RU2016131081A3 - - Google Patents
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- RU2016131081A3 RU2016131081A3 RU2016131081A RU2016131081A RU2016131081A3 RU 2016131081 A3 RU2016131081 A3 RU 2016131081A3 RU 2016131081 A RU2016131081 A RU 2016131081A RU 2016131081 A RU2016131081 A RU 2016131081A RU 2016131081 A3 RU2016131081 A3 RU 2016131081A3
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- RU
- Russia
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
- H01J3/02—Electron guns
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/15—Cathodes heated directly by an electric current
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/20—Cathodes heated indirectly by an electric current; Cathodes heated by electron or ion bombardment
- H01J1/28—Dispenser-type cathodes, e.g. L-cathode
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
- H01J3/02—Electron guns
- H01J3/027—Construction of the gun or parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
- H01J3/02—Electron guns
- H01J3/029—Schematic arrangements for beam forming
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/075—Electron guns using thermionic emission from cathodes heated by particle bombardment or by irradiation, e.g. by laser
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
- H01J37/3177—Multi-beam, e.g. fly's eye, comb probe
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2229/00—Details of cathode ray tubes or electron beam tubes
- H01J2229/48—Electron guns
- H01J2229/4803—Electrodes
- H01J2229/481—Focusing electrodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/061—Construction
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Electron Beam Exposure (AREA)
- Electron Sources, Ion Sources (AREA)
- Solid Thermionic Cathode (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201361921546P | 2013-12-30 | 2013-12-30 | |
US61/921,546 | 2013-12-30 | ||
PCT/EP2014/078993 WO2015101537A1 (en) | 2013-12-30 | 2014-12-22 | Cathode arrangement, electron gun, and lithography system comprising such electron gun |
Publications (3)
Publication Number | Publication Date |
---|---|
RU2016131081A RU2016131081A (ru) | 2018-02-06 |
RU2016131081A3 true RU2016131081A3 (nl) | 2018-06-20 |
RU2689391C2 RU2689391C2 (ru) | 2019-05-28 |
Family
ID=52146507
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
RU2016131081A RU2689391C2 (ru) | 2013-12-30 | 2014-12-22 | Катодное устройство, электронная пушка и установка литографии, содержащая такую электронную пушку |
Country Status (9)
Country | Link |
---|---|
US (3) | US9455112B2 (nl) |
EP (2) | EP3090438B1 (nl) |
JP (4) | JP6590811B2 (nl) |
KR (2) | KR102427119B1 (nl) |
CN (3) | CN105874554B (nl) |
NL (2) | NL2014029B1 (nl) |
RU (1) | RU2689391C2 (nl) |
TW (2) | TWI661457B (nl) |
WO (2) | WO2015101538A1 (nl) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
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KR102427119B1 (ko) * | 2013-12-30 | 2022-07-29 | 에이에스엠엘 네델란즈 비.브이. | 캐소드 어레인지먼트, 전자총, 및 그런 전자총을 포함하는 리소그래피 시스템 |
US10529529B2 (en) * | 2016-04-20 | 2020-01-07 | Moxtek, Inc. | Electron-beam spot optimization |
US10366859B2 (en) * | 2016-08-24 | 2019-07-30 | Varian Medical Systems, Inc. | Electromagnetic interference containment for accelerator systems |
UA113827C2 (xx) * | 2016-09-07 | 2017-03-10 | Аксіальна електронна гармата | |
US10535499B2 (en) * | 2017-11-03 | 2020-01-14 | Varian Semiconductor Equipment Associates, Inc. | Varied component density for thermal isolation |
JP6396618B1 (ja) * | 2018-04-03 | 2018-09-26 | グローテクノロジー株式会社 | グロー放電システム及びこれを用いたグロー放電質量分析装置 |
CN111048373B (zh) * | 2018-10-12 | 2021-04-27 | 中国电子科技集团公司第三十八研究所 | 一种电子源再生方法 |
KR102640728B1 (ko) * | 2019-04-18 | 2024-02-27 | 주식회사 히타치하이테크 | 전자원 및 하전 입자선 장치 |
CA3145964A1 (en) * | 2019-09-23 | 2021-04-01 | Freemelt Ab | Electron gun cathode technology |
JP7554100B2 (ja) * | 2020-11-19 | 2024-09-19 | 株式会社ニューフレアテクノロジー | 電子放出源の動作制御方法、電子ビーム描画方法、及び電子ビーム描画装置 |
JP7549803B2 (ja) | 2021-02-09 | 2024-09-12 | 日新イオン機器株式会社 | 電子源およびイオン源 |
CN114284121B (zh) * | 2021-12-24 | 2023-09-19 | 中国科学院空天信息创新研究院 | 用于行波管的电子枪及其制备方法 |
US11961696B1 (en) * | 2022-10-28 | 2024-04-16 | Ion Technology Solutions, Llc | Ion source cathode |
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KR102427119B1 (ko) * | 2013-12-30 | 2022-07-29 | 에이에스엠엘 네델란즈 비.브이. | 캐소드 어레인지먼트, 전자총, 및 그런 전자총을 포함하는 리소그래피 시스템 |
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2014
- 2014-12-22 KR KR1020167021105A patent/KR102427119B1/ko active IP Right Grant
- 2014-12-22 US US14/578,525 patent/US9455112B2/en active Active
- 2014-12-22 TW TW103144743A patent/TWI661457B/zh active
- 2014-12-22 EP EP14819003.6A patent/EP3090438B1/en active Active
- 2014-12-22 NL NL2014029A patent/NL2014029B1/en active
- 2014-12-22 CN CN201480071826.5A patent/CN105874554B/zh active Active
- 2014-12-22 JP JP2016544160A patent/JP6590811B2/ja active Active
- 2014-12-22 KR KR1020167021108A patent/KR102359077B1/ko active IP Right Grant
- 2014-12-22 CN CN201480071807.2A patent/CN105874555B/zh active Active
- 2014-12-22 RU RU2016131081A patent/RU2689391C2/ru active
- 2014-12-22 JP JP2016544063A patent/JP6208371B2/ja active Active
- 2014-12-22 TW TW103144742A patent/TWI608511B/zh active
- 2014-12-22 NL NL2014030A patent/NL2014030B1/en active
- 2014-12-22 WO PCT/EP2014/078995 patent/WO2015101538A1/en active Application Filing
- 2014-12-22 CN CN201810479190.8A patent/CN108666188B/zh active Active
- 2014-12-22 EP EP14825336.2A patent/EP3090439B1/en active Active
- 2014-12-22 WO PCT/EP2014/078993 patent/WO2015101537A1/en active Application Filing
- 2014-12-22 US US14/578,533 patent/US9466453B2/en active Active
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2016
- 2016-07-07 US US15/203,888 patent/US10622188B2/en active Active
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2017
- 2017-09-06 JP JP2017171156A patent/JP6462805B2/ja active Active
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2019
- 2019-09-17 JP JP2019168023A patent/JP6929910B2/ja active Active
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