KR970008533A - 비지에이 패키지 및 그 제조방법 - Google Patents

비지에이 패키지 및 그 제조방법 Download PDF

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Publication number
KR970008533A
KR970008533A KR1019950022841A KR19950022841A KR970008533A KR 970008533 A KR970008533 A KR 970008533A KR 1019950022841 A KR1019950022841 A KR 1019950022841A KR 19950022841 A KR19950022841 A KR 19950022841A KR 970008533 A KR970008533 A KR 970008533A
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KR
South Korea
Prior art keywords
substrate
package
semiconductor chip
ems
metal wire
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Application number
KR1019950022841A
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English (en)
Other versions
KR0152942B1 (ko
Inventor
김선동
이내정
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문정환
Lg 반도체주식회사
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Priority to KR1019950022841A priority Critical patent/KR0152942B1/ko
Publication of KR970008533A publication Critical patent/KR970008533A/ko
Application granted granted Critical
Publication of KR0152942B1 publication Critical patent/KR0152942B1/ko

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484—Connecting portions
    • H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909—Post-treatment of the connector or wire bonding area
    • H01L2224/85951—Forming additional members, e.g. for reinforcing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151—Die mounting substrate
    • H01L2924/153—Connection portion
    • H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181—Encapsulation

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

본 발명은 비지에이 패키지 및 그 제조방법에 관한 것으로, 종래 비지에이 패키지는 서브스트레이트의 상부에만 이엠시로몰딩되어 있는 구조로서 패키지의 휨이 발생하고, 서브스트레이트와 이엠시의 접착력이 약하며, 노출된 패키지의 하부가외부의 충격에 약할 뿐 아니라, 이엠시의 주입압력에 의해 몰딩시 금속 와이어의 처짐이 발생하는 문제점이 있었다. 본발명은 서브스트레이트(11), 반도체 칩(14), 금속 와이어(16), 솔더볼(17)을 포함하는 서브스트레이트(11)의 상, 하부를감싸도록 이엠시(18)로 몰딩하여 패키지의 휨을 방지하고, 서브스트레이트(11)와 이엠시(18)의 접착력을 향상시켰으며, 패키지의 하부를 외부의 충격으로 부터 보호할 수 있는 것이다. 또한, 몰딩시 서브스트레이트(11)의 측면 혹은 하부로 이엠시(18)를 주입하여 금속 와이어(16)의 처짐을 방지함으로써 패키지의 신뢰성을 향상시키는 효과가 있는 것이다.

Description

비지에이 패키지 및 그 제조방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제4도는 본 발명 비지에이 패키지의 구성을 보인 종단면도, 제5도는 본 발명 비지에이 패키지를 피시비 기판에 실장한 상태를 보인 종단면도.

Claims (3)

  1. 서브스트레이트의 상면 중앙에 반도체 칩이 부착되고, 서브스트레이트의 상부 패턴금속과 반도체 칩의 칩패드가 금속 와이어로 연결되며, 상기 서브스트레이트의 하부 패턴금속에 솔더볼이 부착되고, 상기 서브스트레이트, 반도체 칩, 금속 와이어, 솔더볼을 감싸도록 이엠시가 일체로 몰딩됨과 아울러 상기 이엠시의 하면에 솔더볼이 노출되도록 절취면이 형성되어 있는 것을 특징으로 하는 비지에이 패키지.
  2. 서브스트레이트의 상면에 반도체 칩을 부착하는 다이본딩 공정을 수행하는 단계와, 상기 서브스트레이트의 상부 패턴금속과 상기 반도체 칩의 칩패드를 금속 와이어로 연결하는 와이어 본딩 공정을 수행하는 단계와, 상기 서브스트레이트의 하부 패턴금속에 솔더볼을 부착하는 솔더볼 부착 공정을 수행하는 단계와, 상기 서브스트레이트, 반도체 칩,금속 와이어, 솔더볼을 감싸도록 이엠시로 몰딩하는 몰딩 공정을 수행하는 단계와, 상기 이엠시의 하면에 솔더볼이 외부로 노출이 되도록 이엠시 하면을 그라인딩하는 그라인딩 공정을 수행하는 단계의 순서로 제조되는 것을 특징으로 하는 비지에이 패키지 제조방법.
  3. 제2항에 있어서, 상기 몰딩공정은 이엠시가 서브스트레이트의 측면 혹은 하부로 주입되는 것을 특징으로 하는 비지에이 패키지 제조방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019950022841A 1995-07-28 1995-07-28 비지에이 패키지 및 그 제조방법 KR0152942B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950022841A KR0152942B1 (ko) 1995-07-28 1995-07-28 비지에이 패키지 및 그 제조방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950022841A KR0152942B1 (ko) 1995-07-28 1995-07-28 비지에이 패키지 및 그 제조방법

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KR970008533A true KR970008533A (ko) 1997-02-24
KR0152942B1 KR0152942B1 (ko) 1998-10-01

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100228537B1 (ko) * 1997-05-06 1999-11-01 주병진 남성용 상의
KR100520443B1 (ko) * 1997-09-13 2006-03-14 삼성전자주식회사 칩스케일패키지및그제조방법

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109623541B (zh) * 2018-10-16 2020-07-17 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） Bga封装器件焊球去除设备及其方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100228537B1 (ko) * 1997-05-06 1999-11-01 주병진 남성용 상의
KR100520443B1 (ko) * 1997-09-13 2006-03-14 삼성전자주식회사 칩스케일패키지및그제조방법

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KR0152942B1 (ko) 1998-10-01

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