SE8603963D0 - Kontakt med lag resistans for ett halvledarorgan samt sett att framstella densamma - Google Patents

Kontakt med lag resistans for ett halvledarorgan samt sett att framstella densamma

Info

Publication number
SE8603963D0
SE8603963D0 SE8603963A SE8603963A SE8603963D0 SE 8603963 D0 SE8603963 D0 SE 8603963D0 SE 8603963 A SE8603963 A SE 8603963A SE 8603963 A SE8603963 A SE 8603963A SE 8603963 D0 SE8603963 D0 SE 8603963D0
Authority
SE
Sweden
Prior art keywords
contact
setting
make
semiconductor
organ
Prior art date
Application number
SE8603963A
Other languages
English (en)
Other versions
SE8603963L (sv
Inventor
S T Hsu
Original Assignee
Rca Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rca Corp filed Critical Rca Corp
Publication of SE8603963D0 publication Critical patent/SE8603963D0/sv
Publication of SE8603963L publication Critical patent/SE8603963L/sv

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/45Ohmic electrodes
    • H01L29/456Ohmic electrodes on silicon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28512Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic System
    • H01L21/28518Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic System the conductive layers comprising silicides
SE8603963A 1985-09-27 1986-09-19 Kontakt med lag resistans for ett halvledarorgan samt sett att framstella densamma SE8603963L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US78095685A 1985-09-27 1985-09-27

Publications (2)

Publication Number Publication Date
SE8603963D0 true SE8603963D0 (sv) 1986-09-19
SE8603963L SE8603963L (sv) 1987-03-28

Family

ID=25121206

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8603963A SE8603963L (sv) 1985-09-27 1986-09-19 Kontakt med lag resistans for ett halvledarorgan samt sett att framstella densamma

Country Status (4)

Country Link
JP (1) JPS6278817A (sv)
KR (1) KR940009584B1 (sv)
DE (1) DE3632217A1 (sv)
SE (1) SE8603963L (sv)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2624304B1 (fr) * 1987-12-04 1990-05-04 Philips Nv Procede pour etablir une structure d'interconnexion electrique sur un dispositif semiconducteur au silicium

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5575256A (en) * 1978-12-01 1980-06-06 Nec Corp Semiconductor device
JPS5780739A (en) * 1980-11-07 1982-05-20 Hitachi Ltd Semiconductor integrated circuit device and manufacture thereof
JPS60119750A (ja) * 1983-12-02 1985-06-27 Hitachi Ltd 半導体装置の製造方法

Also Published As

Publication number Publication date
KR940009584B1 (ko) 1994-10-15
SE8603963L (sv) 1987-03-28
JPS6278817A (ja) 1987-04-11
DE3632217A1 (de) 1987-04-02
KR870003581A (ko) 1987-04-18

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