SG10202108096RA - Retaining ring having inner surfaces with features - Google Patents
Retaining ring having inner surfaces with featuresInfo
- Publication number
- SG10202108096RA SG10202108096RA SG10202108096RA SG10202108096RA SG10202108096RA SG 10202108096R A SG10202108096R A SG 10202108096RA SG 10202108096R A SG10202108096R A SG 10202108096RA SG 10202108096R A SG10202108096R A SG 10202108096RA SG 10202108096R A SG10202108096R A SG 10202108096RA
- Authority
- SG
- Singapore
- Prior art keywords
- features
- retaining ring
- inner surfaces
- retaining
- ring
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Materials For Medical Uses (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201562168578P | 2015-05-29 | 2015-05-29 | |
US14/992,763 US10500695B2 (en) | 2015-05-29 | 2016-01-11 | Retaining ring having inner surfaces with features |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10202108096RA true SG10202108096RA (en) | 2021-08-30 |
Family
ID=57398011
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202108096RA SG10202108096RA (en) | 2015-05-29 | 2016-05-27 | Retaining ring having inner surfaces with features |
SG11201708368UA SG11201708368UA (en) | 2015-05-29 | 2016-05-27 | Retaining ring having inner surfaces with features |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201708368UA SG11201708368UA (en) | 2015-05-29 | 2016-05-27 | Retaining ring having inner surfaces with features |
Country Status (8)
Country | Link |
---|---|
US (4) | US10500695B2 (zh) |
EP (1) | EP3302877B1 (zh) |
JP (3) | JP6891127B2 (zh) |
KR (3) | KR102461965B1 (zh) |
CN (3) | CN106181752B (zh) |
SG (2) | SG10202108096RA (zh) |
TW (3) | TWM547177U (zh) |
WO (1) | WO2016196360A1 (zh) |
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US10500695B2 (en) | 2015-05-29 | 2019-12-10 | Applied Materials, Inc. | Retaining ring having inner surfaces with features |
KR102561746B1 (ko) * | 2016-07-25 | 2023-07-28 | 어플라이드 머티어리얼스, 인코포레이티드 | Cmp를 위한 리테이닝 링 |
US11400560B2 (en) | 2017-10-04 | 2022-08-02 | Applied Materials, Inc. | Retaining ring design |
CN107717639A (zh) * | 2017-11-09 | 2018-02-23 | 宁波江丰电子材料股份有限公司 | 控制保持环平面度的方法及生产的保持环、半导体制作系统 |
TWI634613B (zh) * | 2017-12-27 | 2018-09-01 | 億力鑫系統科技股份有限公司 | Carrier disk |
CN110047796B (zh) * | 2018-01-16 | 2021-10-01 | 亿力鑫系统科技股份有限公司 | 承载盘 |
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CN111482893A (zh) * | 2020-04-16 | 2020-08-04 | 华海清科股份有限公司 | 一种化学机械抛光保持环和化学机械抛光承载头 |
US11691244B2 (en) | 2020-07-08 | 2023-07-04 | Applied Materials, Inc. | Multi-toothed, magnetically controlled retaining ring |
US11565367B2 (en) * | 2020-07-09 | 2023-01-31 | Applied Materials, Inc. | Retaining ring |
WO2022040459A1 (en) * | 2020-08-21 | 2022-02-24 | Applied Materials, Inc. | Improved retaining ring design |
CN112792735B (zh) * | 2021-01-20 | 2022-04-05 | 北京科技大学 | 抑制金刚石膜研磨抛光裂纹萌生与扩展的夹具及使用方法 |
US20230129597A1 (en) * | 2021-10-27 | 2023-04-27 | Sch Power Tech Co., Ltd. | Retaining Ring for Wafer Polishing |
WO2024049890A1 (en) * | 2022-09-01 | 2024-03-07 | Applied Materials, Inc. | Retainer for chemical mechanical polishing carrier head |
CN115555988A (zh) * | 2022-11-04 | 2023-01-03 | 荆州市还祥特种材料有限公司 | 一种用于cmp研磨的保持环 |
US20240190026A1 (en) * | 2022-12-12 | 2024-06-13 | Applied Materials, Inc. | Carrier with rotation prevention feature |
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US10500695B2 (en) * | 2015-05-29 | 2019-12-10 | Applied Materials, Inc. | Retaining ring having inner surfaces with features |
US10265829B2 (en) * | 2015-10-30 | 2019-04-23 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical mechanical polishing system |
US11400560B2 (en) | 2017-10-04 | 2022-08-02 | Applied Materials, Inc. | Retaining ring design |
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-
2016
- 2016-01-11 US US14/992,763 patent/US10500695B2/en active Active
- 2016-05-27 CN CN201610366091.XA patent/CN106181752B/zh active Active
- 2016-05-27 CN CN201620502522.6U patent/CN205799209U/zh active Active
- 2016-05-27 KR KR1020177031231A patent/KR102461965B1/ko active IP Right Grant
- 2016-05-27 CN CN202110032638.3A patent/CN112621560B/zh active Active
- 2016-05-27 SG SG10202108096RA patent/SG10202108096RA/en unknown
- 2016-05-27 TW TW105207947U patent/TWM547177U/zh unknown
- 2016-05-27 WO PCT/US2016/034811 patent/WO2016196360A1/en active Application Filing
- 2016-05-27 SG SG11201708368UA patent/SG11201708368UA/en unknown
- 2016-05-27 KR KR1020247000743A patent/KR20240011233A/ko active Application Filing
- 2016-05-27 TW TW105116687A patent/TWI717353B/zh active
- 2016-05-27 JP JP2017556245A patent/JP6891127B2/ja active Active
- 2016-05-27 EP EP16804163.0A patent/EP3302877B1/en active Active
- 2016-05-27 TW TW109146643A patent/TWI768627B/zh active
- 2016-05-27 KR KR1020227037755A patent/KR102624126B1/ko active IP Right Grant
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2019
- 2019-12-09 US US16/708,287 patent/US11453099B2/en active Active
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2021
- 2021-05-25 JP JP2021087352A patent/JP7232285B2/ja active Active
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2022
- 2022-09-15 US US17/945,932 patent/US12048981B2/en active Active
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2023
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US20160346897A1 (en) | 2016-12-01 |
JP2023075112A (ja) | 2023-05-30 |
CN112621560B (zh) | 2022-12-13 |
KR20220150435A (ko) | 2022-11-10 |
US20200114489A1 (en) | 2020-04-16 |
KR102624126B1 (ko) | 2024-01-12 |
US12048981B2 (en) | 2024-07-30 |
CN112621560A (zh) | 2021-04-09 |
JP7232285B2 (ja) | 2023-03-02 |
JP2018517574A (ja) | 2018-07-05 |
US10500695B2 (en) | 2019-12-10 |
JP2021185013A (ja) | 2021-12-09 |
EP3302877B1 (en) | 2022-08-10 |
TWM547177U (zh) | 2017-08-11 |
CN106181752B (zh) | 2021-01-26 |
US11453099B2 (en) | 2022-09-27 |
TWI768627B (zh) | 2022-06-21 |
TW201711802A (zh) | 2017-04-01 |
KR20240011233A (ko) | 2024-01-25 |
US20240316723A1 (en) | 2024-09-26 |
KR20180004127A (ko) | 2018-01-10 |
JP6891127B2 (ja) | 2021-06-18 |
CN106181752A (zh) | 2016-12-07 |
KR102461965B1 (ko) | 2022-11-02 |
US20230019815A1 (en) | 2023-01-19 |
EP3302877A4 (en) | 2019-01-02 |
EP3302877A1 (en) | 2018-04-11 |
SG11201708368UA (en) | 2017-12-28 |
TWI717353B (zh) | 2021-02-01 |
CN205799209U (zh) | 2016-12-14 |
TW202124096A (zh) | 2021-07-01 |
WO2016196360A1 (en) | 2016-12-08 |
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