TW202415956A - Inspection socket and inspection device - Google Patents
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- TW202415956A TW202415956A TW112131581A TW112131581A TW202415956A TW 202415956 A TW202415956 A TW 202415956A TW 112131581 A TW112131581 A TW 112131581A TW 112131581 A TW112131581 A TW 112131581A TW 202415956 A TW202415956 A TW 202415956A
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- 238000007689 inspection Methods 0.000 title claims abstract description 113
- 239000000523 sample Substances 0.000 claims abstract description 150
- 238000012360 testing method Methods 0.000 claims description 11
- 230000000007 visual effect Effects 0.000 claims description 2
- 230000000694 effects Effects 0.000 description 4
- 230000017525 heat dissipation Effects 0.000 description 3
- 101000827703 Homo sapiens Polyphosphoinositide phosphatase Proteins 0.000 description 2
- 102100023591 Polyphosphoinositide phosphatase Human genes 0.000 description 2
- 101100233916 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) KAR5 gene Proteins 0.000 description 2
- 230000004075 alteration Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 1
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 1
- 101100012902 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) FIG2 gene Proteins 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
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- 230000000087 stabilizing effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
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- Condensed Matter Physics & Semiconductors (AREA)
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
Abstract
Description
本揭示是有關於一種檢查插座及檢查裝置。The present disclosure relates to an inspection socket and an inspection device.
專利文獻1中記載了一種太陽能電池電極用檢查裝置。 [現有技術文獻] [專利文獻] Patent document 1 describes a solar cell electrode inspection device. [Prior art document] [Patent document]
專利文獻1:日本專利特開2008-071989號公報Patent document 1: Japanese Patent Publication No. 2008-071989
[發明所欲解決之課題][The problem that the invention wants to solve]
一般而言,在包含專利文獻1的檢查裝置的檢查裝置中,使用圓筒形狀的彈力探針(spring probe)(所謂的彈簧探針(pogo pin))。然而,彈簧探針通常不具有適合於太陽能電池的寬度狹窄的電極的形狀的前端,有時會在檢查時引起接觸不良。Generally speaking, in inspection devices including the inspection device of Patent Document 1, a cylindrical spring probe (so-called pogo pin) is used. However, the spring probe generally does not have a tip that is suitable for the narrow electrode of a solar cell, which may cause poor contact during inspection.
本揭示的目的在於提供一種接觸可靠性高的檢查插座及檢查裝置。 [解決課題之手段] The purpose of this disclosure is to provide a testing socket and testing device with high contact reliability. [Means for solving the problem]
本揭示的一形態的檢查插座包括: 至少一個板狀的探針,具有設於第一方向的其中一端的第一端部及設於所述第一方向的另一端的第二端部; 殼體,以所述第一端部露出於外部的狀態將所述探針收容於內部;以及 導通構件,設於所述殼體的在所述第一方向上較所述第一端部更靠近所述第二端部的部分,且電性連接於所述第二端部, 所述殼體沿著與所述第一方向交叉的第二方向延伸, 所述探針以所述第二方向成為厚度方向的方式被收容於所述殼體的內部, 所述探針的所述第一端部構成為,在所述第一方向上,與包含沿著所述第二方向延伸的細長電極的檢查對象物的所述電極相向,且能夠以交叉的狀態接觸至所述電極。 The inspection socket of one form disclosed in the present invention comprises: At least one plate-shaped probe having a first end portion provided at one end of a first direction and a second end portion provided at the other end of the first direction; A housing that accommodates the probe in a state where the first end portion is exposed to the outside; and A conductive member provided at a portion of the housing that is closer to the second end portion than the first end portion in the first direction and electrically connected to the second end portion, The housing extends along a second direction intersecting the first direction, The probe is accommodated in the housing in a manner that the second direction becomes a thickness direction, The first end portion of the probe is configured to face the electrode of the inspection object including the elongated electrode extending along the second direction in the first direction, and can contact the electrode in a crossed state.
本揭示的一形態的檢查裝置包括至少一個所述形態的檢查插座。 [發明的效果] The inspection device of one form disclosed herein includes at least one inspection socket of the said form. [Effect of the invention]
根據本揭示,可提供一種接觸可靠性高的檢查插座及檢查裝置。According to the present disclosure, a testing socket and a testing device with high contact reliability can be provided.
以下,依據附圖來說明本揭示的一例。以下的說明本質上不過是示例,並非意圖限制本揭示、本揭示的適用物或本揭示的用途。附圖為示意性者,各尺寸的比率等未必與現實一致。An example of the present disclosure is described below with reference to the attached drawings. The following description is merely an example in nature and is not intended to limit the present disclosure, the objects to which the present disclosure applies, or the uses of the present disclosure. The attached drawings are schematic, and the ratios of the dimensions may not necessarily be consistent with the actual ones.
如圖1所示,本揭示的一實施方式的檢查裝置1包括至少一個檢查插座10。在檢查裝置1中,如圖2及圖3所示,後述的檢查插座10的探針20的第一端部21構成為,在第一方向(例如Z方向)上,與檢查對象物(例如太陽能電池板)100的細長電極110相向,且能夠以交叉(例如正交)的狀態接觸至電極110。電極110例如沿著與第一方向Z交叉的第二方向(例如X方向)延伸。As shown in FIG1 , an inspection device 1 of an embodiment of the present disclosure includes at least one
本實施方式中,檢查對象物100具有在與第一方向Z及第二方向X交叉的第三方向(例如Y方向)上隔開間隔、例如等間隔地配置的多個電極110,檢查裝置1包括與多個電極110為相同數量的多個檢查插座10。多個檢查插座10以各檢查插座10的探針20的第一端部21可接觸至各電極110的方式,在第三方向Y上隔開間隔、例如等間隔地配置。檢查裝置1構成為,所有檢查插座10可朝向檢查對象物100而沿著Z方向同時移動。In this embodiment, the inspection object 100 has a plurality of electrodes 110 arranged at intervals, for example, at equal intervals, in a third direction (for example, the Y direction) intersecting the first direction Z and the second direction X, and the inspection device 1 includes a plurality of
檢查裝置1亦可如下所示般構成。
・探針20的第三方向Y的尺寸W1大於電極110的第三方向Y的尺寸W2。
・檢查插座10的第三方向Y的尺寸W3小於相鄰的電極110間的直線距離W4。
The inspection device 1 may also be configured as follows.
・The dimension W1 of the
如圖4及圖5所示,檢查插座10包括至少一個板狀的探針20、將探針20收容於內部的殼體30及導通構件40。本實施方式中,檢查插座10包括在第二方向X上隔開間隔而設置的多個探針20。多個探針20包含第一探針120及第二探針220。第一探針120例如為壓力針(force pin),第二探針220例如為感測針(sense pin)。各探針20是由單個零件所形成。As shown in FIG. 4 and FIG. 5 , the
如圖6所示,探針20具有設於第一方向Z的其中一端的第一端部21及設於第一方向Z的另一端的第二端部22。本實施方式中,探針20包含具有第一端部21的第一接觸部201、具有第二端部22的第二接觸部202、及位於第一接觸部201與第二接觸部202之間的彈性部203。第一接觸部201及第二接觸部202位於沿著第一方向Z延伸的假想直線L1上,藉由彈性部203而連接。As shown in FIG6 , the
第一接觸部201具有沿著第一方向Z延伸的大致矩形板狀。第一接觸部201的在第一方向Z上較第二接觸部202更遠的端構成第一端部21。作為一例,第一端部21的可接觸至電極110的面彎曲。彈性部203自第三方向Y連接於第一接觸部201的在第一方向Z上靠近第二接觸部202的端。The first contact portion 201 has a substantially rectangular plate shape extending along the first direction Z. The end of the first contact portion 201 farther from the second contact portion 202 in the first direction Z constitutes the
第二接觸部202具有沿著第一方向Z延伸的大致矩形板狀。第二接觸部202的第一方向Z的長度小於第一接觸部201。第二接觸部202的在第一方向Z上較第一接觸部201更遠的端構成第二端部22。彈性部203自第三方向Y連接於第二接觸部202的在第一方向Z上靠近第一接觸部201的端。The second contact portion 202 has a substantially rectangular plate shape extending along the first direction Z. The length of the second contact portion 202 in the first direction Z is smaller than that of the first contact portion 201. The end of the second contact portion 202 farther from the first contact portion 201 in the first direction Z constitutes the second end portion 22. The elastic portion 203 is connected to the end of the second contact portion 202 closer to the first contact portion 201 in the first direction Z from the third direction Y.
彈性部203包含相互隔開間隙205而配置的多個構件204。各構件204具有多個第一部分206及多個第二部分207。各第一部分206沿著第一方向Z隔開間隔而配置,且分別沿著第三方向Y而直線地延伸。各第二部分207具有沿著第一方向Z延伸的大致半圓弧形狀,兩端分別連接於相鄰的第一部分206的端部。各構件204的位於第一方向Z的兩端的第一部分206分別自第三方向Y的相同側連接至第一接觸部201及第二接觸部202。所有的第一部分206及第二部分207相對於第一接觸部201的側面208而位於相同側。側面208是與第一接觸部201的跟第三方向Y交叉的一對側面中的、各構件204的第一部分206所連接的側面為相反側的側面。The elastic portion 203 includes a plurality of components 204 arranged with gaps 205 between them. Each component 204 has a plurality of first portions 206 and a plurality of second portions 207. Each first portion 206 is arranged at intervals along the first direction Z and extends linearly along the third direction Y. Each second portion 207 has a substantially semicircular arc shape extending along the first direction Z, and both ends are connected to the ends of the adjacent first portion 206. The first portions 206 located at both ends of each component 204 in the first direction Z are connected to the first contact portion 201 and the second contact portion 202 from the same side of the third direction Y. All the first portions 206 and the second portions 207 are located on the same side relative to the side surface 208 of the first contact portion 201. The side surface 208 is a side surface that is opposite to the side surface to which the first portion 206 of each component 204 is connected, among a pair of side surfaces of the first contact portion 201 that intersect the third direction Y.
如圖4所示,殼體30沿著第二方向X延伸,且如圖5所示般構成為,能夠以第一端部21露出於外部的狀態將探針20收容於內部。本實施方式中,殼體30包含收容探針20的第一殼體31、及可收容並保持第一殼體31的第二殼體32。As shown in FIG4 , the
如圖5所示,第一殼體31具有剖面大致T字形狀。第一殼體31具有多個狹縫狀的第一收容部33,所述狹縫狀的第一收容部33能夠以第一端部21露出於外部的狀態來收容一個探針20。在第一殼體31,設有探針20的數量以上的第一收容部33。探針20是以第二方向X成為其厚度方向的方式被收容於第一收容部33中。多個第一收容部33是以所收容的探針20的第一端部21沿著第二方向X排列成一列的方式而沿著第二方向X配置(參照圖3)。As shown in FIG5 , the
如圖4所示,第二殼體32具有大致長方體形狀。如圖5所示,第二殼體32具有:第二收容部34,可收容並保持第一殼體31;以及多個孔部35,可收容用於將後述的按壓構件50固定至殼體30的緊固構件60。第二收容部34沿第一方向Z貫穿第二殼體32,較之在第一方向Z上靠近探針20的第一端部21的底面321開口的開口部341,在靠近第二端部22的上表面322開口的開口部342更大。作為一例,被收容於第二收容部34的第一殼體31其第一方向Z的一端311自開口部341稍稍突出至第二殼體32的外部。多個孔部35被設於第二殼體32的上表面322。被收容於第二收容部34的第一殼體31例如藉由定位銷61來相對於第二殼體32而定位(參照圖7)。As shown in FIG. 4 , the
如圖4所示,在殼體30的第二方向X的兩端,安裝有底座構件36。各底座構件36自第二殼體32的上表面322沿著第一方向Z延伸。As shown in FIG. 4 ,
如圖5所示,導通構件40設於殼體30的在第一方向Z上較探針20的第一端部21更靠近第二端部22的部分,且電性連接於第二端部22。本實施方式中,導通構件40包含電性獨立的兩個導電性的片材(以下稱作第一構件41及第二構件42)。第一構件41與第一探針120電性接觸,第二構件42與第二探針220電性接觸。第一構件41及第二構件42例如包含銅。As shown in FIG5 , the
如圖7所示,第一構件41具有沿著第二方向X延伸的第一本體部43、及第一突出部44。第一突出部44自第一本體部43朝第三方向Y且接近第二構件42的方向延伸,且如圖5所示,接觸至第一探針120的第二端部22。圖7中省略了按壓構件50。As shown in FIG7 , the first member 41 has a first body portion 43 extending along the second direction X, and a first protrusion 44. The first protrusion 44 extends from the first body portion 43 toward the third direction Y and toward the second member 42, and as shown in FIG5 , contacts the second end portion 22 of the
如圖7所示,第二構件42相對於第一構件41在第三方向Y上隔開間隔而設置。第二構件42具有沿著第二方向Z延伸的第二本體部45、及第二突出部46。第二突出部46自第二本體部45朝第三方向Y且接近第一構件41的方向延伸,且如圖5所示,電性接觸至第二探針220的第二端部22。As shown in FIG. 7 , the second component 42 is spaced apart from the first component 41 in the third direction Y. The second component 42 has a second body portion 45 extending along the second direction Z, and a second protrusion 46. The second protrusion 46 extends from the second body portion 45 toward the third direction Y and close to the first component 41, and as shown in FIG. 5 , electrically contacts the second end portion 22 of the
如圖5所示,導通構件40位於殼體30與按壓構件50之間,藉由按壓構件50而固定於殼體30。如圖4所示,在導通構件40的第二方向X的兩端,分別設有連接端子70的連接部47。連接部47的其中一者電性連接於第一構件41,連接部47的另一者電性連接於第二構件42。As shown in FIG5 , the conducting
檢查插座10可發揮如下所述的效果。The
檢查插座10包括至少一個板狀的探針20、殼體30及導通構件40。探針20具有設於第一方向的其中一端的第一端部21及設於第一方向的另一端的第二端部22。殼體30以第一端部21露出於外部的狀態將探針20收容於內部。導通構件40設於殼體30的在第一方向上較第一端部21更靠近第二端部22的部分,且電性連接於第二端部22。殼體30沿著與第一方向交叉的第二方向延伸,探針20以第二方向成為厚度方向的方式被收容於殼體30的內部。探針20的第一端部21構成為,在第一方向上,與包含沿著第二方向延伸的細長電極110的檢查對象物100的電極110相向,且能夠以交叉的狀態接觸至電極110。藉由此種結構,可使探針20更確實地接觸至寬度狹窄的電極110,因此可減少接觸不良的發生。其結果,可實現接觸可靠性高的檢查插座10。The
彈簧探針通常包含多個零件,因此在使用彈簧探針的檢查插座中,電流特性不穩定。而且,例如在對太陽能電池板的功能進行檢查的情況下,必須對作為檢查對象的太陽能電池板整個面照射光。因此,為了設為儘可能不遮擋對太陽能電池板照射的光的尺寸,有欲將用於太陽能電池板的檢查的檢查用插座小型化或薄型化的期望。為了滿足此期望,被收容至檢查插座內的探針亦必須小型化,但若將探針小型化,則使高電流流動的導通路徑變細,在導通時探針會發熱,因此有欲提高檢查插座的散熱性的期望。在檢查插座10中,使用了作為單個零件的、板狀的探針20,因此可使電流特性穩定,從而可在檢查中使測定值穩定化。而且,板狀的探針20可較彈簧探針加大與空氣接觸的面積,因此可提高檢查插座10的散熱性,抑制探針20的電阻值的上升。A spring probe generally includes a plurality of parts, and therefore, the current characteristics are unstable in an inspection socket using the spring probe. Furthermore, for example, when inspecting the function of a solar panel, the entire surface of the solar panel to be inspected must be irradiated with light. Therefore, in order to set the size so as not to block the light irradiated to the solar panel as much as possible, there is a desire to miniaturize or thin the inspection socket used for inspecting solar panels. In order to meet this expectation, the probe housed in the inspection socket must also be miniaturized, but if the probe is miniaturized, the conduction path diameter through which the high current flows becomes smaller, and the probe generates heat when it is turned on, so there is a desire to improve the heat dissipation of the inspection socket. In the
檢查插座10可任意採用以下所示的多個結構中的任一個或多個結構。即,以下所示的多個結構中的任一個或多個結構在已包含於前述的實施方式中的情況下可任意刪除,在未包含於前述的實施方式中的情況下可任意附加。藉由採用此種結構,可更確實地實現接觸可靠性高的檢查插座10。The
檢查插座10包括沿著第二方向隔開間隔而設置的多個探針20。The
多個探針20包含第一探針120及第二探針220。導通構件40包含:第一構件41,與第一探針120電性接觸;以及第二構件42,相對於第一構件41而在第三方向上隔開間隔而設置,與第一構件41電性獨立,並且與第二探針220電性接觸。第一構件41具有:第一本體部43,沿著第二方向延伸;以及第一突出部44,自第一本體部43朝第三方向且接近第二構件42的方向延伸,電性接觸至第一探針120的第二端部22。第二構件42具有:第二本體部45,沿著第二方向延伸;以及第二突出部46,自第二本體部45朝第三方向且接近第一構件41的方向延伸,電性接觸至第二探針220的第二端部22。The plurality of
檢查裝置1可發揮如下所述的效果。The inspection device 1 can exert the effects described below.
檢查裝置1包括檢查插座10。藉由檢查插座10,可實現接觸可靠性高的檢查裝置1。The inspection device 1 includes an
檢查裝置1可任意採用以下所示的多個結構中的任一個或多個結構。即,以下所示的多個結構中的任一個或多個結構在已包含於前述的實施方式中的情況下可任意刪除,在未包含於前述的實施方式中的情況下可任意附加。藉由採用此種結構,可更確實地實現接觸可靠性高的檢查裝置1。The inspection device 1 can arbitrarily adopt any one or more of the multiple structures shown below. That is, any one or more of the multiple structures shown below can be arbitrarily deleted if they are already included in the aforementioned embodiment, and can be arbitrarily added if they are not included in the aforementioned embodiment. By adopting such a structure, an inspection device 1 with high contact reliability can be more reliably realized.
探針20的第三方向的尺寸W1大於電極110的第三方向的尺寸W2。A dimension W1 of the
檢查插座10的第三方向的尺寸W3小於相鄰的電極110間的距離W4。Check that the dimension W3 of the
檢查裝置1及檢查插座10亦可如下般構成。The inspection device 1 and the
檢查插座10的探針20既可為一個,亦可為三個以上。將殼體30包含多個第一殼體31且在各第一殼體31中收容有多個探針20的檢查插座10示於圖8及圖9。圖9中省略了按壓構件50。The
在圖8及圖9的檢查插座10中,多個探針20包含四個第一探針120及兩個第二探針220,沿著第二方向X,按照兩個第一探針120、兩個第二探針220及兩個第一探針120的順序排列配置。如圖9所示,導通構件40具有兩個第一突出部44及一個第二突出部46。第一突出部44及第二突出部46沿著第二方向X隔開間隔而配置,第二突出部46位於兩個第一突出部44之間。如圖8所示,兩個第一探針120接觸至各第一突出部44,兩個第二探針220接觸至第二突出部46。即,亦可將檢查插座10構成為,第一探針120的數量多於第二探針220的數量,且第一突出部44的數量多於第二突出部46的數量。In the
第一探針120及第二探針220既可為相同的結構,亦可為不同的結構。例如,亦可使用圖10所示的探針20來作為第一探針120,使用圖6的探針20來作為第二探針220。圖10的探針20中,第二接觸部202並非位於假想直線L1上,而是位於相對於假想直線L1在第三方向Y上隔開間隔而配置且與假想直線L1平行的假想直線L2上。圖10的探針20較之圖6的探針20,彈性部203的各構件204中的第一部分206及第二部分207的數量變少。The
設使用圖10所示的探針20來作為第一探針120,使用圖6的探針20來作為第二探針220。此時,例如,如圖11所示,亦可配合第二探針220的第二端部22的位置來變更第二突出部46的形狀。相反地,在使用圖6的探針20來作為第一探針120,使用圖10的探針20來作為第二探針220的情況下,例如亦可配合第一探針120的位置來變更第一突出部44的形狀。即,第一突出部44及第二突出部46的數量及形狀可根據檢查插座10的設計等而變更。圖11的檢查插座10中,四個第一探針120的第二端部22位於沿著第二方向X延伸的假想直線L3上,兩個第二探針220的第二端部22位於相對於假想直線L3在第三方向Y上隔開間隔而配置且與假想直線L3平行的假想直線L4上。Assume that the
探針20只要為板狀且具有第一端部21及第二端部22即可。例如,如圖12所示,探針20的第一端部21亦可具有可接觸至電極110的平面211。如圖13所示,探針20的第二端部22亦可具有兩個突起221。圖13的探針20包含分別位於第三方向Y的兩端的兩個第二接觸部202,在各第二接觸部202設有一個突起221。The
殼體30亦可如圖14所示,具有可自殼體10的外部目測觀察被收容於內部的探針20的窗部301。藉由設置窗部301,即便不自第二殼體32拆卸第一殼體31,亦可確認所收容的探針20的狀態,並且可提高檢查插座10的散熱性。As shown in Fig. 14, the
導通構件40並不限於片材,例如亦可為基板(以下稱作第三構件48)。例如,如圖15及圖16所示,第三構件48具有形成有電極圖案且與第一方向Z交叉的一對面481、482。第三構件48的面481是與殼體30相向的面,第三構件48的面482是與按壓構件50相向的面。電極圖案包含電性連接於第一探針120的第一電極圖案483、及電性連接於第二探針220的第二電極圖案484。The
以上,參照附圖詳細說明了本揭示中的各種實施方式,但在最後,對本揭示的各種形態進行說明。再者,以下的說明中,作為一例,亦添加參照符號而記載。In the above, various embodiments of the present disclosure are described in detail with reference to the accompanying drawings, but finally, various forms of the present disclosure are described. In addition, in the following description, reference symbols are also added as an example.
本揭示的第一形態的檢查插座10包括:
至少一個板狀的探針20,具有設於第一方向的其中一端的第一端部21及設於所述第一方向的另一端的第二端部22;
殼體30,以所述第一端部21露出於外部的狀態將所述探針20收容於內部;以及
導通構件40,設於所述殼體30的在所述第一方向上較所述第一端部21更靠近所述第二端部22的部分,且電性連接於所述第二端部22,
所述殼體30沿著所述第二方向延伸,
所述探針20以與所述第一方向交叉的第二方向成為厚度方向的方式被收容於所述殼體30的內部,
所述探針20的所述第一端部21構成為,在所述第一方向上,與包含沿著所述第二方向延伸的細長電極的檢查對象物的所述電極相向,且能夠以交叉的狀態接觸至所述電極。
The first form of the
本揭示的第二形態的檢查插座10是在第一形態的檢查插座10中包括:
多個所述探針20,沿著所述第二方向隔開間隔而設置。
The second form of the
本揭示的第三形態的檢查插座10是在第二形態的檢查插座10中,
多個所述探針20包含第一探針120及與所述第一探針120不同的第二探針220。
The third form of the
本揭示的第四形態的檢查插座10是在第二形態的檢查插座10中,
多個所述探針20包含第一探針120及第二探針220,
所述導通構件40包含:
第一構件41,與所述第一探針120電性接觸;以及
第二構件42,相對於所述第一構件41而在與所述第一方向及所述第二方向交叉的第三方向上隔開間隔而設置,與所述第一構件41電性獨立,並且與所述第二探針220電性接觸,
所述第一構件41具有:
第一本體部43,沿著所述第二方向延伸;以及
第一突出部44,自所述第一本體部43朝所述第三方向且接近所述第二構件42的方向延伸,電性接觸至所述第一探針120的所述第二端部22,
所述第二構件42具有:
第二本體部45,沿著所述第二方向延伸;以及
第二突出部46,自所述第二本體部45朝所述第三方向且接近所述第一構件41的方向延伸,電性接觸至所述第二探針220的所述第二端部22。
The fourth form of the
本揭示的第五形態的檢查插座10是在第三形態或第四形態的檢查插座10中,
所述第一探針120的數量多於所述第二探針220的數量,
所述第一突出部44的數量多於所述第二突出部46的數量。
The fifth form of the
本揭示的第六形態的檢查插座10是在第一形態至第五形態的任一形態的檢查插座10中,
所述殼體30具有能夠自外部目測觀察被收容於內部的所述探針20的窗部301。
The sixth form of the
本揭示的第七形態的檢查裝置1包括至少一個第一形態至第六形態的任一形態的檢查插座10。The seventh form of the inspection device 1 of the present disclosure includes at least one
本揭示的第八形態的檢查裝置1是在第七形態的檢查裝置1中,
所述探針20的與所述第一方向及所述第二方向交叉的第三方向的尺寸大於所述電極的所述第三方向的尺寸。
The eighth form of the inspection device 1 disclosed herein is the inspection device 1 of the seventh form, wherein the dimension of the
本揭示的第九形態的檢查裝置1是在第七形態或第八形態的檢查裝置1中,
所述探針20的所述第一端部21具有能夠接觸至所述電極的平面211。
The ninth form of the inspection device 1 disclosed herein is in the seventh form or the eighth form of the inspection device 1,
The
本揭示的第十形態的檢查裝置1是在第七形態至第九形態的任一形態的檢查裝置1中,
所述檢查對象物包含在與所述第一方向及所述第二方向交叉的第三方向上隔開間隔而配置的多個所述電極,
所述檢查插座10的所述第三方向的尺寸小於相鄰的電極間的距離。
The inspection device 1 of the tenth form disclosed herein is an inspection device 1 of any form from the seventh form to the ninth form,
the inspection object includes a plurality of electrodes arranged at intervals in a third direction intersecting the first direction and the second direction,
the dimension of the
藉由將前述的各種實施方式或變形例中的任意的實施方式或變形例適當組合,可起到各自具有的效果。而且,可進行實施方式彼此的組合、實施例彼此的組合或者實施方式與實施例的組合,並且亦可進行不同的實施方式或實施例中的特徵彼此的組合。By appropriately combining any of the above-mentioned various embodiments or variations, the effects of each embodiment can be achieved. Moreover, embodiments can be combined with each other, embodiments can be combined with each other, or embodiments can be combined with embodiments, and different embodiments or features in embodiments can also be combined with each other.
本揭示是一邊參照附圖一邊關聯於較佳的實施方式而充分記載,但對於熟悉本技術的人們而言,各種變形或修正是一目了然的。應理解的是,此種變形或修正只要未脫離基於隨附的申請專利範圍的、本揭示的範圍,則包含於其中。 [產業上之可利用性] This disclosure is fully described in relation to the preferred embodiment with reference to the accompanying drawings, but various modifications or alterations are obvious to those familiar with the present technology. It should be understood that such modifications or alterations are included in the scope of this disclosure as long as they do not deviate from the scope of the attached patent application. [Industrial Applicability]
本揭示的檢查插座例如可適用於太陽能電池板的檢查中所用的檢查裝置。The inspection socket disclosed herein can be applied to an inspection device used in the inspection of solar panels, for example.
本揭示的檢查裝置例如可適用作為太陽能電池板的檢查裝置。The inspection device disclosed herein can be used, for example, as an inspection device for solar panels.
1:檢查裝置 10:檢查插座 20:探針 21:第一端部 22:第二端部 30:殼體 31:第一殼體 32:第二殼體 33:第一收容部 34:第二收容部 35:孔部 36:底座構件 40:導通構件 41:第一構件 42:第二構件 43:第一本體部 44:第一突出部 45:第二本體部 46:第二突出部 47:連接部 48:第三構件 50:按壓構件 60:緊固構件 61:定位銷 70:端子 100:檢查對象物 110:電極 120:第一探針 201:第一接觸部 202:第二接觸部 203:彈性部 204:構件 205:間隙 206:第一部分 207:第二部分 208:側面 211:平面 220:第二探針 221:突起 301:窗部 311:一端 321:底面 322:上表面 341、342:開口部 481、482:面 483:第一電極圖案 484:第二電極圖案 L1、L2、L3、L4:假想直線 V-V:剖面線 W1、W2、W3:尺寸 W4:直線距離 X:第二方向 Y:第三方向 Z:第一方向 1: Inspection device 10: Inspection socket 20: Probe 21: First end 22: Second end 30: Housing 31: First housing 32: Second housing 33: First receiving portion 34: Second receiving portion 35: Hole 36: Base member 40: Conductive member 41: First member 42: Second member 43: First body 44: First protrusion 45: Second body 46: Second protrusion 47: Connecting portion 48: Third member 50: Pressing member 60: Fastening member 61: Positioning pin 70: Terminal 100: Inspection object 110: Electrode 120: First probe 201: First contact portion 202: Second contact part 203: Elastic part 204: Component 205: Gap 206: First part 207: Second part 208: Side surface 211: Plane 220: Second probe 221: Protrusion 301: Window 311: One end 321: Bottom surface 322: Upper surface 341, 342: Opening part 481, 482: Surface 483: First electrode pattern 484: Second electrode pattern L1, L2, L3, L4: Imaginary straight line V-V: Section line W1, W2, W3: Dimensions W4: Straight line distance X: Second direction Y: Third direction Z: First direction
圖1是表示本揭示的一實施方式的檢查裝置的立體圖。 圖2是圖1的檢查裝置的放大正面圖。 圖3是沿著圖2的III-III線的剖面圖。 圖4是表示本揭示的一實施方式的檢查插座的立體圖。 圖5是沿著圖4的V-V線的剖面圖。 圖6是表示圖4的檢查插座的探針的立體圖。 圖7是表示拆除了按壓構件的狀態的圖4的檢查插座的放大立體圖。 圖8是表示圖4的檢查插座的第一變形例的剖面圖。 圖9是表示拆除了按壓構件的狀態的圖8的檢查插座的放大立體圖。 圖10是表示圖4的檢查插座的第二變形例的探針的立體圖。 圖11是表示圖4的檢查插座的第二變形例的放大俯視圖。 圖12是表示圖4的檢查插座的第三變形例的探針的放大平面圖。 圖13是表示圖4的檢查插座的第四變形例的探針的放大平面圖。 圖14是表示圖4的檢查插座的第五變形例的放大正面圖。 圖15是表示圖4的檢查插座的第六變形例的導通構件的底面圖。 圖16是表示圖4的檢查插座的第六變形例的導通構件的俯視圖。 FIG. 1 is a perspective view of an inspection device according to an embodiment of the present disclosure. FIG. 2 is an enlarged front view of the inspection device of FIG. 1. FIG. 3 is a cross-sectional view along line III-III of FIG. 2. FIG. 4 is a perspective view of an inspection socket according to an embodiment of the present disclosure. FIG. 5 is a cross-sectional view along line V-V of FIG. 4. FIG. 6 is a perspective view of a probe of the inspection socket of FIG. 4. FIG. 7 is an enlarged perspective view of the inspection socket of FIG. 4 with a pressing member removed. FIG. 8 is a cross-sectional view of a first variant of the inspection socket of FIG. 4. FIG. 9 is an enlarged perspective view of the inspection socket of FIG. 8 with a pressing member removed. FIG. 10 is a perspective view of a probe of a second variant of the inspection socket of FIG. 4. FIG. 11 is an enlarged top view of the second variant of the inspection socket of FIG. 4. FIG. 12 is an enlarged plan view of a probe of a third variant of the inspection socket of FIG. 4 . FIG. 13 is an enlarged plan view of a probe of a fourth variant of the inspection socket of FIG. 4 . FIG. 14 is an enlarged front view of a fifth variant of the inspection socket of FIG. 4 . FIG. 15 is a bottom view of a conductive member of a sixth variant of the inspection socket of FIG. 4 . FIG. 16 is a top view of a conductive member of a sixth variant of the inspection socket of FIG. 4 .
10:檢查插座 10: Check the socket
30:殼體 30: Shell
36:底座構件 36: Base components
40:導通構件 40: Conductive components
47:連接部 47:Connection part
50:按壓構件 50: Press components
60:緊固構件 60: Fastening components
70:端子 70: Terminal
V-V:剖面線 V-V: section line
X:第二方向 X: Second direction
Y:第三方向 Y: Third direction
Z:第一方向 Z: First direction
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2022-164684 | 2022-10-13 | ||
JP2022164684A JP2024057787A (en) | 2022-10-13 | 2022-10-13 | Inspection socket and inspection device |
Publications (1)
Publication Number | Publication Date |
---|---|
TW202415956A true TW202415956A (en) | 2024-04-16 |
Family
ID=88338660
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW112131581A TW202415956A (en) | 2022-10-13 | 2023-08-23 | Inspection socket and inspection device |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2024057787A (en) |
KR (1) | KR20240051822A (en) |
CN (2) | CN219871495U (en) |
TW (1) | TW202415956A (en) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4781948B2 (en) | 2006-09-15 | 2011-09-28 | 信越半導体株式会社 | Solar cell electrode inspection apparatus and solar cell electrode inspection method |
-
2022
- 2022-10-13 JP JP2022164684A patent/JP2024057787A/en active Pending
-
2023
- 2023-01-06 CN CN202320042767.5U patent/CN219871495U/en active Active
- 2023-08-23 TW TW112131581A patent/TW202415956A/en unknown
- 2023-09-13 KR KR1020230121533A patent/KR20240051822A/en not_active Application Discontinuation
- 2023-09-14 CN CN202311184570.6A patent/CN117890636A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
JP2024057787A (en) | 2024-04-25 |
CN117890636A (en) | 2024-04-16 |
CN219871495U (en) | 2023-10-20 |
KR20240051822A (en) | 2024-04-22 |
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