NL7314732A - - Google Patents
Info
- Publication number
- NL7314732A NL7314732A NL7314732A NL7314732A NL7314732A NL 7314732 A NL7314732 A NL 7314732A NL 7314732 A NL7314732 A NL 7314732A NL 7314732 A NL7314732 A NL 7314732A NL 7314732 A NL7314732 A NL 7314732A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/092—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
- H01L27/0927—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors comprising a P-well only in the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/8238—Complementary field-effect transistors, e.g. CMOS
- H01L21/823828—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the gate conductors, e.g. particular materials, shapes
- H01L21/823842—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the gate conductors, e.g. particular materials, shapes gate conductors with different gate conductor materials or different gate conductor implants, e.g. dual gate structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/043—Dual dielectric
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/053—Field effect transistors fets
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/122—Polycrystalline
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Electrodes Of Semiconductors (AREA)
- Bipolar Transistors (AREA)
- Formation Of Insulating Films (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Weting (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00302962A US3821781A (en) | 1972-11-01 | 1972-11-01 | Complementary field effect transistors having p doped silicon gates |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| NL7314732A true NL7314732A (fr) | 1974-05-03 |
| NL182604B NL182604B (nl) | 1987-11-02 |
| NL182604C NL182604C (nl) | 1988-04-05 |
Family
ID=23169988
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NLAANVRAGE7314732,A NL182604C (nl) | 1972-11-01 | 1973-10-26 | Werkwijze voor het vervaardigen van een geintegreerde halfgeleiderschakeling met ten minste een paar complementaire veldeffecttransistoren met een stuurelektrode van polykristallijn of amorf silicium en een met de werkwijze vervaardigde geintegreerde halfgeleiderschakeling. |
Country Status (14)
| Country | Link |
|---|---|
| US (1) | US3821781A (fr) |
| JP (2) | JPS5513431B2 (fr) |
| BE (1) | BE805485A (fr) |
| BR (1) | BR7307671D0 (fr) |
| CA (1) | CA1061012A (fr) |
| CH (1) | CH553482A (fr) |
| DE (1) | DE2352762C2 (fr) |
| ES (1) | ES419843A1 (fr) |
| FR (1) | FR2204896B1 (fr) |
| GB (1) | GB1423183A (fr) |
| IL (1) | IL43098A (fr) |
| IT (1) | IT1001557B (fr) |
| NL (1) | NL182604C (fr) |
| SE (1) | SE389227B (fr) |
Families Citing this family (47)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4016016A (en) * | 1975-05-22 | 1977-04-05 | Rca Corporation | Method of simultaneously forming a polycrystalline silicon gate and a single crystal extension of said gate in silicon on sapphire MOS devices |
| JPS51147274A (en) * | 1975-06-13 | 1976-12-17 | Fujitsu Ltd | Manufacturing process of integrated circuit |
| JPS51147982A (en) * | 1975-06-13 | 1976-12-18 | Nec Corp | Integrated circuit |
| JPS5214381A (en) * | 1975-07-25 | 1977-02-03 | Hitachi Ltd | Mis-type semiconductor device |
| JPS5267276A (en) * | 1975-10-29 | 1977-06-03 | Toshiba Corp | Manufacture of semiconductor unit |
| US4035826A (en) * | 1976-02-23 | 1977-07-12 | Rca Corporation | Reduction of parasitic bipolar effects in integrated circuits employing insulated gate field effect transistors via the use of low resistance substrate contacts extending through source region |
| JPS606105B2 (ja) * | 1976-03-29 | 1985-02-15 | 三菱電機株式会社 | 絶縁ゲ−ト型電界効果トランジスタの製造方法 |
| US4124807A (en) * | 1976-09-14 | 1978-11-07 | Solid State Scientific Inc. | Bistable semiconductor flip-flop having a high resistance feedback |
| US4045259A (en) * | 1976-10-26 | 1977-08-30 | Harris Corporation | Process for fabricating diffused complementary field effect transistors |
| US4157268A (en) * | 1977-06-16 | 1979-06-05 | International Business Machines Corporation | Localized oxidation enhancement for an integrated injection logic circuit |
| JPS5413779A (en) * | 1977-07-04 | 1979-02-01 | Toshiba Corp | Semiconductor integrated circuit device |
| JPS54110068U (fr) * | 1978-01-20 | 1979-08-02 | ||
| US4559694A (en) * | 1978-09-13 | 1985-12-24 | Hitachi, Ltd. | Method of manufacturing a reference voltage generator device |
| US4785341A (en) * | 1979-06-29 | 1988-11-15 | International Business Machines Corporation | Interconnection of opposite conductivity type semiconductor regions |
| EP0024905B1 (fr) * | 1979-08-25 | 1985-01-16 | Zaidan Hojin Handotai Kenkyu Shinkokai | Transistor à effet de champ à porte isolée |
| US4295897B1 (en) * | 1979-10-03 | 1997-09-09 | Texas Instruments Inc | Method of making cmos integrated circuit device |
| JPS5661139A (en) * | 1979-10-25 | 1981-05-26 | Seiko Epson Corp | Manufacture of semiconductor device |
| JPS5664465A (en) * | 1979-10-29 | 1981-06-01 | Seiko Epson Corp | C-mos integrated circuit |
| JPS5663874A (en) * | 1979-10-29 | 1981-05-30 | Hitachi Metals Ltd | Hard tool material |
| US4684971A (en) * | 1981-03-13 | 1987-08-04 | American Telephone And Telegraph Company, At&T Bell Laboratories | Ion implanted CMOS devices |
| DE3133468A1 (de) * | 1981-08-25 | 1983-03-17 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum herstellen von hochintegrierten komplementaeren mos-feldeffekttransistorschaltungen in siliziumgate-technologie |
| DE3133841A1 (de) * | 1981-08-27 | 1983-03-17 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum herstellen von hochintegrierten komplementaeren mos-feldeffekttransistorschaltungen |
| DE3149185A1 (de) * | 1981-12-11 | 1983-06-23 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur herstellung benachbarter mit dotierstoffionen implantierter wannen bei der herstellung von hochintegrierten komplementaeren mos-feldeffekttransistorschaltungen |
| US4474624A (en) * | 1982-07-12 | 1984-10-02 | Intel Corporation | Process for forming self-aligned complementary source/drain regions for MOS transistors |
| JPS5955054A (ja) * | 1982-09-24 | 1984-03-29 | Hitachi Ltd | 半導体装置の製造方法 |
| JPH0636425B2 (ja) * | 1983-02-23 | 1994-05-11 | テキサス インスツルメンツ インコ−ポレイテツド | Ｃｍｏｓ装置の製造方法 |
| JPS6024620U (ja) * | 1983-07-27 | 1985-02-20 | トヨタ自動車株式会社 | 自動車用ドアウエザストリップ |
| JPS5956758A (ja) * | 1983-08-31 | 1984-04-02 | Hitachi Ltd | 電界効果半導体装置の製法 |
| US5257095A (en) * | 1985-12-04 | 1993-10-26 | Advanced Micro Devices, Inc. | Common geometry high voltage tolerant long channel and high speed short channel field effect transistors |
| EP0248267A3 (fr) * | 1986-06-06 | 1990-04-25 | Siemens Aktiengesellschaft | Circuit intégré monolithiques à branches de circuit parallèles entre elles |
| EP0248266A3 (fr) * | 1986-06-06 | 1990-04-25 | Siemens Aktiengesellschaft | Circuit logique à plusieurs transistors à effet de champ complémentaires |
| US4707455A (en) * | 1986-11-26 | 1987-11-17 | General Electric Company | Method of fabricating a twin tub CMOS device |
| US5060037A (en) * | 1987-04-03 | 1991-10-22 | Texas Instruments Incorporated | Output buffer with enhanced electrostatic discharge protection |
| JPS63147A (ja) * | 1987-06-12 | 1988-01-05 | Seiko Epson Corp | 半導体装置 |
| JPS63146A (ja) * | 1987-06-12 | 1988-01-05 | Seiko Epson Corp | 半導体装置 |
| JPH01164062A (ja) * | 1988-11-18 | 1989-06-28 | Hitachi Ltd | 半導体装置の製造方法 |
| US5289027A (en) * | 1988-12-09 | 1994-02-22 | Hughes Aircraft Company | Ultrathin submicron MOSFET with intrinsic channel |
| JP2572653B2 (ja) * | 1989-12-29 | 1997-01-16 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
| JPH02224269A (ja) * | 1989-12-29 | 1990-09-06 | Seiko Epson Corp | 半導体装置 |
| US5849601A (en) | 1990-12-25 | 1998-12-15 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device and method for manufacturing the same |
| US7115902B1 (en) | 1990-11-20 | 2006-10-03 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device and method for manufacturing the same |
| US7098479B1 (en) * | 1990-12-25 | 2006-08-29 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device and method for manufacturing the same |
| US7576360B2 (en) * | 1990-12-25 | 2009-08-18 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device which comprises thin film transistors and method for manufacturing the same |
| JPH0575042A (ja) * | 1992-03-05 | 1993-03-26 | Seiko Epson Corp | 半導体装置 |
| KR0131741B1 (ko) * | 1993-12-31 | 1998-04-15 | 김주용 | 반도체 기억장치 및 그 제조방법 |
| WO1997032343A1 (fr) * | 1996-02-28 | 1997-09-04 | Sierra Semiconductor Coporation | Condensateurs lineaires de haute precision, en technologie mos |
| US6172402B1 (en) * | 1998-06-04 | 2001-01-09 | Advanced Micro Devices | Integrated circuit having transistors that include insulative punchthrough regions and method of formation |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3646665A (en) * | 1970-05-22 | 1972-03-07 | Gen Electric | Complementary mis-fet devices and method of fabrication |
| DE2058660B1 (de) * | 1970-11-28 | 1972-06-08 | Itt Ind Gmbh Deutsche | Verfahren zum Herstellen einer monolithischen Festkoerperschaltung |
-
1972
- 1972-11-01 US US00302962A patent/US3821781A/en not_active Expired - Lifetime
-
1973
- 1973-08-28 IL IL43098A patent/IL43098A/en unknown
- 1973-09-12 GB GB4285673A patent/GB1423183A/en not_active Expired
- 1973-09-19 FR FR7334206A patent/FR2204896B1/fr not_active Expired
- 1973-09-25 CH CH1370973A patent/CH553482A/xx not_active IP Right Cessation
- 1973-09-27 IT IT29434/73A patent/IT1001557B/it active
- 1973-09-28 BE BE136192A patent/BE805485A/fr not_active IP Right Cessation
- 1973-10-03 BR BR7671/73A patent/BR7307671D0/pt unknown
- 1973-10-09 CA CA182,961A patent/CA1061012A/fr not_active Expired
- 1973-10-20 DE DE2352762A patent/DE2352762C2/de not_active Expired
- 1973-10-22 ES ES419843A patent/ES419843A1/es not_active Expired
- 1973-10-23 SE SE7314348A patent/SE389227B/xx unknown
- 1973-10-23 JP JP11861973A patent/JPS5513431B2/ja not_active Expired
- 1973-10-26 NL NLAANVRAGE7314732,A patent/NL182604C/xx not_active IP Right Cessation
-
1979
- 1979-08-17 JP JP10416179A patent/JPS5533096A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| BE805485A (fr) | 1974-01-16 |
| JPS5513431B2 (fr) | 1980-04-09 |
| US3821781A (en) | 1974-06-28 |
| SE389227B (sv) | 1976-10-25 |
| GB1423183A (en) | 1976-01-28 |
| DE2352762C2 (de) | 1984-02-16 |
| JPS5548460B2 (fr) | 1980-12-05 |
| NL182604B (nl) | 1987-11-02 |
| JPS5533096A (en) | 1980-03-08 |
| IT1001557B (it) | 1976-04-30 |
| IL43098A (en) | 1976-04-30 |
| FR2204896A1 (fr) | 1974-05-24 |
| CH553482A (de) | 1974-08-30 |
| FR2204896B1 (fr) | 1978-08-11 |
| CA1061012A (fr) | 1979-08-21 |
| DE2352762A1 (de) | 1974-05-16 |
| IL43098A0 (en) | 1973-11-28 |
| NL182604C (nl) | 1988-04-05 |
| BR7307671D0 (pt) | 1974-10-22 |
| ES419843A1 (es) | 1976-04-01 |
| JPS4979189A (fr) | 1974-07-31 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| BB | A search report has been drawn up | ||
| BC | A request for examination has been filed | ||
| A85 | Still pending on 85-01-01 | ||
| V1 | Lapsed because of non-payment of the annual fee |