SG102717A1 - Semiconductor memory having an arrangememt of memory cells - Google Patents

Semiconductor memory having an arrangememt of memory cells

Info

Publication number
SG102717A1
SG102717A1 SG200303831A SG200303831A SG102717A1 SG 102717 A1 SG102717 A1 SG 102717A1 SG 200303831 A SG200303831 A SG 200303831A SG 200303831 A SG200303831 A SG 200303831A SG 102717 A1 SG102717 A1 SG 102717A1
Authority
SG
Singapore
Prior art keywords
arrangememt
memory
memory cells
semiconductor memory
semiconductor
Prior art date
Application number
SG200303831A
Other languages
English (en)
Inventor
Fuhrmann Dirk
Lindstedt Reidar
Original Assignee
Infineon Technologies Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies Ag filed Critical Infineon Technologies Ag
Publication of SG102717A1 publication Critical patent/SG102717A1/en

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/01—Manufacture or treatment
    • H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/05—Making the transistor
    • H10B12/053—Making the transistor the transistor being at least partially in a trench in the substrate
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/06—Arrangements for interconnecting storage elements electrically, e.g. by wiring
    • G11C5/063—Voltage and signal distribution in integrated semi-conductor memory access lines, e.g. word-line, bit-line, cross-over resistance, propagation delay
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/18—Bit line organisation; Bit line lay-out
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/14—Word line organisation; Word line lay-out
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0207—Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/01—Manufacture or treatment
    • H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03—Making the capacitor or connections thereto
    • H10B12/038—Making the capacitor or connections thereto the capacitor being in a trench in the substrate
    • H10B12/0383—Making the capacitor or connections thereto the capacitor being in a trench in the substrate wherein the transistor is vertical
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/39—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells the capacitor and the transistor being in a same trench
    • H10B12/395—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells the capacitor and the transistor being in a same trench the transistor being vertical
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/48—Data lines or contacts therefor
    • H10B12/482—Bit lines
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/48—Data lines or contacts therefor
    • H10B12/488—Word lines

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Dram (AREA)
SG200303831A 2002-07-31 2003-07-23 Semiconductor memory having an arrangememt of memory cells SG102717A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10234945A DE10234945B3 (de) 2002-07-31 2002-07-31 Halbleiterspeicher mit einer Anordnung von Speicherzellen

Publications (1)

Publication Number Publication Date
SG102717A1 true SG102717A1 (en) 2004-03-26

Family

ID=29796620

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200303831A SG102717A1 (en) 2002-07-31 2003-07-23 Semiconductor memory having an arrangememt of memory cells

Country Status (7)

Country Link
US (1) US6882556B2 (ja)
JP (1) JP2004096095A (ja)
KR (1) KR100659260B1 (ja)
CN (1) CN1263138C (ja)
DE (1) DE10234945B3 (ja)
SG (1) SG102717A1 (ja)
TW (1) TWI245414B (ja)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100630683B1 (ko) 2004-06-02 2006-10-02 삼성전자주식회사 6ｆ2 레이아웃을 갖는 디램 소자
US7326611B2 (en) * 2005-02-03 2008-02-05 Micron Technology, Inc. DRAM arrays, vertical transistor structures and methods of forming transistor structures and DRAM arrays
US7394677B2 (en) 2005-07-07 2008-07-01 Seiko Epson Corporation Ferroelectric random access memory device, display drive IC and electronic equipment
KR100771871B1 (ko) * 2006-05-24 2007-11-01 삼성전자주식회사 수직 채널 트랜지스터를 구비한 반도체 소자
JP5497266B2 (ja) * 2008-01-31 2014-05-21 ピーエスフォー ルクスコ エスエイアールエル 半導体モジュール、基板および配線方法
JP2010080755A (ja) * 2008-09-26 2010-04-08 Elpida Memory Inc 半導体装置
JP2010129972A (ja) * 2008-12-01 2010-06-10 Elpida Memory Inc 半導体装置およびその製造方法
US8355272B2 (en) * 2010-12-22 2013-01-15 Everspin Technologies, Inc. Memory array having local source lines
EP2498291B1 (en) 2011-03-09 2014-12-24 Imec Resistive memory element and related control method
US8848428B2 (en) * 2012-07-13 2014-09-30 Taiwan Semiconductor Manufacturing Co., Ltd. Memory architectures having dense layouts
US9257522B2 (en) 2012-07-13 2016-02-09 Taiwan Semiconductor Manufacturing Co., Ltd. Memory architectures having dense layouts
US20150256385A1 (en) * 2014-03-04 2015-09-10 Qualcomm Connected Experiences, Inc. System and method for providing a human readable representation of an event and a human readable action in response to that event
KR20220050633A (ko) * 2020-10-16 2022-04-25 에스케이하이닉스 주식회사 3차원 구조의 트랜지스터 소자를 구비하는 반도체 장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0744772A1 (de) * 1995-05-24 1996-11-27 Siemens Aktiengesellschaft DRAM-Speicherzelle mit vertikalem Transistor und Verfahren zur Herstellung derselben
US5691934A (en) * 1995-07-13 1997-11-25 Douglass; Barry G. Memory cell and method of operation thereof
US6118683A (en) * 1999-09-29 2000-09-12 Infineon Technologies North America Corporation Dynamic random access memory cell layout
WO2002047159A2 (en) * 2000-12-06 2002-06-13 Infineon Technologies North America Corp. Dram with vertical transistor and trench capacitor memory cells and method of fabrication

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4959698A (en) * 1986-10-08 1990-09-25 Mitsubishi Denki Kabushiki Kaisha Memory cell of a semiconductor memory device
DE19954867C1 (de) 1999-11-15 2000-12-07 Infineon Technologies Ag DRAM-Zellenanordnung und Verfahren zu deren Herstellung
DE10257665B3 (de) * 2002-12-10 2004-07-01 Infineon Technologies Ag Halbleiterspeicher mit einer Anordnung von Speicherzellen
JP2004193483A (ja) * 2002-12-13 2004-07-08 Renesas Technology Corp 半導体記憶装置
JP2004221473A (ja) * 2003-01-17 2004-08-05 Renesas Technology Corp 半導体記憶装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0744772A1 (de) * 1995-05-24 1996-11-27 Siemens Aktiengesellschaft DRAM-Speicherzelle mit vertikalem Transistor und Verfahren zur Herstellung derselben
US5691934A (en) * 1995-07-13 1997-11-25 Douglass; Barry G. Memory cell and method of operation thereof
US6118683A (en) * 1999-09-29 2000-09-12 Infineon Technologies North America Corporation Dynamic random access memory cell layout
WO2002047159A2 (en) * 2000-12-06 2002-06-13 Infineon Technologies North America Corp. Dram with vertical transistor and trench capacitor memory cells and method of fabrication

Also Published As

Publication number Publication date
CN1263138C (zh) 2006-07-05
US20040022100A1 (en) 2004-02-05
TWI245414B (en) 2005-12-11
US6882556B2 (en) 2005-04-19
KR20040012545A (ko) 2004-02-11
DE10234945B3 (de) 2004-01-29
CN1484313A (zh) 2004-03-24
KR100659260B1 (ko) 2006-12-18
JP2004096095A (ja) 2004-03-25
TW200402145A (en) 2004-02-01

Similar Documents

Publication Publication Date Title
DE60222947D1 (de) Halbleiterspeicher
EP1657723A4 (en) SEMICONDUCTOR MEMORY AND METHOD FOR OPERATING A SEMICONDUCTOR MEMORY
HK1051600A1 (en) Memory cell structure
AU2003235106A1 (en) Semiconductor memory
AU2003211425A1 (en) Semiconductor storage
AU2003300399A8 (en) Well regions of semiconductor devices
SG121879A1 (en) Memory cell structure
EP1542237A4 (en) SEMICONDUCTOR MEMORY
AU2003295814A8 (en) External memory controller node
GB2392311B (en) Semiconductor memory devices and methods for manufacturing the same using sidewall spacers
AU2003243484A1 (en) Built-in-self-test of flash memory cells
GB2423174B (en) Self assembly of conducting organic semiconductor for formation of an organic memory cell
SG108925A1 (en) Non-volatile memory cells
AU2003271074A1 (en) Semiconductor storage
DE60315651D1 (de) Halbleiterspeicher
SG102717A1 (en) Semiconductor memory having an arrangememt of memory cells
AU2003285948A8 (en) Source-biased memory cell array
AU2003279478A8 (en) Non-volatile memory cell and method of fabrication
DE60336787D1 (de) Halbleiterspeicher
AU2003294845A8 (en) Semiconductor memory having charge trapping memory cells and fabrication method
EP1605468A4 (en) SEMICONDUCTOR MEMORY
EP1598829A4 (en) SEMICONDUCTOR MEMORY
DE60229712D1 (de) Halbleiterspeicher
DE60238812D1 (de) Halbleiterspeicherzelle
GB2424503B (en) An active memory device