IN2010KN00855A - - Google Patents

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Publication number
IN2010KN00855A
IN2010KN00855A IN855KON2010A IN2010KN00855A IN 2010KN00855 A IN2010KN00855 A IN 2010KN00855A IN 855KON2010 A IN855KON2010 A IN 855KON2010A IN 2010KN00855 A IN2010KN00855 A IN 2010KN00855A
Authority
IN
India
Prior art keywords
laser beam
measuring device
laser
lenses
adapter
Prior art date
Application number
Inventor
Bernd Zerl
Olaf Kittelmann
Original Assignee
Wavelight Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wavelight Ag filed Critical Wavelight Ag
Publication of IN2010KN00855A publication Critical patent/IN2010KN00855A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0448—Adjustable, e.g. focussing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Lens Barrels (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

According to an embodiment, a measuring device for measuring a laser beam comprises a magnification lens system with a total of two lenses (10, 12) which are arranged in series in the beam path of the laser beam and whose foci are coinciding, as well as a camera (74) which is arranged behind the two lenses (10, 12) in the focus of the last lens (12) and includes an electronic image sensor (14) which generates an electronic image of the magnified laser beam. The lenses (10, 12) together with the camera (74) are adjustable along the beam path relative to a reference point (46) of the measuring device, for the purpose of locating the beam waist of the laser beam and of determining a diameter profile of the laser beam. The measuring device further comprises an adapter (42) enclosing the beam path for coupling the measuring device to a laser system which provides the laser beam. The adapter (42) forms an abutment surface (46) for the laser system, which is axially directed with respect to a beam axis (16) of the laser beam, and permits the measuring device to be coupled in situ at the installation site of the laser system.
IN855KON2010 2007-09-13 2008-09-12 IN2010KN00855A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07017968A EP2037238B1 (en) 2007-09-13 2007-09-13 Measuring device for measuring a laser beam
PCT/EP2008/007575 WO2009036932A1 (en) 2007-09-13 2008-09-12 Measuring device for measuring a focused laser beam

Publications (1)

Publication Number Publication Date
IN2010KN00855A true IN2010KN00855A (en) 2015-08-28

Family

ID=39059375

Family Applications (1)

Application Number Title Priority Date Filing Date
IN855KON2010 IN2010KN00855A (en) 2007-09-13 2008-09-12

Country Status (14)

Country Link
US (1) US8351028B2 (en)
EP (1) EP2037238B1 (en)
JP (1) JP5554710B2 (en)
KR (1) KR101255796B1 (en)
CN (1) CN101821595B (en)
BR (1) BRPI0815425B1 (en)
CA (1) CA2699629C (en)
DE (1) DE502007001924D1 (en)
ES (1) ES2333369T3 (en)
IN (1) IN2010KN00855A (en)
MX (1) MX2010002894A (en)
RU (1) RU2474795C2 (en)
TW (1) TW200920334A (en)
WO (1) WO2009036932A1 (en)

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DE102010029089B4 (en) * 2010-05-18 2019-08-29 Carl Zeiss Ag Optical system for calibrating a light source
CN102384782A (en) * 2010-09-06 2012-03-21 杭州法珀激光科技有限公司 Handheld laser beam analyzer
FR2974176B1 (en) * 2011-04-14 2014-01-17 Centre Nat Rech Scient SPATIAL LASER BEAM ANALYZER WITH AUTOMATIC ADJUSTMENT
CN105606213B (en) * 2015-12-05 2018-02-13 中国航空工业集团公司洛阳电光设备研究所 A kind of laser micropulse peak power test device
DE102016009475B4 (en) * 2016-08-05 2019-06-19 Primes GmbH Meßtechnik für die Produktion mit Laserstrahlung Beam power measurement with expansion
WO2018233997A1 (en) * 2017-06-23 2018-12-27 Jenoptik Optical Systems Gmbh Method for supporting an adjustment of a beam expander, adjustment support device and beam expander
CN112368638A (en) * 2018-07-05 2021-02-12 应用材料公司 Photomask protection film residual glue removal
US11243114B2 (en) * 2018-09-17 2022-02-08 Trumpf Lasersystems For Semiconductor Manufacturing Gmbh Method for determining at least one beam propagation parameter of a laser beam
TWI729403B (en) * 2019-05-31 2021-06-01 致茂電子股份有限公司 Device for measuring optolectronic units
CN116907369B (en) * 2023-09-06 2023-12-12 太原科技大学 Spiral welded pipe diameter laser detection system and application method thereof

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JPH01168843U (en) 1988-05-19 1989-11-28
JPH0222658A (en) * 1988-07-08 1990-01-25 Mitsubishi Electric Corp Electron beam exposure method
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US5194993A (en) * 1991-09-24 1993-03-16 Eastman Kodak Company Adjustable mount for cylindrical lens
FR2698182B1 (en) * 1992-11-13 1994-12-16 Commissariat Energie Atomique Device for controlling the centering of a light beam, application to the introduction of this beam into an optical fiber.
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CN2293794Y (en) * 1997-04-28 1998-10-07 中国科学技术大学 Adjustable semi-conductor laser collimation head
JP2000234916A (en) * 1999-02-15 2000-08-29 Konica Corp Light beam form measuring apparatus and alignment measuring apparatus
JP2001004491A (en) * 1999-06-25 2001-01-12 Sankyo Seiki Mfg Co Ltd Apparatus for inspecting light beam
US6922232B2 (en) 2002-09-24 2005-07-26 Infineon Technologies North America Corp. Test system for laser diode far-field pattern measurement
RU40103U1 (en) * 2004-01-08 2004-08-27 Федеральное государственное унитарное предприятие "Производственное объединение "Уральский оптико-механический завод" DEVICE FOR DETERMINING ANGULAR DISCONNECTION OF BEAMS OF LASER RADIATION
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Also Published As

Publication number Publication date
RU2474795C2 (en) 2013-02-10
JP2010539459A (en) 2010-12-16
CN101821595B (en) 2014-11-26
DE502007001924D1 (en) 2009-12-17
CA2699629A1 (en) 2009-03-26
CA2699629C (en) 2016-04-19
EP2037238A1 (en) 2009-03-18
KR20100063118A (en) 2010-06-10
WO2009036932A1 (en) 2009-03-26
BRPI0815425A2 (en) 2016-08-09
US8351028B2 (en) 2013-01-08
MX2010002894A (en) 2010-04-01
CN101821595A (en) 2010-09-01
BRPI0815425B1 (en) 2019-04-09
RU2010113570A (en) 2011-10-20
KR101255796B1 (en) 2013-04-17
TW200920334A (en) 2009-05-16
EP2037238B1 (en) 2009-11-04
US20100253937A1 (en) 2010-10-07
JP5554710B2 (en) 2014-07-23
ES2333369T3 (en) 2010-02-19

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