KR950008844B1 - 반도체 처리시스템에 있어서 반도체 기판을 반송하는 방법 및 장치 - Google Patents
반도체 처리시스템에 있어서 반도체 기판을 반송하는 방법 및 장치 Download PDFInfo
- Publication number
- KR950008844B1 KR950008844B1 KR1019910015384A KR910015384A KR950008844B1 KR 950008844 B1 KR950008844 B1 KR 950008844B1 KR 1019910015384 A KR1019910015384 A KR 1019910015384A KR 910015384 A KR910015384 A KR 910015384A KR 950008844 B1 KR950008844 B1 KR 950008844B1
- Authority
- KR
- South Korea
- Prior art keywords
- time
- processing
- semiconductor substrate
- conveying
- condition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0432—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3304—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber characterised by movements or sequence of movements of transfer devices
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2234095A JP2638668B2 (ja) | 1990-09-03 | 1990-09-03 | 基板搬送方法および基板搬送装置 |
| JP2-234095 | 1990-09-03 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR920007081A KR920007081A (ko) | 1992-04-28 |
| KR950008844B1 true KR950008844B1 (ko) | 1995-08-08 |
Family
ID=16965545
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019910015384A Expired - Fee Related KR950008844B1 (ko) | 1990-09-03 | 1991-09-03 | 반도체 처리시스템에 있어서 반도체 기판을 반송하는 방법 및 장치 |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0474180B1 (https=) |
| JP (1) | JP2638668B2 (https=) |
| KR (1) | KR950008844B1 (https=) |
| DE (1) | DE69128822T2 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6969915B2 (en) | 2001-01-15 | 2005-11-29 | Nec Corporation | Semiconductor device, manufacturing method and apparatus for the same |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3654597B2 (ja) * | 1993-07-15 | 2005-06-02 | 株式会社ルネサステクノロジ | 製造システムおよび製造方法 |
| KR100198477B1 (ko) * | 1994-04-08 | 1999-06-15 | 이시다 아키라 | 기판처리장치 및 방법 |
| JP2994553B2 (ja) * | 1994-04-08 | 1999-12-27 | 大日本スクリーン製造株式会社 | 基板処理装置 |
| US5505132A (en) * | 1995-04-03 | 1996-04-09 | Warren; David K. | Apparatus for field postage stamp cancellation |
| US6672819B1 (en) | 1995-07-19 | 2004-01-06 | Hitachi, Ltd. | Vacuum processing apparatus and semiconductor manufacturing line using the same |
| JPH10112489A (ja) * | 1996-10-07 | 1998-04-28 | Dainippon Screen Mfg Co Ltd | 基板搬送装置および基板処理装置 |
| US6275744B1 (en) | 1997-08-01 | 2001-08-14 | Kokusai Electric Co., Ltd. | Substrate feed control |
| US6466895B1 (en) * | 1999-07-16 | 2002-10-15 | Applied Materials, Inc. | Defect reference system automatic pattern classification |
| JP4093462B2 (ja) | 2002-10-09 | 2008-06-04 | 東京エレクトロン株式会社 | 基板処理方法及び基板処理装置 |
| JP4279102B2 (ja) | 2003-09-22 | 2009-06-17 | 大日本スクリーン製造株式会社 | 基板処理装置及び基板処理方法 |
| WO2005055314A1 (ja) * | 2003-12-01 | 2005-06-16 | Hitachi Kokusai Electric Inc. | 基板処理装置 |
| JP4353903B2 (ja) | 2005-01-07 | 2009-10-28 | 東京エレクトロン株式会社 | クラスタツールの処理システム |
| JP4937559B2 (ja) * | 2005-09-14 | 2012-05-23 | 株式会社Sokudo | 基板処理装置および基板処理方法 |
| JP7324811B2 (ja) * | 2021-09-22 | 2023-08-10 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法、及びプログラム |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4507078A (en) * | 1983-03-28 | 1985-03-26 | Silicon Valley Group, Inc. | Wafer handling apparatus and method |
| GB2194500B (en) * | 1986-07-04 | 1991-01-23 | Canon Kk | A wafer handling apparatus |
| JP2704309B2 (ja) * | 1990-06-12 | 1998-01-26 | 大日本スクリーン製造株式会社 | 基板処理装置及び基板の熱処理方法 |
-
1990
- 1990-09-03 JP JP2234095A patent/JP2638668B2/ja not_active Expired - Fee Related
-
1991
- 1991-09-03 DE DE69128822T patent/DE69128822T2/de not_active Expired - Fee Related
- 1991-09-03 EP EP91114825A patent/EP0474180B1/en not_active Expired - Lifetime
- 1991-09-03 KR KR1019910015384A patent/KR950008844B1/ko not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6969915B2 (en) | 2001-01-15 | 2005-11-29 | Nec Corporation | Semiconductor device, manufacturing method and apparatus for the same |
| US7282432B2 (en) | 2001-01-15 | 2007-10-16 | Nec Corporation | Semiconductor device, manufacturing method and apparatus for the same |
| US7611041B2 (en) | 2001-01-15 | 2009-11-03 | Nec Corporation | Semiconductor device, manufacturing method and apparatus for the same |
| US7793818B2 (en) | 2001-01-15 | 2010-09-14 | Nec Corporation | Semiconductor device, manufacturing method and apparatus for the same |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0474180B1 (en) | 1998-01-28 |
| JP2638668B2 (ja) | 1997-08-06 |
| EP0474180A2 (en) | 1992-03-11 |
| DE69128822D1 (de) | 1998-03-05 |
| JPH04113612A (ja) | 1992-04-15 |
| KR920007081A (ko) | 1992-04-28 |
| DE69128822T2 (de) | 1998-09-24 |
| EP0474180A3 (https=) | 1995-02-15 |
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