BRPI0815425A2 - dispositivo de medição para medir um feixe laser concentrado - Google Patents

dispositivo de medição para medir um feixe laser concentrado

Info

Publication number
BRPI0815425A2
BRPI0815425A2 BRPI0815425A BRPI0815425A BRPI0815425A2 BR PI0815425 A2 BRPI0815425 A2 BR PI0815425A2 BR PI0815425 A BRPI0815425 A BR PI0815425A BR PI0815425 A BRPI0815425 A BR PI0815425A BR PI0815425 A2 BRPI0815425 A2 BR PI0815425A2
Authority
BR
Brazil
Prior art keywords
measuring
laser beam
concentrated laser
measuring device
concentrated
Prior art date
Application number
BRPI0815425A
Other languages
English (en)
Inventor
Kittleman Olaf
Zerl Bernd
Original Assignee
Wavelight Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wavelight Ag filed Critical Wavelight Ag
Publication of BRPI0815425A2 publication Critical patent/BRPI0815425A2/pt
Publication of BRPI0815425B1 publication Critical patent/BRPI0815425B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0448—Adjustable, e.g. focussing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Lens Barrels (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
BRPI0815425-2A 2007-09-13 2008-09-12 Dispositivo de medição para medir um feixe laser concentrado BRPI0815425B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP07017968.4 2007-09-13
EP07017968A EP2037238B1 (de) 2007-09-13 2007-09-13 Messgerät zur Vermessung eines Laserstrahls
PCT/EP2008/007575 WO2009036932A1 (de) 2007-09-13 2008-09-12 Messgerät zur vermessung eines fokussierten laserstrahls

Publications (2)

Publication Number Publication Date
BRPI0815425A2 true BRPI0815425A2 (pt) 2016-08-09
BRPI0815425B1 BRPI0815425B1 (pt) 2019-04-09

Family

ID=39059375

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0815425-2A BRPI0815425B1 (pt) 2007-09-13 2008-09-12 Dispositivo de medição para medir um feixe laser concentrado

Country Status (14)

Country Link
US (1) US8351028B2 (pt)
EP (1) EP2037238B1 (pt)
JP (1) JP5554710B2 (pt)
KR (1) KR101255796B1 (pt)
CN (1) CN101821595B (pt)
BR (1) BRPI0815425B1 (pt)
CA (1) CA2699629C (pt)
DE (1) DE502007001924D1 (pt)
ES (1) ES2333369T3 (pt)
IN (1) IN2010KN00855A (pt)
MX (1) MX2010002894A (pt)
RU (1) RU2474795C2 (pt)
TW (1) TW200920334A (pt)
WO (1) WO2009036932A1 (pt)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010029089B4 (de) * 2010-05-18 2019-08-29 Carl Zeiss Ag Optisches System zur Kalibrierung einer Lichtquelle
CN102384782A (zh) * 2010-09-06 2012-03-21 杭州法珀激光科技有限公司 手持式激光光束分析仪
FR2974176B1 (fr) * 2011-04-14 2014-01-17 Centre Nat Rech Scient Analyseur spatial de faisceau laser a reglage automatique
CN105606213B (zh) * 2015-12-05 2018-02-13 中国航空工业集团公司洛阳电光设备研究所 一种激光微脉冲峰值功率测试装置
DE102016009475B4 (de) * 2016-08-05 2019-06-19 Primes GmbH Meßtechnik für die Produktion mit Laserstrahlung Strahlleistungsmessung mit Aufweitung
KR102579196B1 (ko) * 2018-07-05 2023-09-14 어플라이드 머티어리얼스, 인코포레이티드 포토마스크 펠리클 접착제 잔류물 제거
US11243114B2 (en) * 2018-09-17 2022-02-08 Trumpf Lasersystems For Semiconductor Manufacturing Gmbh Method for determining at least one beam propagation parameter of a laser beam
TWI729403B (zh) * 2019-05-31 2021-06-01 致茂電子股份有限公司 光電元件特性測量裝置
CN116907369B (zh) * 2023-09-06 2023-12-12 太原科技大学 一种螺旋焊管管径激光检测系统及其使用方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB909336A (en) * 1959-11-13 1962-10-31 Leitz Ernst Gmbh Improvements in or relating to tubular guide arrangements
JPS6079127U (ja) * 1983-11-07 1985-06-01 長田電機工業株式会社 レ−ザ−用パワ−メ−タ
JPH01168843U (pt) 1988-05-19 1989-11-28
JPH0222658A (ja) * 1988-07-08 1990-01-25 Mitsubishi Electric Corp 電子ビーム露光方法
JPH071201B2 (ja) * 1989-01-17 1995-01-11 株式会社オプトアート 光ビーム測定装置
US5194993A (en) * 1991-09-24 1993-03-16 Eastman Kodak Company Adjustable mount for cylindrical lens
FR2698182B1 (fr) * 1992-11-13 1994-12-16 Commissariat Energie Atomique Dispositif de contrôle du centrage d'un faisceau lumineux, application à l'introduction de ce faisceau dans une fibre optique.
JPH071201A (ja) 1993-02-28 1995-01-06 Sanshin Kogyo Kk 円筒部材の加工方法
CN2293794Y (zh) * 1997-04-28 1998-10-07 中国科学技术大学 可调式半导体激光准直头
JP2000234916A (ja) * 1999-02-15 2000-08-29 Konica Corp 光ビーム形状計測装置及びアライメント測定装置
JP2001004491A (ja) * 1999-06-25 2001-01-12 Sankyo Seiki Mfg Co Ltd 光ビームの検査装置
US6922232B2 (en) 2002-09-24 2005-07-26 Infineon Technologies North America Corp. Test system for laser diode far-field pattern measurement
RU40103U1 (ru) * 2004-01-08 2004-08-27 Федеральное государственное унитарное предприятие "Производственное объединение "Уральский оптико-механический завод" Устройство для определения углового рассогласования пучков лазерного излучения
JP3935168B2 (ja) * 2004-08-26 2007-06-20 シャープ株式会社 レンズ鏡筒装置
TW200608475A (en) 2004-08-26 2006-03-01 Adv Lcd Tech Dev Ct Co Ltd Method of picking up sectional image of laser light
US20060254115A1 (en) * 2004-11-22 2006-11-16 Thomas Mark A Optical sight with side focus adjustment
JP4524403B2 (ja) * 2005-05-31 2010-08-18 三菱電機株式会社 フーリエ変換光学装置及び光制御型フェーズドアレイアンテナ装置
JP4049171B2 (ja) * 2005-07-08 2008-02-20 コニカミノルタオプト株式会社 鏡胴ユニット並びに撮像装置
US7463342B2 (en) * 2007-05-02 2008-12-09 Angstrom, Inc. Optical tracking device using micromirror array lenses

Also Published As

Publication number Publication date
JP5554710B2 (ja) 2014-07-23
US8351028B2 (en) 2013-01-08
CA2699629C (en) 2016-04-19
RU2010113570A (ru) 2011-10-20
CN101821595B (zh) 2014-11-26
KR101255796B1 (ko) 2013-04-17
BRPI0815425B1 (pt) 2019-04-09
EP2037238A1 (de) 2009-03-18
DE502007001924D1 (de) 2009-12-17
WO2009036932A1 (de) 2009-03-26
EP2037238B1 (de) 2009-11-04
TW200920334A (en) 2009-05-16
KR20100063118A (ko) 2010-06-10
ES2333369T3 (es) 2010-02-19
JP2010539459A (ja) 2010-12-16
MX2010002894A (es) 2010-04-01
US20100253937A1 (en) 2010-10-07
CN101821595A (zh) 2010-09-01
IN2010KN00855A (pt) 2015-08-28
CA2699629A1 (en) 2009-03-26
RU2474795C2 (ru) 2013-02-10

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Legal Events

Date Code Title Description
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B06A Patent application procedure suspended [chapter 6.1 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 10 (DEZ) ANOS CONTADOS A PARTIR DE 09/04/2019, OBSERVADAS AS CONDICOES LEGAIS. (CO) 10 (DEZ) ANOS CONTADOS A PARTIR DE 09/04/2019, OBSERVADAS AS CONDICOES LEGAIS

B25D Requested change of name of applicant approved

Owner name: WAVELIGHT GMBH (DE)

B25A Requested transfer of rights approved

Owner name: ALCON INC. (CH)

B21F Lapse acc. art. 78, item iv - on non-payment of the annual fees in time

Free format text: REFERENTE A 13A ANUIDADE.

B24J Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12)

Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2640 DE 10-08-2021 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.