JP2020170008A - Probe pin - Google Patents

Abstract

To provide a probe pin that can be stably connected to a concave contact point.SOLUTION: A probe pin (10) comprises: an elastic part (20); a first contact part (30) including a pair of leg parts (32, 33) that extend from one end of the elastic part (20) along the longitudinal direction and can be bent in a direction close to each other, and including a pair of contact point parts (321, 331) that are arranged on the tips of the pair of leg parts (32, 33), urged in a direction along the longitudinal direction by the elastic part (20) via the pair of leg parts (32, 33), and can be in contact with a concave contact point of an inspection object; and a second contact part (40) that is arranged on the other end of the elastic part (20) and electrically connected to the first contact part (30). The pair of leg parts (32, 33) include a gap (34) therebetween.SELECTED DRAWING: Figure 4

Description

The present invention relates to probe pins.

In an electronic component module such as a camera or a liquid crystal panel, continuity inspection, operation characteristic inspection, and the like are generally performed in the manufacturing process. In these inspections, probe pins are used to connect the FPC contact electrode for connecting to the main board installed in the electronic component module, or the electrode part such as the mounted board-to-board connector to the inspection device. It is done by.

As such a probe pin, for example, there is one described in Patent Document 1. The probe pin is composed of an elastic portion that expands and contracts in the longitudinal direction and one contact portion provided at both ends of the elastic portion in the longitudinal direction.

Japanese Unexamined Patent Publication No. 2008-516398

However, since the probe pin makes contact with the inspection object and the inspection device at one contact portion, for example, when the terminal of the inspection object is a concave contact such as a female side connector of the substrate-to-board connector, the probe In some cases, the contact portion of the pin and the concave contact of the inspection object cannot be stably connected, and contact reliability cannot be ensured.

Therefore, an object of the present invention is to provide a probe pin that can be stably connected to a concave contact.

The probe pin of the present invention
An elastic part that expands and contracts along the longitudinal direction,
It has a pair of legs extending from one end of the elastic portion along the longitudinal direction and flexing in a direction approaching each other, and is arranged at the tips of the pair of legs and via the pair of legs. A first contact portion having a pair of contact portions that are urged by the elastic portion in a direction along the longitudinal direction and that can contact the concave contact of the inspection object.
A second contact portion that is urged by the elastic portion in a direction opposite to the urging direction of the first contact portion and is electrically connected to the first contact portion.
With
There is a gap between the pair of legs.

According to the probe pin of the present invention, while the pair of legs bend in the direction approaching the concave contact, the pair of contact portions of the pair of legs come into contact with the concave contact, so that the pair of legs can be stably connected to the concave contact. it can.

The perspective view for demonstrating the use state of the probe pin of one Embodiment of this invention. FIG. 2 is a cross-sectional view taken along the line II-II of FIG. The perspective view of the probe pin of one Embodiment of this invention. Top view of the probe pin of FIG. FIG. 3 is a cross-sectional view showing a state before contacting the concave contact of the female connector of the probe pin of FIG. FIG. 3 is a cross-sectional view showing a state in which the probe pin of FIG. 3 is in contact with the concave contact of the female connector. FIG. 5 is a plan view showing a first example of the probe pin of FIG. The plan view which shows the 2nd example of the probe pin of FIG. FIG. 8 is a cross-sectional view showing a state in which the probe pin of FIG. 8 is in contact with the concave contact of the female connector. The plan view which shows the 3rd example of the probe pin of FIG. The perspective view which shows the 4th example of the probe pin of FIG.

Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings. In the following description, terms indicating a specific direction or position (for example, terms including "top", "bottom", "right", and "left") are used as necessary, but the use of these terms is used. Is for facilitating the understanding of the invention with reference to the drawings, and the meaning of those terms does not limit the technical scope of the present invention. In addition, the following description is merely an example and is not intended to limit the present invention, its application, or its use. Furthermore, the drawings are schematic, and the ratio of each dimension does not always match the actual one.

As shown in FIG. 1, the probe pin 10 of the first embodiment of the present invention is used in a state of being housed in a socket 1 attached to a substrate 90 of an inspection device, and constitutes an inspection unit together with the socket 1. ing. In this socket 1, as shown in FIG. 2, a plurality of pairs of storage portions 2 are provided symmetrically with respect to the center line CL0, and the probe pins 10 are housed in the storage portions 2.

Each accommodating portion 2 is composed of a groove portion 3 capable of accommodating the probe pin 10 and a through hole 4 provided on the bottom surface of the groove portion 3, and as shown in FIG. 1, along the center line CL0 of the socket 1. Are evenly spaced.

As shown in FIG. 3, the probe pin 10 includes an elastic portion 20 and first and second contact portions 30 and 40 provided at both ends of the elastic portion 20 in the longitudinal direction. The probe pin 10 is a thin plate and has conductivity, and is integrally formed by, for example, an electroforming method.

In the following description, the width direction of the plate surface of the probe pin 10 is the X direction, the plate thickness direction of the probe pin 10 orthogonal to the X direction is the Y direction, and the longitudinal direction of the elastic portion 20 orthogonal to the XY direction is the Z direction. And.

As shown in FIG. 4, the elastic portion 20 has a meandering shape in which straight portions 21 and curved portions 22 are alternately continuous along the Z direction, and expands and contracts along the Z direction.

The straight portion 21 is parallel to the X direction in the no-load state shown in FIG. The curved portion 22 has a first curved portion 221 located on the right side in the X direction and a second curved portion 222 located on the left side in the X direction, and serves as a tangent line connecting the vertices of the adjacent first curved portions 221. The straight line L1 and the straight line L2 as a tangent line connecting the vertices of the adjacent second curved portions 222 are parallel to the X direction.

Further, through holes 23 penetrating in the plate thickness direction (Y direction) and extending along a meandering shape in the intermediate portion in the width direction of each straight portion 21 of the elastic portion 20 and the intermediate portion in the width direction of each curved portion 22. Is provided. As a result, the springiness of the elastic portion 20 is enhanced.

As shown in FIG. 4, the first contact portion 30 includes a support portion 31 connected to the lower end of the elastic portion 20 in the Z direction and a pair of legs extending downward from the support portion 31 in the Z direction and being flexible. It has portions 32, 33 and a pair of contact portions 321, 331 arranged at the tips of the pair of leg portions 32, 33 so as to be able to contact the concave contacts of the inspection object. The pair of contact portions 321 and 331 are connected by the connecting portion 70, and can be urged downward by the elastic portion 20 in the Z direction via the pair of leg portions 32 and 33.

The support portion 31 has a substantially rectangular shape in a plan view along the Y direction, and when the probe pin 10 is stored in the storage portion 2 of the socket 1, it comes into contact with the groove portion 3 of the storage portion 2 and the probe pin 10 Support. The support portion 31 is a tangent line connecting the straight line L1 which is a tangent line connecting the second curved portions 222 adjacent to each other in the longitudinal direction of the elastic portion 20 and the first curved portion 221 adjacent to each other in the longitudinal direction of the elastic portion 20. It has a width W2 that is substantially the same as the width W1 that is the shortest distance between the straight line L2.

The lower end of the elastic portion 20 in the Z direction is connected to the left side of the support portion 31 in the X direction and the upper side in the Z direction. Further, a pair of legs 32 and 33 are connected to the left side of the support portion 31 in the X direction and the lower side in the Z direction. That is, the center line CL1 in the X direction extending in the Z direction of the elastic portion 20 and the center line CL2 in the X direction extending in the Z direction of the pair of leg portions 32 and 33 do not match and are deviated from each other. In other words, the elastic portion 20 and the pair of leg portions 32, 33 are connected via one end portion in the X direction of the support portion 31 deviating from the center line CL1 in the X direction extending in the Z direction of the elastic portion 20. ..

Each of the pair of legs 32 and 33 extends along the Z direction and is provided asymmetrically with respect to the center line CL2 in the X direction. A gap 34 that can be deformed in a direction approaching each other is provided between the pair of legs 32 and 33. Further, the pair of leg portions 32 and 33 are connected by the leg connecting portion 71. The leg connecting portion 71 is provided at the boundary between the pair of leg portions 32, 33 and the pair of contact portions 321, 331, and divides the gap 34 into two in the Z direction. The orientation of the pair of legs 32, 33 can be adjusted by the gap 34 on the side of the pair of legs 32, 33 (upper side in the Z direction). Therefore, for example, when the pair of legs 32, 33 are brought into contact with the concave contact. The positional deviation between the pair of contact portions 321 and 331 and the concave contact can be adjusted.

Further, each of the pair of leg portions 32, 33 can be bent in a direction approaching the center line CL2 in the X direction of the pair of leg portions 32, 33 (that is, in a direction approaching each other). That is, the leg 32 on the left side in the X direction can be bent toward the right side in the X direction, and the leg 33 on the right side in the X direction can be bent toward the left side in the X direction. In other words, when the pair of legs 32, 33 are inserted into the concave contacts of the object to be inspected, each of the pair of contacts 321, 331 at the tips of the pair of legs 32, 33 is in contact with the concave contacts. It is possible to slide in the direction of approaching each other.

Each of the pair of contact portions 321 and 331 at the tips (lower ends in the Z direction) of the pair of leg portions 32 and 33 is provided with a curved surface 35 that can contact the concave contact. The curved surfaces 35 of the pair of contact portions 321 and 331 are integrated via the contact connecting portion 70. That is, the contact connecting portion 70 has a curved surface 72 that is continuous with the curved surfaces 35 of the pair of contact portions 321, 331, and connects the pair of leg portions 32, 33 in a frame shape.

Further, on the outer surface of the pair of legs 32, 33 on the left side in the X direction opposite to the inner surface facing the contact portion 331 on the right side in the X direction, the elastic portion 20 is urged in the urging direction, that is, below the Z direction. A flat or curved concave inclined surface 36 that approaches each other toward the side is provided.

The second contact portion 40 has a base portion 41 connected to the upper end of the elastic portion 20 in the Z direction and a pair of projecting portions 42 protruding upward in the Z direction from the base portion 41, and the second contact portion 40 and the first contact portion 30. It is electrically connected. The second contact portion 40 is urged by the elastic portion 20 toward the upper side in the Z direction, that is, in a direction opposite to the urging direction of the first contact portion 30.

The base 41 has a substantially rectangular shape in a plan view along the Y direction. The upper end of the elastic portion 20 in the Z direction is connected to the left side of the base portion 41 in the X direction and the lower side in the Z direction.

The pair of protruding portions 42 are provided symmetrically with respect to the center line CL1 in the X direction of the elastic portion 20. Each of the pair of protruding portions 42 is curved so that its tip (upper end in the Z direction) protrudes upward in the Z direction, and is provided on the substrate 90 of the inspection device in a state of being housed in the socket 1. It comes into contact with the terminal 91 (shown in FIG. 2).

Further, each of the pair of projecting portions 42 is provided with a through hole 43 penetrating in the plate thickness direction (Y direction). As a result, each protruding portion 42 elastically deforms when it comes into contact with the terminal 91 of the substrate 90 and presses the terminal 91 by the elastic force, so that the contact reliability between the probe pin 10 and the inspection device is improved. be able to.

By providing a pair of projecting portions 42 at both ends of the base portion 41, when the probe pin 10 is housed in the socket 1, as shown in FIG. 2, the projecting portions 42 of the probe pins 10 adjacent to each other in the Y direction are provided. The pitch P1 between them can be reduced. Further, by pairing the protruding portions 42, stable contact with the substrate 90 of the inspection device becomes possible.

Next, referring to FIGS. 5 and 6, a case where the two probe pins 10 are housed in the pair of storage portions 2 of the socket 1 and brought into contact with two adjacent concave contacts 81 of the inspection object 80. The operation of is described. The concave contact 81 is a pair of contact portions 82 facing each other in a direction (X direction) intersecting the insertion direction (Z direction) of the probe pin 10 on the facing surfaces in the recess of the inspection object 80. , 83. A deformable gap 84 is provided between the pair of contact portions 82 and 83.

As shown in FIG. 5, each probe pin 10 is inspected with the pair of leg portions 32, 33 of each probe pin 10 located in the gap 84 between the pair of contact portions 82, 83 of the concave contact 81. As it approaches the object 80, the outer surface of each curved surface 35 of the pair of contact portions 321 and 331 of the pair of legs 32 and 33 comes into contact with the pair of contact portions 82 and 83 of the concave contact 81.

Each probe pin 10 is brought closer to the inspection object 80, and a pair of leg portions 32 of each probe pin 10 are provided in the gap 84 between the pair of contact portions 82 and 83 of each concave contact 81 of the inspection object 80. , 33 are inserted, and as shown in FIG. 6, the pair of legs 32, 33 push the pair of contact portions 82, 83 of the concave contact 81 away from each other, while the pushed-out concave portion. The pair of contact portions 82, 83 of the contact 81 bends the pair of leg portions 32, 33 in the direction of approaching each other. At this time, the pair of legs 32 and 33 move while sliding while their outer surfaces are in contact with the pair of contact portions 82 and 83 of the concave contacts 81.

On the other hand, when each probe pin 10 is separated from the inspection object 80 and the pair of legs 32 and 33 are removed from the gap 84 of the concave contact 81 of the inspection object 80, the pair of contact portions 82 of the concave contact 81 , 83 return in the direction of approaching each other, and the pair of legs 32, 33 return in the direction of separating from each other. At this time, the pair of legs 32 and 33 move while sliding while their outer surfaces are in contact with the pair of contact portions 82 and 83 of the concave contacts 81.

As described above, in the probe pin 10 of one embodiment, the pair of legs 32 and 33 are in contact with the pair of contact portions 82 and 83 of the concave contact 81 when the probe pin 10 is inserted and removed from the inspection object 80. Move while sliding, that is, wiping. Therefore, even when foreign matter adheres to the outer surface of the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 or the surface of the pair of contact portions 82 and 83 of the concave contact 81. , Foreign matter is rubbed by wiping between the pair of contact portions 321 and 331 of the pair of leg portions 32 and 33 and the pair of contact portions 82 and 83 of the concave contact 81, so that the contact is avoided due to poor continuity due to the foreign matter. Reliability can be ensured.

Further, each of the pair of legs 32 and 33 can be bent in a direction approaching each other, and there is a gap 34 between the pair of legs 32 and 33 that can be deformed in a direction approaching each other. ing. As a result, the distance that the pair of contact portions 321, 331 of the pair of leg portions 32, 33 moves in contact with the pair of contact portions 82, 83 of the concave contact 81 can be lengthened, and the wiping effect is enhanced. be able to.

Further, the first contact portion 30 has a leg connecting portion 71 that connects the pair of leg portions 32, 33. By adjusting the position of the leg connecting portion 71, the amount of bending of the pair of leg portions 32, 33 can be adjusted.

Further, the first contact portion 30 has a contact connecting portion 70 for connecting the pair of contact portions 321, 331 of the pair of leg portions 32 and 33. As a result, the pair of contact portions 321 and 331 are integrated, so that the pair of leg portions 32 and 33 can be easily inserted into the gap 84 of the concave contact 81 of the inspection object 80.

Further, the center line CL1 extending in the Z direction (longitudinal direction) of the elastic portion 20 and the center line CL2 extending in the Z direction of the pair of legs 32 and 33 do not match and are deviated from each other. Therefore, when the two probe pins 10 are stored in the pair of storage portions 2 of the socket 1, the pair of legs 32 and 33 are arranged so that the center line CL2 coincides with the center line CL1 of the elastic portion 20. In a state where the pair of legs 32 and 33 are arranged at the ends of the two probe pins 10 on the side close to each other, the pitch of the two adjacent concave contacts 81 of the inspection object 80 is narrowed. It is possible to cope with a narrow pitch.

Further, curved surfaces 35 are provided on the pair of contact portions 321 and 331 at the tips of the pair of leg portions 32 and 33, and the outer surfaces of the pair of leg portions 32 and 33 are provided with each other in the urging direction of the elastic portions 20. An inclined surface 36 of an approaching flat surface or a curved concave surface is provided. As a result, the pair of legs 32 and 33 can be smoothly guided to the gap 84 of the concave contact 81 of the inspection object 80.

If the probe pin 10 has a gap 34 that can be deformed in the direction of approaching each other between the pair of contact portions 321 and 331 of the pair of legs 32 and 33 that can bend in the direction of approaching each other. , Stable contact can be maintained.

For example, the pair of legs 32 and 33 are not limited to a flexible configuration, and at least one of them may be flexible.

Further, the curved surface 35 and the inclined surface 36 of the pair of legs 32 and 33 may be omitted, or may be provided on either or both of the pair of legs 32 and 33. Further, only the curved surface 35 may be provided, or only the inclined surface 36 may be provided. However, in order to secure more stable contact with the concave contact 81, it is better to arrange the curved surface 35 or the inclined surface 36.

When it is not necessary to correspond to a narrow pitch, the probe so that the center line CL1 extending in the Z direction of the elastic portion 20 and the center line CL2 extending in the Z direction of the pair of legs 32 and 33 coincide with each other. Pin 10 may be configured.

Further, the contact connecting portion 70 may be configured to have an inclined surface 73 continuous with the curved surfaces 35 of the pair of contact portions 321 and 331, for example, as shown in FIG. 7, instead of the curved surface 72. .. The gap 34 between the pair of leg portions 32, 33 is not limited to the case of being divided, and as shown in FIG. 7, the leg connecting portion 71 may be omitted and integrated.

Further, the contact connecting portion 70 can be omitted as shown in FIGS. 8 and 9. In this case, for example, by providing the inclined surfaces 36 on each of the outer surfaces of the pair of contact portions 321 and 331, the pair of legs 32 and 33 can be easily inserted into the gap 84 of the concave contact 81 of the inspection object 80. Become.

The pair of legs 32 and 33 may be provided symmetrically with respect to the center line CL2 extending in the longitudinal direction as shown in FIGS. 8 and 9, or may be provided in the longitudinal direction as shown in FIG. May be provided so as to be different.

Further, the probe pin 10 is not limited to the case where the elastic portion 20 and the first and second contact portions 30 and 40 are integrally formed. For example, as shown in FIG. 11, the first and second contact portions 130 and 140 may be separately configured.

In this case, a part of each of the first and second contact portions 130 and 140 is located inside the coil spring 120 as an elastic body, and the plate surfaces are connected so as to be orthogonal to each other. In FIG. 7, the direction along the plate surface of the first contact portion 130 is the Y direction, the direction along the plate surface of the second contact portion 140 is the X direction, and the directions orthogonal to the X direction and the Y direction are Z. The direction.

The first contact portion 130 extends upward from the support portion 31 in the Z direction and has an insertion portion 37 arranged inside the coil spring 120. The insertion portion 37 is provided with a through hole 38 that penetrates in the plate thickness direction (X direction) and extends along the Z direction.

The second contact portion 140 extends downward from the base portion 41 in the Z direction and has a pair of elastic pieces 44, 45 arranged inside the coil spring 120. A gap larger than the plate thickness of the first contact portion 130 is provided between the pair of elastic pieces 44 and 45. At the tip of one elastic piece 44, a protrusion 46 that can be fitted into the through hole 38 of the first contact portion 130 is provided. By fitting the protrusion 46 into the through hole 38, the first and second contact portions 130 and 140 are connected. Further, when the first and second contact portions 130 and 140 are connected to the tip of the other elastic piece 45, the surface between the through hole 38 of the insertion portion 37 of the first contact portion 130 and the support portion 31 A contact protrusion 47 is provided.

In the state where the first and second contact portions 130 and 140 are connected, both ends of the coil spring 120 are supported by the support portion 31 of the first contact portion 130 and the base portion 41 of the second contact portion, and are constantly compressed. It is supposed to be done.

It goes without saying that the components described in the above-described embodiments may be combined as appropriate, and may be selected, replaced, or deleted as appropriate.

The probe pin of the present invention
An elastic part that expands and contracts along the longitudinal direction,
It has a pair of legs extending from one end of the elastic portion along the longitudinal direction and flexing in a direction approaching each other, and is arranged at the tips of the pair of legs and via the pair of legs. A first contact portion having a pair of contact portions that are urged by the elastic portion in a direction along the longitudinal direction and that can contact the concave contact of the inspection object.
A second contact portion arranged at the other end of the elastic portion, urged by the elastic portion in a direction opposite to the urging direction of the first contact portion, and electrically connected to the first contact portion.
With
There is a gap between the pair of legs.

According to the probe pin of the present invention, the pair of legs flex freely in the direction approaching the concave contact, and the pair of contact portions come into contact with the concave contact, so that the pair of legs can be stably connected to the concave contact. In addition, since the pair of legs move while sliding in contact with the pair of contacts and the concave contacts, foreign matter adhering to the surfaces of the pair of contacts and the concave contacts of the pair of legs due to the wiping effect. Poor continuity can be avoided.

In one embodiment of the probe pin
It has a contact connecting portion for connecting the pair of contact portions of the pair of legs.

According to the above embodiment, since the pair of contact portions are integrated, the pair of legs can be easily inserted into the concave contact portion of the inspection object.

In one embodiment of the probe pin
The probe pin according to claim 1 or 2, wherein the first contact portion is provided at a boundary between the pair of legs and the pair of contact portions, and has a leg connecting portion that connects the pair of legs.

According to the above embodiment, the amount of bending of the pair of legs can be adjusted by adjusting the position of the leg connecting portions.

In one embodiment of the probe pin
The center line of the pair of legs along the longitudinal direction and the center line of the elastic portion along the longitudinal direction are deviated from each other.

According to the probe pin of the above embodiment, the center line along the longitudinal direction is different from the state where the pair of legs are arranged so that the center line along the longitudinal direction coincides with the center line along the longitudinal direction of the elastic portion. In the state where the pair of legs are arranged so as not to coincide with the center line along the longitudinal direction of the elastic part and to be offset from each other, it is possible to correspond to a narrow pitch in which the pitch of two adjacent concave contacts of the inspection object is narrowed. it can.

In one embodiment of the probe pin
Each of the pair of contact portions of the pair of legs of the first contact portion has a curved surface.

According to the probe pin of the above embodiment, the pair of legs can be smoothly guided to the concave contact.

In one embodiment of the probe pin
At least one of the surfaces of the pair of legs of the first contact portion opposite to the surfaces of the pair of contact portions facing each other has inclined surfaces that approach each other in the urging direction of the elastic portion. are doing.

According to the probe pin of the above embodiment, the pair of legs can be smoothly guided to the concave contact.

The probe pin of the present invention can be applied to, for example, an inspection unit used for inspecting a liquid crystal panel having a female connector as a terminal.

1 Socket 2 Storage part 3 Groove part 4 Through hole 10 Probe pin 20 Elastic part 120 Coil spring 21 Straight part 22 Curved part 23 Through hole 221 First curved part 222 Second curved part 30, 130 First contact part 31 Support part 32, 33, 132, 133 Legs 321,331 Contact 34 Gap 35 Curved surface 36 Inclined surface 37 Insertion 38 Through hole 40,140 Second contact 41 Base 42 Protrusion 43 Through hole 44,45 Elastic piece 46,47 Projection 70 Contact connection part 71 Leg connection part 72 Curved surface 73 Inclined surface 80 Inspection object 81 Concave contact 82, 83 Contact part 84 Gap 90 Board 91 Terminal CL0 Center line (socket)
CL1 center line (elastic part)
CL2 center line (pair of legs)
L1 (connecting the vertices of the first curved part) Straight line L2 (connecting the vertices of the second curved part) Straight line W1 Width of the elastic part W2 Width of the supporting part P1 (between the protruding parts of the adjacent probe pins) Pitch P2 (adjacent) Pitch (between the legs of the probe pin)

Claims (5)

An elastic part that expands and contracts along the longitudinal direction,
It has a pair of legs extending from one end of the elastic portion along the longitudinal direction and flexing in a direction approaching each other, and is arranged at the tips of the pair of legs and via the pair of legs. A first contact portion having a pair of contact portions that are urged by the elastic portion in a direction along the longitudinal direction and that can contact the concave contact of the inspection object.
A second contact portion arranged at the other end of the elastic portion, urged by the elastic portion in a direction opposite to the urging direction of the first contact portion, and electrically connected to the first contact portion.
With
There is a gap between the pair of legs,
A probe pin in which the first contact portion has a contact connecting portion for connecting the pair of contact portions of the pair of legs. The probe pin according to claim 1, wherein the first contact portion is provided at a boundary between the pair of legs and the pair of contact portions, and has a leg connecting portion that connects the pair of legs. The probe pin according to claim 1 or 2, wherein the center line of the pair of legs along the longitudinal direction and the center line of the elastic portion along the longitudinal direction are deviated from each other. The probe pin according to any one of claims 1 to 3, wherein each of the pair of contact portions of the pair of legs of the first contact portion has a curved surface. The pair of legs of the first contact portion, the pair of legs, on at least one of the surfaces of the pair of legs opposite to each other, as the elastic portion is urged. The probe pin according to any one of claims 1 to 4, which is provided with an inclined surface approaching a center line along the longitudinal direction.

Images