KR970019756U - 반도체 소자의 표면 상태 감지장치 - Google Patents
반도체 소자의 표면 상태 감지장치Info
- Publication number
- KR970019756U KR970019756U KR2019950028656U KR19950028656U KR970019756U KR 970019756 U KR970019756 U KR 970019756U KR 2019950028656 U KR2019950028656 U KR 2019950028656U KR 19950028656 U KR19950028656 U KR 19950028656U KR 970019756 U KR970019756 U KR 970019756U
- Authority
- KR
- South Korea
- Prior art keywords
- surface condition
- condition detection
- semiconductor device
- detection device
- semiconductor
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019950028656U KR0134557Y1 (ko) | 1995-10-12 | 1995-10-12 | 반도체 소자의 표면 상태 감지장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019950028656U KR0134557Y1 (ko) | 1995-10-12 | 1995-10-12 | 반도체 소자의 표면 상태 감지장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970019756U true KR970019756U (ko) | 1997-05-26 |
KR0134557Y1 KR0134557Y1 (ko) | 1999-03-20 |
Family
ID=19425895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019950028656U KR0134557Y1 (ko) | 1995-10-12 | 1995-10-12 | 반도체 소자의 표면 상태 감지장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0134557Y1 (ko) |
-
1995
- 1995-10-12 KR KR2019950028656U patent/KR0134557Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0134557Y1 (ko) | 1999-03-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20050922 Year of fee payment: 8 |
|
LAPS | Lapse due to unpaid annual fee |