CN212514717U - Small-interval compression joint detects uses elasticity flat probe and detection instrument - Google Patents

Abstract

The utility model discloses a small interval crimping detects uses elasticity flat probe and detection instrument, this probe includes: a first connection part extending along a length direction of the probe; one end of the first contact part is connected with the first connecting part, and the other end of the first contact part is provided with a first contact part of which the extending direction is crossed with the extending direction of the first contact part; one end of the second connecting part is connected with the first connecting part, and the second connecting part and the first contact part are positioned on the same side of the first connecting part; one end of the second contact part is connected with the other end of the second connecting part, and the other end of the second contact part is provided with a second contact part of which the extending direction is crossed with the extending direction of the second contact part; the second and first contact parts are respectively located on different sides of the second connection part and can deform along the direction close to the second connection part when the contact part of each end part is in contact with an external object and is stressed. The utility model discloses can ensure to inspection object thing and inspection device's contact reliability and can be applicable to the crimping test of small interval product.

Description

Small-interval compression joint detects uses elasticity flat probe and detection instrument

Technical Field

The utility model belongs to the technical field of signal transmission and test, more specifically relates to a crimping of little spacing of product detects used elasticity flat probe and detection instrument.

Background

In the manufacturing process of electronic component modules such as liquid crystal panels, integrated circuits, and semiconductors, it is often necessary to perform processes such as conduction detection and operation characteristic inspection, and this generally requires that a main substrate of the electronic component module be connected to contact electrodes of a Flexible Printed Circuit (FPC) using probes, or that an electrode portion of the main substrate be connected to an inspection device, and during testing, one end of each probe is directly contacted to a gold finger on the main substrate of a product to be tested, and the other end is contacted to a Pad point on a relay PCB or an FPC, and the electronic component module is connected to the inspection device by relay of the PCB or the FPC, thereby forming a via, and completing the corresponding detection operation.

Under a common condition, a common probe needs to be provided with a pair of contacts which can be respectively contacted with a gold finger on a tested product, a Pad point on a switching PCB and a Pad point on an FPC, and the pair of contacts can generate elastic deformation after being stressed, so that the contact pressure between the contacts and the gold finger on the tested product, the Pad point on the switching PCB and the Pad point on the FPC is ensured, and the contact reliability of the gold finger on the tested product, the Pad point on the switching PCB and the Pad point on the FPC is improved.

With the miniaturization and integration design of products such as integrated circuits, semiconductors and the like, the distance between gold fingers for pressure test on the products is smaller and smaller, and the structural form of a conventional flat probe can not meet the detection requirement.

SUMMERY OF THE UTILITY MODEL

To at least one defect or improvement demand of prior art, the utility model provides a small interval crimping detects with elasticity flat probe and detection instrument can ensure to the contact reliability of inspection object thing and inspection device and can be applicable to the crimping test of small interval product.

In order to achieve the above object, according to an aspect of the present invention, there is provided an elastic flat probe for detecting a micro gap crimp, including:

a first connection part extending along a length direction of the probe;

a first contact portion having one end connected to a first end of the first connection portion and extending in a direction crossing the longitudinal direction, and having a first contact portion at the other end, the extending direction of the first contact portion crossing the extending direction of the first contact portion;

a second connecting portion, one end of which is connected to the second end of the first connecting portion and extends along a direction intersecting the length direction, and the second connecting portion and the first contact portion are located on the same side of the first connecting portion in the length direction;

a second contact portion having one end connected to the other end of the second connection portion and extending in a direction close to the first connection portion, the other end having a second contact portion whose extending direction intersects with the extending direction of the second contact portion;

the second contact part and the first contact part are respectively positioned on different sides of the second connecting part and can be deformed along the direction close to the second connecting part when the contact part at the end part of each contact part is in contact with an external object and is stressed.

Preferably, in the elastic flat probe for fine pitch pressure bonding detection, a limit boss is provided at a connection portion between the first contact portion and the first connection portion, the limit boss is located in a region surrounded by the first contact portion, the first connection portion, and the second connection portion, extends in a direction intersecting the longitudinal direction, and has a gap with the first contact portion.

Preferably, in the elastic flat probe for fine pitch crimp detection, an included angle between the first contact portion and the limiting boss in an unstressed state is greater than 0 degree and less than or equal to 5 degrees.

Preferably, the elastic flat probe for fine pitch crimp detection is characterized in that an angle between the second contact portion and the second connection portion in an unstressed state is greater than 0 degree and equal to or less than 5 degrees.

Preferably, in the elastic flat probe for fine pitch pressure welding detection, a clamping boss is formed on a surface of a connection portion of the second connection portion and the second contact portion, the surface being close to the first contact portion.

Preferably, in the elastic flat probe for fine pitch crimp detection, one or more positioning bosses are provided on a surface of the first connection portion on a side away from the first contact portion/the second contact portion, and the positioning bosses protrude from a surface of the first connection portion.

Preferably, in the elastic flat probe for fine pitch pressure bonding detection, one or more notches are formed in a surface of the first connection portion on a side away from the first contact portion/the second contact portion, and the number of the notches and the extension length of the second contact portion have a predetermined corresponding relationship.

Preferably, in the fine pitch pressure bonding detection elastic flat probe, an auxiliary assembly hole is provided at a joint of the first contact portion and the first connection portion.

According to another aspect of the utility model, still provide a detection instrument, it includes:

the fine pitch crimp detection elastic flat probe described in any one of the above; and the number of the first and second groups,

and the probe fixing block is provided with a clamping groove capable of accommodating the probe, and the probe is accommodated in the clamping groove in a state that the first contact part and the second contact part of the probe protrude out of the surface of the clamping groove.

According to another aspect of the utility model, still provide a detection instrument, it includes:

the fine pitch crimp detection elastic flat probe described in any one of the above; and the number of the first and second groups,

a probe fixing block having a card slot capable of receiving the probe, the probe being received in the card slot with a first contact portion and a second contact portion thereof protruding from the card slot;

the probe fixing block includes:

the first limit groove provides a groove position space for accommodating the limit boss of the probe;

the second limit groove provides a groove space for accommodating the clamping boss of the probe.

Preferably, in the detection tool, an insulating coating is coated on a surface of an area where the probe protrudes from the card slot.

Generally, through the utility model discloses above technical scheme who conceives compares with prior art, can gain following beneficial effect:

(1) the utility model provides an elastic flat probe for detecting the small-interval crimping, a first connecting part extends along the length direction of the probe; one end of the first contact part is connected with the first end of the first connecting part and extends along the direction crossed with the length direction, the other end of the first contact part is provided with a first contact part, and the extending direction of the first contact part is crossed with the extending direction of the first contact part; one end of the second connecting part is connected with the second end of the first connecting part and extends along the direction crossed with the length direction, and the second connecting part and the first contact part are positioned on the same side of the first connecting part; one end of the second contact part is connected with the other end of the second connecting part and extends along the direction close to the first connecting part, and the other end of the second contact part is provided with a second contact part of which the extending direction is crossed with the extending direction of the second contact part; the second contact part and the first contact part are respectively positioned on different sides of the second connecting part and can respectively deform along the direction close to the second connecting part when the contact part at the end part of each contact part is in contact with an external object and is stressed; with this configuration, the probe can be adapted to the pressure contact detection of the fine pitch product, and the thickness of the probe can be adjusted to adapt to the pressure contact test of the fine pitch product having a different pitch.

(2) The utility model discloses a small interval crimping detects uses elasticity flat probe, the length of the second contact site through the adjustment probe makes the contact terminal on the switching object stagger to can make the contact terminal on the switching object do greatly, also can reduce the cost of manufacture of switching object when guaranteeing the contact reliability.

(3) The utility model provides an elasticity flat probe for tiny interval crimping detection, the junction of first contact site and first connecting portion is provided with the spacing boss that is certain angle with first contact site, and this spacing boss has spacing and fixed action, can restrict the deformation degree of first contact site on the one hand, prevents that first contact site from resulting in the first contact site to break when the atress is too big; on the other hand, the probe in the storage state can be fixed, and the phenomena of looseness, infirm fixation and the like of the probe 1 are prevented.

(4) The utility model provides a small interval crimping detects uses elasticity flat probe, the screens boss has been seted up in the joint department of second connecting portion and second contact site, and this screens boss is located a side surface that is close to first contact site, can fix the probe when being in the state of accomodating, prevents that phenomenons such as not hard up, fixed not firm from appearing in the probe.

(5) The utility model provides a detection tool has the probe draw-in groove that the multiunit is used for the holding probe on the probe fixed block, and the spacing groove has been seted up respectively to the upper and lower surface of probe fixed block, uses with spacing boss, the common cooperation of screens boss of probe, can make it can not drop with the probe card on the probe fixed block.

Drawings

Fig. 1 is a schematic three-dimensional structure diagram of an elastic flat probe for detecting a fine pitch crimp provided in an embodiment of the present invention;

fig. 2 is a first schematic structural diagram of a probe according to an embodiment of the present invention;

fig. 3 is a schematic diagram of a second structure of the probe according to the embodiment of the present invention;

fig. 4 is a schematic view of a third structure of the probe provided by the embodiment of the present invention;

fig. 5 is a schematic three-dimensional structure diagram of a detection tool provided by an embodiment of the present invention;

fig. 6 is a schematic view illustrating a process state of accommodating the probe in the card slot according to an embodiment of the present invention;

fig. 7 is a schematic view illustrating a state in which the probe according to the embodiment of the present invention is accommodated in the card slot;

fig. 8 is a schematic view illustrating a deformation condition of the probe compressed by a force when the probe is accommodated in the slot according to the embodiment of the present invention;

fig. 9 is a schematic view of a probe according to an embodiment of the present invention exposed on a partial region of a surface of a card slot;

FIG. 10 is a schematic diagram illustrating an area of an insulating layer coated on a surface of a probe according to an embodiment of the present invention;

fig. 11 is a schematic structural diagram of the first contact portion and the second contact portion in different shapes according to the embodiment of the present invention;

in all the figures, the same reference numerals denote the same features, in particular:

1. a probe;

2. a first contact portion;

21. a first contact portion;

3. a first connection portion;

31. a first end portion;

33. an auxiliary assembly hole;

34. positioning the boss;

35. a notch;

36. a clamping boss;

37. a limiting surface;

38. a limiting boss;

4. a second contact portion;

41. a second contact portion;

5. a second connecting portion;

51. a second end portion;

6. a probe fixing block;

61. a probe card slot;

62. a limiting groove;

63. a lower clamping surface;

64. loading a clamping surface;

F. and (4) external force.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. Furthermore, the technical features mentioned in the embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship indicated based on the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present application, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

The following description is merely exemplary in nature and is not intended to limit the present invention, the applications thereof, or the uses thereof. Further, the drawings are schematic, and the proportions of the respective dimensions and the like do not necessarily coincide with the actual situation.

FIG. 1 is a schematic three-dimensional structure diagram of an elastic flat probe for fine pitch crimp detection provided in this embodiment; 2-4 are two-dimensional structural diagrams of the elastic flat probe for detecting the fine-pitch crimping provided by the embodiment;

referring to fig. 1 to 4, the probe 1 integrally has: a first contact portion 2, a first connection portion 3, a second connection portion 5, and a second contact portion 4;

wherein the first connection portion 3 extends along the length direction of the probe;

one end of the first contact portion 2 is connected to the first end of the first connection portion 3 and extends in a direction intersecting the longitudinal direction, and the other end has a first contact portion 21, and the extending direction of the first contact portion 21 intersects the extending direction of the first contact portion 2;

one end of the second connecting part 5 is connected with the second end of the first connecting part 3 and extends along the direction crossed with the length direction, and the second connecting part 5 and the first contact part 2 are positioned on the same side of the first connecting part 3 in the length direction;

one end of the second contact portion 4 is connected to the other end of the second connection portion 5 and extends in a direction close to the first connection portion 3, and the other end has a second contact portion 41 whose extending direction intersects with the extending direction of the second contact portion 4;

the second contact portion 4 and the first contact portion 2 are located on different sides of the second connection portion 5, respectively, and are deformable in directions approaching the second connection portion, respectively, when the contact portions (21, 41) of the respective ends are subjected to a force upon contact with an external object.

Specifically, the plate-like first contact portion 2 is connected to the first end portion 31 of the first connection portion 3 in the width direction of the probe 1; and a plate-like second contact portion 4 arranged substantially parallel to the first contact portion 2 and connected to a second end 51 of the second connection portion 5 in the width direction of the probe 1.

As shown in fig. 2 to 4, the first contact portion 2 extends along the width direction of the probe 1 (i.e., the left-right direction in fig. 2), and one end portion in the extending direction thereof is connected to the first end portion 31 of the first connection portion 3. A first contact portion 21 is provided at the other end portion in the extending direction of the first contact portion 2, the first contact portion 21 extending in a direction intersecting with the width direction of the probe; as can be seen from fig. 2, the end of the first contact point portion 21 extends upward.

The second contact portion 4 extends in the width direction of the probe 1, and one end portion in the extending direction thereof is connected to the second end portion 51 of the second connection portion 5. A second contact portion 41 is provided at the other end portion in the extending direction of the second contact portion 4, and the extending direction of the second contact portion 41 intersects with the extending direction of the second contact portion 4; as can be seen from fig. 2, the end of the second contact portion 41 extends downward.

The first connecting portion 3 extends from the first end portion 31 along the length direction of the probe (i.e., the up-down direction in fig. 2), one end of the second connecting portion 5 extends from the other end of the first connecting portion 3 along a direction crossing the length direction, and the second connecting portion 5 and the first contact portion 2 are located on the same side of the first connecting portion 3 in the length direction, i.e., the second connecting portion 5 and the first contact portion 2 are both located on the right side of the first connecting portion 3; in a preferred example, the second connecting portion 5 extends in a direction perpendicular to the first connecting portion 3, and the first connecting portion 3 and the second connecting portion 5 form an L-shaped configuration, which is advantageous for reducing the length of the probe 1. The second contact portion 4 extends from the second end portion 51 in the width direction of the probe 1, the extending direction being close to the first connection portion 3;

the end of the second contact portion 4 has a second contact portion 41 that matches the contact terminal of the transfer target, and the second contact portion 4 and the first contact portion 1 are located on different sides of the second connection portion 5, that is, on the upper and lower sides of the second connection portion 5.

The spatial relationship between the first contact portion 2, the second contact portion 4, and the second connection portion 5 and the first connection portion 3 is not strictly limited to a perpendicular relationship, and the first contact portion 2, the second contact portion 4, and the second connection portion 5 are preferably arranged perpendicular to the first connection portion 3 from the viewpoint of reducing the length of the probe 1.

The first contact part 2 is in a strip shape and horizontally arranged in a cantilever shape, and when the first contact part 21 of the first contact part 2 is pressed downwards, the first contact part 2 can deform downwards to generate elastic force, so that the first contact part 21 of the first contact part 2 can be ensured to be in good contact with a detected object.

The second contact portion 4 is elongated and horizontally arranged in a cantilever shape, and when the second contact portion 41 of the second contact portion 4 is pressed upwards, the second contact portion 4 is deformed upwards to generate elastic force, so that the second contact portion 41 of the second contact portion 4 can be ensured to be in good contact with a transfer object.

The probe 1 is a thin plate, has conductivity, and is integrally molded. When the probe 1 is transferred, the first contact portion 21 of the first contact portion 2 is in contact with the contact terminal of the object to be transferred, the second contact portion 41 of the second contact portion 4 is in contact with the contact terminal of the object to be transferred, and the object to be transferred corresponding to the first contact portion 2 and the object to be transferred corresponding to the second contact portion 4 are arranged substantially in parallel. For example, the first contact point portion 21 is in contact with a gold finger on an object to be detected (for example, a screen display substrate, a chip, a wafer, or the like). In addition, the second contact point portion 41 is in point contact with a Pad of a relay target (for example, a PCB, an FPC, or the like), as an example.

Comparing fig. 2 to fig. 4, it can be seen that the lengths of the second contact portions 4 are different, mainly because the first contact portions 21 of the probes 1 contact with the gold fingers of the detected object, and the corresponding second contact portions 41 also contact with Pad points on the PCB/FPC to form a path. However, since the distance between the gold fingers of the detected object is too small, the Pad point process on the transfer PCB/FPC cannot be performed with a corresponding small distance, or the manufacturing cost is too high, in this embodiment, the Pad points on the transfer PCB/FPC are staggered by changing the length of the second contact portion 4 of the probe 1, so that the Pad points on the transfer PCB/FPC can be made large, and the manufacturing cost of the transfer PCB/FPC can be reduced while the contact reliability is ensured.

In general, the thickness of the probe 1 can be classified into two types: the distance between the product golden fingers is 0.035-0.1 mm, the thickness of the probe 1 (namely the length of the probe in the through direction of the paper surface of figure 2) is 0.015-0.05 mm, and the specific thickness is selected according to the thickness of the product golden fingers; the other type of the probe corresponds to a product golden finger with a small distance, the distance between the golden fingers of the product is 0.1-0.3 mm, the thickness of the probe 1 is 0.05-0.2 mm, and the specific thickness is selected according to the thickness of the golden finger of the product.

In a preferred example, a limiting boss 38 is disposed at the joint of the first contact portion 2 and the first connection portion 3, and the limiting boss 38 is located in the enclosed area of the first contact portion 2, the first connection portion 3 and the second connection portion 4, extends along the direction crossing the length direction, and has a gap with the first contact portion 1. In a specific example, the included angle between the first contact part 2 and the limiting boss 38 in the unstressed state is greater than 0 degree and less than or equal to 5 degrees.

With continued reference to fig. 2, a limiting boss 38 is disposed at a connection position of the first contact portion 2 and the first end portion 31 of the first connection portion 3, and an angle θ is formed between an upper surface of the limiting boss 38 and a lower surface of the first contact portion 2; the size of the angle theta is adjusted to change the size of the stress required when the first contact part 2 deforms downwards; the larger the angle theta is, the larger the elastic force generated by deformation is, and the corresponding angle is generally selected according to the different elastic forces required by the product to be tested in compression joint; in a specific example, the angle θ ranges from 0 to 5 degrees. In addition, the limiting boss 38 also has limiting and fixing functions, on one hand, the limiting boss 38 can limit the deformation degree of the first contact part 2, and prevent the first contact part 2 from being broken when the first contact part 21 is stressed too much; on the other hand, the limiting boss 38 can fix the probe 1 when the probe 1 is in the storage state, so that the probe 1 is prevented from loosening, being fixed infirm and the like.

In a preferred example, the angle between the second contact portion 4 and the second connection portion 5 in the unstressed state is greater than 0 degrees and equal to or less than 5 degrees. With continued reference to fig. 2, the upper surface of the second contact portion 4 and the lower surface of the second connection portion 5 form an angle θ; the size of the angle theta is adjusted to change the size of the stress required when the second contact part 4 deforms upwards, and the larger the angle theta is, the larger the elastic force generated by deformation is; in a specific example, the angle θ ranges from 0 to 5 degrees. Generally, if the thickness of the probe 1 is larger, the probe 1 itself can generate larger elastic force to ensure good contact with the adaptor PCB and the FPC. At this time, the angle θ may be 0; however, if the thickness of the probe 1 is thin, the elastic force generated by the probe itself cannot make the second contact portion 4 make good contact with the relay PCB or the FPC, and the elastic force of the probe is increased by adjusting the angle θ.

With continued reference to fig. 2-4, the joint of the second end portion 51 of the second connecting portion 5 and the second contact portion 4 is provided with a locking protrusion 36, and the locking protrusion 36 is located on a side surface close to the first contact portion 2. The shape and the size of screens boss 36 do not do the restriction, and it is mainly responsible for probe 1 and carries on spacingly when being in the state of accomodating to probe 1, prevents that phenomena such as probe 1 from appearing not hard up, fixed insecure.

In a preferred example, the surface of the first connection portion 3 on the side away from the first contact portion 2/the second contact portion 4 (i.e. the left side of the first connection portion 3) is provided with one or more positioning bosses 34, and the positioning bosses 34 protrude from the surface of the first connection portion 3. When the probe 1 is accommodated in the detection tool, an auxiliary tool, such as a push block, is generally used to press the probe 1 into the detection tool; the positioning boss 34 is mainly responsible for abutting joint with the push block, and the positioning boss 34 protruding from the surface of the first connecting part 3 is beneficial to the push block to apply force to the probe 1.

In addition, one or more notches 35 are further formed on the surface of the first connecting portion 3 on the side away from the first contact portion 2/the second contact portion 4 (i.e., on the left side of the first connecting portion 3), and the number of the notches 35 and the extending length of the second contact portion 4 have a predetermined relationship.

As shown in fig. 2 to 4, the first connecting portion 3 has 1 to 3 gaps 35, and the gaps 35 may be formed on the positioning bosses 34 or on the non-positioning boss 34 area on the surface of the first connecting portion 3; the number of such notches 35 is mainly used to quickly distinguish between different lengths of the second contact portion 4. For example, the length of the second contact portion 4 is three, the number of the notches 35 is three, and the length of the second contact portion 4 and the number of the notches 35 may be selected from 2 to 5 according to actual use. Meanwhile, when the second contact portion 4 is longest, the first connection portion 3 has 3 notches 35, and when the second contact portion is shortest, the first connection portion 3 has 1 notch 35, and the number and distribution of the notches may also form a corresponding relationship with the length of the second contact portion 4 in other forms, which is not limited in this embodiment.

In an alternative embodiment, the junction of the first contact portion 2 and the first connection portion 3 is provided with an auxiliary assembly hole 33. As shown in fig. 2 to 4, the first connecting portion 3 is provided with an auxiliary assembling hole 33, and the auxiliary assembling hole 33 is mainly used for assembling a plurality of probes 1 strung on a rod-shaped object matched with the auxiliary assembling hole 33, so as to facilitate assembling.

The utility model also provides a detection tool, this detection tool includes: the elastic flat probe for detecting the micro-space crimping; and a probe fixing block having a card slot capable of receiving the probe, the probe being received in the card slot with the first contact portion and the second contact portion thereof protruding from the surface of the card slot.

Fig. 5 is a schematic three-dimensional structure diagram of the detection tool provided in this embodiment, referring to fig. 5, a probe fixing block 6 has a plurality of sets of probe card slots 61 for accommodating probes, and each probe 1 is installed in one probe card slot 61; the spacing between the probe card slots 61 may be equal or different, which depends mainly on the distribution of the contact terminals on the product to be tested; if the contact terminals on the product to be tested are distributed at unequal intervals, the probe card slots 61 on the probe fixing block 6 are also distributed at unequal intervals. The probe 1 is used in a state of being housed in the probe card slot 61.

In another preferred example, two limiting grooves 62 are further formed on the probe fixing block 6, and are used for clamping the probe 1 on the probe fixing block 6 so that the probe cannot fall off. As shown in fig. 6, when the probe 1 is assembled on the probe fixing block 6, the probe 1 is placed in the probe card slot 61, the probe 1 is firstly inclined, the clamping boss 36 on the probe 1 falls into the limiting groove 62 at the lower end of the probe fixing block 6, and the left side of the clamping boss 36 contacts with the lower clamping surface 63, at this time, the limiting boss 38 on the probe 1 slightly interferes with the upper clamping surface 64 of the limiting groove 62 at the upper end of the probe fixing block 6, and an external force F is applied to the upper part of the probe 1 as shown by an arrow, so that the limiting boss 38 on the probe 1 is deformed upwards until the probe 1 is completely assembled in the probe fixing block 6, and the limiting boss 38 on the probe 1 is deformed and restored to the state shown in fig. 7.

As shown in fig. 7, after the probe 1 is assembled in the probe fixing block 6, the limiting surface 37 of the probe 1 contacts with the surface of the probe fixing block 6, and the probe 1 can be clamped in the probe fixing block 6 without falling off by the common limiting action of the lower clamping surface 63 on the clamping boss 36 and the limiting groove 62 and the upper clamping surface 64 on the limiting groove 62 of the limiting boss 38. When the probe 1 is replaced, the probe 1 can be separated from the probe fixing block 6 only by applying an external force F from the position and direction shown by the arrow in the figure and overcoming the friction force between the lower surface of the limiting boss 38 on the probe 1 and the upper clamping surface 64.

It should be noted that the shapes and sizes of the two limiting grooves 62 are not specifically limited, and only the limiting groove 62 at the upper end of the probe fixing block 6 needs to provide a groove capable of accommodating the limiting boss 38, and the limiting groove 62 at the lower end of the probe fixing block 6 needs to provide a groove capable of accommodating the clamping boss 36.

As shown in fig. 8, when the probe 1 is fixed to the probe fixing block 6, since the probe 1 is placed in the probe card slot 61 and the vertical walls on both sides of the probe card slot 61 restrict the lateral deformation of the probe 1, the first contact portion 2 and the second contact portion 4 are deformed only in the vertical direction and generate elastic force when the first contact portion 21 and the second contact portion 41 are subjected to the external force F.

The thickness of the probe 1 is divided into the following parts according to the distance between the golden fingers of the product: the thickness of the probe is 0.015-0.05 mm and 0.05-0.2 mm, the width of the corresponding probe clamping groove 61 is 0.016-0.06 mm and 0.06-0.22 mm, and the smaller the width of the clamping groove 61 is, the deeper the depth capable of being processed is, and the greater the processing difficulty is; therefore, as shown in fig. 9, a large part (hatched part) of the probe 1 is not located inside the probe card slot 61.

When probe 1 corresponds the golden finger of connecting the fine pitch product, probe 1 thickness can be very thin, its hardness can become very poor, receive the exogenic action and take place to warp very easily, and probe 1 most region can't stretch into probe draw-in groove 61 the inside, under this kind of condition, when probe 1 receives the exogenic action crimping, probe 1 does not stretch into the region of probe draw-in groove 61 the inside and will contact each other, form the short circuit, cause harmful effects or even can burn to the testing result and surveyed the product.

As shown in fig. 10, in order to solve the problem that the probes 1 are thin and short circuit may be caused by mutual contact between the probes due to pressure welding, in this embodiment, an insulating layer is coated on the surface (the same area on the front and back surfaces) of the probe 1, so as to effectively prevent short circuit caused by mutual contact between the probes; the region covered with the insulating coating is the region where the probe 1 does not extend into the probe card slot 61; for example, the area of the surface of the probe 1 covered with the insulating coating is a shaded area (front and back surfaces) shown in fig. 10, and other areas, such as the connection portion between the second connection portion 3 and the second contact portion 4 and the second contact portion 41, are not short-circuited with other portions, so that the insulating coating is not required.

Fig. 11 is a schematic structural view of the first and second contact portions of different shapes provided in the present embodiment; as shown in fig. 11, the shapes of the first contact portion 21 and the second contact portion 41 may be designed in various different manners, specifically designed according to the product to be tested and the use environment, and are not limited to the shapes shown in fig. 11. For example, the first contact portion 21 can be designed to have a shape and a position appropriately changed according to the form of the contact terminal of the object to be tested so that the contact surface between the probe 1 and the object to be tested can be as large as possible during the test, or to have another shape according to the specific shape of the contact terminal pair of the object to be tested.

The probe that this embodiment provided is integrated into one piece's flat plate structure, does not have inside friction influence life-span in the test compression process, and general life-span can reach more than 5 times of conventional probe.

It will be understood by those skilled in the art that the foregoing is merely a preferred embodiment of the present invention, and is not intended to limit the invention to the particular forms disclosed, but on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the appended claims.

Claims (10)

1. The utility model provides a little interval crimping detects uses elasticity flat probe which characterized in that includes:

a first connection part extending along a length direction of the probe;

a first contact portion having one end connected to a first end of the first connection portion and extending in a direction crossing the longitudinal direction, and having a first contact portion at the other end, the extending direction of the first contact portion crossing the extending direction of the first contact portion;

a second connecting portion, one end of which is connected to the second end of the first connecting portion and extends along a direction intersecting the length direction, and the second connecting portion and the first contact portion are located on the same side of the first connecting portion in the length direction;

a second contact portion having one end connected to the other end of the second connection portion and extending in a direction close to the first connection portion, the other end having a second contact portion whose extending direction intersects with the extending direction of the second contact portion;

the second contact portion and the first contact portion are respectively located on different sides of the second connecting portion and can be deformed in a direction close to the second connecting portion when the contact portions of the respective ends are stressed.

2. The elastic flat probe for fine pitch crimp detection according to claim 1, wherein a limit boss is provided at a connection point of the first contact portion and the first connection portion, the limit boss being located in a region surrounded by the first contact portion, the first connection portion, and the second connection portion, extending in a direction intersecting the longitudinal direction, and having a gap with the first contact portion.

3. The elastic flat probe for fine pitch crimp detection according to claim 2, wherein an included angle between the first contact portion and the limiting boss in an unstressed state is greater than 0 degree and less than or equal to 5 degrees.

4. The elastic flat probe for fine pitch crimp detection according to claim 1 or 3, wherein an angle between the second contact portion and the second connection portion in an unstressed state is greater than 0 degrees and equal to or less than 5 degrees.

5. The elastic flat probe for fine pitch crimp detection according to claim 2, wherein a locking projection is formed on a surface of a connection portion between the second connection portion and the second contact portion, the surface being close to the first contact portion.

6. The elastic flat probe for fine pitch crimp detection according to claim 1, wherein one or more positioning bosses are distributed on a surface of one side of the first connection portion, which is away from the first contact portion and the second contact portion.

7. The elastic flat probe for fine pitch crimp detection according to claim 1, wherein one or more notches are formed in a surface of the first connection portion on a side away from the first contact portion and the second contact portion, and the number of the notches and the extension length of the second contact portion have a predetermined corresponding relationship.

8. An inspection tool, comprising:

an elastic flat probe for fine pitch crimp inspection according to any one of claims 1 to 7; and the number of the first and second groups,

and the probe fixing block is provided with a clamping groove capable of accommodating the probe, and the probe is accommodated in the clamping groove in a state that the first contact part and the second contact part of the probe protrude out of the clamping groove.

9. The inspection tool of claim 8, wherein the surface of the probe protruding from the card slot is coated with an insulating coating.

10. An inspection tool, comprising:

the fine pitch crimp inspection elastic flat probe according to claim 5; and the number of the first and second groups,

a probe fixing block having a card slot capable of receiving the probe, the probe being received in the card slot with a first contact portion and a second contact portion thereof protruding from the card slot;

the probe fixing block further has:

the first limit groove provides a groove position space for accommodating the limit boss of the probe;

the second limit groove provides a groove space for accommodating the clamping boss of the probe.

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