KR960015119A - 병렬구조를 갖는 시간간격 측정기 - Google Patents
병렬구조를 갖는 시간간격 측정기 Download PDFInfo
- Publication number
- KR960015119A KR960015119A KR1019940028325A KR19940028325A KR960015119A KR 960015119 A KR960015119 A KR 960015119A KR 1019940028325 A KR1019940028325 A KR 1019940028325A KR 19940028325 A KR19940028325 A KR 19940028325A KR 960015119 A KR960015119 A KR 960015119A
- Authority
- KR
- South Korea
- Prior art keywords
- counting
- unit
- counters
- input signal
- clock
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000001934 delay Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
- G01R29/0273—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
- G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F10/00—Apparatus for measuring unknown time intervals by electric means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Measurement Of Unknown Time Intervals (AREA)
- Manipulation Of Pulses (AREA)
Abstract
Description
Claims (1)
- 정밀하게 동작하면서도 보다 저렴한 병렬구조를 갖는 시간 간격 측정기에 있어서, 기설정된 주기(T) 마다 클럭신호(CLK)를 출력하는 클럭부와; N-1개의 지연기를 가지며, 상기 지연기 각각은 선행하는 지연기로부터 입력되는 클럭신호를 상기 기설정된 주기(T)/N만큼 지연시킨 후 출력하되, 첫번째 지연기(101)는 상가 클럭부로부터 클럭신호(CLK)를 입력받는 지연부(100)와; N개의 카운터를 가지며, 상기 카운터 각각은 인에이블(Enable) 단자로 입력신호(I)가 제공되는 동안, 대응되는 상기 지연기로부터 제공되는 클럭신호에 응답하여 카운팅을 수행하고, 상기 인에이블 단자로 입력신호(I) 제공이 종료될 때 상기 카운팅 결과값을 출력하되, 첫번째 카운터(201)는 상기 클럭부로부터 제공되는 클럭신호(CLK)에 응답하여 카운팅을 수행하는 카운팅부(200)와; 입력신호(I)를 제공받고, 상기 N개의 카운터 각각으로부터 카운팅값을 입력받으며, 상기 입력신호(I)의 제공이 종료될때, 상기 입력신호(I)가 제공된 시간간격(D)을 기설정된 계산식에 따라서 계산하여 출력하되, 상기 기설정된 계산식은 D=(n-1) *T+a*T/N이며, 상기 n은 상기 카운팅부(200)로부터 제공된 카운팅값 중 가상 큰 값이고, 상기 a는 상기 카운터 N개 중 상기 n카운팅 값을 출력한 카운터의 갯수인 산술논리부(300)를 포함하며, 상기 N은 임의의 양의 정수인 것을 특징으로 하는 병렬구조를 갖는 시간간격 측정기.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019940028325A KR100220672B1 (ko) | 1994-10-31 | 1994-10-31 | 병렬구조를 갖는 시간간격 측정기 |
JP7280597A JPH08211165A (ja) | 1994-10-31 | 1995-10-27 | パルス持続時間測定装置 |
US08/550,332 US5598116A (en) | 1994-10-31 | 1995-10-30 | Apparatus for measuring a pulse duration |
CN95118238A CN1082667C (zh) | 1994-10-31 | 1995-10-31 | 用于测量脉冲持续时间的装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019940028325A KR100220672B1 (ko) | 1994-10-31 | 1994-10-31 | 병렬구조를 갖는 시간간격 측정기 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960015119A true KR960015119A (ko) | 1996-05-22 |
KR100220672B1 KR100220672B1 (ko) | 1999-09-15 |
Family
ID=19396661
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940028325A Expired - Lifetime KR100220672B1 (ko) | 1994-10-31 | 1994-10-31 | 병렬구조를 갖는 시간간격 측정기 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5598116A (ko) |
JP (1) | JPH08211165A (ko) |
KR (1) | KR100220672B1 (ko) |
CN (1) | CN1082667C (ko) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11281690A (ja) * | 1998-03-30 | 1999-10-15 | Mitsubishi Electric Corp | パルス幅検証装置及びパルス幅検証方法 |
JP3199027B2 (ja) * | 1998-05-11 | 2001-08-13 | 日本電気株式会社 | デューティ測定回路、データ識別システム、データ信号再生システム、デューティ測定方法、データ識別方法、及びデータ信号再生方法 |
GB2397709B (en) * | 2003-01-27 | 2005-12-28 | Evangelos Arkas | Period-to-digital converter |
JP4199589B2 (ja) * | 2003-04-28 | 2008-12-17 | Necエンジニアリング株式会社 | 距離測定装置 |
JP3960271B2 (ja) * | 2003-07-02 | 2007-08-15 | ソニー株式会社 | 位相誤差判定方法、デジタルpll装置 |
JP2005181180A (ja) | 2003-12-22 | 2005-07-07 | Tdk Corp | レーダ装置 |
US7916135B2 (en) * | 2005-03-08 | 2011-03-29 | Au Optronics Corporation | Timing controller and method of generating timing signals |
US7227387B1 (en) * | 2005-05-13 | 2007-06-05 | Xilinx, Inc. | Measuring pulse edge delay value relative to a clock using multiple delay devices to address a memory to access the delay value |
JP5023508B2 (ja) * | 2006-02-20 | 2012-09-12 | 富士通株式会社 | 無線測位システム、無線測位方法および無線測位のためのプログラム |
EP1936396A1 (en) * | 2006-12-22 | 2008-06-25 | Nxp B.V. | Integrated circuit with built-in test circuit |
CN101577792B (zh) * | 2008-05-06 | 2011-01-19 | 通嘉科技股份有限公司 | 操作模式的判断装置及其判断方法 |
CN102025350B (zh) * | 2009-09-18 | 2013-03-06 | 中芯国际集成电路制造(上海)有限公司 | 脉冲衰减环路及延迟测量装置 |
US8290094B2 (en) * | 2010-01-18 | 2012-10-16 | Infineon Technologies Ag | Methods and systems for measuring data pulses |
CN103176059B (zh) * | 2011-12-21 | 2016-12-21 | 北京普源精电科技有限公司 | 一种测量脉冲宽度的方法、装置和频率计 |
AT518870B1 (de) * | 2016-07-29 | 2018-02-15 | Johannes Kepler Univ Linz Institut Fuer Nachrichtentechnik Und Hochfrequenzsysteme | Zeitdiskretes Verfahren zur Bestimmung der Pulsdauerlänge von periodisch gesendeten und empfangenen Pulsen ohne bandbegrenzende Maßnahmen |
CN109188106A (zh) * | 2018-08-18 | 2019-01-11 | 国营芜湖机械厂 | 一种航空机载设备点火脉冲的脉宽测量电路 |
CN112764342B (zh) * | 2019-11-01 | 2022-02-18 | 北京一径科技有限公司 | 一种时间测量装置和方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2729422C2 (de) * | 1977-06-29 | 1982-06-24 | Endress U. Hauser Gmbh U. Co, 7867 Maulburg | Schaltungsanordnung zur Impulsbreitenmessung |
US4197502A (en) * | 1978-10-16 | 1980-04-08 | Motorola, Inc. | Digital signal detector |
KR950007267B1 (ko) * | 1990-10-16 | 1995-07-07 | 삼성전자주식회사 | 리모콘신호의 펄스폭 측정회로 |
-
1994
- 1994-10-31 KR KR1019940028325A patent/KR100220672B1/ko not_active Expired - Lifetime
-
1995
- 1995-10-27 JP JP7280597A patent/JPH08211165A/ja active Pending
- 1995-10-30 US US08/550,332 patent/US5598116A/en not_active Expired - Lifetime
- 1995-10-31 CN CN95118238A patent/CN1082667C/zh not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CN1082667C (zh) | 2002-04-10 |
KR100220672B1 (ko) | 1999-09-15 |
JPH08211165A (ja) | 1996-08-20 |
CN1122453A (zh) | 1996-05-15 |
US5598116A (en) | 1997-01-28 |
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