TR201900085T4 - Plazma kaynağı. - Google Patents
Plazma kaynağı. Download PDFInfo
- Publication number
- TR201900085T4 TR201900085T4 TR2019/00085T TR201900085T TR201900085T4 TR 201900085 T4 TR201900085 T4 TR 201900085T4 TR 2019/00085 T TR2019/00085 T TR 2019/00085T TR 201900085 T TR201900085 T TR 201900085T TR 201900085 T4 TR201900085 T4 TR 201900085T4
- Authority
- TR
- Turkey
- Prior art keywords
- plasma source
- filament
- welding shield
- potential drop
- isolation
- Prior art date
Links
- 238000003466 welding Methods 0.000 abstract 3
- 238000010438 heat treatment Methods 0.000 abstract 1
- 238000002955 isolation Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/022—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32018—Glow discharge
- H01J37/32045—Circuits specially adapted for controlling the glow discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32055—Arc discharge
- H01J37/32064—Circuits specially adapted for controlling the arc discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Combustion & Propulsion (AREA)
- Electron Sources, Ion Sources (AREA)
- Plasma Technology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Mevcut buluş, bir vakum haznesi içinde yüzer bir şekilde düzenlemiş bir plazma kaynağı ile ilgilidir, burada plazma kaynağı bir kaynak muhafazasını içermektedir ve kaynak muhafazası içinde bir filament sağlanmaktadır ve bu yalıtılmış olarak düzenlenmiştir, burada kaynak muhafazası ile filament arasındaki potansiyel düşüşünün ölçülmesi için araçlar sağlanmaktadır. Ölçülen potansiyel düşüşü filamentin ısıtılmasının ayarlanması için kullanılabilir. Buluşa göre karşılık gelen araçlar sağlanmaktadır.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102011112759A DE102011112759A1 (de) | 2011-09-08 | 2011-09-08 | Plasmaquelle |
Publications (1)
Publication Number | Publication Date |
---|---|
TR201900085T4 true TR201900085T4 (tr) | 2019-02-21 |
Family
ID=46980879
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TR2019/00085T TR201900085T4 (tr) | 2011-09-08 | 2012-08-29 | Plazma kaynağı. |
Country Status (21)
Country | Link |
---|---|
US (1) | US9226379B2 (tr) |
EP (1) | EP2754167B1 (tr) |
JP (1) | JP6251676B2 (tr) |
KR (1) | KR102028767B1 (tr) |
CN (1) | CN103765551B (tr) |
AR (1) | AR087804A1 (tr) |
BR (1) | BR112014004654B1 (tr) |
CA (1) | CA2846679C (tr) |
DE (1) | DE102011112759A1 (tr) |
DK (1) | DK2754167T3 (tr) |
ES (1) | ES2704708T3 (tr) |
HU (1) | HUE040659T2 (tr) |
IN (1) | IN2014DN01967A (tr) |
MX (1) | MX340593B (tr) |
MY (1) | MY172720A (tr) |
PL (1) | PL2754167T3 (tr) |
RU (1) | RU2622048C2 (tr) |
SG (1) | SG2014013429A (tr) |
SI (1) | SI2754167T1 (tr) |
TR (1) | TR201900085T4 (tr) |
WO (1) | WO2013034258A1 (tr) |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3956666A (en) * | 1975-01-27 | 1976-05-11 | Ion Tech, Inc. | Electron-bombardment ion sources |
US4301391A (en) * | 1979-04-26 | 1981-11-17 | Hughes Aircraft Company | Dual discharge plasma device |
US4647818A (en) * | 1984-04-16 | 1987-03-03 | Sfe Technologies | Nonthermionic hollow anode gas discharge electron beam source |
JPS6343240A (ja) * | 1986-08-07 | 1988-02-24 | Seiko Instr & Electronics Ltd | イオン源 |
JPH01267943A (ja) * | 1988-04-19 | 1989-10-25 | Agency Of Ind Science & Technol | イオン源装置 |
US4910435A (en) * | 1988-07-20 | 1990-03-20 | American International Technologies, Inc. | Remote ion source plasma electron gun |
JPH0536370A (ja) * | 1991-07-26 | 1993-02-12 | Origin Electric Co Ltd | イオン源における電力供給装置 |
JPH0574395A (ja) * | 1991-09-18 | 1993-03-26 | Hitachi Ltd | 電子源システム及びその制御法 |
US5198677A (en) * | 1991-10-11 | 1993-03-30 | The United States Of America As Represented By The United States Department Of Energy | Production of N+ ions from a multicusp ion beam apparatus |
JPH05275047A (ja) * | 1992-03-23 | 1993-10-22 | Tokyo Electron Ltd | イオン注入装置 |
CH687111A5 (de) * | 1992-05-26 | 1996-09-13 | Balzers Hochvakuum | Verfahren zum Erzeugen einer Niederspannungsentladung, Vakuumbehandlungsanlage hierfuer sowie Anwendung des Verfahrens. |
US5523652A (en) * | 1994-09-26 | 1996-06-04 | Eaton Corporation | Microwave energized ion source for ion implantation |
US6388381B2 (en) * | 1996-09-10 | 2002-05-14 | The Regents Of The University Of California | Constricted glow discharge plasma source |
US6137231A (en) * | 1996-09-10 | 2000-10-24 | The Regents Of The University Of California | Constricted glow discharge plasma source |
JP2965293B1 (ja) * | 1998-11-10 | 1999-10-18 | 川崎重工業株式会社 | 電子ビーム励起プラズマ発生装置 |
JP3414380B2 (ja) * | 2000-11-14 | 2003-06-09 | 日新電機株式会社 | イオンビーム照射方法ならびに関連の方法および装置 |
US6454910B1 (en) * | 2001-09-21 | 2002-09-24 | Kaufman & Robinson, Inc. | Ion-assisted magnetron deposition |
US6724160B2 (en) * | 2002-04-12 | 2004-04-20 | Kaufman & Robinson, Inc. | Ion-source neutralization with a hot-filament cathode-neutralizer |
US7138768B2 (en) * | 2002-05-23 | 2006-11-21 | Varian Semiconductor Equipment Associates, Inc. | Indirectly heated cathode ion source |
WO2004027825A2 (en) * | 2002-09-19 | 2004-04-01 | Applied Process Technologies, Inc. | Beam plasma source |
US7411352B2 (en) * | 2002-09-19 | 2008-08-12 | Applied Process Technologies, Inc. | Dual plasma beam sources and method |
JP2004165034A (ja) | 2002-11-14 | 2004-06-10 | Nissin Electric Co Ltd | イオン源のフィラメント寿命予測方法およびイオン源装置 |
US7038389B2 (en) * | 2003-05-02 | 2006-05-02 | Applied Process Technologies, Inc. | Magnetron plasma source |
JP2004362901A (ja) * | 2003-06-04 | 2004-12-24 | Sharp Corp | イオンドーピング装置、イオンドーピング方法および半導体装置 |
KR20080048433A (ko) * | 2006-11-28 | 2008-06-02 | 가부시키가이샤 쇼와 신쿠 | 하전 입자 조사 장치, 하전 입자 제어 방법 및 주파수 조정장치 |
BRPI0722169A2 (pt) * | 2007-11-01 | 2014-04-08 | Oerlikon Trading Ag | Processo para a fabricação de uma superfície tratada, e fontes de plasma a vácuo |
JP4463310B2 (ja) * | 2008-03-07 | 2010-05-19 | 三井造船株式会社 | イオン源 |
US7843138B2 (en) * | 2008-06-11 | 2010-11-30 | Kaufman & Robinson, Inc. | Power supply for a hot-filament cathode |
-
2011
- 2011-09-08 DE DE102011112759A patent/DE102011112759A1/de not_active Withdrawn
-
2012
- 2012-08-29 MY MYPI2014000663A patent/MY172720A/en unknown
- 2012-08-29 PL PL12769011T patent/PL2754167T3/pl unknown
- 2012-08-29 RU RU2014113560A patent/RU2622048C2/ru active
- 2012-08-29 US US14/343,549 patent/US9226379B2/en active Active
- 2012-08-29 DK DK12769011.3T patent/DK2754167T3/en active
- 2012-08-29 IN IN1967DEN2014 patent/IN2014DN01967A/en unknown
- 2012-08-29 BR BR112014004654-9A patent/BR112014004654B1/pt active IP Right Grant
- 2012-08-29 SG SG2014013429A patent/SG2014013429A/en unknown
- 2012-08-29 WO PCT/EP2012/003623 patent/WO2013034258A1/de active Application Filing
- 2012-08-29 JP JP2014528885A patent/JP6251676B2/ja active Active
- 2012-08-29 MX MX2014002777A patent/MX340593B/es active IP Right Grant
- 2012-08-29 SI SI201231494T patent/SI2754167T1/sl unknown
- 2012-08-29 TR TR2019/00085T patent/TR201900085T4/tr unknown
- 2012-08-29 ES ES12769011T patent/ES2704708T3/es active Active
- 2012-08-29 KR KR1020147006192A patent/KR102028767B1/ko active IP Right Grant
- 2012-08-29 EP EP12769011.3A patent/EP2754167B1/de active Active
- 2012-08-29 CA CA2846679A patent/CA2846679C/en active Active
- 2012-08-29 CN CN201280043726.2A patent/CN103765551B/zh active Active
- 2012-08-29 HU HUE12769011A patent/HUE040659T2/hu unknown
- 2012-09-07 AR ARP120103300A patent/AR087804A1/es active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
DK2754167T3 (en) | 2019-01-21 |
WO2013034258A1 (de) | 2013-03-14 |
DE102011112759A1 (de) | 2013-03-14 |
US9226379B2 (en) | 2015-12-29 |
JP6251676B2 (ja) | 2017-12-20 |
HUE040659T2 (hu) | 2019-03-28 |
MY172720A (en) | 2019-12-11 |
RU2622048C2 (ru) | 2017-06-09 |
BR112014004654A2 (pt) | 2017-03-28 |
MX2014002777A (es) | 2014-12-05 |
EP2754167B1 (de) | 2018-10-10 |
CN103765551A (zh) | 2014-04-30 |
CA2846679C (en) | 2019-10-22 |
SG2014013429A (en) | 2014-07-30 |
AR087804A1 (es) | 2014-04-16 |
BR112014004654B1 (pt) | 2021-09-21 |
CA2846679A1 (en) | 2013-03-14 |
KR20140074288A (ko) | 2014-06-17 |
MX340593B (es) | 2016-07-15 |
EP2754167A1 (de) | 2014-07-16 |
SI2754167T1 (sl) | 2019-02-28 |
KR102028767B1 (ko) | 2019-10-04 |
US20140217892A1 (en) | 2014-08-07 |
ES2704708T3 (es) | 2019-03-19 |
JP2014526771A (ja) | 2014-10-06 |
IN2014DN01967A (tr) | 2015-05-15 |
CN103765551B (zh) | 2016-07-06 |
PL2754167T3 (pl) | 2019-03-29 |
RU2014113560A (ru) | 2015-10-20 |
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