SE384931B - Logiksystem for utforande av minst en forutbestemd logikfunktion i en digital dator for allmenna endamal - Google Patents

Logiksystem for utforande av minst en forutbestemd logikfunktion i en digital dator for allmenna endamal

Info

Publication number
SE384931B
SE384931B SE7312847A SE7312847A SE384931B SE 384931 B SE384931 B SE 384931B SE 7312847 A SE7312847 A SE 7312847A SE 7312847 A SE7312847 A SE 7312847A SE 384931 B SE384931 B SE 384931B
Authority
SE
Sweden
Prior art keywords
circuitry
latch
latches
logic
shift register
Prior art date
Application number
SE7312847A
Other languages
English (en)
Swedish (sv)
Inventor
E B Eichelberger
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SE384931B publication Critical patent/SE384931B/xx

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs
    • G06F9/448—Execution paradigms, e.g. implementations of programming paradigms
    • G06F9/4482—Procedural
    • G06F9/4484—Executing subprograms
SE7312847A 1972-10-16 1973-09-20 Logiksystem for utforande av minst en forutbestemd logikfunktion i en digital dator for allmenna endamal SE384931B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29754372A 1972-10-16 1972-10-16

Publications (1)

Publication Number Publication Date
SE384931B true SE384931B (sv) 1976-05-24

Family

ID=23146762

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7312847A SE384931B (sv) 1972-10-16 1973-09-20 Logiksystem for utforande av minst en forutbestemd logikfunktion i en digital dator for allmenna endamal

Country Status (11)

Country Link
US (1) US3783254A (fr)
JP (1) JPS5228614B2 (fr)
BR (1) BR7308087D0 (fr)
CA (1) CA1005529A (fr)
CH (1) CH568620A5 (fr)
DE (1) DE2349377C2 (fr)
ES (1) ES419582A1 (fr)
FR (1) FR2203232B1 (fr)
GB (1) GB1448382A (fr)
IT (1) IT998504B (fr)
SE (1) SE384931B (fr)

Families Citing this family (108)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4058767A (en) * 1975-04-29 1977-11-15 International Business Machines Corporation Apparatus and process for testing AC performance of LSI components
US3986057A (en) * 1975-06-30 1976-10-12 International Business Machines Corporation High performance latch circuit
US4120043A (en) * 1976-04-30 1978-10-10 Burroughs Corporation Method and apparatus for multi-function, stored logic Boolean function generation
US4071902A (en) * 1976-06-30 1978-01-31 International Business Machines Corporation Reduced overhead for clock testing in a level system scan design (LSSD) system
US4063078A (en) * 1976-06-30 1977-12-13 International Business Machines Corporation Clock generation network for level sensitive logic system
US4074851A (en) * 1976-06-30 1978-02-21 International Business Machines Corporation Method of level sensitive testing a functional logic system with embedded array
US4051353A (en) * 1976-06-30 1977-09-27 International Business Machines Corporation Accordion shift register and its application in the implementation of level sensitive logic system
NL7809397A (nl) * 1978-09-15 1980-03-18 Philips Nv Geintegreerde schakeling in dynamische mos-logika met gescheiden opstelling van kombinatorische en sequen- tieele logische elementen.
DE2842750A1 (de) * 1978-09-30 1980-04-10 Ibm Deutschland Verfahren und anordnung zur pruefung von durch monolithisch integrierten halbleiterschaltungen dargestellten sequentiellen schaltungen
GB2030807B (en) * 1978-10-02 1982-11-10 Ibm Latch circuit
US4225957A (en) * 1978-10-16 1980-09-30 International Business Machines Corporation Testing macros embedded in LSI chips
US4244048A (en) * 1978-12-29 1981-01-06 International Business Machines Corporation Chip and wafer configuration and testing method for large-scale-integrated circuits
US4293919A (en) * 1979-08-13 1981-10-06 International Business Machines Corporation Level sensitive scan design (LSSD) system
EP0037965B1 (fr) * 1980-04-11 1987-07-15 Siemens Aktiengesellschaft Dispositif pour essayer un circuit digital avec des circuits d'essai insérés dans ce circuit
US4340857A (en) * 1980-04-11 1982-07-20 Siemens Corporation Device for testing digital circuits using built-in logic block observers (BILBO's)
US4363124A (en) * 1980-06-26 1982-12-07 International Business Machines Corp. Recirculating loop memory array tester
US4313199A (en) * 1980-06-26 1982-01-26 International Business Machines Corp. Recirculating loop memory array fault locator
DE3029883A1 (de) * 1980-08-07 1982-03-11 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
US4388701A (en) * 1980-09-30 1983-06-14 International Business Machines Corp. Recirculating loop memory array having a shift register buffer for parallel fetching and storing
DE3043563A1 (de) * 1980-11-15 1982-06-24 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zur auswertung boolescher ausdruecke
US4404519A (en) * 1980-12-10 1983-09-13 International Business Machine Company Testing embedded arrays in large scale integrated circuits
US4441075A (en) * 1981-07-02 1984-04-03 International Business Machines Corporation Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4503386A (en) * 1982-04-20 1985-03-05 International Business Machines Corporation Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks
US4477902A (en) * 1982-06-18 1984-10-16 Ibm Corporation Testing method for assuring AC performance of high performance random logic designs using low speed tester
US4493077A (en) * 1982-09-09 1985-01-08 At&T Laboratories Scan testable integrated circuit
US4519078A (en) * 1982-09-29 1985-05-21 Storage Technology Corporation LSI self-test method
US4513283A (en) * 1982-11-30 1985-04-23 International Business Machines Corporation Latch circuits with differential cascode current switch logic
US4791602A (en) * 1983-04-14 1988-12-13 Control Data Corporation Soft programmable logic array
US4551838A (en) * 1983-06-20 1985-11-05 At&T Bell Laboratories Self-testing digital circuits
US4564772A (en) * 1983-06-30 1986-01-14 International Business Machines Corporation Latching circuit speed-up technique
US4564943A (en) * 1983-07-05 1986-01-14 International Business Machines System path stressing
US4580137A (en) * 1983-08-29 1986-04-01 International Business Machines Corporation LSSD-testable D-type edge-trigger-operable latch with overriding set/reset asynchronous control
US4581738A (en) * 1983-10-06 1986-04-08 Honeywell Information Systems Inc. Test and maintenance method and apparatus for a data processing system
EP0139516B1 (fr) * 1983-10-17 1992-03-11 BRITISH TELECOMMUNICATIONS public limited company Système de génération de tests pour circuits numériques
JPS6088370A (ja) * 1983-10-20 1985-05-18 Toshiba Corp 論理回路
US4542509A (en) * 1983-10-31 1985-09-17 International Business Machines Corporation Fault testing a clock distribution network
US4542508A (en) * 1983-11-21 1985-09-17 Aerojet-General Corporation Amenable logic gate and method of testing
DE3375843D1 (en) * 1983-12-28 1988-04-07 Ibm Electrical-diagnosis method for a defect cell in a chain of cells of a shift register
JPH0641966B2 (ja) * 1984-02-15 1994-06-01 株式会社アドバンテスト パタ−ン発生装置
US4580066A (en) * 1984-03-22 1986-04-01 Sperry Corporation Fast scan/set testable latch using two levels of series gating with two current sources
US4581739A (en) * 1984-04-09 1986-04-08 International Business Machines Corporation Electronically selectable redundant array (ESRA)
US4638183A (en) * 1984-09-20 1987-01-20 International Business Machines Corporation Dynamically selectable polarity latch
WO1986003592A1 (fr) * 1984-12-11 1986-06-19 Aerojet-General Corporation Porte logique pouvant etre testee et methode d'essai
US5023775A (en) * 1985-02-14 1991-06-11 Intel Corporation Software programmable logic array utilizing "and" and "or" gates
US4682329A (en) * 1985-03-28 1987-07-21 Kluth Daniel J Test system providing testing sites for logic circuits
US4669081A (en) * 1986-02-04 1987-05-26 Raytheon Company LSI fault insertion
JPH0746120B2 (ja) * 1986-03-10 1995-05-17 株式会社東芝 テスト容易化回路及びテスト方法
US4726023A (en) * 1986-05-14 1988-02-16 International Business Machines Corporation Determination of testability of combined logic end memory by ignoring memory
JPS6329276A (ja) * 1986-07-23 1988-02-06 Hitachi Ltd 論理ｌｓｉ
JPH0785099B2 (ja) * 1986-08-04 1995-09-13 三菱電機株式会社 半導体集積回路装置
KR900008022B1 (ko) * 1986-10-16 1990-10-29 페어차일드 세미콘덕터 코퍼레이션 동기배열논리회로 및 시스템
US5047710A (en) * 1987-10-07 1991-09-10 Xilinx, Inc. System for scan testing of logic circuit networks
US4855669A (en) * 1987-10-07 1989-08-08 Xilinx, Inc. System for scan testing of logic circuit networks
US5068603A (en) * 1987-10-07 1991-11-26 Xilinx, Inc. Structure and method for producing mask-programmed integrated circuits which are pin compatible substitutes for memory-configured logic arrays
US5155432A (en) * 1987-10-07 1992-10-13 Xilinx, Inc. System for scan testing of logic circuit networks
US4879718A (en) * 1987-11-30 1989-11-07 Tandem Computers Incorporated Scan data path coupling
US4875209A (en) * 1988-04-04 1989-10-17 Raytheon Company Transient and intermittent fault insertion
US4903266A (en) * 1988-04-29 1990-02-20 International Business Machines Corporation Memory self-test
US4873456A (en) * 1988-06-06 1989-10-10 Tektronix, Inc. High speed state machine
US5151995A (en) * 1988-08-05 1992-09-29 Cray Research, Inc. Method and apparatus for producing successive calculated results in a high-speed computer functional unit using low-speed VLSI components
US4945536A (en) * 1988-09-09 1990-07-31 Northern Telecom Limited Method and apparatus for testing digital systems
DD284981B5 (de) * 1989-06-13 1996-11-28 Zentr Mikroelekt Dresden Gmbh Anordnung zum Test digitaler Schaltungen mit konfigurierbaren in den Test einbezogenen Takterzeugungsschaltungen
US5101409A (en) * 1989-10-06 1992-03-31 International Business Machines Corporation Checkboard memory self-test
US5132974A (en) * 1989-10-24 1992-07-21 Silc Technologies, Inc. Method and apparatus for designing integrated circuits for testability
US4972414A (en) * 1989-11-13 1990-11-20 International Business Machines Corporation Method and apparatus for detecting oscillator stuck faults in a level sensitive scan design (LSSD) system
US5079725A (en) * 1989-11-17 1992-01-07 Ibm Corporation Chip identification method for use with scan design systems and scan testing techniques
JP2945103B2 (ja) * 1990-05-15 1999-09-06 株式会社リコー テスト用スキャン回路装置
US5285453A (en) * 1990-12-28 1994-02-08 International Business Machines Corporation Test pattern generator for testing embedded arrays
US5331643A (en) * 1991-09-04 1994-07-19 International Business Machines Corporation Self-testing logic with embedded arrays
US5951703A (en) * 1993-06-28 1999-09-14 Tandem Computers Incorporated System and method for performing improved pseudo-random testing of systems having multi driver buses
DE4339159C1 (de) * 1993-11-16 1995-04-27 Siemens Ag Schaltungsanordnung zur synchronen Takterzeugung wenigstens zweier Taktsignale
US5465224A (en) * 1993-11-30 1995-11-07 Texas Instruments Incorporated Three input arithmetic logic unit forming the sum of a first Boolean combination of first, second and third inputs plus a second Boolean combination of first, second and third inputs
US5485411A (en) * 1993-11-30 1996-01-16 Texas Instruments Incorporated Three input arithmetic logic unit forming the sum of a first input anded with a first boolean combination of a second input and a third input plus a second boolean combination of the second and third inputs
JP3157681B2 (ja) * 1994-06-27 2001-04-16 日本電気株式会社 論理データ入力ラッチ回路
US5821773A (en) * 1995-09-06 1998-10-13 Altera Corporation Look-up table based logic element with complete permutability of the inputs to the secondary signals
US5684808A (en) * 1995-09-19 1997-11-04 Unisys Corporation System and method for satisfying mutually exclusive gating requirements in automatic test pattern generation systems
US5867507A (en) * 1995-12-12 1999-02-02 International Business Machines Corporation Testable programmable gate array and associated LSSD/deterministic test methodology
US5869979A (en) * 1996-04-05 1999-02-09 Altera Corporation Technique for preconditioning I/Os during reconfiguration
US6421812B1 (en) 1997-06-10 2002-07-16 Altera Corporation Programming mode selection with JTAG circuits
US6691267B1 (en) 1997-06-10 2004-02-10 Altera Corporation Technique to test an integrated circuit using fewer pins
US5955898A (en) * 1997-06-30 1999-09-21 Sun Microsystems, Inc. Selector and decision wait using pass gate XOR
US6023778A (en) * 1997-12-12 2000-02-08 Intel Corporation Method and apparatus for utilizing mux scan flip-flops to test speed related defects by delaying an active to inactive transition of a scan mode signal
US6687865B1 (en) * 1998-03-25 2004-02-03 On-Chip Technologies, Inc. On-chip service processor for test and debug of integrated circuits
DE19819264A1 (de) * 1998-04-30 1999-11-25 Micronas Intermetall Gmbh Verfahren zum Testen einer integrierten Schaltungsanordnung und integrierte Schaltungsanordnung hierfür
US6184707B1 (en) 1998-10-07 2001-02-06 Altera Corporation Look-up table based logic element with complete permutability of the inputs to the secondary signals
US6442720B1 (en) 1999-06-04 2002-08-27 International Business Machines Corporation Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis
DE19929546C1 (de) * 1999-06-23 2000-09-07 Michael Goessel Multi-Mode Speicherelement
US6629277B1 (en) 2000-02-15 2003-09-30 Sun Microsystems, Inc. LSSD interface
US6300809B1 (en) * 2000-07-14 2001-10-09 International Business Machines Corporation Double-edge-triggered flip-flop providing two data transitions per clock cycle
US6748565B1 (en) 2000-10-02 2004-06-08 International Business Machines Corporation System and method for adjusting timing paths
US7103816B2 (en) * 2001-01-23 2006-09-05 Cadence Design Systems, Inc. Method and system for reducing test data volume in the testing of logic products
US6782501B2 (en) 2001-01-23 2004-08-24 Cadence Design Systems, Inc. System for reducing test data volume in the testing of logic products
US6457161B1 (en) 2001-03-27 2002-09-24 Benoit Nadeau-Dostie Method and program product for modeling circuits with latch based design
US6785855B2 (en) 2001-11-13 2004-08-31 Sun Microsystems, Inc. Implementation of an assertion check in ATPG models
US7039843B2 (en) * 2001-11-13 2006-05-02 Sun Microsystems, Inc. Modeling custom scan flops in level sensitive scan design
US6957358B1 (en) 2002-01-28 2005-10-18 Cisco Systems, Inc. Scaling dynamic clock distribution for large service provider networks
US7096393B2 (en) * 2002-12-20 2006-08-22 Sun Microsystems, Inc. Built-in self-test (BIST) of memory interconnect
US7020820B2 (en) * 2002-12-20 2006-03-28 Sun Microsystems, Inc. Instruction-based built-in self-test (BIST) of external memory
US7062694B2 (en) * 2003-02-07 2006-06-13 Sun Microsystems, Inc. Concurrently programmable dynamic memory built-in self-test (BIST)
US7089136B2 (en) * 2003-07-18 2006-08-08 International Business Machines Corporation Method for reduced electrical fusing time
US6791362B1 (en) * 2003-12-09 2004-09-14 Honeywell International Inc. System level hardening of asynchronous combinational logic
US7383480B2 (en) * 2004-07-22 2008-06-03 International Business Machines Corporation Scanning latches using selecting array
US7257745B2 (en) * 2005-01-31 2007-08-14 International Business Machines Corporation Array self repair using built-in self test techniques
US7484187B2 (en) * 2005-12-07 2009-01-27 International Business Machines Corporation Clock-gating through data independent logic
US7853846B2 (en) * 2007-10-31 2010-12-14 Verigy (Singapore) Pte. Ltd. Locating hold time violations in scan chains by generating patterns on ATE
US8010856B2 (en) * 2007-10-31 2011-08-30 Verigy (Singapore) Pte. Ltd. Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chains
US7908532B2 (en) * 2008-02-16 2011-03-15 International Business Machines Corporation Automated system and processing for expedient diagnosis of broken shift registers latch chains
US8984324B2 (en) * 2011-02-10 2015-03-17 Sony Corporation Establishing clock speed for lengthy or non-compliant HDMI cables

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3564226A (en) * 1966-12-27 1971-02-16 Digital Equipment Parallel binary processing system having minimal operational delay
US3619583A (en) * 1968-10-11 1971-11-09 Bell Telephone Labor Inc Multiple function programmable arrays
US3636376A (en) * 1969-05-01 1972-01-18 Fairchild Camera Instr Co Logic network with a low-power shift register
US3700868A (en) * 1970-12-16 1972-10-24 Nasa Logical function generator
US3707621A (en) * 1971-03-10 1972-12-26 Ronald L Krutz Successive addition utilizing a bistable latch

Also Published As

Publication number Publication date
GB1448382A (en) 1976-09-08
FR2203232B1 (fr) 1976-05-14
JPS4974857A (fr) 1974-07-19
FR2203232A1 (fr) 1974-05-10
AU6051173A (en) 1975-03-20
DE2349377C2 (de) 1982-10-28
JPS5228614B2 (fr) 1977-07-27
BR7308087D0 (pt) 1974-08-15
CH568620A5 (fr) 1975-10-31
CA1005529A (en) 1977-02-15
IT998504B (it) 1976-02-20
US3783254A (en) 1974-01-01
DE2349377A1 (de) 1974-05-02
ES419582A1 (es) 1976-04-16

Similar Documents

Publication Publication Date Title
SE384931B (sv) Logiksystem for utforande av minst en forutbestemd logikfunktion i en digital dator for allmenna endamal
GB1342099A (en) Logic circuit using complementary type insulated gate field effect transistors
JP2504568B2 (ja) 信号生成回路
GB1366772A (en) Field effect transistor inverter circuits
JPS60500038A (ja) プログラム・ロジツク・アレイ
NL7504984A (nl) Longitudinale pariteitgenerator voor een hoofd- geheugen.
ATE6824T1 (de) Breitband-koppelanordnung.
KR870009595A (ko) 직렬-비트 2의 보수 디지탈 신호 처리 장치
GB1278650A (en) Frequency divider circuit
GB2040625A (en) Serial data logic circuit
KR910007266A (ko) 클럭 및 제어 신호 발생 회로
JPS5446463A (en) Pre-scaler
US3601591A (en) Digital differential analyzer employing counters controled by logic levels
ES400068A1 (es) Perfeccionamientos en celulas para la realizacion de cir- cuitos de control de automatismo secuencial.
SU491950A1 (ru) Двоичный арифметический блок
FR2362534A1 (fr) Circuit diviseur logique
US3346728A (en) Binary divider with multiple feedback lines
KR840001223B1 (ko) 래치회로가 부착된 시프트 레지스터
JPH01183211A (ja) 信号保持回路
SU396832A1 (ru) Д-триггер с задержкой
JPS5987575A (ja) デ−タ並び換え回路
GB1278373A (en) Input synchronizer circuit
SU766018A1 (ru) Делитель частоты следовани импульсов
JPS5636220A (en) Static type d flip-flop circuit
GB1143189A (en) Multiple level logic circuits