WO2008020565A1 - Conductive contactor unit - Google Patents

Conductive contactor unit Download PDF

Info

Publication number
WO2008020565A1
WO2008020565A1 PCT/JP2007/065659 JP2007065659W WO2008020565A1 WO 2008020565 A1 WO2008020565 A1 WO 2008020565A1 JP 2007065659 W JP2007065659 W JP 2007065659W WO 2008020565 A1 WO2008020565 A1 WO 2008020565A1
Authority
WO
WIPO (PCT)
Prior art keywords
conductive contact
conductive
contact
longitudinal direction
short side
Prior art date
Application number
PCT/JP2007/065659
Other languages
French (fr)
Japanese (ja)
Inventor
Yuka Ooyashiki
Takahiro Motegi
Original Assignee
Nhk Spring Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co., Ltd. filed Critical Nhk Spring Co., Ltd.
Priority to TW096129931A priority Critical patent/TWI346206B/en
Publication of WO2008020565A1 publication Critical patent/WO2008020565A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/2872Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Definitions

  • the present invention relates to a conductive material that transmits and receives electrical signals by contacting electrodes and terminals of an electronic component when conducting a conduction state inspection or an operation characteristic inspection in an electronic component such as a liquid crystal panel or a semiconductor integrated circuit. This relates to the contact unit.
  • a plurality of conductive contacts are provided corresponding to the connection electrodes of the semiconductor integrated circuit, and the conductive contacts are used for connection.
  • a technology related to a conductive contact unit having a function of ensuring electrical continuity by making physical contact with an electrode is known! /.
  • the conductive contact unit includes a plurality of conductive contacts and a conductive contact holder that holds the plurality of conductive contacts.
  • various technologies have been proposed to cope with the narrowing of the arrangement interval of the connection electrodes accompanying the trend toward miniaturization of the semiconductor integrated circuit to be inspected. .
  • Patent Document 1 discloses a technique relating to a plate-shaped conductive contact that includes a contact portion that contacts an object to be inspected and an elastic portion that urges and urges against the contact portion. Yes.
  • this prior art by arranging a plurality of conductive contacts arranged in the plate thickness direction at a narrow interval, it is possible to cope with a narrow array interval of connection electrodes to be inspected.
  • Patent Document 1 Japanese Patent Laid-Open No. 2001-343397
  • the present invention has been made in view of the above, and an object thereof is to provide a conductive contact unit having excellent durability.
  • one embodiment of the present invention provides a conductive contact that transmits and receives signals between a circuit structure that outputs a test signal and a test target.
  • a first contact portion that is made of a plate-like conductive material and that contacts a circuit structure that outputs a signal for inspection, an elastic portion that can be expanded and contracted in the longitudinal direction,
  • the contact tip is a second contact portion that protrudes in a direction away from the center axis of the elastic portion in the width direction than the edge portion in the width direction of the elastic portion, and the elastic portion and the first contact.
  • a rectangular opening having a long side extending in the plate thickness direction and parallel to the longitudinal direction.
  • the first connecting portion connecting the portion and the elastic portion and the second contact portion are connected.
  • a plurality of first guide grooves that fit and hold the edge portion on the side from which the second contact portion protrudes, and the plurality of first guide grooves, and are opposed to each other.
  • a conductive contact holder having a plurality of second guide grooves for fitting and holding the other edge of the conductive contact fitted in the first guide groove, and fixed to the conductive contact holder;
  • a bar-shaped member penetrating the opening provided in each of the plurality of conductive contacts, and a cross section perpendicular to the longitudinal direction of the bar-shaped member is substantially equal to the length of the short side of the opening. Shorter than the length of the short side of the opening! /, At least one of the two sides having a length, which is lower than the rectangle having two sides parallel to the short side of the opening and having a short side. It is characterized by the shape obtained by removing the region including the part.
  • the cross section perpendicular to the longitudinal direction of the rod-shaped member may be trapezoidal.
  • the ratio of the length of the upper base to the length of the lower base in the trapezoidal cross section may be 2: 1.
  • the cross section perpendicular to the longitudinal direction of the rod-shaped member may have a pentagonal shape having two sets of parallel opposite sides.
  • the cross section perpendicular to the longitudinal direction of the rod-shaped member is a right triangle. It may be shaped.
  • the tip of the second contact portion is the outer surface of the conductive contact holder, and the outer surface of the portion where the first guide groove is formed on the inner surface. It is better to project in the direction of the normal of the outer surface!
  • the first contact portion that is formed of a plate-like conductive material and contacts a circuit structure that outputs a signal for inspection, an elastic portion that can expand and contract in the longitudinal direction, and a contact with an inspection target.
  • a second contact portion that protrudes in a direction in which the tip to touch is farther away from the central axis in the width direction of the elastic portion than the edge portion in the width direction of the elastic portion; the elastic portion and the first contact portion
  • the first connecting portion and the elastic portion and the second contact portion are connected, and a rectangular opening having a long side extending in the plate thickness direction and parallel to the longitudinal direction is provided.
  • a plurality of conductive contacts having a second connection portion formed thereon, and a conductive contact holder holding the plurality of conductive contacts, and the openings provided in the plurality of conductive contacts, respectively.
  • FIG. 1 is a perspective view showing a configuration of a conductive contact unit according to an embodiment of the present invention.
  • FIG. 2 is a diagram showing a configuration of a conductive contact according to an embodiment of the present invention.
  • FIG. 3 is a partially enlarged perspective view of the upper surface portion of the conductive contact holder.
  • FIG. 4 is a diagram showing an internal configuration of a conductive contact unit according to one embodiment of the present invention.
  • FIG. 5 is a partially enlarged view showing the cross-sectional shape of the rod-shaped member.
  • FIG. 6 is a cross-sectional view showing another configuration example (second example) of the rod-shaped member.
  • FIG. 7 is a cross-sectional view showing another configuration example (third example) of the rod-shaped member.
  • FIG. 8 is a cross-sectional view showing another configuration example (fourth example) of the rod-shaped member.
  • FIG. 1 is a perspective view showing a configuration of a conductive contact unit according to an embodiment of the present invention.
  • the conductive contact unit 1 shown in the figure performs a conduction state inspection and an operation characteristic inspection of a circuit structure such as a liquid crystal panel to be inspected, and includes a plurality of plate-like conductive contact 2 and A conductive contact holder 3 that accommodates and holds a plurality of conductive contacts 2 and a rod-like member 4 that is fixed to the conductive contact holder 3 and supports the plurality of conductive contacts 2 are provided.
  • FIG. 2 is a diagram illustrating a configuration of the conductive contact 2 according to the first embodiment.
  • the vertical direction in FIG. 2 is “longitudinal direction of conductive contact 2”
  • the horizontal direction in FIG. 2 is “width direction of conductive contact 2”.
  • the direction in which the contact is made that is, the direction perpendicular to the paper surface, is referred to as the “plate thickness direction of the conductive contact 2”.
  • the conductive contact 2 shown in FIG. 2 is formed in a plate shape using a conductive material, and establishes an electrical connection between a circuit structure that generates a test signal and a test target. To do. More specifically, the conductive contact 2 includes a first contact portion 21 that is in physical contact with a predetermined circuit structure including an inspection circuit, and a second contact that is in physical contact with an inspection target such as a liquid crystal panel.
  • An elastic part 23 that is interposed between the contact part 22, the first contact part 21 and the second contact part 22 and can be expanded and contracted in the longitudinal direction, and a first connection part 24 that connects the first contact part 21 and the elastic part 23 And a second connection portion 26 that connects the second contact portion 22 and the elastic portion 23, penetrates in the thickness direction, and has a rectangular opening 25 having a long side parallel to the longitudinal direction. .
  • the first contact portion 21 is provided so as to protrude in the longitudinal direction from the central portion in the short direction of the first connection portion 24.
  • the protruding position of the first contact portion 21 from the first connection portion 24 is not limited to this, and may be determined according to conditions such as the position of the electrode provided in the circuit structure to be contacted.
  • the second contact portion 22 protrudes in the direction of the center axial force in the width direction of the elastic portion 23, away from the edge of the elastic portion 23 in the width direction.
  • the shape of the second contact portion 22 is the material of the conductive contact 2, the load to be applied to the conductive contact 2 during inspection, and the conductive contact holder 3 that holds and holds the conductive contact 2. If it protrudes in the width direction from the edge in the width direction of the second connection portion 26, the details of the shape should be determined. Can be appropriately changed.
  • the elastic portion 23 includes a plurality of straight portions 23a that are orthogonal to the longitudinal direction of the conductive contact 2 and parallel to the width direction, and a plurality of curved portions 23b that connect adjacent straight portions. Along the way, it is meandering in an S shape.
  • the wire diameter of the straight portion 23a is uniform, and the outer diameter and wire diameter of the curved portion 23b are also uniform. Note that the number of the curved portions 23b of the elastic portion 23 is determined according to the load applied to the conductive contact 2.
  • the conductive contact holder 3 As shown in FIG. 1, the conductive contact holder 3 has a substantially rectangular parallelepiped appearance, and passes through the top surface portion 3a and the bottom surface portion (not shown in FIG. 1) to attach a plurality of conductive contact members 2 to each other.
  • maintain and the fixing hole part 32 which each is formed in the predetermined position of the side part 3b which mutually opposes via the holding part 31, and fixes the edge part of the rod-shaped member 4 are provided.
  • FIG. 3 is a partially enlarged perspective view of the upper surface portion 3 a of the conductive contact holder 3.
  • the first linear guide that fits and holds one edge in the width direction of the conductive contact 2
  • a groove 31a and a linear shape that is positioned opposite to the first guide groove 31a and that fits and holds the other edge in the width direction of the conductive contact 2 fitted in the first guide groove 31a.
  • a plurality of pairs of the second guide grooves 31b are formed.
  • the first guide groove 31a and the second guide groove 31b forming a pair have a function of positioning the conductive contact 2 with respect to the surface direction perpendicular to the longitudinal direction, and guide the expansion and contraction of the conductive contact 2 It has a function to do. Further, among the pairs formed by the first guide groove 31a and the second guide groove 31b, the intervals between adjacent pairs are all equal and parallel to each other.
  • Each of the first guide groove 31a and the second guide groove 31b has the same groove width (referred to as w) and the same groove depth (referred to as d).
  • the groove depth of the first guide groove 31a and the groove depth of the second guide groove 31b are equal to each other! /.
  • the groove depths of both guide grooves are different from each other. It does not matter.
  • FIG. 4 is a diagram showing an internal configuration of the conductive contact unit 1.
  • the cross section of the conductive contact holder 3 shown in the figure corresponds to the cross section along line AA in FIG.
  • the first guide groove 31a and the second guide groove 31b have a structure extending in parallel with each other along the z-axis direction (direction perpendicular to the groove width direction) in FIG.
  • the length of the first guide groove 31a extending in the z-axis direction of FIG. 4 is shorter than the length of the second guide groove 31b extending in the same z-axis direction.
  • the second guide groove 31b is a conductive contact holder 3
  • the force reaching the bottom surface portion 3d of the first guide groove 31a reaches only a position vertically above the bottom surface portion 3d! / ,!
  • the conductive contact holder 3 having the above-described configuration is such that the width direction is parallel to the X-axis direction in the coordinate system (xyz) shown in FIGS.
  • the direction is parallel to the y-axis direction, and the longitudinal force is held so as to be parallel to the axial direction.
  • the plate thickness of the conductive contact 2 is slightly smaller than the groove width (w) of the first guide groove 31a and the second guide groove 31b.
  • the conductive contact 2 held by the conductive contact holder 3 is loaded with a load on the first contact portion 21 and the second contact portion 22! /,! /, And the state (the state shown in FIG. 4). ),
  • the tip Q of the second contact portion 22 protrudes a predetermined amount in the positive direction of the X-axis from the side surface portion 3c of the conductive contact holder 3 (the protrusion amount is ⁇ ).
  • the tip Q of the second contact portion 22 is the bottom surface portion of the conductive contact holder 3.
  • the operator can confirm the presence or absence of physical contact between the tip of the conductive contact 2 and the inspection object even from an obliquely upper side of the conductive contact unit 1 (see FIG. 1).
  • the offset amount of the tip of the second contact portion 22 from the axis O that passes through the tip P of the first contact portion 21 and is parallel to the z-axis direction is ⁇ .
  • 1 1 1 1 is appropriately determined according to conditions such as the size of the conductive contact 2 and the conductive contact holder 3 and the load to be applied to the inspection object.
  • the conductive contact holder 3 is preferably formed of an insulating material from the viewpoint of being electrically connected to the conductive contact 2 and preventing a short circuit from occurring.
  • the conductive contact holder 3 is formed using a synthetic resin having low thermal expansion
  • the first guide groove 31a and the second guide groove 31b are formed by dicing or the like!
  • Other examples include alumina (A1 ⁇ 3 ), ceramics such as Zirco-Yure (Zr ⁇ 2 ), silica (Si ⁇ 2 ), thermosetting resins such as silicon and epoxy, engineering plastics such as polycarbonate, etc.
  • the first guide groove 31a and the second guide groove 31b may be formed by a processing technique such as etching.
  • a base material is formed using another suitable material (regardless of insulation), and the conductive contact 2 is contacted.
  • a suitable insulating paint may be applied to the possible portion (the portion including the first guide groove 31a and the second guide groove 31b). In this sense, an insulating paint may be applied to part or all of the surface of the conductive contact 2.
  • the rod-like member 4 will be described as! /.
  • the rod-shaped member 4 has a plurality of conductive contacts 2 attached to the holding portion 31 and passes through the opening 25 of each conductive contact 2, and then both ends thereof face each other of the conductive contact holder 3. It passes through the fixing holes 32 respectively formed in the side surface portions 3b and is fixed to the conductive contact holder 3.
  • the rod-like member 4 functions to prevent the conductive contact 2 from being removed from the holding portion 31 by penetrating through the openings 25 of the plurality of conductive contacts 2 held by the holding portion 31 at the same time. It performs the function of imparting initial deflection to contact 2.
  • the rod-shaped member 4 In view of supporting the conductive contacts 2 through the openings 25 of a large number of conductive contacts 2, the rod-shaped member 4 has high rigidity and little deflection even when a load is applied. Low sliding resistance with the conductive contact 2! / Insulating materials such as ceramics are particularly preferred! /. This As a result, the distance between the rod-shaped member 4 and the opening 25 can be reduced. As a result, the conductive contact 2 can be smoothly moved when a load is applied, and the support stability of the conductive contact 2 can be ensured by the rod-like member 4.
  • a circuit board 100 that establishes an electrical connection with a signal processing circuit that generates and outputs an inspection signal is attached above the conductive contact holder 3 having the above configuration.
  • the circuit board 100 has a large number of wirings and connection electrodes made of nickel or the like formed on one surface of a sheet-like base material made of polyimide or the like.
  • the inspection object 200 such as a liquid crystal panel is brought into contact with the tip Q of the second contact portion 22 by a predetermined driving means (not shown), and is raised until it reaches a predetermined position.
  • the tip Q of the second contact portion 22 is equal to ⁇ in the X-axis direction from the tip P of the first contact portion 21 as described above.
  • the tip Q of the second contact portion 22 moves while pulling on the surface while maintaining the contact state with the surface of the inspection object 200. In this way, the tip of the second contact portion 22 moves on the inspection object 200, thereby removing the oxide film formed on the surface of the inspection object 200 and the dirt adhering to the surface. It is possible to obtain stable electrical contact between them. At that time, if the moving speed (rising speed) of the inspection target 200 is appropriately controlled, an excessive load is applied to the conductive contact 2 in which the tip of the second contact portion 22 does not greatly damage the surface of the inspection target 200. No need to add.
  • the conductive contact unit 1 described above is partially fitted in the first guide groove 31a and the second guide groove 3 lb extending along the expansion / contraction direction of the elastic portion 23 of the conductive contact 2.
  • State Holds the conductive contact 2. This prevents the occurrence of buckling and torsion when the elastic part 23 contracts, which is a problem peculiar to the plate-like conductive contact 2, and causes the spring characteristics of the elastic part 23 to deteriorate due to them. You do n’t have to. Therefore, even if a certain load or more is applied to the conductive contact 2 within an appropriate range, a large stoke can be realized without causing buckling or twisting. It is possible to obtain a contact state.
  • the inspection object 200 continues to rise slightly after contacting the tip Q of the second contact portion 22 as described above.
  • the conductive contact 2 has only a small angle. Rotates to contact the rod-like member 4 and the second guide groove 31b.
  • the trapezoidal shape described above is used as the cross-sectional shape of the bar-shaped member 4, so that the number of contact points between the opening 25 and the bar-shaped member 4 is reduced, and the load characteristics of the conductive contact 2 are stabilized. be able to. As a result, the durability of the conductive contact 2 is improved, and the reliability of inspection can be improved.
  • the conductive contact 2 since the conductive contact 2 is held by the first guide groove 31a and the second guide groove 31b, the conductive contact 2 and the conductive contact holder 3 It is possible to reduce the sliding resistance by reducing the contact area with the (holding portion 31), and the conductive contact 2 can be smoothly expanded and contracted.
  • the conductive contactor unit 1 has a groove width of the first guide groove 31a and the second guide groove 31b.
  • the conductive contact 2 is penetrated through the rod-like member 4 to give the conductive contact 2 initial deflection and prevent it from coming off.
  • the protrusion amount h in which the tip Q of the second contact portion 22, that is, the lower end of the conductive contact 2 protrudes vertically downward from the bottom surface portion 3 d of the conductive contact holder 3 can be reduced.
  • the second contact portion 22 is made smaller, it is possible to prevent bending near the tip and stably hold the conductive contact 2, and the conductive contact 2 closes the first guide groove 31a near the lower end. Yo And / or slipping out of the second guide groove 31b. Therefore, the positional accuracy of the conductive contact 2 is increased, and the reliability and durability of the conductive contact unit 1 can be improved.
  • the step of accommodating the conductive contact 2 in the holding portion 31 is performed by inserting the first contact portion 21 side first into the holding portion 31 and then in the width direction. This is completed by fitting the edge portions of the first guide groove 31a and the second guide groove 31b. Therefore, assembling is easy even when compared with the conventional conductive contact unit, and if the manufacturing cost is reduced, the result can be obtained.
  • the first contact portion that is formed of a plate-like conductive material and that contacts the circuit structure that outputs a signal for inspection, expands and contracts in the longitudinal direction.
  • a second contact portion that protrudes in a direction in which the tip that contacts the object to be inspected is farther away from the central axis in the width direction of the elastic portion than the edge in the width direction of the elastic portion;
  • a first connecting portion that connects the elastic portion and the first contact portion, and the elastic portion and the second contact portion are connected, and a side that penetrates in the plate thickness direction and is parallel to the longitudinal direction is defined as a long side.
  • a plurality of conductive contacts having a second connection portion provided with a rectangular opening, and a plurality of the conductive contacts fixed to a conductive contact holder holding the plurality of conductive contacts.
  • the present embodiment even if the number of inspections increases and the friction between the conductive contacts decreases, the number of contact points between the conductive contacts and the rod-shaped member may increase.
  • the load characteristics of the conductive contact can be stabilized. As a result, the durability of the conductive contact is improved and stable inspection is possible.
  • FIG. 6 to FIG. 8 are cross-sectional views showing other configuration examples of the rod-shaped member provided in the conductive contact holder according to the present invention. This house
  • the rod-like member 5 shown in FIG. 6 has a cross-sectional shape that is reversed from the rod-like member 4 in the above embodiment in the drawing.
  • the rod-like member 6 shown in FIG. 7 has a pentagonal cross section having two sets of parallel opposite sides.
  • the rod-shaped member 7 shown in FIG. 8 has a right-angled triangular cross section. 6 to 8, the apex portion in each cross section is chamfered to improve the slidability of the conductive contact 2 and forms an R shape.
  • the cross section perpendicular to the longitudinal direction of the rod-shaped member provided in the conductive contact holder according to the present invention is a short of the opening of the conductive contact when the conductive contact is held. Positioned downward from a rectangle that has two sides that are approximately equal to the length of the side and shorter than the length of the short side of the opening! /, And have two sides parallel to the short side of the opening. It suffices if the shape is obtained by removing a region including at least a part of the short side. In addition, the ratio of the sides! /, Even if it is determined appropriately according to conditions such as rigidity required for the rod-shaped member! /,
  • the conductive contact unit according to the present invention is not limited to the case of inspecting a liquid crystal panel, but as a high-density conductive contact unit used for inspection of a package substrate mounted with a semiconductor chip or a wafer level. Is also applicable.
  • the conductive contact unit according to the present invention is useful when conducting a conduction state inspection or an operation characteristic inspection in an electronic component such as a liquid crystal panel or a semiconductor integrated circuit.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Liquid Crystal (AREA)

Abstract

A conductive contactor unit excellent in durability. The conductive contactor unit comprises a first contact portion touching a circuit structure delivering an inspecting signal, an elastic portion able to telescope in the longitudinal direction, a second contact portion of which the distal end touching an inspection object projects beyond the edge end of the elastic portion in the width direction in a direction away from the central axis in the width direction, a plurality of planar conductive contactors having a second joint for connecting the elastic portion with the second contact portion and provided with a rectangular opening penetrating in the plate thickness direction and having a long side parallel with the longitudinal direction, and a rodlike member bonded to a conductive contactor holder and penetrating the openings provided in the plurality of conductive contactors, respectively. Cross-section of the rodlike member in a direction perpendicular to the longitudinal direction has such a profile that a region including at least a portion of a short side located below is removed from a rectangle having two sides of substantially same length as that of the short side of the opening and shorter than the length of the short side of the opening, and parallel with the short side of the opening as the short sides.

Description

明 細 書  Specification
導電性接触子ユニット  Conductive contact unit
技術分野  Technical field
[0001] 本発明は、液晶パネルや半導体集積回路などの電子部品における導通状態検査 や動作特性検査を行う際に、その電子部品の電極や端子に接触して電気信号の送 受信を行う導電性接触子ユニットに関するものである。  [0001] The present invention relates to a conductive material that transmits and receives electrical signals by contacting electrodes and terminals of an electronic component when conducting a conduction state inspection or an operation characteristic inspection in an electronic component such as a liquid crystal panel or a semiconductor integrated circuit. This relates to the contact unit.
背景技術  Background art
[0002] 従来、半導体集積回路等の検査対象の電気特性検査に関する技術分野において 、半導体集積回路の接続用電極に対応して複数の導電性接触子を配設し、導電性 接触子を接続用電極と物理的に接触させることによって電気的導通を確保する機能 を有する導電性接触子ユニットに関する技術が知られて!/、る。導電性接触子ユニット は、複数の導電性接触子と、その複数の導電性接触子を保持する導電性接触子ホ ルダとを具備する。このような導電性接触子ユニットにおいては、検査対象である半 導体集積回路等の微細化傾向に伴った接続用電極の配列間隔の狭小化に対応す るためのさまざまな技術が提案されている。  Conventionally, in the technical field relating to inspection of electrical characteristics of an inspection target of a semiconductor integrated circuit or the like, a plurality of conductive contacts are provided corresponding to the connection electrodes of the semiconductor integrated circuit, and the conductive contacts are used for connection. A technology related to a conductive contact unit having a function of ensuring electrical continuity by making physical contact with an electrode is known! /. The conductive contact unit includes a plurality of conductive contacts and a conductive contact holder that holds the plurality of conductive contacts. In such a conductive contact unit, various technologies have been proposed to cope with the narrowing of the arrangement interval of the connection electrodes accompanying the trend toward miniaturization of the semiconductor integrated circuit to be inspected. .
[0003] 例えば、下記特許文献 1では、検査対象と接触する接触部とその接触部に対して 弹発付勢する弾性部とを備え、板状をなす導電性接触子に関する技術が開示され ている。この従来技術では、複数の導電性接触子を狭い間隔で板厚方向に並べて 配置することにより、検査対象の接続用電極の配列間隔の狭小化に対応することを 可能としている。  [0003] For example, Patent Document 1 below discloses a technique relating to a plate-shaped conductive contact that includes a contact portion that contacts an object to be inspected and an elastic portion that urges and urges against the contact portion. Yes. In this prior art, by arranging a plurality of conductive contacts arranged in the plate thickness direction at a narrow interval, it is possible to cope with a narrow array interval of connection electrodes to be inspected.
[0004] 特許文献 1:特開 2001— 343397号公報  [0004] Patent Document 1: Japanese Patent Laid-Open No. 2001-343397
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0005] しかしながら、上述した導電性接触子ユニットで検査を繰り返した場合、導電性接 触子ごとの荷重特性に乱れが生じることがあった。このため、安定した検査が実施で きなくなるだけでなぐ場合によっては導電性接触子が破損してしまう恐れがあり、耐 久十生に問題があった。 [0006] 本発明は、上記に鑑みてなされたものであって、耐久性に優れた導電性接触子ュ ニットを提供することを目的とする。 However, when the inspection is repeated with the above-described conductive contact unit, the load characteristics for each conductive contact may be disturbed. For this reason, there is a possibility that the conductive contact may be damaged depending on the case where the stable inspection cannot be carried out, and there has been a problem in durability. The present invention has been made in view of the above, and an object thereof is to provide a conductive contact unit having excellent durability.
課題を解決するための手段  Means for solving the problem
[0007] 上述した課題を解決し、 目的を達成するために、本発明の一態様は、検査用の信 号を出力する回路構造と検査対象との間の信号の送受信を行う導電性接触子ュニッ トであって、板状をなす導電性材料によって形成され、検査用の信号を出力する回 路構造と接触する第 1接触部、長手方向に伸縮可能な弾性部、検査対象と接触し、 この接触する先端が前記弾性部の幅方向の縁端部よりも前記弾性部の幅方向の中 心軸から遠ざ力、る方向に突出する第 2接触部、前記弾性部と前記第 1接触部とを接 続する第 1接続部、および前記弾性部と前記第 2接触部とを接続し、板厚方向に貫 通し前記長手方向に平行な辺を長辺とする長方形状の開口部が設けられた第 2接 続部を有する複数の導電性接触子と、前記導電性接触子の長手方向の一方の縁端 部であって前記第 2接触部が突出している側の縁端部を嵌合保持する複数の第 1ガ イド溝、および前記複数の第 1ガイド溝とそれぞれ対向して位置し、対向する前記第 1ガイド溝に嵌め込まれた前記導電性接触子の他方の縁端部を嵌合保持する複数 の第 2ガイド溝を有する導電性接触子ホルダと、前記導電性接触子ホルダに固着さ れ、前記複数の導電性接触子にそれぞれ設けられた前記開口部を貫通する棒状部 材と、を備え、前記棒状部材の長手方向に垂直な断面は、前記開口部の短辺の長さ と略等しく該開口部の短辺の長さよりも短!/、長さを有する 2辺であって前記開口部の 短辺と平行な 2辺を短辺とする長方形から下方に位置する短辺の少なくとも一部を含 む領域を取り除くことによって得られる形状をなすことを特徴とする。  In order to solve the above-described problems and achieve the object, one embodiment of the present invention provides a conductive contact that transmits and receives signals between a circuit structure that outputs a test signal and a test target. A first contact portion that is made of a plate-like conductive material and that contacts a circuit structure that outputs a signal for inspection, an elastic portion that can be expanded and contracted in the longitudinal direction, The contact tip is a second contact portion that protrudes in a direction away from the center axis of the elastic portion in the width direction than the edge portion in the width direction of the elastic portion, and the elastic portion and the first contact. A rectangular opening having a long side extending in the plate thickness direction and parallel to the longitudinal direction. The first connecting portion connecting the portion and the elastic portion and the second contact portion are connected. A plurality of conductive contacts having a second connection portion provided, and one edge in a longitudinal direction of the conductive contacts; A plurality of first guide grooves that fit and hold the edge portion on the side from which the second contact portion protrudes, and the plurality of first guide grooves, and are opposed to each other. A conductive contact holder having a plurality of second guide grooves for fitting and holding the other edge of the conductive contact fitted in the first guide groove, and fixed to the conductive contact holder; A bar-shaped member penetrating the opening provided in each of the plurality of conductive contacts, and a cross section perpendicular to the longitudinal direction of the bar-shaped member is substantially equal to the length of the short side of the opening. Shorter than the length of the short side of the opening! /, At least one of the two sides having a length, which is lower than the rectangle having two sides parallel to the short side of the opening and having a short side. It is characterized by the shape obtained by removing the region including the part.
[0008] また、上記発明において、前記棒状部材の長手方向に垂直な断面は台形状をな すとしてあよい。  [0008] In the above invention, the cross section perpendicular to the longitudinal direction of the rod-shaped member may be trapezoidal.
[0009] また、上記発明において、前記台形状の断面における上底の長さと下底の長さの 比は 2: 1であるとしてもよい。  [0009] In the above invention, the ratio of the length of the upper base to the length of the lower base in the trapezoidal cross section may be 2: 1.
[0010] また、上記発明において、前記棒状部材の長手方向に垂直な断面は、 2組の平行 な対辺を有する五角形状をなすとしてもよい。 [0010] In the above invention, the cross section perpendicular to the longitudinal direction of the rod-shaped member may have a pentagonal shape having two sets of parallel opposite sides.
[0011] また、上記発明において、前記棒状部材の長手方向に垂直な断面は直角三角形 状をなすとしてもよい。 [0011] In the above invention, the cross section perpendicular to the longitudinal direction of the rod-shaped member is a right triangle. It may be shaped.
[0012] また、上記発明にお!/、て、前記第 2接触部の先端は、前記導電性接触子ホルダの 外側面であって内側に前記第 1ガイド溝が形成された部分の外側面よりも当該外側 面の法線方向に突出してレ、るとしてもよ!/、。  [0012] In the invention described above, the tip of the second contact portion is the outer surface of the conductive contact holder, and the outer surface of the portion where the first guide groove is formed on the inner surface. It is better to project in the direction of the normal of the outer surface!
発明の効果  The invention's effect
[0013] 本発明によれば、板状をなす導電性材料によって形成され、検査用の信号を出力 する回路構造と接触する第 1接触部、長手方向に伸縮可能な弾性部、検査対象と接 触する先端が前記弾性部の幅方向の縁端部よりも前記弾性部の幅方向の中心軸か ら遠ざ力、る方向に突出する第 2接触部、前記弾性部と前記第 1接触部とを接続する 第 1接続部、および前記弾性部と前記第 2接触部とを接続し、板厚方向に貫通し前 記長手方向に平行な辺を長辺とする長方形状の開口部が設けられた第 2接続部を 有する複数の導電性接触子と、前記複数の導電性接触子を保持する導電性接触子 ホルダに固着され、前記複数の前記導電性接触子にそれぞれ設けられた前記開口 部を貫通する棒状部材と、を備え、前記棒状部材の長手方向に垂直な断面は、前記 開口部の短辺の長さと略等しく該開口部の短辺の長さよりも短!/、長さを有する 2辺で あって前記開口部の短辺と平行な 2辺を短辺とする長方形から、下方に位置する短 辺の少なくとも一部を含む領域を取り除いて得られる形状をなすことにより、耐久性に 優れた導電性接触子ユニットを提供することができる。  [0013] According to the present invention, the first contact portion that is formed of a plate-like conductive material and contacts a circuit structure that outputs a signal for inspection, an elastic portion that can expand and contract in the longitudinal direction, and a contact with an inspection target. A second contact portion that protrudes in a direction in which the tip to touch is farther away from the central axis in the width direction of the elastic portion than the edge portion in the width direction of the elastic portion; the elastic portion and the first contact portion The first connecting portion and the elastic portion and the second contact portion are connected, and a rectangular opening having a long side extending in the plate thickness direction and parallel to the longitudinal direction is provided. A plurality of conductive contacts having a second connection portion formed thereon, and a conductive contact holder holding the plurality of conductive contacts, and the openings provided in the plurality of conductive contacts, respectively. A cross section perpendicular to the longitudinal direction of the bar-shaped member, A rectangle that is approximately equal to the length of the short side of the mouth and shorter than the length of the short side of the opening! /, And has two sides that are parallel to the short side of the opening. From this, it is possible to provide a conductive contact unit excellent in durability by forming a shape obtained by removing a region including at least a part of the short side located below.
図面の簡単な説明  Brief Description of Drawings
[0014] [図 1]図 1は、本発明の一実施の形態に係る導電性接触子ユニットの構成を示す斜 視図である。  FIG. 1 is a perspective view showing a configuration of a conductive contact unit according to an embodiment of the present invention.
[図 2]図 2は、本発明の一実施の形態に係る導電性接触子の構成を示す図である。  FIG. 2 is a diagram showing a configuration of a conductive contact according to an embodiment of the present invention.
[図 3]図 3は、導電性接触子ホルダの上面部の部分拡大斜視図である。  FIG. 3 is a partially enlarged perspective view of the upper surface portion of the conductive contact holder.
[図 4]図 4は、本発明の一実施の形態に係る導電性接触子ユニットの内部構成を示 す図である。  FIG. 4 is a diagram showing an internal configuration of a conductive contact unit according to one embodiment of the present invention.
[図 5]図 5は、棒状部材の断面形状を示す部分拡大図である。  FIG. 5 is a partially enlarged view showing the cross-sectional shape of the rod-shaped member.
[図 6]図 6は、棒状部材の別な構成例(第 2例)を示す断面図である。  FIG. 6 is a cross-sectional view showing another configuration example (second example) of the rod-shaped member.
[図 7]図 7は、棒状部材の別な構成例(第 3例)を示す断面図である。 [図 8]図 8は、棒状部材の別な構成例(第 4例)を示す断面図である。 符号の説明 FIG. 7 is a cross-sectional view showing another configuration example (third example) of the rod-shaped member. FIG. 8 is a cross-sectional view showing another configuration example (fourth example) of the rod-shaped member. Explanation of symbols
1 導電性接触子ユニット  1 Conductive contact unit
2 導電性接触子  2 Conductive contact
3 導電性接触子ホルダ  3 Conductive contact holder
3a 上面部  3a Top surface
3b、 3c 側面部  3b, 3c side
3d 底面部  3d bottom
4、 5、 6、 7 棒状部材  4, 5, 6, 7 Bar-shaped member
21 第 1接触部  21 First contact
22 第 2接触部  22 Second contact area
23 弾性部  23 Elastic part
23a 直線部  23a Straight section
23b 湾曲部  23b Curved part
24 第 1接続部  24 First connection
25 開口部  25 opening
26 第 2接続部  26 Second connection
31 保持部  31 Holding part
32 固着用孔部  32 fixing hole
31 a 第 1ガイド溝  31 a 1st guide groove
31b 第 2ガイド溝  31b Second guide groove
100 回路基板  100 circuit board
101 固定部材  101 Fixing member
200 検査対象  200 Inspection target
P、 Q 先端  P, Q Tip
Δ オフセット量  Δ Offset amount
1  1
δ 、h 突出量  δ, h Protrusion
1  1
発明を実施するための最良の形態 [0016] 以下、添付図面を参照して本発明を実施するための最良の形態(以後、「実施の形 態」と称する)を説明する。なお、図面は模式的なものであって、各部分の厚みと幅と の関係、それぞれの部分の厚みの比率などは現実のものとは異なる場合もあることに 留意すべきであり、図面の相互間においても互いの寸法の関係や比率が異なる部分 が含まれる場合があることは勿論である。 BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, the best mode for carrying out the present invention (hereinafter referred to as “embodiment”) will be described with reference to the accompanying drawings. It should be noted that the drawings are schematic, and the relationship between the thickness and width of each part, the ratio of the thickness of each part, etc. may differ from the actual ones. Of course, there are cases in which parts having different dimensional relationships and ratios are included.
[0017] 図 1は、本発明の一実施の形態に係る導電性接触子ユニットの構成を示す斜視図 である。同図に示す導電性接触子ユニット 1は、検査対象である液晶パネル等の回 路構造の導通状態検査や動作特性検査を行うものであり、板状をなす複数の導電性 接触子 2と、複数の導電性接触子 2を収容保持する導電性接触子ホルダ 3と、導電 性接触子ホルダ 3に固着され、複数の導電性接触子 2を支持する棒状部材 4とを備 X·る。  FIG. 1 is a perspective view showing a configuration of a conductive contact unit according to an embodiment of the present invention. The conductive contact unit 1 shown in the figure performs a conduction state inspection and an operation characteristic inspection of a circuit structure such as a liquid crystal panel to be inspected, and includes a plurality of plate-like conductive contact 2 and A conductive contact holder 3 that accommodates and holds a plurality of conductive contacts 2 and a rod-like member 4 that is fixed to the conductive contact holder 3 and supports the plurality of conductive contacts 2 are provided.
[0018] まず、導電性接触子 2について説明する。図 2は、本実施の形態 1に係る導電性接 触子 2の構成を示す図である。以下の説明では、図 2における鉛直方向を「導電性接 触子 2の長手方向」、図 2における水平方向を「導電性接触子 2の幅方向」、これら長 手方向および幅方向とそれぞれ直交する方向すなわち紙面に垂直な方向を「導電 性接触子 2の板厚方向」とそれぞれ称することにする。  [0018] First, the conductive contact 2 will be described. FIG. 2 is a diagram illustrating a configuration of the conductive contact 2 according to the first embodiment. In the following description, the vertical direction in FIG. 2 is “longitudinal direction of conductive contact 2”, and the horizontal direction in FIG. 2 is “width direction of conductive contact 2”. The direction in which the contact is made, that is, the direction perpendicular to the paper surface, is referred to as the “plate thickness direction of the conductive contact 2”.
[0019] 図 2に示す導電性接触子 2は、導電性材料を用いて板状をなすように形成され、検 查用の信号を生成する回路構造と検査対象との電気的な接続を確立する。より具体 的には、導電性接触子 2は、検査用回路を含む所定の回路構造と物理的に接触す る第 1接触部 21と、液晶パネル等の検査対象と物理的に接触する第 2接触部 22と、 第 1接触部 21および第 2接触部 22の間に介在し、長手方向に伸縮可能な弾性部 23 と、第 1接触部 21および弾性部 23を接続する第 1接続部 24と、第 2接触部 22および 弾性部 23を接続し、板厚方向に貫通し、長手方向と平行な長辺を有する長方形状 の開口部 25が形成された第 2接続部 26と、を備える。  The conductive contact 2 shown in FIG. 2 is formed in a plate shape using a conductive material, and establishes an electrical connection between a circuit structure that generates a test signal and a test target. To do. More specifically, the conductive contact 2 includes a first contact portion 21 that is in physical contact with a predetermined circuit structure including an inspection circuit, and a second contact that is in physical contact with an inspection target such as a liquid crystal panel. An elastic part 23 that is interposed between the contact part 22, the first contact part 21 and the second contact part 22 and can be expanded and contracted in the longitudinal direction, and a first connection part 24 that connects the first contact part 21 and the elastic part 23 And a second connection portion 26 that connects the second contact portion 22 and the elastic portion 23, penetrates in the thickness direction, and has a rectangular opening 25 having a long side parallel to the longitudinal direction. .
[0020] 第 1接触部 21は、第 1接続部 24の短手方向中央部から長手方向に突出するように 設けられている。なお、第 1接触部 21の第 1接続部 24からの突出位置はこれに限ら れるわけではなぐ接触対象の回路構造に設けられた電極の位置等の条件に応じて 定めればよい。 [0021] 第 2接触部 22は、弾性部 23の幅方向の縁端部よりも弾性部 23の幅方向の中心軸 力、ら遠ざ力、る方向に突出している。なお、第 2接触部 22の形状は、導電性接触子 2の 材質や検査の際に導電性接触子 2に対して加えるべき荷重、導電性接触子 2を収容 保持する導電性接触子ホルダ 3の形状、検査対象の種類などさまざまな条件によつ て定められるべきものであり、第 2接続部 26の幅方向の縁端部よりも当該幅方向に突 出していれば、その形状の細部については適宜変更することが可能である。 The first contact portion 21 is provided so as to protrude in the longitudinal direction from the central portion in the short direction of the first connection portion 24. The protruding position of the first contact portion 21 from the first connection portion 24 is not limited to this, and may be determined according to conditions such as the position of the electrode provided in the circuit structure to be contacted. [0021] The second contact portion 22 protrudes in the direction of the center axial force in the width direction of the elastic portion 23, away from the edge of the elastic portion 23 in the width direction. The shape of the second contact portion 22 is the material of the conductive contact 2, the load to be applied to the conductive contact 2 during inspection, and the conductive contact holder 3 that holds and holds the conductive contact 2. If it protrudes in the width direction from the edge in the width direction of the second connection portion 26, the details of the shape should be determined. Can be appropriately changed.
[0022] 弾性部 23は、導電性接触子 2の長手方向と直交し幅方向に平行な複数の直線部 23a,および隣接する直線部を接続する複数の湾曲部 23bを有し、長手方向に沿つ て S字状に蛇行した形状をなしている。直線部 23aの線径は一様であり、湾曲部 23b の外径および線径も一様である。なお、弾性部 23の湾曲部 23bの数は、導電性接触 子 2に加わる荷重に応じて定められる。  The elastic portion 23 includes a plurality of straight portions 23a that are orthogonal to the longitudinal direction of the conductive contact 2 and parallel to the width direction, and a plurality of curved portions 23b that connect adjacent straight portions. Along the way, it is meandering in an S shape. The wire diameter of the straight portion 23a is uniform, and the outer diameter and wire diameter of the curved portion 23b are also uniform. Note that the number of the curved portions 23b of the elastic portion 23 is determined according to the load applied to the conductive contact 2.
[0023] 次に、導電性接触子ホルダ 3について説明する。導電性接触子ホルダ 3は、図 1に 示すように、略直方体状の外観形状をなし、上面部 3aと底面部(図 1では図示せず) を貫通して複数の導電性接触子 2を保持する保持部 31と、保持部 31を介して互い に対向する側面部 3bの所定位置にそれぞれ形成され、棒状部材 4の端部を固着す る固着用孔部 32とを有する。  Next, the conductive contact holder 3 will be described. As shown in FIG. 1, the conductive contact holder 3 has a substantially rectangular parallelepiped appearance, and passes through the top surface portion 3a and the bottom surface portion (not shown in FIG. 1) to attach a plurality of conductive contact members 2 to each other. The holding part 31 to hold | maintain and the fixing hole part 32 which each is formed in the predetermined position of the side part 3b which mutually opposes via the holding part 31, and fixes the edge part of the rod-shaped member 4 are provided.
[0024] 図 3は、導電性接触子ホルダ 3の上面部 3aの部分拡大斜視図である。図 3に示す ように、保持部 31には、導電性接触子 2を装着する際にその導電性接触子 2の幅方 向の一方の縁端部を嵌合保持する直線状の第 1ガイド溝 31 aと、この第 1ガイド溝 31 aと対向して位置し、その第 1ガイド溝 31aにはめ込まれた導電性接触子 2の幅方向 の他方の縁端部を嵌合保持する直線状の第 2ガイド溝 31bとが複数対形成されてい る。対をなす第 1ガイド溝 31aおよび第 2ガイド溝 31bは、導電性接触子 2をその長手 方向と垂直な面方向に対して位置決めする機能を有するとともに、導電性接触子 2 の伸縮動作をガイドする機能を有している。また、第 1ガイド溝 31aおよび第 2ガイド溝 31bのなす対のうち隣接する対同士の間隔は全て等しぐかつ互いに平行である。  FIG. 3 is a partially enlarged perspective view of the upper surface portion 3 a of the conductive contact holder 3. As shown in FIG. 3, in the holding portion 31, when the conductive contact 2 is mounted, the first linear guide that fits and holds one edge in the width direction of the conductive contact 2 A groove 31a and a linear shape that is positioned opposite to the first guide groove 31a and that fits and holds the other edge in the width direction of the conductive contact 2 fitted in the first guide groove 31a. A plurality of pairs of the second guide grooves 31b are formed. The first guide groove 31a and the second guide groove 31b forming a pair have a function of positioning the conductive contact 2 with respect to the surface direction perpendicular to the longitudinal direction, and guide the expansion and contraction of the conductive contact 2 It has a function to do. Further, among the pairs formed by the first guide groove 31a and the second guide groove 31b, the intervals between adjacent pairs are all equal and parallel to each other.
[0025] 第 1ガイド溝 31aおよび第 2ガイド溝 31bの各々は同じ溝幅 (wとする)を有するととも に、同じ溝深さ(dとする)を有する。なお、ここでは第 1ガイド溝 31aの溝深さと第 2ガ イド溝 31bとの溝深さが等し!/、場合を説明したが、両ガイド溝の溝深さが互いに異な つていても構わない。 Each of the first guide groove 31a and the second guide groove 31b has the same groove width (referred to as w) and the same groove depth (referred to as d). Here, the groove depth of the first guide groove 31a and the groove depth of the second guide groove 31b are equal to each other! /. Although the case has been described, the groove depths of both guide grooves are different from each other. It does not matter.
[0026] 図 4は、導電性接触子ユニット 1の内部構成を示す図である。同図に示す導電性接 触子ホルダ 3の断面は、図 3の A— A線断面に相当している。図 4に示すように、第 1 ガイド溝 31aおよび第 2ガイド溝 31bは、図 4の z軸方向(溝幅方向に垂直な方向)に 沿って互いに平行に延伸した構造を有する。第 1ガイド溝 31aが図 4の z軸方向に延 伸する長さは、第 2ガイド溝 31bが同じ z軸方向に延伸する長さよりも短ぐ第 2ガイド 溝 31bは導電性接触子ホルダ 3の底面部 3dまで到達している力 第 1ガイド溝 31aは 底面部 3dよりも鉛直上方の位置までしか到達して!/、な!/、。  FIG. 4 is a diagram showing an internal configuration of the conductive contact unit 1. The cross section of the conductive contact holder 3 shown in the figure corresponds to the cross section along line AA in FIG. As shown in FIG. 4, the first guide groove 31a and the second guide groove 31b have a structure extending in parallel with each other along the z-axis direction (direction perpendicular to the groove width direction) in FIG. The length of the first guide groove 31a extending in the z-axis direction of FIG. 4 is shorter than the length of the second guide groove 31b extending in the same z-axis direction. The second guide groove 31b is a conductive contact holder 3 The force reaching the bottom surface portion 3d of the first guide groove 31a reaches only a position vertically above the bottom surface portion 3d! / ,!
[0027] 以上の構成を有する導電性接触子ホルダ 3は、導電性接触子 2を、図 1および図 4 に示す座標系(xyz)において、幅方向が X軸方向と平行であり、板厚方向が y軸方向 と平行であり、長手方向力 ¾軸方向と平行であるように保持している。この意味で、導 電性接触子 2の板厚は、第 1ガイド溝 31aおよび第 2ガイド溝 31bの溝幅 (w)よりも若 干小さい。  [0027] The conductive contact holder 3 having the above-described configuration is such that the width direction is parallel to the X-axis direction in the coordinate system (xyz) shown in FIGS. The direction is parallel to the y-axis direction, and the longitudinal force is held so as to be parallel to the axial direction. In this sense, the plate thickness of the conductive contact 2 is slightly smaller than the groove width (w) of the first guide groove 31a and the second guide groove 31b.
[0028] 導電性接触子ホルダ 3に保持された導電性接触子 2は、第 1接触部 21および第 2 接触部 22に荷重が加わって!/、な!/、状態(図 4に示す状態)で第 2接触部 22の先端 Q が導電性接触子ホルダ 3の側面部 3cよりも X軸正の方向に所定量突出している(突 出量を δ とする)。また、第 2接触部 22の先端 Qは、導電性接触子ホルダ 3の底面部  [0028] The conductive contact 2 held by the conductive contact holder 3 is loaded with a load on the first contact portion 21 and the second contact portion 22! /,! /, And the state (the state shown in FIG. 4). ), The tip Q of the second contact portion 22 protrudes a predetermined amount in the positive direction of the X-axis from the side surface portion 3c of the conductive contact holder 3 (the protrusion amount is δ). The tip Q of the second contact portion 22 is the bottom surface portion of the conductive contact holder 3.
1  1
3dから Ζ軸負の方向に所定量突出している(突出量を hとする)。これによりオペレー タは、導電性接触子ユニット 1の斜め上方からでも導電性接触子 2の先端と検査対象 との物理的な接触の有無を確認することができる(図 1を参照)。なお、図 4では、第 1 接触部 21の先端 Pを通過し z軸方向に平行な軸 Oからの第 2接触部 22の先端のオフ セット量を Δとしている。ここで説明した突出量 δ および h、ならびにオフセット量 Δ By a predetermined amount of protrusion from the 3d in the direction of the Ζ axis negative (the amount of protrusion and h). As a result, the operator can confirm the presence or absence of physical contact between the tip of the conductive contact 2 and the inspection object even from an obliquely upper side of the conductive contact unit 1 (see FIG. 1). In FIG. 4, the offset amount of the tip of the second contact portion 22 from the axis O that passes through the tip P of the first contact portion 21 and is parallel to the z-axis direction is Δ. Protrusion amounts δ and h described here, and offset amount Δ
1 1 1 は、導電性接触子 2や導電性接触子ホルダ 3の大きさ、検査対象に加えるべき荷重 等の条件に応じて適宜定められる。  1 1 1 is appropriately determined according to conditions such as the size of the conductive contact 2 and the conductive contact holder 3 and the load to be applied to the inspection object.
[0029] 導電性接触子ホルダ 3は、導電性接触子 2と電気的に接続して短絡が発生すること を防止する観点から、絶縁性材料によって形成されることが好ましい。例えば、低熱 膨張の合成樹脂を用いて導電性接触子ホルダ 3を形成し、ダイシング等によって第 1 ガイド溝 31aおよび第 2ガイド溝 31bを形成すればよ!/、。他にも、例えばアルミナ (A1 〇3)、ジルコユア(Zr〇2)、シリカ(Si〇2)等のセラミックス、シリコン、エポキシ等の熱硬 化性樹脂、ポリカーボネート等のエンジニアリングプラスチックなどによって導電性接 触子ホルダ 3の母材を形成し、エッチング等の加工技術によって第 1ガイド溝 31aお よび第 2ガイド溝 31bを形成してもよい。また、絶縁性材料を用いて導電性接触子ホ ルダ 3を形成する代わりに、他の適当な材料 (絶縁性の有無は不問)を用いて母材を 形成し、導電性接触子 2と接触しうる部分 (第 1ガイド溝 31aや第 2ガイド溝 31bを含む 部分)に対して適当な絶縁性塗料を塗布するような構成としてもよい。この意味では、 導電性接触子 2の表面の一部または全部に対して絶縁性塗料を塗布してもよい。 The conductive contact holder 3 is preferably formed of an insulating material from the viewpoint of being electrically connected to the conductive contact 2 and preventing a short circuit from occurring. For example, the conductive contact holder 3 is formed using a synthetic resin having low thermal expansion, and the first guide groove 31a and the second guide groove 31b are formed by dicing or the like! Other examples include alumina (A1 ○ 3 ), ceramics such as Zirco-Yure (Zr ○ 2 ), silica (Si ○ 2 ), thermosetting resins such as silicon and epoxy, engineering plastics such as polycarbonate, etc. The first guide groove 31a and the second guide groove 31b may be formed by a processing technique such as etching. In addition, instead of forming the conductive contact holder 3 using an insulating material, a base material is formed using another suitable material (regardless of insulation), and the conductive contact 2 is contacted. A suitable insulating paint may be applied to the possible portion (the portion including the first guide groove 31a and the second guide groove 31b). In this sense, an insulating paint may be applied to part or all of the surface of the conductive contact 2.
[0030] 続!/、て、棒状部材 4につ!/、て説明する。棒状部材 4は、複数の導電性接触子 2を保 持部 31に装着し、各導電性接触子 2の開口部 25を貫通した後、その両端部が導電 性接触子ホルダ 3の互いに対向する側面部 3bにそれぞれ形成された固着用孔部 32 に揷通され、導電性接触子ホルダ 3に対して固着される。棒状部材 4は、保持部 31 で保持する複数の導電性接触子 2の開口部 25を一括して貫通することによって導電 性接触子 2の保持部 31からの抜け止め機能を果たすとともに、導電性接触子 2に対 して初期たわみを付与する機能を果たす。  [0030] Continued! /, The rod-like member 4 will be described as! /. The rod-shaped member 4 has a plurality of conductive contacts 2 attached to the holding portion 31 and passes through the opening 25 of each conductive contact 2, and then both ends thereof face each other of the conductive contact holder 3. It passes through the fixing holes 32 respectively formed in the side surface portions 3b and is fixed to the conductive contact holder 3. The rod-like member 4 functions to prevent the conductive contact 2 from being removed from the holding portion 31 by penetrating through the openings 25 of the plurality of conductive contacts 2 held by the holding portion 31 at the same time. It performs the function of imparting initial deflection to contact 2.
[0031] 棒状部材 4の長手方向に垂直な断面は、図 4に示すように、導電性接触子 2の第 2 接続部 26が有する開口部 25の短辺の長さと略等しくその開口部 25の短辺の長さよ りも短!/、長さを有する 2辺であって開口部 25の短辺と平行な 2辺を短辺とする長方形 力、ら下方に位置する短辺の少なくとも一部を含む領域を取り除くことによって得られる 形状をなしており、より具体的には、短手方向の辺を上辺および下辺とする台形状を なしている。この台形の頂点部分は、導電性接触子 2の摺動性をよくするために面取 りされて R形状をなしている。図 5の拡大図に示すように、この台形状をなす断面にお ける上底の長さ uと下底の長さ Vとの比は 2 : 1である(v=u/2)。なお、この比はあく までも一例に過ぎず、棒状部材 4に要求される剛性などの条件に応じて変更可能で ある。  As shown in FIG. 4, the cross section perpendicular to the longitudinal direction of the rod-shaped member 4 is substantially equal to the length of the short side of the opening 25 of the second connecting portion 26 of the conductive contact 2. Is shorter than the length of the short side! /, A rectangular force that has two sides that are parallel to the short side of the opening 25 and the short side is at least one of the short sides located below. It has a shape obtained by removing the region including the part, and more specifically, it has a trapezoidal shape with the sides in the short direction being the upper side and the lower side. The apex of this trapezoid is chamfered to make the conductive contact 2 more slidable and has an R shape. As shown in the enlarged view of FIG. 5, the ratio of the upper base length u to the lower base length V in the trapezoidal cross section is 2: 1 (v = u / 2). This ratio is merely an example, and can be changed according to conditions such as rigidity required for the rod-shaped member 4.
[0032] 棒状部材 4は、多数の導電性接触子 2の開口部 25を貫通してそれら全ての導電性 接触子 2を支持することに鑑み、剛性が高く荷重が加わってもたわみが少なぐ導電 性接触子 2との摺動抵抗が小さ!/、セラミックスなどの絶縁性材料が特に好まし!/、。こ れにより、棒状部材 4と開口部 25との間隔を小さくすることができる。その結果、荷重 を加えたときの導電性接触子 2の動きを円滑にすることができるとともに、棒状部材 4 によって導電性接触子 2の支持安定性を確保することも可能となる。 [0032] In view of supporting the conductive contacts 2 through the openings 25 of a large number of conductive contacts 2, the rod-shaped member 4 has high rigidity and little deflection even when a load is applied. Low sliding resistance with the conductive contact 2! / Insulating materials such as ceramics are particularly preferred! /. This As a result, the distance between the rod-shaped member 4 and the opening 25 can be reduced. As a result, the conductive contact 2 can be smoothly moved when a load is applied, and the support stability of the conductive contact 2 can be ensured by the rod-like member 4.
[0033] 以上の構成を有する導電性接触子ホルダ 3の上方には、検査用信号を生成出力 する信号処理回路との電気的な接続を確立する回路基板 100を取り付ける。回路基 板 100は、ポリイミドなどからなるシート状の基材の一方の表面に、ニッケル等からな る多数の配線および接続用の電極が形成されてなる。回路基板 100を取り付ける際 には、回路基板 100の電極が導電性接触子 2の第 1接触部 21と接触するように位置 決めを行い、導電性接触子ホルダ 3と同様の材料からなる固定部材 101および導電 性接触子ホルダ 3によって回路基板 100を挟持し、ねじ等の締結手段(図示せず)を 用いて固定する。この結果、各導電性接触子 2には自身に作用する重力以外の力に 起因する荷重 (初期荷重)が加わり、各弾性部 23が長手方向に収縮する。  A circuit board 100 that establishes an electrical connection with a signal processing circuit that generates and outputs an inspection signal is attached above the conductive contact holder 3 having the above configuration. The circuit board 100 has a large number of wirings and connection electrodes made of nickel or the like formed on one surface of a sheet-like base material made of polyimide or the like. When mounting the circuit board 100, position the electrode so that the electrode of the circuit board 100 is in contact with the first contact portion 21 of the conductive contact 2, and a fixing member made of the same material as the conductive contact holder 3 The circuit board 100 is sandwiched between 101 and the conductive contact holder 3 and fixed using fastening means (not shown) such as screws. As a result, a load (initial load) due to a force other than gravity acting on itself is applied to each conductive contact 2, and each elastic portion 23 contracts in the longitudinal direction.
[0034] 次に、導電性接触子ユニット 1と検査対象 200との接触態様について説明する。検 查を行う際には、液晶パネル等の検査対象 200を所定の駆動手段(図示せず)によ つて第 2接触部 22の先端 Qと接触し、所定の位置に達するまで上昇させていく。第 2 接触部 22の先端 Qは、上述したように第 1接触部 21の先端 Pから X軸方向に Δだけ  Next, a contact mode between the conductive contact unit 1 and the inspection object 200 will be described. When performing inspection, the inspection object 200 such as a liquid crystal panel is brought into contact with the tip Q of the second contact portion 22 by a predetermined driving means (not shown), and is raised until it reaches a predetermined position. . The tip Q of the second contact portion 22 is equal to Δ in the X-axis direction from the tip P of the first contact portion 21 as described above.
1 オフセットしているため、検査対象 200と接触した導電性接触子 2にはモーメントが発 生する。すなわち、導電性接触子 2は、弾性部 23が収縮して開口部 25が棒状部材 4 力 離間した後、図 4で時計回りに微小角だけ回転する。  1 Because of the offset, a moment is generated in the conductive contact 2 in contact with the inspection object 200. That is, the conductive contact 2 rotates by a small angle in the clockwise direction in FIG. 4 after the elastic portion 23 contracts and the opening 25 is separated from the rod-like member 4 by force.
[0035] 上述した回転により、第 2接触部 22の先端 Qは、検査対象 200の表面との接触状 態を持続しながらその表面上を引つ搔いて移動する。このようにして、第 2接触部 22 の先端が検査対象 200上を移動することにより、検査対象 200の表面に形成された 酸化膜やその表面に付着した汚れを除去し、検査対象 200との間で安定した電気的 接触を得ることが可能となる。その際、検査対象 200の移動速度(上昇速度)を適切 に制御すれば、第 2接触部 22の先端が検査対象 200の表面を大きく傷付けることが なぐ導電性接触子 2にも過度の荷重を加えないで済む。  [0035] By the rotation described above, the tip Q of the second contact portion 22 moves while pulling on the surface while maintaining the contact state with the surface of the inspection object 200. In this way, the tip of the second contact portion 22 moves on the inspection object 200, thereby removing the oxide film formed on the surface of the inspection object 200 and the dirt adhering to the surface. It is possible to obtain stable electrical contact between them. At that time, if the moving speed (rising speed) of the inspection target 200 is appropriately controlled, an excessive load is applied to the conductive contact 2 in which the tip of the second contact portion 22 does not greatly damage the surface of the inspection target 200. No need to add.
[0036] 以上説明した導電性接触子ユニット 1は、導電性接触子 2の弾性部 23の伸縮方向 に沿って延伸した第 1ガイド溝 31 aおよび第 2ガイド溝 3 lbに一部を嵌め込んだ状態 で導電性接触子 2を保持している。このため、板状をなす導電性接触子 2に特有な問 題である弾性部 23の収縮時の座屈およびねじれの発生を防止し、それらに起因する 弾性部 23のばね特性の劣化を生じさせずに済む。したがって、導電性接触子 2に適 切な範囲内で一定以上の荷重を加えても座屈やねじれを生じることなく大きなスト口 ークを実現することができ、検査対象 200との間で所望の接触状態を得ることが可能 となる。 [0036] The conductive contact unit 1 described above is partially fitted in the first guide groove 31a and the second guide groove 3 lb extending along the expansion / contraction direction of the elastic portion 23 of the conductive contact 2. State Holds the conductive contact 2. This prevents the occurrence of buckling and torsion when the elastic part 23 contracts, which is a problem peculiar to the plate-like conductive contact 2, and causes the spring characteristics of the elastic part 23 to deteriorate due to them. You do n’t have to. Therefore, even if a certain load or more is applied to the conductive contact 2 within an appropriate range, a large stoke can be realized without causing buckling or twisting. It is possible to obtain a contact state.
[0037] 検査対象 200は、上述したように第 2接触部 22の先端 Qと接触した後も若干上昇を 続けるが、接触後の検査対象 200の上昇により、導電性接触子 2は微小角だけ回転 して棒状部材 4や第 2ガイド溝 31bと接触する。本実施の形態では、棒状部材 4の断 面形状として上述した台形状とすることにより、開口部 25と棒状部材 4との接触箇所 が削減され、導電性接触子 2の荷重特性を安定化することができる。この結果、導電 性接触子 2の耐久性が向上し、検査の信頼度も向上させることができる。  [0037] The inspection object 200 continues to rise slightly after contacting the tip Q of the second contact portion 22 as described above. However, due to the increase of the inspection object 200 after contact, the conductive contact 2 has only a small angle. Rotates to contact the rod-like member 4 and the second guide groove 31b. In the present embodiment, the trapezoidal shape described above is used as the cross-sectional shape of the bar-shaped member 4, so that the number of contact points between the opening 25 and the bar-shaped member 4 is reduced, and the load characteristics of the conductive contact 2 are stabilized. be able to. As a result, the durability of the conductive contact 2 is improved, and the reliability of inspection can be improved.
[0038] また、導電性接触子ユニット 1においては、第 1ガイド溝 31aおよび第 2ガイド溝 31b によって導電性接触子 2を保持することとしたため、導電性接触子 2と導電性接触子 ホルダ 3 (の保持部 31)との間の接触面積を低減して摺動抵抗を減少させることがで き、導電性接触子 2の伸縮動作をスムーズに行うことが可能となる。  In the conductive contact unit 1, since the conductive contact 2 is held by the first guide groove 31a and the second guide groove 31b, the conductive contact 2 and the conductive contact holder 3 It is possible to reduce the sliding resistance by reducing the contact area with the (holding portion 31), and the conductive contact 2 can be smoothly expanded and contracted.
[0039] さらに、導電性接触子ユニット 1は、第 1ガイド溝 31aおよび第 2ガイド溝 31bの溝幅  [0039] Furthermore, the conductive contactor unit 1 has a groove width of the first guide groove 31a and the second guide groove 31b.
(w)が導電性接触子 2の板厚と同程度の値でよぐ互いに隣接する第 1ガイド溝 31a 間および第 2ガイド溝 31b間の各間隔は、隣接する導電性接触子 2間の絶縁性が十 分確保できる値であれば、任意の小さな値としてよい。したがって、複数の導電性接 触子 2の配列間隔を狭小化することが可能であり、回路基板 100や検査対象 200が 有する接続用の電極や端子の配列間隔の狭小化にも十分に対応することができる。  Each interval between the first guide grooves 31a and the second guide grooves 31b adjacent to each other where (w) is the same value as the thickness of the conductive contact 2 is between the adjacent conductive contacts 2. Any small value can be used as long as the insulation can be sufficiently secured. Therefore, it is possible to reduce the arrangement interval of the plurality of conductive contacts 2 and sufficiently cope with the reduction of the arrangement interval of the connection electrodes and terminals of the circuit board 100 and the inspection target 200. be able to.
[0040] 加えて、導電性接触子ユニット 1においては、導電性接触子 2に棒状部材 4を貫通 することによって導電性接触子 2に初期たわみを与えるとともに抜け止めを行ってい る。この結果、第 2接触部 22の先端 Qすなわち導電性接触子 2の下端が導電性接触 子ホルダ 3の底面部 3dから鉛直下方に突出する突出量 hを小さくすることができる。 換言すれば、第 2接触部 22を小さくしても、その先端付近の曲がりを防止し、安定し て保持することが可能となり、導電性接触子 2が下端部付近で第 1ガイド溝 31aおよ び/または第 2ガイド溝 31bから外れてしまうのを抑制することができる。したがって、 導電性接触子 2の位置精度が高くなり、導電性接触子ユニット 1の信頼性および耐久 性を向上させることができる。 In addition, in the conductive contact unit 1, the conductive contact 2 is penetrated through the rod-like member 4 to give the conductive contact 2 initial deflection and prevent it from coming off. As a result, the protrusion amount h in which the tip Q of the second contact portion 22, that is, the lower end of the conductive contact 2 protrudes vertically downward from the bottom surface portion 3 d of the conductive contact holder 3 can be reduced. In other words, even if the second contact portion 22 is made smaller, it is possible to prevent bending near the tip and stably hold the conductive contact 2, and the conductive contact 2 closes the first guide groove 31a near the lower end. Yo And / or slipping out of the second guide groove 31b. Therefore, the positional accuracy of the conductive contact 2 is increased, and the reliability and durability of the conductive contact unit 1 can be improved.
[0041] 導電性接触子ユニット 1を組み立てる際に導電性接触子 2を保持部 31に収容する 工程は、第 1接触部 21の側を先に保持部 31の内部に揷入し、幅方向の縁端部を第 1ガイド溝 31aおよび第 2ガイド溝 31bに嵌め込むことによって完了する。したがって、 従来の導電性接触子ユニットと比較しても組み立てが容易であり、製造コストを低減 するとレ、う ¾]果を得ることもできる。  [0041] When assembling the conductive contact unit 1, the step of accommodating the conductive contact 2 in the holding portion 31 is performed by inserting the first contact portion 21 side first into the holding portion 31 and then in the width direction. This is completed by fitting the edge portions of the first guide groove 31a and the second guide groove 31b. Therefore, assembling is easy even when compared with the conventional conductive contact unit, and if the manufacturing cost is reduced, the result can be obtained.
[0042] 以上説明した本発明の一実施の形態によれば、板状をなす導電性材料によって形 成され、検査用の信号を出力する回路構造と接触する第 1接触部、長手方向に伸縮 可能な弾性部、検査対象と接触する先端が前記弾性部の幅方向の縁端部よりも前 記弾性部の幅方向の中心軸から遠ざ力、る方向に突出する第 2接触部、前記弾性部と 前記第 1接触部とを接続する第 1接続部、および前記弾性部と前記第 2接触部とを接 続し、板厚方向に貫通し前記長手方向に平行な辺を長辺とする長方形状の開口部 が設けられた第 2接続部を有する複数の導電性接触子と、前記複数の導電性接触 子を保持する導電性接触子ホルダに固着され、前記複数の前記導電性接触子にそ れぞれ設けられた前記開口部を貫通する棒状部材と、を備え、前記棒状部材の長手 方向に垂直な断面は、前記開口部の短辺の長さと略等しく該開口部の短辺の長さよ りも短!/、長さを有する 2辺であって前記開口部の短辺と平行な 2辺を短辺とする長方 形から下方に位置する短辺の少なくとも一部を含む領域を取り除いて得られる形状 をなすことにより、耐久性に優れた導電性接触子ユニットを提供することができる。  [0042] According to the embodiment of the present invention described above, the first contact portion that is formed of a plate-like conductive material and that contacts the circuit structure that outputs a signal for inspection, expands and contracts in the longitudinal direction. A second contact portion that protrudes in a direction in which the tip that contacts the object to be inspected is farther away from the central axis in the width direction of the elastic portion than the edge in the width direction of the elastic portion; A first connecting portion that connects the elastic portion and the first contact portion, and the elastic portion and the second contact portion are connected, and a side that penetrates in the plate thickness direction and is parallel to the longitudinal direction is defined as a long side. A plurality of conductive contacts having a second connection portion provided with a rectangular opening, and a plurality of the conductive contacts fixed to a conductive contact holder holding the plurality of conductive contacts. A bar-shaped member penetrating the opening provided in each of the children, and a longitudinal direction of the bar-shaped member The cross section perpendicular to the direction is substantially equal to the length of the short side of the opening and shorter than the length of the short side of the opening! /, And has two lengths parallel to the short side of the opening. To provide a conductive contact unit with excellent durability by forming a shape obtained by removing a region including at least a part of a short side located below from a rectangular shape having two short sides. Can do.
[0043] また、本実施の形態によれば、検査回数が増加して導電性接触子との間の摩擦が 小さくなつても導電性接触子と棒状部材との接触箇所が増えたりすることがなぐ導 電性接触子の荷重特性を安定化させることができる。この結果、導電性接触子の耐 久性が向上し、安定した検査が可能となる。  [0043] Further, according to the present embodiment, even if the number of inspections increases and the friction between the conductive contacts decreases, the number of contact points between the conductive contacts and the rod-shaped member may increase. The load characteristics of the conductive contact can be stabilized. As a result, the durability of the conductive contact is improved and stable inspection is possible.
[0044] ここまで、本発明を実施するための最良の形態を詳述してきたが、本発明は上記一 実施の形態によってのみ限定されるべきものではない。図 6〜図 8は、本発明に係る 導電性接触子ホルダが備える棒状部材の別な構成例を示す断面図である。このうち 、図 6に示す棒状部材 5は、上記一実施の形態における棒状部材 4と図で左右が逆 転した断面形状を有している。また、図 7に示す棒状部材 6は、 2組の平行な対辺を 有する五角形状の断面を有している。さらに、図 8に示す棒状部材 7は、直角三角形 状の断面を有している。図 6〜図 8においても、各断面における頂点部分は、導電性 接触子 2の摺動性をよくするために面取りされて R形状をなしている。 [0044] The best mode for carrying out the present invention has been described in detail so far, but the present invention should not be limited only by the above-described embodiment. FIG. 6 to FIG. 8 are cross-sectional views showing other configuration examples of the rod-shaped member provided in the conductive contact holder according to the present invention. this house The rod-like member 5 shown in FIG. 6 has a cross-sectional shape that is reversed from the rod-like member 4 in the above embodiment in the drawing. Further, the rod-like member 6 shown in FIG. 7 has a pentagonal cross section having two sets of parallel opposite sides. Furthermore, the rod-shaped member 7 shown in FIG. 8 has a right-angled triangular cross section. 6 to 8, the apex portion in each cross section is chamfered to improve the slidability of the conductive contact 2 and forms an R shape.
[0045] このように、本発明に係る導電性接触子ホルダが備える棒状部材の長手方向に垂 直な断面は、導電性接触子を保持したとき、その導電性接触子が有する開口部の短 辺の長さと略等しく該開口部の短辺の長さよりも短!/、長さを有する 2辺であってその 開口部の短辺と平行な 2辺を短辺とする長方形から下方に位置する短辺の少なくとも 一部を含む領域を取り除くことによって得られる形状をなしていればよい。また、辺の 比率につ!/、ても、棒状部材に要求される剛性などの条件に応じて適宜定めればよ!/、 [0045] As described above, the cross section perpendicular to the longitudinal direction of the rod-shaped member provided in the conductive contact holder according to the present invention is a short of the opening of the conductive contact when the conductive contact is held. Positioned downward from a rectangle that has two sides that are approximately equal to the length of the side and shorter than the length of the short side of the opening! /, And have two sides parallel to the short side of the opening. It suffices if the shape is obtained by removing a region including at least a part of the short side. In addition, the ratio of the sides! /, Even if it is determined appropriately according to conditions such as rigidity required for the rod-shaped member! /,
[0046] ところで、本発明に係る導電性接触子ユニットは、液晶パネルを検査する場合に限 られるわけではなぐ半導体チップを搭載したパッケージ基板やウェハレベルの検査 に用いる高密度導電性接触子ユニットとしても適用可能である。 Incidentally, the conductive contact unit according to the present invention is not limited to the case of inspecting a liquid crystal panel, but as a high-density conductive contact unit used for inspection of a package substrate mounted with a semiconductor chip or a wafer level. Is also applicable.
[0047] 以上の説明からも明らかなように、本発明は、ここでは記載していないさまざまな実 施の形態等を含みうるものであり、特許請求の範囲により特定される技術的思想を逸 脱しない範囲内において種々の設計変更等を施すことが可能である。  As is apparent from the above description, the present invention can include various embodiments and the like not described herein, and deviates from the technical idea specified by the claims. Various design changes and the like can be made without departing from the scope.
産業上の利用可能性  Industrial applicability
[0048] 以上のように、本発明に係る導電性接触子ユニットは、液晶パネルや半導体集積 回路などの電子部品における導通状態検査や動作特性検査を行う際に有用である As described above, the conductive contact unit according to the present invention is useful when conducting a conduction state inspection or an operation characteristic inspection in an electronic component such as a liquid crystal panel or a semiconductor integrated circuit.

Claims

請求の範囲 The scope of the claims
[1] 検査用の信号を出力する回路構造と検査対象との間の信号の送受信を行う導電 性接触子ユニットであって、  [1] A conductive contact unit that transmits and receives signals between a circuit structure that outputs inspection signals and an inspection target,
板状をなす導電性材料によって形成され、検査用の信号を出力する回路構造と接 触する第 1接触部、長手方向に伸縮可能な弾性部、検査対象と接触し、この接触す る先端が前記弾性部の幅方向の縁端部よりも前記弾性部の幅方向の中心軸から遠 ざ力、る方向に突出する第 2接触部、前記弾性部と前記第 1接触部とを接続する第 1接 続部、および前記弾性部と前記第 2接触部とを接続し、板厚方向に貫通し前記長手 方向に平行な辺を長辺とする長方形状の開口部が設けられた第 2接続部を有する複 数の導電性接触子と、  A first contact portion that is formed of a plate-shaped conductive material and contacts a circuit structure that outputs a signal for inspection, an elastic portion that can expand and contract in the longitudinal direction, and a tip that contacts the inspection object. A second contact portion that protrudes in a direction away from the central axis in the width direction of the elastic portion than the edge portion in the width direction of the elastic portion, a second contact portion that connects the elastic portion and the first contact portion. 1 connection part and 2nd connection which provided the rectangular-shaped opening part which connected the said elastic part and the said 2nd contact part, and penetrated in the plate | board thickness direction and made the side parallel to the said longitudinal direction into a long side A plurality of conductive contacts having a portion;
前記導電性接触子の長手方向の一方の縁端部であって前記第 2接触部が突出し てレ、る側の縁端部を嵌合保持する複数の第 1ガイド溝、および前記複数の第 1ガイド 溝とそれぞれ対向して位置し、対向する前記第 1ガイド溝に嵌め込まれた前記導電 性接触子の他方の縁端部を嵌合保持する複数の第 2ガイド溝を有する導電性接触 子ホルダと、  A plurality of first guide grooves which are one edge in the longitudinal direction of the conductive contact and the second contact protrudes and holds the edge on the side, and the plurality of first A conductive contact having a plurality of second guide grooves that are positioned opposite to each of the one guide grooves and that fit and hold the other edge of the conductive contact that is fitted into the opposed first guide grooves. A holder,
前記導電性接触子ホルダに固着され、前記複数の導電性接触子にそれぞれ設け られた前記開口部を貫通する棒状部材と、  A bar-shaped member fixed to the conductive contact holder and penetrating through the opening provided in each of the plurality of conductive contacts;
を備え、  With
前記棒状部材の長手方向に垂直な断面は、前記開口部の短辺の長さと略等しく該 開口部の短辺の長さよりも短!/、長さを有する 2辺であって前記開口部の短辺と平行な 2辺を短辺とする長方形から下方に位置する短辺の少なくとも一部を含む領域を取り 除くことによって得られる形状をなすことを特徴とする導電性接触子ユニット。  The cross section perpendicular to the longitudinal direction of the rod-shaped member is two sides having a length substantially equal to the length of the short side of the opening and shorter than the length of the short side of the opening. A conductive contact unit characterized by having a shape obtained by removing a region including at least a part of a short side located below from a rectangle having two short sides parallel to the short side.
[2] 前記棒状部材の長手方向に垂直な断面は台形状をなすことを特徴とする請求項 1 記載の導電性接触子ユニット。  2. The conductive contact unit according to claim 1, wherein a cross section perpendicular to the longitudinal direction of the rod-shaped member has a trapezoidal shape.
[3] 前記台形状の断面における上底の長さと下底の長さの比は 2: 1であることを特徴と する請求項 2記載の導電性接触子ユニット。  3. The conductive contact unit according to claim 2, wherein the ratio of the length of the upper base to the length of the lower base in the trapezoidal cross section is 2: 1.
[4] 前記棒状部材の長手方向に垂直な断面は、 2組の平行な対辺を有する五角形状 をなすことを特徴とする請求項 1記載の導電性接触子ユニット。 4. The conductive contact unit according to claim 1, wherein a cross section perpendicular to the longitudinal direction of the bar-shaped member has a pentagonal shape having two sets of parallel opposite sides.
[5] 前記棒状部材の長手方向に垂直な断面は直角三角形状をなすことを特徴とする 請求項 1記載の導電性接触子ユニット。 5. The conductive contact unit according to claim 1, wherein a cross section perpendicular to the longitudinal direction of the rod-shaped member has a right triangle shape.
[6] 前記第 2接触部の先端は、前記導電性接触子ホルダの外側面であって内側に前 記第 1ガイド溝が形成された部分の外側面よりも当該外側面の法線方向に突出して いることを特徴とする請求項 1〜5のいずれか一項記載の導電性接触子ユニット。  [6] The tip of the second contact portion is an outer surface of the conductive contact holder and is in a direction normal to the outer surface of the outer surface of the portion where the first guide groove is formed inside. The conductive contact unit according to claim 1, wherein the conductive contact unit protrudes.
PCT/JP2007/065659 2006-08-18 2007-08-09 Conductive contactor unit WO2008020565A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW096129931A TWI346206B (en) 2006-08-18 2007-08-14 Conductive contacts unit

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006223386A JP4781938B2 (en) 2006-08-18 2006-08-18 Conductive contact unit
JP2006-223386 2006-08-18

Publications (1)

Publication Number Publication Date
WO2008020565A1 true WO2008020565A1 (en) 2008-02-21

Family

ID=39082090

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/065659 WO2008020565A1 (en) 2006-08-18 2007-08-09 Conductive contactor unit

Country Status (5)

Country Link
JP (1) JP4781938B2 (en)
KR (1) KR20090045347A (en)
CN (1) CN101506665A (en)
TW (1) TWI346206B (en)
WO (1) WO2008020565A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105719730B (en) * 2016-02-05 2017-09-22 燕山大学 A kind of embedded straight line segmentation shape of a hoof flexible electronic device crosslinking conductor structure
CN111033273B (en) * 2018-01-11 2022-04-26 欧姆龙株式会社 Probe, inspection tool, inspection unit, and inspection apparatus
KR20230032064A (en) * 2021-08-30 2023-03-07 (주)포인트엔지니어링 The cantilever contact probe pin

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11133060A (en) * 1997-10-31 1999-05-21 Tani Denki Kogyo Kk Testing terminal
WO2006088131A1 (en) * 2005-02-18 2006-08-24 Nhk Spring Co., Ltd. Conductive terminal unit and conductive terminal
WO2007060939A1 (en) * 2005-11-22 2007-05-31 Nhk Spring Co., Ltd. Conductive contact unit, and conductive contact
WO2007094237A1 (en) * 2006-02-17 2007-08-23 Nhk Spring Co., Ltd. Electrically conductive contact and electrically conductive contact unit

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11133060A (en) * 1997-10-31 1999-05-21 Tani Denki Kogyo Kk Testing terminal
WO2006088131A1 (en) * 2005-02-18 2006-08-24 Nhk Spring Co., Ltd. Conductive terminal unit and conductive terminal
WO2007060939A1 (en) * 2005-11-22 2007-05-31 Nhk Spring Co., Ltd. Conductive contact unit, and conductive contact
WO2007094237A1 (en) * 2006-02-17 2007-08-23 Nhk Spring Co., Ltd. Electrically conductive contact and electrically conductive contact unit

Also Published As

Publication number Publication date
TW200813442A (en) 2008-03-16
TWI346206B (en) 2011-08-01
JP4781938B2 (en) 2011-09-28
KR20090045347A (en) 2009-05-07
CN101506665A (en) 2009-08-12
JP2008046045A (en) 2008-02-28

Similar Documents

Publication Publication Date Title
JP4907191B2 (en) Conductive contact unit
JP4884753B2 (en) Conductive contact unit and conductive contact
KR101000426B1 (en) Conductive contactor and conductive contactor unit
US8222912B2 (en) Probe head structure for probe test cards
JP4863466B2 (en) Manufacturing method of substrate inspection jig
JP5095604B2 (en) Conductive contact unit
JP5179347B2 (en) Conductive contact unit
JPWO2008133089A1 (en) Conductive contact unit
JP2010156595A (en) Probe unit
WO2008020565A1 (en) Conductive contactor unit
JP2007127488A (en) Probe card
JP2011153998A (en) Contact probe and probe unit
JP5353968B2 (en) Substrate inspection jig
JP5235776B2 (en) Contact probe
JP2013200256A (en) Probe device
KR20130102236A (en) Probe assembly

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200780030682.9

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 07805920

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

WWE Wipo information: entry into national phase

Ref document number: 1020097005468

Country of ref document: KR

NENP Non-entry into the national phase

Ref country code: RU

122 Ep: pct application non-entry in european phase

Ref document number: 07805920

Country of ref document: EP

Kind code of ref document: A1