MX340593B - Fuente de plasma. - Google Patents

Fuente de plasma.

Info

Publication number
MX340593B
MX340593B MX2014002777A MX2014002777A MX340593B MX 340593 B MX340593 B MX 340593B MX 2014002777 A MX2014002777 A MX 2014002777A MX 2014002777 A MX2014002777 A MX 2014002777A MX 340593 B MX340593 B MX 340593B
Authority
MX
Mexico
Prior art keywords
plasma source
filament
source housing
source
potential drop
Prior art date
Application number
MX2014002777A
Other languages
English (en)
Other versions
MX2014002777A (es
Inventor
Krassnitzer Siegfried
Lendi Daniel
Hagmann Juerg
Original Assignee
Oerlikon Surface Solutions Ag Pfäffikon
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oerlikon Surface Solutions Ag Pfäffikon filed Critical Oerlikon Surface Solutions Ag Pfäffikon
Publication of MX2014002777A publication Critical patent/MX2014002777A/es
Publication of MX340593B publication Critical patent/MX340593B/es

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H01J27/022—Details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32018—Glow discharge
    • H01J37/32045—Circuits specially adapted for controlling the glow discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32055—Arc discharge
    • H01J37/32064—Circuits specially adapted for controlling the arc discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Combustion & Propulsion (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Plasma Technology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical Vapour Deposition (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

La presente invención se relaciona con una fuente de plasma que se coloca de una manera flotante en una cámara de vacío, donde la fuente de plasma comprende un alojamiento de fuente, y un filamento se proporciona en el alojamiento de fuente y se coloca para estar aislado del mismo, donde se proporcionan los medios para medir la disminución de potencial entre el alojamiento de fuente y el filamento. La disminución de potencial medida puede usarse para regular el voltaje que calienta el filamento. De acuerdo con la invención, se proporcionan los medios correspondientes.
MX2014002777A 2011-09-08 2012-08-29 Fuente de plasma. MX340593B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102011112759A DE102011112759A1 (de) 2011-09-08 2011-09-08 Plasmaquelle
PCT/EP2012/003623 WO2013034258A1 (de) 2011-09-08 2012-08-29 Plasmaquelle

Publications (2)

Publication Number Publication Date
MX2014002777A MX2014002777A (es) 2014-12-05
MX340593B true MX340593B (es) 2016-07-15

Family

ID=46980879

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2014002777A MX340593B (es) 2011-09-08 2012-08-29 Fuente de plasma.

Country Status (21)

Country Link
US (1) US9226379B2 (es)
EP (1) EP2754167B1 (es)
JP (1) JP6251676B2 (es)
KR (1) KR102028767B1 (es)
CN (1) CN103765551B (es)
AR (1) AR087804A1 (es)
BR (1) BR112014004654B1 (es)
CA (1) CA2846679C (es)
DE (1) DE102011112759A1 (es)
DK (1) DK2754167T3 (es)
ES (1) ES2704708T3 (es)
HU (1) HUE040659T2 (es)
IN (1) IN2014DN01967A (es)
MX (1) MX340593B (es)
MY (1) MY172720A (es)
PL (1) PL2754167T3 (es)
RU (1) RU2622048C2 (es)
SG (1) SG2014013429A (es)
SI (1) SI2754167T1 (es)
TR (1) TR201900085T4 (es)
WO (1) WO2013034258A1 (es)

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3956666A (en) * 1975-01-27 1976-05-11 Ion Tech, Inc. Electron-bombardment ion sources
US4301391A (en) * 1979-04-26 1981-11-17 Hughes Aircraft Company Dual discharge plasma device
US4647818A (en) * 1984-04-16 1987-03-03 Sfe Technologies Nonthermionic hollow anode gas discharge electron beam source
JPS6343240A (ja) * 1986-08-07 1988-02-24 Seiko Instr & Electronics Ltd イオン源
JPH01267943A (ja) * 1988-04-19 1989-10-25 Agency Of Ind Science & Technol イオン源装置
US4910435A (en) * 1988-07-20 1990-03-20 American International Technologies, Inc. Remote ion source plasma electron gun
JPH0536370A (ja) * 1991-07-26 1993-02-12 Origin Electric Co Ltd イオン源における電力供給装置
JPH0574395A (ja) * 1991-09-18 1993-03-26 Hitachi Ltd 電子源システム及びその制御法
US5198677A (en) * 1991-10-11 1993-03-30 The United States Of America As Represented By The United States Department Of Energy Production of N+ ions from a multicusp ion beam apparatus
JPH05275047A (ja) * 1992-03-23 1993-10-22 Tokyo Electron Ltd イオン注入装置
CH687111A5 (de) * 1992-05-26 1996-09-13 Balzers Hochvakuum Verfahren zum Erzeugen einer Niederspannungsentladung, Vakuumbehandlungsanlage hierfuer sowie Anwendung des Verfahrens.
US5523652A (en) * 1994-09-26 1996-06-04 Eaton Corporation Microwave energized ion source for ion implantation
US6388381B2 (en) * 1996-09-10 2002-05-14 The Regents Of The University Of California Constricted glow discharge plasma source
US6137231A (en) * 1996-09-10 2000-10-24 The Regents Of The University Of California Constricted glow discharge plasma source
JP2965293B1 (ja) * 1998-11-10 1999-10-18 川崎重工業株式会社 電子ビーム励起プラズマ発生装置
JP3414380B2 (ja) * 2000-11-14 2003-06-09 日新電機株式会社 イオンビーム照射方法ならびに関連の方法および装置
US6454910B1 (en) * 2001-09-21 2002-09-24 Kaufman & Robinson, Inc. Ion-assisted magnetron deposition
US6724160B2 (en) * 2002-04-12 2004-04-20 Kaufman & Robinson, Inc. Ion-source neutralization with a hot-filament cathode-neutralizer
US7138768B2 (en) * 2002-05-23 2006-11-21 Varian Semiconductor Equipment Associates, Inc. Indirectly heated cathode ion source
WO2004027825A2 (en) * 2002-09-19 2004-04-01 Applied Process Technologies, Inc. Beam plasma source
US7411352B2 (en) * 2002-09-19 2008-08-12 Applied Process Technologies, Inc. Dual plasma beam sources and method
JP2004165034A (ja) 2002-11-14 2004-06-10 Nissin Electric Co Ltd イオン源のフィラメント寿命予測方法およびイオン源装置
US7038389B2 (en) * 2003-05-02 2006-05-02 Applied Process Technologies, Inc. Magnetron plasma source
JP2004362901A (ja) * 2003-06-04 2004-12-24 Sharp Corp イオンドーピング装置、イオンドーピング方法および半導体装置
KR20080048433A (ko) * 2006-11-28 2008-06-02 가부시키가이샤 쇼와 신쿠 하전 입자 조사 장치, 하전 입자 제어 방법 및 주파수 조정장치
BRPI0722169A2 (pt) * 2007-11-01 2014-04-08 Oerlikon Trading Ag Processo para a fabricação de uma superfície tratada, e fontes de plasma a vácuo
JP4463310B2 (ja) * 2008-03-07 2010-05-19 三井造船株式会社 イオン源
US7843138B2 (en) * 2008-06-11 2010-11-30 Kaufman & Robinson, Inc. Power supply for a hot-filament cathode

Also Published As

Publication number Publication date
DK2754167T3 (en) 2019-01-21
WO2013034258A1 (de) 2013-03-14
DE102011112759A1 (de) 2013-03-14
US9226379B2 (en) 2015-12-29
JP6251676B2 (ja) 2017-12-20
HUE040659T2 (hu) 2019-03-28
MY172720A (en) 2019-12-11
RU2622048C2 (ru) 2017-06-09
BR112014004654A2 (pt) 2017-03-28
MX2014002777A (es) 2014-12-05
EP2754167B1 (de) 2018-10-10
CN103765551A (zh) 2014-04-30
CA2846679C (en) 2019-10-22
SG2014013429A (en) 2014-07-30
AR087804A1 (es) 2014-04-16
BR112014004654B1 (pt) 2021-09-21
CA2846679A1 (en) 2013-03-14
KR20140074288A (ko) 2014-06-17
EP2754167A1 (de) 2014-07-16
SI2754167T1 (sl) 2019-02-28
KR102028767B1 (ko) 2019-10-04
US20140217892A1 (en) 2014-08-07
ES2704708T3 (es) 2019-03-19
JP2014526771A (ja) 2014-10-06
IN2014DN01967A (es) 2015-05-15
TR201900085T4 (tr) 2019-02-21
CN103765551B (zh) 2016-07-06
PL2754167T3 (pl) 2019-03-29
RU2014113560A (ru) 2015-10-20

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