KR900004632B1 - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
KR900004632B1
KR900004632B1 KR8408476A KR840008476A KR900004632B1 KR 900004632 B1 KR900004632 B1 KR 900004632B1 KR 8408476 A KR8408476 A KR 8408476A KR 840008476 A KR840008476 A KR 840008476A KR 900004632 B1 KR900004632 B1 KR 900004632B1
Authority
KR
South Korea
Prior art keywords
collector
word lines
load
transistors
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
KR8408476A
Other languages
English (en)
Korean (ko)
Inventor
Yasuhisa Sugo
Toru Dakesima
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of KR900004632B1 publication Critical patent/KR900004632B1/ko
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/411Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using bipolar transistors only
    • G11C11/4116Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using bipolar transistors only with at least one cell access via separately connected emittors of said transistors or via multiple emittors, e.g. T2L, ECL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B10/00Static random access memory [SRAM] devices
    • H10B10/10SRAM devices comprising bipolar components
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00Diodes
    • H10D8/60Schottky-barrier diodes 
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/60Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
    • H10D84/611Combinations of BJTs and one or more of diodes, resistors or capacitors
    • H10D84/613Combinations of vertical BJTs and one or more of diodes, resistors or capacitors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
KR8408476A 1983-12-29 1984-12-28 Semiconductor memory device Expired KR900004632B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58247704A JPS60143496A (ja) 1983-12-29 1983-12-29 半導体記憶装置

Publications (1)

Publication Number Publication Date
KR900004632B1 true KR900004632B1 (en) 1990-06-30

Family

ID=17167412

Family Applications (1)

Application Number Title Priority Date Filing Date
KR8408476A Expired KR900004632B1 (en) 1983-12-29 1984-12-28 Semiconductor memory device

Country Status (4)

Country Link
US (1) US4538244A (enExample)
EP (1) EP0149401A3 (enExample)
JP (1) JPS60143496A (enExample)
KR (1) KR900004632B1 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4706107A (en) * 1981-06-04 1987-11-10 Nippon Electric Co., Ltd. IC memory cells with reduced alpha particle influence
US4551901A (en) * 1984-02-24 1985-11-12 Amp Incorporated Component insertion apparatus
JPS61127159A (ja) * 1984-11-26 1986-06-14 Nippon Texas Instr Kk スタテイツク形記憶素子
US4809052A (en) * 1985-05-10 1989-02-28 Hitachi, Ltd. Semiconductor memory device
GB2176339A (en) * 1985-06-10 1986-12-17 Philips Electronic Associated Semiconductor device with schottky junctions
JPH0740590B2 (ja) * 1985-09-06 1995-05-01 株式会社日立製作所 半導体装置
US5087956A (en) * 1985-10-25 1992-02-11 Hitachi, Ltd. Semiconductor memory device
JPS62130553A (ja) * 1985-12-02 1987-06-12 Mitsubishi Electric Corp 半導体集積回路装置
US4811067A (en) * 1986-05-02 1989-03-07 International Business Machines Corporation High density vertically structured memory
US4745580A (en) * 1986-06-09 1988-05-17 Laymoun Samir M Variable clamped memory cell
US4833644A (en) * 1986-08-26 1989-05-23 General Electric Company Memory cell circuit having radiation hardness
JPS6379373A (ja) * 1986-09-24 1988-04-09 Hitachi Ltd 半導体装置およびその製造方法
JPH0714037B2 (ja) * 1986-10-20 1995-02-15 三菱電機株式会社 半導体記憶装置
US4754430A (en) * 1986-12-18 1988-06-28 Honeywell Inc. Memory cell with dual collector, active load transistors
US4903087A (en) * 1987-01-13 1990-02-20 National Semiconductor Corporation Schottky barrier diode for alpha particle resistant static random access memories
US4922455A (en) * 1987-09-08 1990-05-01 International Business Machines Corporation Memory cell with active device for saturation capacitance discharge prior to writing
JP3099349B2 (ja) * 1989-06-29 2000-10-16 日本電気株式会社 バイポーラ型半導体メモリの製造方法
KR940001425B1 (ko) * 1990-11-06 1994-02-23 재단법인 한국전자통신연구소 수직구조를 갖는 바이폴라형 다이내믹 램을 제조하는 방법 및 그 다이내믹 램의 구조
DE102009018971A1 (de) * 2009-04-25 2010-11-04 Secos Halbleitertechnologie Gmbh Konstruktion einer Schottkydiode mit verbessertem Hochstromverhalten und Verfahren zu deren Herstellung

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4110775A (en) * 1976-08-23 1978-08-29 Festa Thomas A Schottky diode with voltage limiting guard band
JPS6058593B2 (ja) * 1976-10-01 1985-12-20 株式会社日立製作所 半導体メモリ
JPS6057707B2 (ja) * 1978-01-25 1985-12-16 株式会社日立製作所 記憶回路
JPS57167675A (en) * 1981-04-08 1982-10-15 Nec Corp Semiconductor device
JPS5843485A (ja) * 1981-09-10 1983-03-14 梶谷 正治 フリ−・ミニアチュア

Also Published As

Publication number Publication date
EP0149401A2 (en) 1985-07-24
US4538244A (en) 1985-08-27
JPS60143496A (ja) 1985-07-29
JPH041958B2 (enExample) 1992-01-14
EP0149401A3 (en) 1988-03-16

Similar Documents

Publication Publication Date Title
KR900004632B1 (en) Semiconductor memory device
KR870006662A (ko) 홈 용량을 가진 다이나믹 랜덤 액세스 메모리
JPS564263A (en) Semiconductor memory
KR850002639A (ko) 반도체 기억장치
KR890002886A (ko) 반도체 기억장치
GB1419834A (en) Integrated semiconductor memory cell array
CA1270328C (en) SEMICONDUCTOR MEMORY WITH TWIN CAPACITOR TYPE CELLS
US3852800A (en) One transistor dynamic memory cell
KR850004879A (ko) 반도체 메모리
KR950020709A (ko) 소프트에러가 감소된 메모리셀 및 메모리장치와 소프트에러의 감소방법
US3573573A (en) Memory cell with buried load impedances
US4815037A (en) Bipolar type static memory cell
KR910020896A (ko) 반도체집적회로
DE3778388D1 (de) Halbleiter speichergeraet.
ATE58027T1 (de) Bipolare speicherzelle mit externer kapazitaet.
KR880700467A (ko) 반도체 장치
US5452247A (en) Three-dimensional static random access memory device for avoiding disconnection among transistors of each memory cell
KR840007313A (ko) 매입저항(埋入抵抗)을 가진 반도체 집적회로(半導體集積回路)
JPS5698783A (en) Semiconductor memory device
KR850004876A (ko) 이중 다결정 구조를 갖는 스태틱 메모리셀
EP0401686A3 (en) Semiconductor memory cell having high density structure
KR880000970A (ko) 개선된 메모리셀 회로
JPS5766660A (en) Semiconductor memory
GB1335890A (en) Associative semiconductor memory
GB1516058A (en) Semiconductor storage cells

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

G160 Decision to publish patent application
PG1605 Publication of application before grant of patent

St.27 status event code: A-2-2-Q10-Q13-nap-PG1605

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

FPAY Annual fee payment

Payment date: 19980619

Year of fee payment: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 19990701

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 19990701

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000