JP6628002B2 - Probe pin - Google Patents

Description

  The present invention relates to a probe pin.

  2. Description of the Related Art Generally, in a manufacturing process of an electronic component module such as a camera or a liquid crystal panel, a continuity test and an operation characteristic test are performed. In these inspections, probe pins are used to connect FPC contact electrodes for connection to a main board installed in an electronic component module or an electrode unit such as a mounted board-to-board connector and an inspection device. It is done by doing.

  As such a probe pin, for example, there is one described in Patent Document 1. The probe pin includes an elastic portion which expands and contracts in the longitudinal direction, and one contact portion provided at each of both ends of the elastic portion in the longitudinal direction.

JP 2008-516398 A

  However, since the probe pin makes contact with the inspection object and the inspection device at one contact portion, for example, when the terminal of the inspection object is a convex contact such as a male connector of a board-to-board connector, the probe In some cases, the contact portion of the pin and the convex contact of the inspection object cannot be stably connected, and contact reliability cannot be ensured.

  Therefore, an object of the present invention is to provide a probe pin that can be stably connected to a convex contact.

The probe pin of the present invention
An elastic part that expands and contracts along the longitudinal direction,
A pair of legs extending along the longitudinal direction from one end of the elastic portion and capable of flexing in a direction away from each other, and is disposed at a tip of the pair of legs and via the pair of legs. A first contact portion having a pair of contact portions urged in a direction along the longitudinal direction by the elastic portion and capable of contacting a convex contact of the inspection object;
A second contact portion disposed at the other end of the elastic portion and urged by the elastic portion in a direction opposite to the urging direction of the first contact portion, and electrically connected to the first contact portion;
With
Between the pair of legs, there is a gap capable of inserting the convex contact of the inspection object,
When the convex contact is inserted into the gap, the pair of contact portions of the pair of legs of the first contact portion can contact the convex contact.

  ADVANTAGE OF THE INVENTION According to the probe pin of this invention, it can connect to a convex contact stably by a pair of contact part of the front-end | tip of a pair of bendable leg parts.

FIG. 3 is a perspective view for explaining a use state of the probe pin according to the first embodiment of the present invention. FIG. 2 is a sectional view taken along the line II-II in FIG. 1. FIG. 2 is a perspective view of a probe pin according to the first embodiment of the present invention. FIG. 4 is a plan view of the probe pin of FIG. 3. FIG. 4 is a sectional view showing a state before the probe pin of FIG. 3 comes into contact with a convex contact of a male connector. FIG. 4 is a sectional view showing a state in which the probe pins of FIG. 3 are in contact with the convex contacts of the male connector. FIG. 4 is a perspective view showing another example of the probe pin of FIG. 3. FIG. 6 is a plan view of a probe pin according to a second embodiment of the present invention. FIG. 9 is a sectional view showing a state in which the probe pins of FIG. 8 are in contact with the convex contacts of the male connector. FIG. 9 is a plan view showing another example of the probe pin of FIG. 8. The front view of the probe pin of a 3rd embodiment of the present invention. FIG. 12 is a cross-sectional view showing a state where the probe pin of FIG. 11 is in contact with a convex contact of the male connector. The front view of the probe pin of a 4th embodiment of the present invention. FIG. 14 is a sectional view showing a state in which the probe pins of FIG. 13 are in contact with the convex contacts of the male connector.

  Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings. In the following description, terms indicating a specific direction or position (for example, terms including “up”, “down”, “right”, and “left”) will be used as needed. Is to facilitate understanding of the invention with reference to the drawings, and the technical scope of the invention is not limited by the meaning of those terms. Further, the following description is merely an example in nature, and is not intended to limit the present invention, its application, or its use. Furthermore, the drawings are schematic, and the ratios of the dimensions do not always match actual ones.

(1st Embodiment)
The probe pin 10 of the first embodiment of the present invention is used, for example, as shown in FIG. ing. In this socket 1, as shown in FIG. 2, a plurality of pairs of storage portions 2 are provided symmetrically with respect to a center line CL0, and the probe pins 10 are stored in the storage portions 2.

  Each storage section 2 is composed of a groove 3 in which a probe pin 10 can be stored and a through-hole 4 provided on the bottom surface of the groove 3, and extends along a center line CL0 of the socket 1 as shown in FIG. Are arranged at equal intervals.

  As shown in FIG. 3, the probe pin 10 includes an elastic portion 20 and first and second contact portions 30 and 40 provided at both ends of the elastic portion 20 in the longitudinal direction. The probe pin 10 is a thin plate having conductivity and is formed integrally by, for example, electroforming.

  In the following description, the width direction of the plate surface of the probe pin 10 is the X direction, the thickness direction of the probe pin 10 orthogonal to the X direction is the Y direction, and the longitudinal direction of the elastic portion 20 orthogonal to the XY direction is the Z direction. And

  As shown in FIG. 4, the elastic portion 20 has a meandering shape in which the linear portion 21 and the curved portion 22 are alternately continuous along the Z direction, and expands and contracts along the Z direction.

  The straight portion 21 is parallel to the X direction in the no-load state shown in FIG. The bending portion 22 has a first bending portion 221 located on the right side in the X direction and a second bending portion 222 located on the left side in the X direction, and the first bending portion 221 adjacent to the elastic portion 20 in the longitudinal direction. And a straight line L2 which is a tangent connecting the apexes of the second curved portions 222 adjacent in the longitudinal direction of the elastic portion 20 is parallel to the X direction.

  Further, a through-hole 23 that penetrates in the plate thickness direction (Y direction) and extends along the meandering shape is formed in a middle portion in the width direction of each linear portion 21 and a middle portion in the width direction of each curved portion 22 of the elastic portion 20. Is provided. Thereby, the resiliency of the elastic portion 20 is enhanced.

  As shown in FIG. 4, the first contact portion 30 includes a support portion 31 connected to a lower end of the elastic portion 20 in the Z direction, and a pair of legs extending downward from the support portion 31 in the Z direction and capable of bending. And a pair of contact portions 321 and 331 arranged at the tips of the pair of leg portions 32 and 33 so as to be able to contact the convex contacts of the inspection object. The pair of contact portions 321 and 331 can be urged downward in the Z direction by the elastic portion 20 via the pair of leg portions 32 and 33.

  The support portion 31 has a substantially rectangular shape in a plan view along the Y direction. When the probe pin 10 is stored in the storage portion 2 of the socket 1, the support portion 31 contacts the groove 3 of the storage portion 2, and Support. The support portion 31 is a tangent line connecting a straight line L <b> 1 connecting the second curved portions 222 adjacent to each other in the longitudinal direction of the elastic portion 20, and a tangent line connecting the first curved portions 221 adjacent to each other in the longitudinal direction of the elastic portion 20. It has a width W2 that is substantially the same as the width W1 that is the shortest distance from the straight line L2.

  The lower end of the elastic portion 20 in the Z direction is connected to the left side of the support portion 31 in the X direction and the upper side in the Z direction. A pair of legs 32 and 33 are connected to the left side of the support portion 31 in the X direction and the lower side of the Z direction. That is, the center line CL1 in the X direction of the elastic portion 20 extending in the Z direction does not coincide with the center line CL2 of the pair of legs 32, 33 in the X direction extending in the Z direction. In other words, the elastic portion 20 and the pair of leg portions 32 and 33 are connected to each other via one end in the X direction of the support portion 31 deviated from the center line CL1 in the X direction of the elastic portion 20 extending in the Z direction. .

  Each of the pair of legs 32 and 33 extends along the Z direction, and is provided symmetrically with respect to the center line CL2 in the X direction. A gap 34 is provided between the pair of legs 32 and 33 so as to be deformable in a direction approaching each other and into which a convex contact point of the inspection object can be inserted.

  In addition, each of the pair of legs 32, 33 can bend in a direction away from the center line CL2 in the X direction of the pair of legs 32, 33 (that is, in a direction away from each other). That is, the left leg 32 in the X direction can bend toward the left in the X direction, and the right leg 33 in the X direction can be bent toward the right in the X direction. In other words, when the convex contact of the inspection object is inserted into the gap 34 between the pair of legs 32, 33, each of the pair of contact portions 321 and 331 at the tips of the pair of legs 32 and 33 becomes convex. It is slidable in the direction away from each other while making contact on the contacts.

  Each of the pair of contact portions 321 and 331 at the tip (lower end in the Z direction) of the pair of leg portions 32 and 33 is provided with a curved surface 35 that can contact the convex contact. Further, each of the mutually facing surfaces of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 is connected to the curved surface 35 and in the biasing direction of the elastic portion 20, that is, the lower side in the Z direction. A flat surface or a curved concave inclined surface 36 is provided so as to move away from each other.

  The second contact portion 40 has a base 41 connected to the upper end of the elastic portion 20 in the Z direction, and a pair of protrusions 42 projecting upward from the base 41 in the Z direction. It is electrically connected. The second contact portion 40 is urged upward by the elastic portion 20 in the Z direction, that is, in the direction opposite to the urging direction of the first contact portion 30.

  The base 41 has a substantially rectangular shape in plan view along the Y direction. The upper end of the elastic portion 20 in the Z direction is connected to the left side of the base portion 41 in the X direction and the lower side of the Z direction.

  The pair of projecting portions 42 are provided symmetrically with respect to the center line CL1 of the elastic portion 20 in the X direction. Each of the pair of protrusions 42 is curved so that the tip (upper end in the Z direction) protrudes upward in the Z direction, and is provided on the substrate 90 of the inspection device in a state of being housed in the socket 1. The terminal 91 (shown in FIG. 2) comes into contact therewith.

  Further, each of the pair of projecting portions 42 is provided with a through hole 43 penetrating in the plate thickness direction (Y direction). Thereby, each protruding portion 42 is elastically deformed when it comes into contact with the terminal 91 of the substrate 90 and presses the terminal 91 by its elastic force, so that the contact reliability between the probe pin 10 and the inspection device is improved. be able to.

  By providing the pair of protrusions 42 at both ends of the base 41, when the probe pins 10 are stored in the socket 1, as shown in FIG. The pitch P1 between them can be reduced. Further, by making the protrusions 42 a pair, stable contact with the substrate 90 of the inspection device becomes possible.

  Next, referring to FIGS. 5 and 6, when two probe pins 10 are stored in a pair of storage portions 2 of socket 1 and are brought into contact with two adjacent convex contacts 81 of inspection object 80. The operation of will be described.

  As shown in FIG. 5, in a state where the convex contact 81 is located between the pair of legs 32 and 33 of each probe pin 10, when each probe pin 10 is brought closer to the inspection object 80, The portions of the curved surfaces 35 of the pair of contact portions 321 and 331 of the leg portions 32 and 33 near the center line CL2 are in contact with the convex contacts 81.

  When each probe pin 10 is further approached toward the inspection object 80 and each convex contact 81 of the inspection object 80 is inserted into each gap 34, as shown in FIG. The pair of contact portions 321 and 331 are bent by the inserted inspection object 80 in a direction away from the center line CL2, that is, in a direction away from each other. At this time, the convex contact 81 is in contact with the opposing surfaces (hereinafter referred to as contact surfaces) of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33, and the curved surface of the pair of contact portions 321 and 331. It moves while sliding from 35 toward the inclined surface 36.

  On the other hand, when each probe pin 10 is separated from the inspection object 80 and the convex contact 81 of the inspection object 80 is pulled out from the gap 34, the pair of contact portions 321 and 331 of the pair of legs 32 and 33 are It returns in the direction approaching the center line CL2, that is, the direction approaching each other. At this time, each convex contact 81 moves while sliding from the inclined surface 36 toward the curved surface 35 in a state of being in contact with the contact surfaces of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33.

  As described above, in the probe pin 10 according to the first embodiment, when the test object 80 is inserted into and removed from the probe pin 10, the convex contact 81 is connected to the pair of contacts 321 and 331 of the pair of legs 32 and 33. It moves while sliding, that is, wiping in contact with the surface. For this reason, even when foreign matter is attached to the pair of contact surfaces of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 or the surface of the convex contact 81, the pair of bendable legs is used. Since foreign matter is scraped off by wiping between the pair of contact portions 321 and 331 of the portions 32 and 33 and the convex contact 81, conduction failure due to the foreign matter can be avoided and contact reliability can be ensured.

  Further, since a gap 84 is formed between the pair of legs 32 and 33 so as to be deformable in a direction away from each other and into which the convex contact 81 of the inspection object 80 can be inserted, the tip of the pair of legs 32 and 33 is provided. The pair of contact portions 321 and 331 can be stably connected to the convex contact 81, and the contact reliability between the probe pin 10 and the inspection object 80 can be secured.

  Further, a direction in which each of the pair of legs 32, 33 intersects in the Z direction (longitudinal direction) and moves away from a center line CL2 extending in the Z direction of the pair of legs 32, 33, that is, a direction in which the pair approach each other. It is possible to bend. Accordingly, the distance that the convex contact 81 moves in a state of contacting the pair of legs 32 and 33 can be increased, and the wiping effect can be enhanced.

  The center line CL1 of the elastic portion 20 extending in the Z direction (longitudinal direction) does not coincide with the center line CL2 of the pair of leg portions 32 and 33 extending in the Z direction, and is shifted from each other. Therefore, when the two probe pins 10 are stored in the pair of storage portions 2 of the socket 1, the pair of legs 32, 33 is arranged such that the center line CL 2 coincides with the center line CL 1 of the elastic portion 20. In a state where the pair of legs 32 and 33 are disposed at the ends of the support portions 31 of the two probe pins 10 on the side closer to each other, the pitch between two adjacent convex contacts 81 of the inspection object 80 is narrowed. It is possible to cope with the narrow pitch.

  In addition, each of the mutually facing surfaces of the pair of contact portions 321 and 331 of the pair of legs 32 and 33 has an inclined surface 36 that is separated from each other as the elastic portion 20 is biased. , 33 has a curved surface 35 at a pair of contact portions 321 and 331 at the distal end. Thereby, the convex contact 81 of the inspection object 80 can be smoothly guided into the gap 34 between the pair of legs 32 and 33.

  Further, each of the pair of legs 32 and 33 adjusts the distance W3 from the support portion 31 to the vertex of the curved surface 35 so that when the convex contact 81 of the inspection object 80 is inserted into the gap 34, The legs 32, 33 can adjust the amount of bending. For example, by making the ratio of the distance W3 and the width W2 of the support portion 31 equal to or greater than 1 and lengthening the pair of legs 32, 33, the bending dimension can be increased, and the convex contact 81 of the inspection object 80 can be formed. A sufficient wiping distance can be secured so that foreign substances on the contact surfaces of the pair of legs 32 and 33 can be scraped off.

  The probe pin 10 has a gap 34 between the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 that can bend in directions away from each other, in which the convex contact 81 of the inspection object 80 can be inserted. When the convex contact 81 can be brought into contact with the pair of contact portions 321, 331 of the pair of leg portions 32, 33 when the convex contact 81 is inserted into the gap 34, it is possible to maintain stable contact. it can.

  For example, the pair of leg portions 32 and 33 are not limited to a configuration in which both can be bent, and it is sufficient that at least one of the pair is legible.

  In addition, the curved surface 35 and the inclined surface 36 of the pair of legs 32, 33 may be omitted, or may be provided on one of the pair of legs 32, 33. Further, only the curved surface 35 may be provided, or only the inclined surface 36 may be provided. However, in order to secure more stable contact with the convex contact 81, it is better to arrange the curved surface 35 or the inclined surface 36.

  When it is not necessary to cope with the narrow pitch, the probe is set so that the center line CL1 extending in the Z direction of the elastic portion 20 and the center line CL2 extending in the Z direction of the pair of legs 32, 33 coincide with each other. The pins 10 may be configured.

  Further, the probe pin 10 is not limited to the case where the elastic portion 20 and the first and second contact portions 30 and 40 are integrally formed. For example, as shown in FIG. 7, the first and second contact portions 130 and 140 may be configured separately.

  In this case, each of the first and second contact portions 130 and 140 is partially located inside the coil spring 120 as an elastic body, and is connected such that the plate surfaces are orthogonal to each other. In FIG. 7, the direction along the plate surface of the first contact portion 130 is the Y direction, the direction along the plate surface of the second contact portion 140 is the X direction, and the direction orthogonal to the X direction and the Y direction is Z. Direction.

  The first contact portion 130 extends upward from the support portion 31 in the Z direction and has an insertion portion 37 arranged inside the coil spring 120. The insertion portion 37 is provided with a through hole 38 that penetrates in the thickness direction (X direction) and extends along the Z direction.

  The second contact portion 140 extends downward from the base portion 41 in the Z direction and has a pair of elastic pieces 44 and 45 arranged inside the coil spring 120. A gap larger than the thickness of the first contact portion 130 is provided between the pair of elastic pieces 44 and 45. At the tip of one elastic piece 44, a projection 46 that can be fitted into the through hole 38 of the first contact portion 130 is provided. The first and second contact portions 130 and 140 are connected by fitting the protrusion 46 into the through hole 38. In addition, at the tip of the other elastic piece 45, when the first and second contact portions 130 and 140 are connected, a surface between the through hole 38 of the insertion portion 37 of the first contact portion 130 and the support portion 31 is formed. A projection 47 is provided for contact.

  In a state where the first and second contact portions 130 and 140 are connected, both ends of the coil spring 120 are supported by the support portion 31 of the first contact portion 130 and the base portion 41 of the second contact portion, and are constantly compressed. It is supposed to be.

(2nd Embodiment)
As shown in FIG. 8, the probe pin 110 of the second embodiment is different from the probe pin of the first embodiment in that a stopper 50 is provided on each of opposing surfaces (contact surfaces) of a pair of legs 32 and 33. It is different from the probe pin 10.

  In the second embodiment, the same parts as those in the first embodiment are denoted by the same reference numerals, and the description thereof will be omitted. Only different points from the first embodiment will be described.

  Each of the stoppers 50 protrudes from the contact surfaces of the legs 32 and 33 in a direction approaching each other (X direction) so as to close the gap 34. By providing each stopper 50 in this manner, the insertion amount of the convex contact 81 can be regulated as shown in FIG. Thereby, the excessive insertion of the convex contact 81 can be prevented, and the trouble caused by the excessive insertion of the convex contact 81 such as breakage of the probe pin 110 can be avoided.

  A projection 51 is provided at the lower end of the stopper 50 in the Z direction. As shown in FIG. 9, the projection 51 can come into contact with the convex contact 81 when the convex contact 81 is inserted into the gap 34. As a result, in addition to the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33, the protrusion 51 of each stopper 50 also comes into contact with the convex contact 81, so that the distance between the probe pin 10 and the inspection target 80 is increased. High contact reliability can be achieved.

  The stopper 50 may be provided on only one of the pair of legs 32 and 33, as shown in FIG. In this case, by adjusting the size of the stopper 50, the position at which the protruding portion 51 contacts the convex contact 81 can be adjusted, and the insertion amount of the convex contact 81 can be regulated.

(Third embodiment)
As shown in FIG. 11, the probe pin 210 of the third embodiment is different from the probe pin 10 of the first embodiment in that a stopper 60 for connecting a pair of legs 32, 33 is provided. .

  In the third embodiment, like the second embodiment, the same parts as those in the first embodiment will be denoted by the same reference numerals, and the description thereof will be omitted. The different points from the first embodiment will be described.

  The stopper 60 is provided above the inclined surface 36 of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 in the Z direction, and the lower surface in the Z direction is connected to the inclined surface 36. By providing the stopper 60 in this manner, the insertion amount of the convex contact 81 can be regulated as shown in FIG.

  A pair of protrusions 61 are provided on the lower surface of the stopper 60 in the Z direction. As shown in FIG. 12, as shown in FIG. 12, when the convex contact 81 is inserted into the gap 34, in addition to the pair of contact portions 321 and 331, the pair of projecting portions 61 can also contact the convex contact 81. It has become. Thereby, higher contact reliability between the probe pin 210 and the inspection object 80 can be realized.

  In the probe pin 210 of the third embodiment, since the stopper 60 is provided near the tip of the pair of legs 32, 33, the pair of legs 32, 33 necessary for securing a sufficient wiping distance is provided. 33 is smaller than the probe pin 10 of the first embodiment. For this reason, the size of the gap 34 is adjusted so that the length of the pair of legs 32 and 33 is shorter than that of the probe pin 10 of the first embodiment. Thereby, the strength of the first contact portion 30 is increased.

(Fourth embodiment)
As shown in FIG. 13, in the probe pin 310 of the fourth embodiment, the first contact portion 30 has a pair of legs 132, 133 having different lengths and a connecting portion connecting the pair of legs 132, 133. 70, and is different from the probe pin 10 of the first embodiment in that a pair of contacts are disposed asymmetrically with respect to the center line of the pair of legs 132, 133.

  In the fourth embodiment, like the second and third embodiments, the same parts as those in the first embodiment are denoted by the same reference numerals, and description thereof will be omitted. Only different points from the first embodiment will be described.

  In the pair of legs 132 and 133, the distance from the support portion 31 to the vertex of the curved surface 35 is shorter in the first leg 132 on the left side in the X direction than in the second leg 133 on the right side in the X direction. . The contact surface 321 of the first leg 132 is not provided with the inclined surface 36.

  The connecting portion 70 has a lower surface in the Z direction connected to the inclined surface 36 of the contact portion 331 of the second leg 133, and an upper portion in the Z direction of the curved surface 35 of the contact portion 331 of the first leg 132. It is provided so as to be continuous with a surface facing the second leg 133.

  In the probe pin 310 of the fourth embodiment, when the convex contact 81 is inserted into the gap 34, a portion of the contact portion 331 of the second leg 133 near the center line CL2 of the curved surface 35 and the convex contact 81 are formed. Contact. Further, when the convex contact 81 is inserted into the gap 34, the convex contact 81 slides from the curved surface 35 toward the inclined surface 36 in a state of being in contact with the second leg 133 contact portion 331, as shown in FIG. As described above, the first leg 133 moves until it comes into contact with a portion near the center line CL2 of the curved surface 35 of the contact portion 321 of the first leg 133.

  Therefore, in the probe pin 310 of the fourth embodiment, only the second leg 133 is bent, and the curved surface 35 of the first leg 132 restricts the insertion amount of the convex contact 81. Also serves as.

  Thus, by providing the pair of legs 132 and 133 asymmetrically with respect to the center line CL2 extending in the Z direction, for example, one of the side portions of the convex contact 81 of the inspection target 80 is covered with the resin 82 or the like. In this case, both of the pair of legs 132 and 133 can be brought into contact with the convex contact 81. Thereby, high contact reliability between the probe pin 210 and the inspection object 80 can be realized.

  The components described in the first to fourth embodiments may be appropriately combined, or may be appropriately selected, replaced, or deleted, as a matter of course.

The probe pin of the present invention
An elastic part that expands and contracts along the longitudinal direction,
A pair of legs extending along the longitudinal direction from one end of the elastic portion and capable of flexing in a direction away from each other, and is disposed at a tip of the pair of legs and via the pair of legs. A first contact portion having a pair of contact portions urged in a direction along the longitudinal direction by the elastic portion and capable of contacting a convex contact of the inspection object;
A second contact portion disposed at the other end of the elastic portion and urged by the elastic portion in a direction opposite to the urging direction of the first contact portion, and electrically connected to the first contact portion;
With
Between the pair of legs, there is a gap capable of inserting the convex contact of the inspection object,
When the convex contact is inserted into the gap, the pair of contact portions of the pair of legs of the first contact portion can contact the convex contact.

  ADVANTAGE OF THE INVENTION According to the probe pin of this invention, while a pair of leg parts flex freely in the direction which mutually separates with respect to a convex contact, a pair of contact parts contact a convex contact, and can connect to a convex contact stably. In addition, when the convex contact is inserted, the convex contact slides while being in contact with the pair of contact portions of the pair of leg portions, so that the wiping effect causes foreign matter attached to the surface of the pair of leg portions that comes into contact with the convex contact portion. The conduction failure can be avoided.

In one embodiment of the probe pin,
At least one of the mutually facing surfaces of the pair of legs has a stopper for restricting insertion of the convex contact.

  According to the probe pin of the embodiment, the stopper can prevent the convex contact from being excessively inserted.

In one embodiment of the probe pin,
At least one leg of the pair of legs is bendable in a direction away from the other leg of the pair of legs.

  According to the probe pin of the above embodiment, the distance that the convex contact moves in a state of contacting the pair of legs can be increased, and the wiping effect can be enhanced.

In one embodiment of the probe pin,
A center line along the longitudinal direction of the pair of legs is displaced from a center line along the longitudinal direction of the elastic portion.

  According to the probe pin of the embodiment, the center line along the longitudinal direction is different from the state in which the pair of legs are arranged so that the center line along the longitudinal direction matches the center line along the longitudinal direction of the elastic portion. In the state where the pair of legs are arranged so as not to coincide with the center line along the longitudinal direction of the elastic portion and to be shifted from each other, it is possible to correspond to a narrow pitch in which the pitch between two adjacent convex contacts of the inspection object is reduced. it can.

In one embodiment of the probe pin,
Each of the mutually facing surfaces of the pair of contact portions of the pair of leg portions of the first contact portion has an inclined surface that moves away from each other in the direction in which the elastic portion is biased.

  According to the probe pin of the embodiment, the convex contact can be smoothly guided into the gap between the pair of legs.

In one embodiment of the probe pin,
Each of the pair of contact portions of the pair of leg portions of the first contact portion has a curved surface.

  According to the probe pin of the embodiment, the convex contact can be smoothly guided into the gap between the pair of legs.

  The probe pin of the present invention can be applied to, for example, an inspection unit used for inspecting a liquid crystal panel having a male connector as a terminal.

DESCRIPTION OF SYMBOLS 1 Socket 2 Storage part 3 Groove part 4 Through hole 10, 110, 210, 310 Probe pin 20 Elastic part 120 Coil spring 21 Straight part 22 Curved part 23 Through hole 221 First curved part 222 Second curved part 30, 130 First contact Part 31 Support part 32, 33, 132, 133 Leg part 321, 331 Contact part 34 Gap 35 Curved surface 36 Inclined part 37 Insert part 38 Through hole 40, 140 Second contact part 41 Base 42 Projection part 43 Through hole 44, 45 Elastic pieces 46, 47 Projections 50, 60 Stoppers 51, 61 Projections 70 Connecting parts 80 Inspection target 81 Projected contacts 90 Substrate 91 Terminal CL0 Center line (socket)
CL1 center line (elastic part)
CL2 center line (pair of legs)
L1 (connecting the apex of the first curved portion) Straight line L2 (connecting the apex of the second curved portion) Straight line W1 Width of the elastic portion W2 Width of the supporting portion W3 Distance P1 from the supporting portion to the apex of the curved surface (adjacent probe pin) P2 (between legs of adjacent probe pins)

Claims (4)

An elastic portion that expands and contracts along a first direction;
A first contact portion disposed at one end of the elastic portion in the first direction;
A second contact portion disposed at the other end of the elastic portion in the first direction,
In a probe pin which can be accommodated in a socket in a state where the elastic portion can expand and contract in the first direction,
The elastic portion is disposed closer to the other end of the first contact portion in the second direction in the second direction than one end of the first contact portion in the second direction intersecting with the first direction,
The first contact portion has a support portion disposed on the same side in the second direction as the elastic portion with respect to the one end of the first contact portion, and protruding in the second direction,
The support portion is configured to be able to abut on the inside of the socket in the first direction while being accommodated in the socket ,
The elastic portion,
A plurality of extending portions extending along the second direction;
At least one curved portion connected to the adjacent extending portion;
Has,
Each of the extending portion and the curved portion,
That having a plate thickness direction to penetrate and through holes extending along the shape of the elastic portion of the probe pins, the probe pins. The first contact portion is
A pair of legs each extending along the first direction, and capable of flexing in the second direction and in a direction away from each other;
Each of the pair of legs has a pair of contact portions that are disposed at the tip of each of the leg portions and that can contact a convex contact of the inspection object,
A gap is provided between the pair of legs so that the convex contact of the test object can be inserted,
The probe pin according to claim 1, wherein the pair of contact portions and the convex contact are capable of contacting when the convex contact is inserted into the gap. A probe pin according to claim 1 or 2 ,
The socket capable of accommodating the probe pin,
An inspection unit, wherein the support unit is configured to abut on an inner surface of the socket in the first direction when the probe pin is accommodated in the socket. An inspection apparatus comprising at least one inspection unit according to claim 3 .

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