KR970019756U - 반도체 소자의 표면 상태 감지장치 - Google Patents

반도체 소자의 표면 상태 감지장치

Info

Publication number
KR970019756U
KR970019756U KR2019950028656U KR19950028656U KR970019756U KR 970019756 U KR970019756 U KR 970019756U KR 2019950028656 U KR2019950028656 U KR 2019950028656U KR 19950028656 U KR19950028656 U KR 19950028656U KR 970019756 U KR970019756 U KR 970019756U
Authority
KR
South Korea
Prior art keywords
surface condition
condition detection
semiconductor device
detection device
semiconductor
Prior art date
Application number
KR2019950028656U
Other languages
English (en)
Other versions
KR0134557Y1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019950028656U priority Critical patent/KR0134557Y1/ko
Publication of KR970019756U publication Critical patent/KR970019756U/ko
Application granted granted Critical
Publication of KR0134557Y1 publication Critical patent/KR0134557Y1/ko

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
KR2019950028656U 1995-10-12 1995-10-12 반도체 소자의 표면 상태 감지장치 KR0134557Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950028656U KR0134557Y1 (ko) 1995-10-12 1995-10-12 반도체 소자의 표면 상태 감지장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950028656U KR0134557Y1 (ko) 1995-10-12 1995-10-12 반도체 소자의 표면 상태 감지장치

Publications (2)

Publication Number Publication Date
KR970019756U true KR970019756U (ko) 1997-05-26
KR0134557Y1 KR0134557Y1 (ko) 1999-03-20

Family

ID=19425895

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950028656U KR0134557Y1 (ko) 1995-10-12 1995-10-12 반도체 소자의 표면 상태 감지장치

Country Status (1)

Country Link
KR (1) KR0134557Y1 (ko)

Also Published As

Publication number Publication date
KR0134557Y1 (ko) 1999-03-20

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