 is inserted into the gap 34, the convex contact 81 slides from the curved surface 35 toward the inclined surface 36 in a state of being in contact with the second leg 133 contact portion 331, as shown in FIG. In this way, the first leg 133 moves until it comes into contact with a portion near the center line CL2 of the curved surface 35 of the contact portion 321.

  For this reason, in the probe pin 310 of the fourth embodiment, only the second leg 133 is bent, and the curved surface 35 of the first leg 132 restricts the insertion amount of the convex contact 81. Doubles as

  Thus, by providing the pair of leg portions 132 and 133 asymmetrically with respect to the center line CL2 extending in the Z direction, for example, one of the side portions of the convex contact 81 of the inspection object 80 is covered with the resin 82 or the like. Even if it is a case, both of a pair of leg parts 132 and 133 can be made to contact the convex contact 81. FIG. Thereby, high contact reliability between the probe pin 210 and the inspection object 80 can be realized.

  Of course, the components described in the first to fourth embodiments may be combined as appropriate, and may be selected, replaced, or deleted as appropriate.

The probe pin of the present invention is
An elastic part that expands and contracts along the longitudinal direction;
A pair of leg portions extending along the longitudinal direction from one end of the elastic portion and capable of bending in a direction away from each other, disposed at the tips of the pair of leg portions and via the pair of leg portions; A first contact portion having a pair of contact portions that are urged by the elastic portion in a direction along the longitudinal direction and that can contact a convex contact of an inspection object;
A second contact portion disposed at the other end of the elastic portion and biased in a direction opposite to a biasing direction of the first contact portion by the elastic portion and electrically connected to the first contact portion;
With
Between the pair of legs, there is a gap into which the convex contact of the inspection object can be inserted,
When the convex contact is inserted into the gap, the pair of contact portions of the pair of leg portions of the first contact portion can contact the convex contact.

  According to the probe pin of the present invention, it is possible to stably connect to the convex contact by the pair of contact portions coming into contact with the convex contact while the pair of leg portions flex freely in the direction away from the convex contact. Moreover, since the convex contact moves while sliding in a state of being in contact with the pair of contact portions of the pair of leg portions at the time of inserting the convex contact, due to the wiping effect, the foreign matter attached to the surface contacting the convex contact of the pair of leg portions Conduction failure can be avoided.

In one embodiment of the probe pin,
A stopper for restricting the insertion of the convex contact is provided on at least one of the surfaces of the pair of legs facing each other.

  According to the probe pin of the said embodiment, the excessive insertion of a convex contact can be prevented with a stopper.

In one embodiment of the probe pin,
At least one leg of the pair of legs can be bent in a direction away from the other leg of the pair of legs.

  According to the probe pin of the said embodiment, the distance which moves in the state which a convex contact contacted a pair of leg part can be lengthened, and a wiping effect can be heightened.

In one embodiment of the probe pin,
The center line along the longitudinal direction of the pair of leg portions is shifted from the center line along the longitudinal direction of the elastic portion.

  According to the probe pin of the embodiment, the center line along the longitudinal direction is different from the state in which the pair of legs are arranged so that the center line along the longitudinal direction coincides with the center line along the longitudinal direction of the elastic portion. In a state where the pair of leg portions are arranged so as not to coincide with the center line along the longitudinal direction of the elastic portion and to be shifted from each other, it is possible to correspond to a narrow pitch in which the pitch between two adjacent convex contact points of the inspection object is narrowed. it can.

In one embodiment of the probe pin,
Each of the surfaces of the pair of contact portions of the pair of leg portions of the first contact portion facing each other has inclined surfaces that are separated from each other toward the urging direction of the elastic portion.

  According to the probe pin of the said embodiment, a convex contact can be smoothly guided to the clearance gap between a pair of leg parts.

In one embodiment of the probe pin,
Each of the pair of contact portions of the pair of leg portions of the first contact portion has a curved surface.

  According to the probe pin of the said embodiment, a convex contact can be smoothly guided to the clearance gap between a pair of leg parts.

  The probe pin of the present invention can be applied to, for example, an inspection unit used for inspecting a liquid crystal panel having a male connector as a terminal.

DESCRIPTION OF SYMBOLS 1 Socket 2 Storage part 3 Groove part 4 Through-hole 10,110,210,310 Probe pin 20 Elastic part 120 Coil spring 21 Straight line part 22 Curved part 23 Through-hole 221 1st curved part 222 2nd curved part 30,130 1st contact Part 31 Support part 32, 33, 132, 133 Leg part 321, 331 Contact part 34 Gap 35 Curved surface 36 Inclined surface 37 Insertion part 38 Through hole 40,140 Second contact part 41 Base part 42 Protrusion part 43 Through hole 44,45 Elastic piece 46, 47 Protrusion 50, 60 Stopper 51, 61 Protrusion part 70 Connection part 80 Inspection object 81 Convex contact 90 Substrate 91 Terminal CL0 Center line (socket)
CL1 center line (elastic part)
CL2 center line (a pair of legs)
L1 (connecting the apex of the first bending portion) straight line L2 (connecting the apex of the second bending portion) straight line W1 elastic portion width W2 support portion width W3 distance P1 from the support portion to the apex of the curved surface (adjacent probe pin Pitch P2) (between adjacent projection pins)

Claims (6)

An elastic part that expands and contracts along the longitudinal direction;
A pair of leg portions extending along the longitudinal direction from one end of the elastic portion and capable of bending in a direction away from each other, disposed at the tips of the pair of leg portions and via the pair of leg portions; A first contact portion having a pair of contact portions that are urged by the elastic portion in a direction along the longitudinal direction and that can contact a convex contact of an inspection object;
A second contact portion disposed at the other end of the elastic portion and biased in a direction opposite to a biasing direction of the first contact portion by the elastic portion and electrically connected to the first contact portion;
With
Between the pair of legs, there is a gap into which the convex contact of the inspection object can be inserted,
The probe pin, wherein the pair of contact portions of the pair of leg portions of the first contact portion and the convex contact can be contacted when the convex contact is inserted into the gap.   The probe pin according to claim 1, further comprising a stopper that restricts insertion of the convex contact on at least one of the surfaces of the pair of legs facing each other.   The probe pin according to claim 1 or 2, wherein at least one leg of the pair of legs can be bent in a direction away from the other leg of the pair of legs.   The probe pin according to any one of claims 1 to 3, wherein a center line along the longitudinal direction of the pair of legs is shifted from a center line along the longitudinal direction of the elastic portion.   From each of the mutually facing surfaces of the pair of contact portions of the pair of leg portions of the first contact portion, there are inclined surfaces that are separated from each other toward the urging direction of the elastic portion. 5. The probe pin according to any one of 4.   The probe pin according to any one of claims 1 to 5, wherein each of the pair of contact portions of the pair of leg portions of the first contact portion has a curved surface.

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