RU2474795C2 - Измерительное устройство для измерения параметров сфокусированного лазерного пучка - Google Patents
Измерительное устройство для измерения параметров сфокусированного лазерного пучка Download PDFInfo
- Publication number
- RU2474795C2 RU2474795C2 RU2010113570/28A RU2010113570A RU2474795C2 RU 2474795 C2 RU2474795 C2 RU 2474795C2 RU 2010113570/28 A RU2010113570/28 A RU 2010113570/28A RU 2010113570 A RU2010113570 A RU 2010113570A RU 2474795 C2 RU2474795 C2 RU 2474795C2
- Authority
- RU
- Russia
- Prior art keywords
- lens
- measuring device
- lenses
- laser beam
- adapter
- Prior art date
Links
- 230000008878 coupling Effects 0.000 claims description 3
- 238000010168 coupling process Methods 0.000 claims description 3
- 238000005859 coupling reaction Methods 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims 1
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- 230000000694 effects Effects 0.000 abstract description 5
- 239000000126 substance Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 description 5
- 230000007935 neutral effect Effects 0.000 description 5
- 238000006073 displacement reaction Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000001356 surgical procedure Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
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- 238000012625 in-situ measurement Methods 0.000 description 1
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- 230000013011 mating Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000003032 molecular docking Methods 0.000 description 1
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- 230000035945 sensitivity Effects 0.000 description 1
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- 125000006850 spacer group Chemical group 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0448—Adjustable, e.g. focussing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Lens Barrels (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP07017968.4 | 2007-09-13 | ||
| EP07017968A EP2037238B1 (de) | 2007-09-13 | 2007-09-13 | Messgerät zur Vermessung eines Laserstrahls |
| PCT/EP2008/007575 WO2009036932A1 (de) | 2007-09-13 | 2008-09-12 | Messgerät zur vermessung eines fokussierten laserstrahls |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| RU2010113570A RU2010113570A (ru) | 2011-10-20 |
| RU2474795C2 true RU2474795C2 (ru) | 2013-02-10 |
Family
ID=39059375
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| RU2010113570/28A RU2474795C2 (ru) | 2007-09-13 | 2008-09-12 | Измерительное устройство для измерения параметров сфокусированного лазерного пучка |
Country Status (14)
| Country | Link |
|---|---|
| US (1) | US8351028B2 (https=) |
| EP (1) | EP2037238B1 (https=) |
| JP (1) | JP5554710B2 (https=) |
| KR (1) | KR101255796B1 (https=) |
| CN (1) | CN101821595B (https=) |
| BR (1) | BRPI0815425B1 (https=) |
| CA (1) | CA2699629C (https=) |
| DE (1) | DE502007001924D1 (https=) |
| ES (1) | ES2333369T3 (https=) |
| IN (1) | IN2010KN00855A (https=) |
| MX (1) | MX2010002894A (https=) |
| RU (1) | RU2474795C2 (https=) |
| TW (1) | TW200920334A (https=) |
| WO (1) | WO2009036932A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2827964C1 (ru) * | 2024-07-03 | 2024-10-04 | Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский университет "Московский институт электронной техники" | Устройство для определения параметров сфокусированного лазерного пучка |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102010029089B4 (de) * | 2010-05-18 | 2019-08-29 | Carl Zeiss Ag | Optisches System zur Kalibrierung einer Lichtquelle |
| CN102384782A (zh) * | 2010-09-06 | 2012-03-21 | 杭州法珀激光科技有限公司 | 手持式激光光束分析仪 |
| FR2974176B1 (fr) | 2011-04-14 | 2014-01-17 | Centre Nat Rech Scient | Analyseur spatial de faisceau laser a reglage automatique |
| CN105606213B (zh) * | 2015-12-05 | 2018-02-13 | 中国航空工业集团公司洛阳电光设备研究所 | 一种激光微脉冲峰值功率测试装置 |
| DE102016009475B4 (de) * | 2016-08-05 | 2019-06-19 | Primes GmbH Meßtechnik für die Produktion mit Laserstrahlung | Strahlleistungsmessung mit Aufweitung |
| CN110799892B (zh) * | 2017-06-23 | 2022-04-12 | 业纳光学系统有限公司 | 用于辅助调整射束扩展器的方法、调整辅助设备以及射束扩展器 |
| CN112368638A (zh) * | 2018-07-05 | 2021-02-12 | 应用材料公司 | 光掩模保护膜残胶移除 |
| US11243114B2 (en) * | 2018-09-17 | 2022-02-08 | Trumpf Lasersystems For Semiconductor Manufacturing Gmbh | Method for determining at least one beam propagation parameter of a laser beam |
| TWI729403B (zh) * | 2019-05-31 | 2021-06-01 | 致茂電子股份有限公司 | 光電元件特性測量裝置 |
| US12153208B2 (en) * | 2020-11-23 | 2024-11-26 | Coherent Lasersystems Gmbh & Co. Kg | Laser beam wavefront correction with adaptive optics and mid-field monitoring |
| CN116907369B (zh) * | 2023-09-06 | 2023-12-12 | 太原科技大学 | 一种螺旋焊管管径激光检测系统及其使用方法 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001004491A (ja) * | 1999-06-25 | 2001-01-12 | Sankyo Seiki Mfg Co Ltd | 光ビームの検査装置 |
| US20040066504A1 (en) * | 2002-09-24 | 2004-04-08 | Infineon Technologies North America Corp. | Test system for laser diode far-field pattern measurement |
| RU40103U1 (ru) * | 2004-01-08 | 2004-08-27 | Федеральное государственное унитарное предприятие "Производственное объединение "Уральский оптико-механический завод" | Устройство для определения углового рассогласования пучков лазерного излучения |
| US20060043258A1 (en) * | 2004-08-26 | 2006-03-02 | Masayuki Jyumonji | Method of picking up sectional image of laser light |
| US20060056060A1 (en) * | 2004-08-26 | 2006-03-16 | Masaaki Ozaki | Lens-barrel device |
| US20060254115A1 (en) * | 2004-11-22 | 2006-11-16 | Thomas Mark A | Optical sight with side focus adjustment |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB909336A (en) | 1959-11-13 | 1962-10-31 | Leitz Ernst Gmbh | Improvements in or relating to tubular guide arrangements |
| JPS6079127U (ja) | 1983-11-07 | 1985-06-01 | 長田電機工業株式会社 | レ−ザ−用パワ−メ−タ |
| JPH01168843U (https=) | 1988-05-19 | 1989-11-28 | ||
| JPH0222658A (ja) * | 1988-07-08 | 1990-01-25 | Mitsubishi Electric Corp | 電子ビーム露光方法 |
| JPH071201B2 (ja) * | 1989-01-17 | 1995-01-11 | 株式会社オプトアート | 光ビーム測定装置 |
| US5194993A (en) * | 1991-09-24 | 1993-03-16 | Eastman Kodak Company | Adjustable mount for cylindrical lens |
| FR2698182B1 (fr) * | 1992-11-13 | 1994-12-16 | Commissariat Energie Atomique | Dispositif de contrôle du centrage d'un faisceau lumineux, application à l'introduction de ce faisceau dans une fibre optique. |
| JPH071201A (ja) | 1993-02-28 | 1995-01-06 | Sanshin Kogyo Kk | 円筒部材の加工方法 |
| CN2293794Y (zh) * | 1997-04-28 | 1998-10-07 | 中国科学技术大学 | 可调式半导体激光准直头 |
| JP2000234916A (ja) | 1999-02-15 | 2000-08-29 | Konica Corp | 光ビーム形状計測装置及びアライメント測定装置 |
| WO2006078349A2 (en) * | 2004-11-22 | 2006-07-27 | Meade Instruments Corporation | Scope for a firearm |
| JP4524403B2 (ja) * | 2005-05-31 | 2010-08-18 | 三菱電機株式会社 | フーリエ変換光学装置及び光制御型フェーズドアレイアンテナ装置 |
| JP4049171B2 (ja) * | 2005-07-08 | 2008-02-20 | コニカミノルタオプト株式会社 | 鏡胴ユニット並びに撮像装置 |
| US7463342B2 (en) * | 2007-05-02 | 2008-12-09 | Angstrom, Inc. | Optical tracking device using micromirror array lenses |
-
2007
- 2007-09-13 ES ES07017968T patent/ES2333369T3/es active Active
- 2007-09-13 DE DE502007001924T patent/DE502007001924D1/de active Active
- 2007-09-13 EP EP07017968A patent/EP2037238B1/de active Active
-
2008
- 2008-09-12 CA CA2699629A patent/CA2699629C/en active Active
- 2008-09-12 IN IN855KON2010 patent/IN2010KN00855A/en unknown
- 2008-09-12 MX MX2010002894A patent/MX2010002894A/es active IP Right Grant
- 2008-09-12 WO PCT/EP2008/007575 patent/WO2009036932A1/de not_active Ceased
- 2008-09-12 KR KR1020107008066A patent/KR101255796B1/ko not_active Expired - Fee Related
- 2008-09-12 RU RU2010113570/28A patent/RU2474795C2/ru not_active IP Right Cessation
- 2008-09-12 BR BRPI0815425-2A patent/BRPI0815425B1/pt not_active IP Right Cessation
- 2008-09-12 CN CN200880106717.7A patent/CN101821595B/zh active Active
- 2008-09-12 JP JP2010524407A patent/JP5554710B2/ja active Active
- 2008-09-12 US US12/677,776 patent/US8351028B2/en active Active
- 2008-09-12 TW TW097135025A patent/TW200920334A/zh unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001004491A (ja) * | 1999-06-25 | 2001-01-12 | Sankyo Seiki Mfg Co Ltd | 光ビームの検査装置 |
| US20040066504A1 (en) * | 2002-09-24 | 2004-04-08 | Infineon Technologies North America Corp. | Test system for laser diode far-field pattern measurement |
| RU40103U1 (ru) * | 2004-01-08 | 2004-08-27 | Федеральное государственное унитарное предприятие "Производственное объединение "Уральский оптико-механический завод" | Устройство для определения углового рассогласования пучков лазерного излучения |
| US20060043258A1 (en) * | 2004-08-26 | 2006-03-02 | Masayuki Jyumonji | Method of picking up sectional image of laser light |
| US20060056060A1 (en) * | 2004-08-26 | 2006-03-16 | Masaaki Ozaki | Lens-barrel device |
| US20060254115A1 (en) * | 2004-11-22 | 2006-11-16 | Thomas Mark A | Optical sight with side focus adjustment |
Non-Patent Citations (1)
| Title |
|---|
| МАЛЬЦЕВ М.Д. и др. Прикладная оптика и оптические измерения. - М.: Машиностроение, 1958, с.115, 118. * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2827964C1 (ru) * | 2024-07-03 | 2024-10-04 | Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский университет "Московский институт электронной техники" | Устройство для определения параметров сфокусированного лазерного пучка |
Also Published As
| Publication number | Publication date |
|---|---|
| DE502007001924D1 (de) | 2009-12-17 |
| TW200920334A (en) | 2009-05-16 |
| CA2699629A1 (en) | 2009-03-26 |
| ES2333369T3 (es) | 2010-02-19 |
| BRPI0815425A2 (pt) | 2016-08-09 |
| EP2037238A1 (de) | 2009-03-18 |
| WO2009036932A1 (de) | 2009-03-26 |
| MX2010002894A (es) | 2010-04-01 |
| RU2010113570A (ru) | 2011-10-20 |
| US20100253937A1 (en) | 2010-10-07 |
| IN2010KN00855A (https=) | 2015-08-28 |
| CA2699629C (en) | 2016-04-19 |
| CN101821595A (zh) | 2010-09-01 |
| KR101255796B1 (ko) | 2013-04-17 |
| EP2037238B1 (de) | 2009-11-04 |
| JP2010539459A (ja) | 2010-12-16 |
| KR20100063118A (ko) | 2010-06-10 |
| BRPI0815425B1 (pt) | 2019-04-09 |
| US8351028B2 (en) | 2013-01-08 |
| CN101821595B (zh) | 2014-11-26 |
| JP5554710B2 (ja) | 2014-07-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | The patent is invalid due to non-payment of fees |
Effective date: 20200913 |