JPH11133060A - Testing terminal - Google Patents
Testing terminalInfo
- Publication number
- JPH11133060A JPH11133060A JP9299744A JP29974497A JPH11133060A JP H11133060 A JPH11133060 A JP H11133060A JP 9299744 A JP9299744 A JP 9299744A JP 29974497 A JP29974497 A JP 29974497A JP H11133060 A JPH11133060 A JP H11133060A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- test
- test terminal
- terminals
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【発明の属する技術分野】この発明はテスト用端子に関
し、特にプリント基板及びそれに実装する電気・電子機
器等の導通テストをするための端子に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test terminal, and more particularly, to a terminal for conducting a continuity test of a printed circuit board and an electric / electronic device mounted thereon.
【0002】[0002]
【従来の技術】プリント基板やそれに実装する電気・電
子機器は、導通テストを行う必要性に迫られることがあ
る。その場合、それらの端子部の間隔がきわめて微小サ
イズであることが多いため、従来では、微細な径のパイ
プ内にコイルスプリングを挿入し、そのスプリング力で
パイプ端部から突出するニードルを導通線に適宜接続し
てそのニードルを端子部に当てて接触させ、導通を試し
ていた。2. Description of the Related Art In some cases, it is necessary to conduct a continuity test on a printed circuit board and electric / electronic devices mounted thereon. In such a case, since the distance between the terminal portions is often extremely small, conventionally, a coil spring is inserted into a pipe having a small diameter, and a needle protruding from the end of the pipe due to the spring force is connected to a conductive wire. , And the needle was brought into contact with the terminal portion to make contact with it, thereby testing the conduction.
【0003】[0003]
【発明が解決しようとする課題】しかしながら、微細な
パイプにコイルスプリングとニードルを挿入すること自
体が難儀な仕業であるから、テスト用端子の製造コスト
がかかり、しかも、パイプはニードルよりも径大である
から単純にそれを横に整列させても、ニードル自体を整
列させたものよりもピッチ間隔が大きくなるので、ピッ
チ間隔はおのずと制約されたものになり、したがって、
ニードルのピッチ間隔で端子部が形成されているような
素子の導通テストは、端子部の一つ々々毎直接にテスト
用端子を当てて行わねばならなかった。そのため、導通
テスト自体に時間を要して非能率的であった。However, since it is difficult to insert the coil spring and the needle into the fine pipe itself, the production cost of the test terminal is increased, and the pipe is larger in diameter than the needle. Therefore, simply aligning it sideways will result in a larger pitch interval than the needle itself, so the pitch interval will naturally be constrained,
A continuity test of an element in which terminals are formed at needle pitch intervals has to be performed by directly applying a test terminal to each of the terminals. Therefore, the continuity test itself takes time and is inefficient.
【0004】そこで、この発明は、素子等の端子部のピ
ッチ間隔が如何様に微細であっても、それに対処できる
テスト用端子を提供する。Accordingly, the present invention provides a test terminal capable of coping with a fine pitch interval between terminal portions of an element or the like.
【0005】[0005]
【課題を解決するための手段】この発明にかかるテスト
用端子は、導通線に接続する結線部を備えた上部と、端
子部に接触する接触部を具えた下部と、前記上部と下部
との間で上下方向で弾性を保持可能な中間部とが、金属
薄板で一体成形されていることを特徴とする。According to the present invention, there is provided a test terminal comprising: an upper portion provided with a connection portion connected to a conductive line; a lower portion provided with a contact portion contacting the terminal portion; A middle portion capable of holding elasticity in the up-down direction between them is integrally formed of a thin metal plate.
【0006】そして、前記中間部の形状が略S字形であ
ることを特徴とし、また、少なくとも前記上部に透孔が
穿設されていることを特徴とするとともに、前記金属薄
板の複数枚を、それらの間に電気絶縁性の高い絶縁板を
介在し重ね合わせて締結し、電気・電子機器の端子部の
数に相応する接触部を具えたブロックを形成したことを
特徴とする。[0006] The intermediate portion is substantially S-shaped, and at least a through hole is formed in the upper portion. It is characterized in that an insulating plate having high electrical insulation is interposed between them, and they are overlapped and fastened to form a block having contact portions corresponding to the number of terminals of the electric / electronic device.
【0007】したがって、金属薄板の肉厚を選択するこ
とにより、素子等の端子部のピッチ間隔が如何様であ
れ、それに対処できるピッチ間隔の接触部を形成できる
というものである。Therefore, by selecting the thickness of the thin metal plate, it is possible to form a contact portion having a pitch interval that can cope with the pitch interval of the terminal portion of the element or the like, regardless of the pitch interval.
【0008】[0008]
【発明の実施の形態】以下、この発明の実施の形態につ
き、図を参照して説明する。図1に示すように、テスト
用端子1は略方形の上部2と、先鋭な略三角形の接触部
4を形成した略方形の下部3と、上部2と下部3を弾性
的に結ぶ中間部5とを一体成形した金属薄板からなる。
上部2には導通線を接続するのに適するような結線部6
を一体に成形し、かつ、重ね合わせて連結する際の位置
決めのための角形の透孔7を穿設してあり、また、下部
3の接触部4は素子等の端子部8(図2参照)に接触で
きる。中間部5は略S字形に打ち抜かれて上部2と下部
3との間で連続して一体で介在し、上部2又は下部3に
圧力を加えると、S字が撓んで変形することができてそ
の圧力を吸収できる。接触部4は略三角錐形に形成され
ている。Embodiments of the present invention will be described below with reference to the drawings. As shown in FIG. 1, the test terminal 1 has a substantially rectangular upper part 2, a substantially rectangular lower part 3 having a sharply triangular contact part 4, and an intermediate part 5 elastically connecting the upper part 2 and the lower part 3. And a sheet metal integrally formed.
The upper part 2 has a connection portion 6 suitable for connecting a conductive line.
Are formed integrally, and a rectangular through hole 7 for positioning when overlapping and connecting is formed, and the contact portion 4 of the lower portion 3 is a terminal portion 8 of an element or the like (see FIG. 2). ) Can be contacted. The intermediate portion 5 is stamped into a substantially S-shape and intervenes continuously and integrally between the upper portion 2 and the lower portion 3. When pressure is applied to the upper portion 2 or the lower portion 3, the S-shape can be bent and deformed. It can absorb that pressure. The contact portion 4 is formed in a substantially triangular pyramid shape.
【0009】なお、接触部4は右側の一端部に成形した
が、これを仮想線図示のように1枚毎順次、左側の端部
に向けて変位させた4種類のテスト用端子1を成形して
もよい。また、結線部6は左側に傾斜させた配置として
もよい。上部2と下部3を略方形としたのは、複数枚の
テスト用端子1を重ねて一体化する際にまとまりやすく
するためであり、その際、前記透孔7に断面角形のロッ
ド13を挿通して締結すれば接触部4が整然と整列でき
るようにしたものである。そして、中間部5の形状はS
字形としたが、必要とする弾性の程度によりては、図3
に示すようなZ字形、若しくは図4に示すようなΣ字形
でもよい。Although the contact portion 4 is formed at the right end, four types of test terminals 1 are formed by sequentially displacing the contact portions 4 toward the left end as shown in phantom lines. May be. Further, the connection portion 6 may be arranged to be inclined leftward. The reason why the upper part 2 and the lower part 3 are substantially rectangular is to make it easier to unite when a plurality of test terminals 1 are stacked and integrated, and in this case, a rod 13 having a rectangular cross section is inserted into the through hole 7. Then, the contact portions 4 can be neatly aligned. The shape of the intermediate part 5 is S
Although it is shaped like a letter, depending on the required degree of elasticity, FIG.
, Or a Σ shape as shown in FIG.
【0010】このテスト用端子1は、導電性の高い所望
の肉厚の金属板をプレス等にて打ち抜き成形したもの
で、例えば肉厚が0.05mm程度のタングステン等の
比較的硬い薄板からなるが、その肉厚寸法を限定するも
のではない。したがって、上記1枚のテスト用端子1を
単体として導通テストに用いることができるのは勿論の
こと、図5〜図7に示すように、テスト用端子1の複数
枚を、それぞれの間に硬質の素材からなり、透孔7と一
致する透孔10を形成した電気絶縁性の高い絶縁板9を
挟み重ね合わせてコ字形のホルダー11で一体にまと
め、該ホルダー11の外側から透孔7に角形のロッド1
3を挿通してその両端部をホルダー11と一体化した端
子ブロック17を形成することができる。ホルダー11
は結線部6を上方に向けて突出させるための開口部12
を有する。なお、テスト用端子1の肉厚が極薄板でない
場合には、図8に示すように、ロッド13の両端部にね
じ部14を形成し、このねじ部14に螺合するナット1
6をホルダー11との間にワッシャ15を介在させて締
結することができる。The test terminal 1 is formed by stamping a metal plate having a desired thickness with high conductivity by a press or the like, and is made of a relatively hard thin plate such as tungsten having a thickness of about 0.05 mm. However, the thickness dimension is not limited. Therefore, not only can the single test terminal 1 be used alone for a continuity test, but also, as shown in FIGS. A highly electrically insulating insulating plate 9 having a through-hole 10 corresponding to the through-hole 7 is sandwiched and overlapped, and integrated together by a U-shaped holder 11. Square rod 1
3, the terminal block 17 having both ends integrated with the holder 11 can be formed. Holder 11
Is an opening 12 for projecting the connection portion 6 upward.
Having. In the case where the thickness of the test terminal 1 is not an extremely thin plate, as shown in FIG. 8, threaded portions 14 are formed at both ends of the rod 13, and the nut 1 to be screwed to the threaded portion 14 is formed.
6 can be fastened to the holder 11 with the washer 15 interposed therebetween.
【0011】また、端子ブロック17を形成するための
他の例としては、図9に示すように、上部2の相対向す
る両側部に三角形状等任意の切欠部2a,2aを形成す
る一方、この切欠部2aが係合する三角形状等任意の突
起部20を内面に相対向して形成した合成樹脂等の絶縁
部材からなる断面コ字形のホルダー21を形成し、テス
ト用端子1の切欠部2aを突起部20に係合させて複数
枚のテスト用端子1を間に絶縁板を介在させてホルダー
21に保持させた単体又はその単体の複数個を適宜一体
的にまとめるようにしてもよい。As another example for forming the terminal block 17, as shown in FIG. 9, arbitrary notches 2a, 2a such as triangles are formed on opposite sides of the upper part 2 while A notch portion of the test terminal 1 is formed by forming a holder 21 having a U-shaped cross section made of an insulating member such as a synthetic resin in which an arbitrary protrusion portion 20 such as a triangular shape with which the notch portion 2a is engaged is formed on the inner surface thereof so as to face each other. The unit 2a may be engaged with the protruding portion 20, and a plurality of test terminals 1 may be held by the holder 21 with an insulating plate interposed therebetween and a single unit or a plurality of the single units may be appropriately integrated. .
【0012】このように端子ブロック17を形成する場
合、絶縁板9の肉厚は任意に選択できるから、接触部4
のピッチ間隔は自在に変更できることになる。したがっ
て、素子等の端子部8の数に相応する枚数のテスト用端
子1を絶縁板9を介在させて一つの端子ブロック17を
形成すれば、素子等の端子部導通テストが一度で済む利
点がある。さらに、接触部4の配置について前記したよ
うな4種類のテスト用端子1を用い、図10に示すよう
に、1枚毎に位置をずらせてジグザグ状配置としてもよ
く、また、図11に示すように、1枚毎斜め右方向へ段
違いに移相させた2つのテスト用端子ブロック18,1
8を並列して横幅の大きな一つのホルダー11aにまと
めたものとしてもよい。When the terminal block 17 is formed as described above, the thickness of the insulating plate 9 can be arbitrarily selected.
Can be freely changed. Therefore, if one terminal block 17 is formed with a number of test terminals 1 corresponding to the number of terminal portions 8 such as elements with the insulating plate 9 interposed therebetween, there is an advantage that the terminal portion continuity test of the elements etc. can be performed only once. is there. Furthermore, the four types of test terminals 1 described above for the arrangement of the contact portions 4 may be used, and the positions may be shifted one by one as shown in FIG. 10 to form a zigzag arrangement, or as shown in FIG. As described above, the two test terminal blocks 18, 1 each having a phase shifted diagonally to the right in a stepwise manner.
8 may be arranged side by side in one large holder 11a.
【0013】そこで、図12に示すように、端子ブロッ
ク17の接触部4を素子19等の端子部8に所定の圧力
で接触させると、各テスト用端子1は、図2に示すよう
に、中間部5が撓んでその圧力を緩和・吸収することが
できる。したがって、複数の端子部8に高低差があって
もそれに影響されることなく、すべての接触部4が端子
部9から反発して離れるのを阻止し、確実な導通テスト
を行うことができる。Therefore, as shown in FIG. 12, when the contact portion 4 of the terminal block 17 is brought into contact with the terminal portion 8 such as the element 19 at a predetermined pressure, each test terminal 1 becomes, as shown in FIG. The intermediate portion 5 is bent, so that the pressure can be reduced and absorbed. Therefore, even if there is a difference in height between the plurality of terminal portions 8, it is possible to prevent all the contact portions 4 from repelling and separating from the terminal portions 9 without being influenced by the difference in height, thereby performing a reliable conduction test.
【0014】[0014]
【発明の効果】以上説明したこの発明によれば、金属薄
板からなるのでその肉厚を選択してその複数枚を絶縁板
を介在して重ね合わせれば、素子等の如何様なピッチ間
隔の端子部にも適用できる端子ブロックを得ることがで
き、しかも、構造単純にして生産性も良好で安価に提供
できる。また、弾性部を一体成形することにより、接触
部が端子部に反発することなく接触するのに最適の弾性
を持つ形状とすることも容易かつ簡便にでき、総じて確
実な導通テストを可能にする。According to the present invention described above, since a thin metal plate is selected and its thickness is selected and a plurality of the thin plates are overlapped with an insulating plate interposed therebetween, terminals having any pitch interval such as elements can be obtained. A terminal block which can be applied to the portion can be obtained, and the structure can be simplified, the productivity can be improved, and the cost can be reduced. In addition, by integrally molding the elastic portion, the contact portion can be easily and easily made to have a shape having optimal elasticity so as to make contact with the terminal portion without repelling, thereby enabling a reliable conduction test as a whole. .
【図1】この発明にかかるテスト用端子の正面図(A)
及び側面図(B)FIG. 1 is a front view (A) of a test terminal according to the present invention.
And side view (B)
【図2】テスト用端子の作用説明図FIG. 2 is a diagram illustrating the operation of a test terminal.
【図3】テスト用端子の他の例を示す正面図FIG. 3 is a front view showing another example of the test terminal.
【図4】テスト用端子の更に他の例を示す正面図FIG. 4 is a front view showing still another example of the test terminal.
【図5】端子ブロックの分解斜視図FIG. 5 is an exploded perspective view of a terminal block.
【図6】端子ブロックの側面図FIG. 6 is a side view of a terminal block.
【図7】端子ブロックの横断面図FIG. 7 is a cross-sectional view of a terminal block.
【図8】端子ブロックの他の例を示す分解斜視図FIG. 8 is an exploded perspective view showing another example of the terminal block.
【図9】端子ブロックの更に他の例を示す分解斜視図FIG. 9 is an exploded perspective view showing still another example of the terminal block.
【図10】端子ブロックにおける接触部の配置を示す底
面図FIG. 10 is a bottom view showing the arrangement of contact portions in the terminal block.
【図11】端子ブロックにおける接触部の他の配置を示
す底面図FIG. 11 is a bottom view showing another arrangement of the contact portion in the terminal block.
【図12】端子ブロックの作用説明図FIG. 12 is a diagram illustrating the operation of a terminal block.
1…テスト用端子 2…上部 3…下部 4…接触部 5…中間部 6…結線部 7,10…透孔 9…絶縁板 11,11a…ホルダー 12…開口部 13…棒 DESCRIPTION OF SYMBOLS 1 ... Test terminal 2 ... Upper part 3 ... Lower part 4 ... Contact part 5 ... Intermediate part 6 ... Connection part 7, 10 ... Through-hole 9 ... Insulating plate 11, 11a ... Holder 12 ... Opening 13 ... Rod
Claims (4)
と、端子部に接触する接触部を具えた下部と、前記上部
と下部との間で上下方向で弾性を保持可能な中間部と
が、金属薄板で一体成形されていることを特徴とするテ
スト用端子。1. An upper portion having a connection portion connected to a conductive line, a lower portion having a contact portion contacting a terminal portion, and an intermediate portion capable of maintaining elasticity in a vertical direction between the upper portion and the lower portion. A test terminal, which is integrally formed of a thin metal plate.
を特徴とする請求項1記載のテスト用端子。2. The test terminal according to claim 1, wherein the shape of the intermediate portion is substantially S-shaped.
いることを特徴とする請求項1記載のテスト用端子。3. The test terminal according to claim 1, wherein a through hole is formed in at least the upper part.
電気絶縁性の高い絶縁板を介在し重ね合わせて締結し、
電気・電子機器の端子部の数に相応する先鋭端部を具え
たブロックを形成したことを特徴とする請求項1,2又
は3記載のテスト用端子。4. A plurality of thin metal sheets are overlapped and fastened by interposing an insulating plate having high electrical insulation therebetween.
4. The test terminal according to claim 1, wherein a block having sharp ends corresponding to the number of terminals of the electric / electronic device is formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9299744A JPH11133060A (en) | 1997-10-31 | 1997-10-31 | Testing terminal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9299744A JPH11133060A (en) | 1997-10-31 | 1997-10-31 | Testing terminal |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH11133060A true JPH11133060A (en) | 1999-05-21 |
Family
ID=17876454
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9299744A Pending JPH11133060A (en) | 1997-10-31 | 1997-10-31 | Testing terminal |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH11133060A (en) |
Cited By (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001091537A (en) * | 1999-09-24 | 2001-04-06 | Isao Kimoto | Contact and contact assembly using it |
JP2002296295A (en) * | 2001-03-29 | 2002-10-09 | Isao Kimoto | Contact-holding structure for contact assembly |
JP2003057264A (en) * | 2001-08-13 | 2003-02-26 | Micronics Japan Co Ltd | Contactor and probe card |
JP2004138391A (en) * | 2002-10-15 | 2004-05-13 | Renesas Technology Corp | Method for manufacturing semiconductor device |
WO2006088131A1 (en) * | 2005-02-18 | 2006-08-24 | Nhk Spring Co., Ltd. | Conductive terminal unit and conductive terminal |
WO2007060939A1 (en) * | 2005-11-22 | 2007-05-31 | Nhk Spring Co., Ltd. | Conductive contact unit, and conductive contact |
WO2007094237A1 (en) * | 2006-02-17 | 2007-08-23 | Nhk Spring Co., Ltd. | Electrically conductive contact and electrically conductive contact unit |
WO2007100059A1 (en) * | 2006-03-03 | 2007-09-07 | Nhk Spring Co., Ltd. | Conductive contact unit |
WO2007102401A1 (en) * | 2006-03-03 | 2007-09-13 | Nhk Spring Co., Ltd. | Conductive contact unit |
JP2007303969A (en) * | 2006-05-11 | 2007-11-22 | Micronics Japan Co Ltd | Probe and probe assembly |
WO2008020565A1 (en) * | 2006-08-18 | 2008-02-21 | Nhk Spring Co., Ltd. | Conductive contactor unit |
WO2008020564A1 (en) * | 2006-08-18 | 2008-02-21 | Nhk Spring Co., Ltd. | Conductive contactor and conductive contactor unit |
WO2008133089A1 (en) * | 2007-04-20 | 2008-11-06 | Nhk Spring Co., Ltd. | Conductive contact unit |
US7449906B2 (en) | 2003-05-13 | 2008-11-11 | Kabushiki Kaisha Nihon Micronics | Probe for testing an electrical device |
JP2009014480A (en) * | 2007-07-04 | 2009-01-22 | Koyo Technos:Kk | Inspection tool |
JP2009244139A (en) * | 2008-03-31 | 2009-10-22 | Micronics Japan Co Ltd | Test socket |
JP2010008335A (en) * | 2008-06-30 | 2010-01-14 | Japan Electronic Materials Corp | Probe card |
JP2010256255A (en) * | 2009-04-28 | 2010-11-11 | Kiyota Seisakusho:Kk | Laminated probe |
JP2013255985A (en) * | 2012-04-03 | 2013-12-26 | Dainippon Printing Co Ltd | Needle body fixture including plurality of projected needles, and manufacturing method of the same |
JP2014074674A (en) * | 2012-10-05 | 2014-04-24 | Mitsubishi Electric Corp | Laminated probe |
JP2016164491A (en) * | 2015-03-06 | 2016-09-08 | 三菱電機株式会社 | Semiconductor device inspection tool |
CN106153988A (en) * | 2016-06-24 | 2016-11-23 | 段超毅 | Contact conducting structure, contact conducting device and plate are to board test device |
KR101872817B1 (en) * | 2018-04-20 | 2018-06-29 | (주)에이치엠티 | Integral probe pin assembly for pin block |
KR101940599B1 (en) * | 2018-03-07 | 2019-01-21 | (주)티에스이 | Probe card and method for manufacturing the same |
KR20190009277A (en) * | 2016-06-17 | 2019-01-28 | 오므론 가부시키가이샤 | Probe pin |
JP2020170008A (en) * | 2016-06-17 | 2020-10-15 | オムロン株式会社 | Probe pin |
JP2020180889A (en) * | 2019-04-25 | 2020-11-05 | オムロン株式会社 | Probe pin, inspection jig, and inspection unit |
-
1997
- 1997-10-31 JP JP9299744A patent/JPH11133060A/en active Pending
Cited By (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001091537A (en) * | 1999-09-24 | 2001-04-06 | Isao Kimoto | Contact and contact assembly using it |
JP2002296295A (en) * | 2001-03-29 | 2002-10-09 | Isao Kimoto | Contact-holding structure for contact assembly |
JP2003057264A (en) * | 2001-08-13 | 2003-02-26 | Micronics Japan Co Ltd | Contactor and probe card |
JP2004138391A (en) * | 2002-10-15 | 2004-05-13 | Renesas Technology Corp | Method for manufacturing semiconductor device |
US7449906B2 (en) | 2003-05-13 | 2008-11-11 | Kabushiki Kaisha Nihon Micronics | Probe for testing an electrical device |
WO2006088131A1 (en) * | 2005-02-18 | 2006-08-24 | Nhk Spring Co., Ltd. | Conductive terminal unit and conductive terminal |
JP2006226907A (en) * | 2005-02-18 | 2006-08-31 | Nhk Spring Co Ltd | Conductive contact unit and conductive contact |
KR100950789B1 (en) * | 2005-02-18 | 2010-04-02 | 니혼 하츠쵸 가부시키가이샤 | Conductive terminal unit and conductive terminal |
US7866986B2 (en) | 2005-11-22 | 2011-01-11 | Nhk Spring Co., Ltd. | Conductive contact unit and conductive contact |
WO2007060939A1 (en) * | 2005-11-22 | 2007-05-31 | Nhk Spring Co., Ltd. | Conductive contact unit, and conductive contact |
JP2007139711A (en) * | 2005-11-22 | 2007-06-07 | Nhk Spring Co Ltd | Conductive contactor unit and conductive contactor |
KR100976147B1 (en) * | 2005-11-22 | 2010-08-16 | 니혼 하츠쵸 가부시키가이샤 | Conductive contact unit, and conductive contact |
WO2007094237A1 (en) * | 2006-02-17 | 2007-08-23 | Nhk Spring Co., Ltd. | Electrically conductive contact and electrically conductive contact unit |
KR101012732B1 (en) * | 2006-02-17 | 2011-02-09 | 니혼 하츠쵸 가부시키가이샤 | Electrically conductive contact and electrically conductive contact unit |
US7942677B2 (en) | 2006-02-17 | 2011-05-17 | Nhk Spring Co., Ltd. | Conductive contact and conductive contact unit |
TWI384224B (en) * | 2006-02-17 | 2013-02-01 | Nhk Spring Co Ltd | Conductive contact element unit |
JP2007218776A (en) * | 2006-02-17 | 2007-08-30 | Nhk Spring Co Ltd | Conductive contact and conductive contact unit |
JP5095604B2 (en) * | 2006-03-03 | 2012-12-12 | 日本発條株式会社 | Conductive contact unit |
KR101013170B1 (en) * | 2006-03-03 | 2011-02-10 | 니혼 하츠쵸 가부시키가이샤 | Conductive contact unit |
JP5179347B2 (en) * | 2006-03-03 | 2013-04-10 | 日本発條株式会社 | Conductive contact unit |
WO2007100059A1 (en) * | 2006-03-03 | 2007-09-07 | Nhk Spring Co., Ltd. | Conductive contact unit |
WO2007102401A1 (en) * | 2006-03-03 | 2007-09-13 | Nhk Spring Co., Ltd. | Conductive contact unit |
US7955122B2 (en) | 2006-03-03 | 2011-06-07 | Nhk Spring Co., Ltd. | Conductive contact unit |
US7789707B2 (en) | 2006-03-03 | 2010-09-07 | Nhk Spring Co., Ltd. | Conductive contact unit |
KR100866644B1 (en) * | 2006-05-11 | 2008-11-03 | 가부시키가이샤 니혼 마이크로닉스 | Probe and Probe Assembly |
JP2007303969A (en) * | 2006-05-11 | 2007-11-22 | Micronics Japan Co Ltd | Probe and probe assembly |
JP2008046044A (en) * | 2006-08-18 | 2008-02-28 | Nhk Spring Co Ltd | Conductive contact and conductive contact unit |
JP2008046045A (en) * | 2006-08-18 | 2008-02-28 | Nhk Spring Co Ltd | Conductive contact unit |
WO2008020564A1 (en) * | 2006-08-18 | 2008-02-21 | Nhk Spring Co., Ltd. | Conductive contactor and conductive contactor unit |
WO2008020565A1 (en) * | 2006-08-18 | 2008-02-21 | Nhk Spring Co., Ltd. | Conductive contactor unit |
KR101000426B1 (en) | 2006-08-18 | 2010-12-13 | 니혼 하츠쵸 가부시키가이샤 | Conductive contactor and conductive contactor unit |
WO2008133089A1 (en) * | 2007-04-20 | 2008-11-06 | Nhk Spring Co., Ltd. | Conductive contact unit |
JP2009014480A (en) * | 2007-07-04 | 2009-01-22 | Koyo Technos:Kk | Inspection tool |
JP2009244139A (en) * | 2008-03-31 | 2009-10-22 | Micronics Japan Co Ltd | Test socket |
JP2010008335A (en) * | 2008-06-30 | 2010-01-14 | Japan Electronic Materials Corp | Probe card |
JP2010256255A (en) * | 2009-04-28 | 2010-11-11 | Kiyota Seisakusho:Kk | Laminated probe |
JP2013255985A (en) * | 2012-04-03 | 2013-12-26 | Dainippon Printing Co Ltd | Needle body fixture including plurality of projected needles, and manufacturing method of the same |
JP2014074674A (en) * | 2012-10-05 | 2014-04-24 | Mitsubishi Electric Corp | Laminated probe |
JP2016164491A (en) * | 2015-03-06 | 2016-09-08 | 三菱電機株式会社 | Semiconductor device inspection tool |
KR20190009277A (en) * | 2016-06-17 | 2019-01-28 | 오므론 가부시키가이샤 | Probe pin |
JP2020170008A (en) * | 2016-06-17 | 2020-10-15 | オムロン株式会社 | Probe pin |
CN106153988A (en) * | 2016-06-24 | 2016-11-23 | 段超毅 | Contact conducting structure, contact conducting device and plate are to board test device |
KR101940599B1 (en) * | 2018-03-07 | 2019-01-21 | (주)티에스이 | Probe card and method for manufacturing the same |
KR101872817B1 (en) * | 2018-04-20 | 2018-06-29 | (주)에이치엠티 | Integral probe pin assembly for pin block |
JP2020180889A (en) * | 2019-04-25 | 2020-11-05 | オムロン株式会社 | Probe pin, inspection jig, and inspection unit |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH11133060A (en) | Testing terminal | |
US4144648A (en) | Connector | |
US3474389A (en) | Electric connector | |
JPH07254462A (en) | Electric connector | |
US3123664A (en) | Multiple barrel electrical connector | |
US4872851A (en) | Electrical connector with torsional contacts | |
US5453700A (en) | Test clip contact arrangement | |
US5181852A (en) | Programmable input-output electrical connector | |
US3059153A (en) | Printed circuit board restraining means | |
JP4814029B2 (en) | Terminal block short-circuit device | |
JP2000156269A (en) | Socket for semiconductor | |
JP4505342B2 (en) | Electrical connection device | |
DE60304390T2 (en) | electronic module | |
US20120287591A1 (en) | Connection member | |
JP3456187B2 (en) | Electrical junction box | |
JPH11317270A (en) | Contact pin and electric component socket using same | |
CN212514717U (en) | Small-interval compression joint detects uses elasticity flat probe and detection instrument | |
JP7240901B2 (en) | IDC connector | |
US5095406A (en) | Circuit board arrangement for electronic/electromechanical apparatus | |
US4533206A (en) | Flexible printed circuit connector | |
JPH11185913A (en) | Bga package socket | |
JP2729691B2 (en) | connector | |
JPH03147250A (en) | Battery fitting device | |
JP2005513789A (en) | Method and apparatus for connecting circuit boards of a sensor assembly | |
JPH0631082U (en) | Wire bond contacts |