MX9305898A - Metodo de grabado fotoquimico anisotropico para la fabricacion decircuitos integrados. - Google Patents
Metodo de grabado fotoquimico anisotropico para la fabricacion decircuitos integrados.Info
- Publication number
- MX9305898A MX9305898A MX9305898A MX9305898A MX9305898A MX 9305898 A MX9305898 A MX 9305898A MX 9305898 A MX9305898 A MX 9305898A MX 9305898 A MX9305898 A MX 9305898A MX 9305898 A MX9305898 A MX 9305898A
- Authority
- MX
- Mexico
- Prior art keywords
- passivant
- engraving
- portions
- etch
- illuminated
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 238000002161 passivation Methods 0.000 abstract 3
- 230000005855 radiation Effects 0.000 abstract 3
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 abstract 2
- 239000002253 acid Substances 0.000 abstract 2
- 230000000873 masking effect Effects 0.000 abstract 2
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 abstract 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract 1
- 239000011248 coating agent Substances 0.000 abstract 1
- 238000000576 coating method Methods 0.000 abstract 1
- 229910052802 copper Inorganic materials 0.000 abstract 1
- 239000010949 copper Substances 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 229910052740 iodine Inorganic materials 0.000 abstract 1
- 239000011630 iodine Substances 0.000 abstract 1
- 239000007788 liquid Substances 0.000 abstract 1
- 239000007791 liquid phase Substances 0.000 abstract 1
- 238000001259 photo etching Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/02—Local etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
- H01L21/30655—Plasma etching; Reactive-ion etching comprising alternated and repeated etching and passivation steps, e.g. Bosch process
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
- H01L21/32133—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
- H01L21/32134—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by liquid etching only
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Plasma & Fusion (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Weting (AREA)
- ing And Chemical Polishing (AREA)
Abstract
Un grabado fotoquímico en fase líquida, anisótropo, es efectuadosumergiendo un substrato 30 (por ejemplo de cobre) en un líquido 34 quetiene un ácido para grabar (pro ejemplo ácido clorhídrico) y un pasivante(por ejemplo yodo), el pasivante forma una capa de pasivación 36 insoluble(por ejemplo CuI) sobre la superficie, evitando que el ácido para grabar,ataque o grabe la superficie. El pasivante y su concentración se eligende tal modo que la capa de pasivación 36 tenga una solubilidad la cual esincrementada sustancialmente cuando la misma es iluminada con radiación 38(por ejemplo una luz visible/ultravioleta). Las porciones de la superficieson iluminadas entonces con la radiación 38, por medio de lo cual la capade pasivación 36 es removida o eliminada de aquéllas porciones iluminadasde la superficie, permitiendo que el grabado proceda allí. Las porcionesde la superficie no iluminada, no son grabadas, conduciendo a un grabadoanisótropo. Preferiblemente, un enmascaramiento 32 para el grabado, esutilizado para crear las áreas no iluminadas. Este enmascaramiento 32para el grabado, puede ser formado sobre la superficie o él mismo puedeestar interpuesto entre la superficie y la fuente de radiación.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US95413192A | 1992-10-30 | 1992-10-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
MX9305898A true MX9305898A (es) | 1995-01-31 |
Family
ID=25494971
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX9305898A MX9305898A (es) | 1992-10-30 | 1993-09-24 | Metodo de grabado fotoquimico anisotropico para la fabricacion decircuitos integrados. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5460687A (es) |
EP (1) | EP0595053A3 (es) |
JP (1) | JPH06204204A (es) |
KR (1) | KR940008010A (es) |
MX (1) | MX9305898A (es) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5746930A (en) * | 1995-01-03 | 1998-05-05 | Texas Instruments Incorporated | Method and structure for forming an array of thermal sensors |
US5603848A (en) * | 1995-01-03 | 1997-02-18 | Texas Instruments Incorporated | Method for etching through a substrate to an attached coating |
US5847390A (en) * | 1996-04-09 | 1998-12-08 | Texas Instruments Incorporated | Reduced stress electrode for focal plane array of thermal imaging system and method |
EP0938597B1 (en) | 1996-09-06 | 2003-08-20 | Obducat Aktiebolag | Method for anisotropic etching of structures in conducting materials |
US5971527A (en) * | 1996-10-29 | 1999-10-26 | Xerox Corporation | Ink jet channel wafer for a thermal ink jet printhead |
US6080987A (en) * | 1997-10-28 | 2000-06-27 | Raytheon Company | Infrared-sensitive conductive-polymer coating |
US6083557A (en) * | 1997-10-28 | 2000-07-04 | Raytheon Company | System and method for making a conductive polymer coating |
JP4498601B2 (ja) * | 1998-03-05 | 2010-07-07 | オブデュキャット、アクチボラグ | エッチング方法 |
JP4698024B2 (ja) * | 1998-07-23 | 2011-06-08 | サーフィス テクノロジー システムズ ピーエルシー | 異方性エッチングのための方法と装置 |
US6136210A (en) * | 1998-11-02 | 2000-10-24 | Xerox Corporation | Photoetching of acoustic lenses for acoustic ink printing |
US6358430B1 (en) * | 1999-07-28 | 2002-03-19 | Motorola, Inc. | Technique for etching oxides and/or insulators |
US6884740B2 (en) * | 2001-09-04 | 2005-04-26 | The Regents Of The University Of California | Photoelectrochemical undercut etching of semiconductor material |
SG121697A1 (en) * | 2001-10-25 | 2006-05-26 | Inst Data Storage | A method of patterning a substrate |
KR100561005B1 (ko) * | 2003-12-30 | 2006-03-16 | 동부아남반도체 주식회사 | 반도체 소자의 제조 방법 |
US7323699B2 (en) * | 2005-02-02 | 2008-01-29 | Rave, Llc | Apparatus and method for modifying an object |
US20060207890A1 (en) | 2005-03-15 | 2006-09-21 | Norbert Staud | Electrochemical etching |
US7569490B2 (en) | 2005-03-15 | 2009-08-04 | Wd Media, Inc. | Electrochemical etching |
JP4608613B2 (ja) * | 2005-04-22 | 2011-01-12 | 国立大学法人九州工業大学 | レーザー照射微細加工方法 |
DE102006022722B4 (de) | 2006-05-12 | 2010-06-17 | Hueck Engraving Gmbh & Co. Kg | Verfahren und Vorrichtung zur Oberflächenstrukturierung eines Pressbleches oder eines Endlosbandes |
DE102019127776A1 (de) * | 2019-08-14 | 2021-03-04 | Vacuumschmelze Gmbh & Co. Kg | Amorphes Metallband und Verfahren zum Herstellen eines amorphen Metallbands |
EP3890457A1 (en) * | 2020-03-30 | 2021-10-06 | AT & S Austria Technologie & Systemtechnik Aktiengesellschaft | Anisotropic etching using photosensitive compound |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE687248A (es) * | 1966-09-22 | 1967-03-22 | ||
US3489564A (en) * | 1967-05-29 | 1970-01-13 | Gen Electric | Photolytic etching of silicon dioxide |
US3762325A (en) * | 1967-11-27 | 1973-10-02 | Teeg Research Inc | Electromagnetic radiation sensitive lithographic plates |
US4518456A (en) * | 1983-03-11 | 1985-05-21 | At&T Bell Laboratories | Light induced etching of InP by aqueous solutions of H3 PO4 |
US4838989A (en) * | 1987-08-25 | 1989-06-13 | The United States Of America As Represented By The United States Department Of Energy | Laser-driven fusion etching process |
US4861421A (en) * | 1988-06-01 | 1989-08-29 | Texas Instruments Incorporated | Photochemical semiconductor etching |
EP0433983B1 (en) * | 1989-12-20 | 1998-03-04 | Texas Instruments Incorporated | Copper etch process using halides |
IL98660A (en) * | 1991-06-28 | 1996-10-16 | Orbotech Ltd | Method of printing an image on a substrate particularly useful for producing printed circuit boards |
US5201989A (en) * | 1992-04-20 | 1993-04-13 | Texas Instruments Incorporated | Anisotropic niobium pentoxide etch |
US5279702A (en) * | 1992-09-30 | 1994-01-18 | Texas Instruments Incorporated | Anisotropic liquid phase photochemical copper etch |
-
1993
- 1993-09-24 MX MX9305898A patent/MX9305898A/es not_active IP Right Cessation
- 1993-09-28 KR KR1019930020076A patent/KR940008010A/ko not_active Application Discontinuation
- 1993-09-29 JP JP5243287A patent/JPH06204204A/ja active Pending
- 1993-09-30 EP EP93115796A patent/EP0595053A3/en not_active Withdrawn
-
1994
- 1994-05-20 US US08/246,388 patent/US5460687A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5460687A (en) | 1995-10-24 |
KR940008010A (ko) | 1994-04-28 |
EP0595053A2 (en) | 1994-05-04 |
JPH06204204A (ja) | 1994-07-22 |
EP0595053A3 (en) | 1995-03-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG | Grant or registration | ||
MM | Annulment or lapse due to non-payment of fees |