KR920003932B1 - 반도체장치의 수지모울드의 외관검사방법과 그 외관검사장치 - Google Patents

반도체장치의 수지모울드의 외관검사방법과 그 외관검사장치 Download PDF

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Publication number
KR920003932B1
KR920003932B1 KR1019890006231A KR890006231A KR920003932B1 KR 920003932 B1 KR920003932 B1 KR 920003932B1 KR 1019890006231 A KR1019890006231 A KR 1019890006231A KR 890006231 A KR890006231 A KR 890006231A KR 920003932 B1 KR920003932 B1 KR 920003932B1
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South Korea
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image
histogram
pixel
relative
memory
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Expired
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KR1019890006231A
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English (en)
Korean (ko)
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KR890017545A (ko
Inventor
다카유키 오자키
Original Assignee
가부시키가이샤 도시바
아오이 죠이치
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Publication of KR890017545A publication Critical patent/KR890017545A/ko
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Publication of KR920003932B1 publication Critical patent/KR920003932B1/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/265—Contactless testing
    • G01R31/2656—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
KR1019890006231A 1988-05-10 1989-05-10 반도체장치의 수지모울드의 외관검사방법과 그 외관검사장치 Expired KR920003932B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP88-113355 1988-05-10
JP63113355A JPH01284743A (ja) 1988-05-10 1988-05-10 半導体装置の樹脂モールドの外観検査方法とその検査装置

Publications (2)

Publication Number Publication Date
KR890017545A KR890017545A (ko) 1989-12-16
KR920003932B1 true KR920003932B1 (ko) 1992-05-18

Family

ID=14610172

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890006231A Expired KR920003932B1 (ko) 1988-05-10 1989-05-10 반도체장치의 수지모울드의 외관검사방법과 그 외관검사장치

Country Status (5)

Country Link
US (1) US5568564A (enExample)
EP (1) EP0341685B1 (enExample)
JP (1) JPH01284743A (enExample)
KR (1) KR920003932B1 (enExample)
DE (1) DE68924092T2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2803388B2 (ja) * 1991-04-26 1998-09-24 三菱電機株式会社 部品検査装置
US5793642A (en) * 1997-01-21 1998-08-11 Tektronix, Inc. Histogram based testing of analog signals
JP3793977B2 (ja) * 1997-01-30 2006-07-05 ソニー株式会社 画像照合装置
US7184594B1 (en) * 1999-01-18 2007-02-27 Nikon Corporation Pattern matching method and device, position determining method and device, position aligning method and device, exposing method and device, and device and its production method
US6488405B1 (en) * 2000-03-08 2002-12-03 Advanced Micro Devices, Inc. Flip chip defect analysis using liquid crystal
JP4743805B2 (ja) * 2000-04-06 2011-08-10 ルネサスエレクトロニクス株式会社 外観検査方法および装置
US7151850B2 (en) * 2001-10-30 2006-12-19 Matsushita Electric Industrial Co., Ltd. Apparatus and method for setting teaching data, teaching data providing system over network
JP2003248008A (ja) * 2001-12-18 2003-09-05 Inst Of Physical & Chemical Res 反応液の攪拌方法
JP4254204B2 (ja) * 2001-12-19 2009-04-15 富士ゼロックス株式会社 画像照合装置、画像形成装置及び画像照合プログラム
JP2003240521A (ja) * 2002-02-21 2003-08-27 Bridgestone Corp 被検体の外観・形状検査方法とその装置、及び、被検体の外観・形状検出装置
DE102005017642B4 (de) * 2005-04-15 2010-04-08 Vistec Semiconductor Systems Jena Gmbh Verfahren zur Inspektion eines Wafers
JP5004478B2 (ja) * 2006-02-17 2012-08-22 日立造船株式会社 物体の判別方法および判別装置
KR100940301B1 (ko) * 2008-03-26 2010-02-05 호서대학교 산학협력단 마크 분할 검사 방법
JP7303720B2 (ja) * 2019-10-15 2023-07-05 ケミカルグラウト株式会社 地層構造解析システム及びプログラム

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4472736A (en) * 1980-03-11 1984-09-18 Dainippon Ink And Chemicals Incorporated Lithographic reproduction original classification and color separation tone curve adjustment
US4484081A (en) * 1980-09-19 1984-11-20 Trw Inc. Defect analysis system
JPH0722166B2 (ja) * 1982-09-22 1995-03-08 株式会社東芝 ダイボンダ等におけるペレツト認識方法
JPS6083328A (ja) * 1983-10-13 1985-05-11 Fujitsu Ltd フオトマスクの検査方法
GB8331248D0 (en) * 1983-11-23 1983-12-29 Kearney & Trecker Marwin Ltd Inspecting articles
JPS6342575A (ja) * 1986-08-08 1988-02-23 Dainippon Screen Mfg Co Ltd 階調変換方法およびその装置
DE3750285T2 (de) * 1986-10-03 1995-03-30 Omron Tateisi Electronics Co Gerät zur Untersuchung einer elektronischen Vorrichtung in fester Baugruppe.

Also Published As

Publication number Publication date
DE68924092T2 (de) 1996-03-21
JPH0588779B2 (enExample) 1993-12-24
US5568564A (en) 1996-10-22
EP0341685A3 (en) 1990-12-19
DE68924092D1 (de) 1995-10-12
EP0341685A2 (en) 1989-11-15
EP0341685B1 (en) 1995-09-06
JPH01284743A (ja) 1989-11-16
KR890017545A (ko) 1989-12-16

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