SG10201913707UA - Method for cleaning semiconductor wafer - Google Patents

Method for cleaning semiconductor wafer

Info

Publication number
SG10201913707UA
SG10201913707UA SG10201913707UA SG10201913707UA SG10201913707UA SG 10201913707U A SG10201913707U A SG 10201913707UA SG 10201913707U A SG10201913707U A SG 10201913707UA SG 10201913707U A SG10201913707U A SG 10201913707UA SG 10201913707U A SG10201913707U A SG 10201913707UA
Authority
SG
Singapore
Prior art keywords
semiconductor wafer
cleaning semiconductor
cleaning
wafer
semiconductor
Prior art date
Application number
SG10201913707UA
Other languages
English (en)
Inventor
Kensaku Igarashi
Tatsuo Abe
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Publication of SG10201913707UA publication Critical patent/SG10201913707UA/en

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00Cleaning of wafers, substrates or parts of devices
    • H10P70/10Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H10P70/15Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00Cleaning of wafers, substrates or parts of devices
    • H10P70/20Cleaning during device manufacture
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7618Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating carrousel
SG10201913707UA 2017-01-23 2017-12-20 Method for cleaning semiconductor wafer SG10201913707UA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017009295A JP6575538B2 (ja) 2017-01-23 2017-01-23 半導体ウェーハの洗浄方法

Publications (1)

Publication Number Publication Date
SG10201913707UA true SG10201913707UA (en) 2020-03-30

Family

ID=62907914

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201913707UA SG10201913707UA (en) 2017-01-23 2017-12-20 Method for cleaning semiconductor wafer

Country Status (8)

Country Link
US (1) US11094525B2 (https=)
EP (1) EP3573090B1 (https=)
JP (1) JP6575538B2 (https=)
KR (1) KR102509323B1 (https=)
CN (1) CN110140197B (https=)
SG (1) SG10201913707UA (https=)
TW (1) TWI778004B (https=)
WO (1) WO2018135226A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI128613B (en) * 2019-06-19 2020-08-31 Comptek Solutions Oy Optoelectronic device
KR20240121053A (ko) * 2023-02-01 2024-08-08 에스케이실트론 주식회사 반도체 기판 및 반도체 기판의 세정 방법

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH069195B2 (ja) * 1989-05-06 1994-02-02 大日本スクリーン製造株式会社 基板の表面処理方法
JP2002368067A (ja) * 2001-06-08 2002-12-20 Tokyo Electron Ltd 回転式基板処理装置及び回転式基板処理方法
JP4089809B2 (ja) * 2002-03-13 2008-05-28 Sumco Techxiv株式会社 半導体ウェーハのエッジ部の酸化膜除去装置
JP2005327936A (ja) * 2004-05-14 2005-11-24 Canon Inc 基板の洗浄方法及びその製造方法
CN100524639C (zh) * 2005-02-07 2009-08-05 株式会社荏原制作所 基板处理方法、基板处理装置及控制程序
JP2007165366A (ja) * 2005-12-09 2007-06-28 Ebara Corp 基板処理装置および基板処理方法
JP4832201B2 (ja) * 2006-07-24 2011-12-07 大日本スクリーン製造株式会社 基板処理装置
JP2009147038A (ja) * 2007-12-13 2009-07-02 Dainippon Screen Mfg Co Ltd 基板処理方法
JP5317529B2 (ja) 2008-05-02 2013-10-16 Sumco Techxiv株式会社 半導体ウェーハの処理方法及び処理装置
JP2010177543A (ja) * 2009-01-30 2010-08-12 Ebara Corp 基板処理方法及び基板処理装置
JP5795917B2 (ja) * 2010-09-27 2015-10-14 株式会社Screenホールディングス 基板処理装置および基板処理方法
JP5061229B2 (ja) * 2010-10-18 2012-10-31 東京エレクトロン株式会社 基板洗浄装置及び基板洗浄方法。
JP5589968B2 (ja) * 2011-06-17 2014-09-17 信越半導体株式会社 半導体ウェーハの洗浄方法
JP6379400B2 (ja) * 2013-09-26 2018-08-29 株式会社Screenホールディングス 基板処理方法および基板処理装置
JP6256828B2 (ja) * 2013-10-10 2018-01-10 株式会社Screenホールディングス 基板処理方法および基板処理装置
JP2015220284A (ja) * 2014-05-15 2015-12-07 信越半導体株式会社 ウエーハの洗浄方法

Also Published As

Publication number Publication date
US11094525B2 (en) 2021-08-17
WO2018135226A1 (ja) 2018-07-26
EP3573090A1 (en) 2019-11-27
EP3573090B1 (en) 2024-05-01
TWI778004B (zh) 2022-09-21
JP2018120886A (ja) 2018-08-02
CN110140197B (zh) 2023-04-28
KR20190105581A (ko) 2019-09-17
KR102509323B1 (ko) 2023-03-13
JP6575538B2 (ja) 2019-09-18
CN110140197A (zh) 2019-08-16
US20200105517A1 (en) 2020-04-02
EP3573090A4 (en) 2020-11-04
TW201841240A (zh) 2018-11-16

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