KR890700998A - 플라즈마처리방법과 장치 및 그 장치용 모드변환기 - Google Patents
플라즈마처리방법과 장치 및 그 장치용 모드변환기Info
- Publication number
- KR890700998A KR890700998A KR1019880701635A KR880701635A KR890700998A KR 890700998 A KR890700998 A KR 890700998A KR 1019880701635 A KR1019880701635 A KR 1019880701635A KR 880701635 A KR880701635 A KR 880701635A KR 890700998 A KR890700998 A KR 890700998A
- Authority
- KR
- South Korea
- Prior art keywords
- processing method
- plasma processing
- mode converter
- converter
- mode
- Prior art date
Links
- 238000003672 processing method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32357—Generation remote from the workpiece, e.g. down-stream
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/511—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using microwave discharges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/16—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation
- H01J27/18—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation with an applied axial magnetic field
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Combustion & Propulsion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62-103785 | 1987-04-27 | ||
JP10378587 | 1987-04-27 | ||
JP63-98330 | 1988-04-22 | ||
JP63098330A JPH0754759B2 (ja) | 1987-04-27 | 1988-04-22 | プラズマ処理方法および装置並びにプラズマ処理装置用モード変換器 |
PCT/JP1988/000401 WO1988008659A1 (en) | 1987-04-27 | 1988-04-25 | Method and apparatus for processing with plasma |
Publications (2)
Publication Number | Publication Date |
---|---|
KR890700998A true KR890700998A (ko) | 1989-04-28 |
KR920003018B1 KR920003018B1 (ko) | 1992-04-13 |
Family
ID=26439522
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019880701635A KR920003018B1 (ko) | 1987-04-27 | 1988-04-25 | 플라즈마처리방법과 장치 및 그 장치용 모드변환기 |
Country Status (7)
Country | Link |
---|---|
US (1) | US5003152A (ko) |
EP (1) | EP0311696B1 (ko) |
JP (1) | JPH0754759B2 (ko) |
KR (1) | KR920003018B1 (ko) |
CA (1) | CA1299773C (ko) |
DE (1) | DE3854111T2 (ko) |
WO (1) | WO1988008659A1 (ko) |
Families Citing this family (56)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5146138A (en) * | 1988-04-05 | 1992-09-08 | Mitsubishi Denki Kabushiki Kaisha | Plasma processor |
US5115167A (en) * | 1988-04-05 | 1992-05-19 | Mitsubishi Denki Kabushiki Kaisha | Plasma processor |
US5153406A (en) * | 1989-05-31 | 1992-10-06 | Applied Science And Technology, Inc. | Microwave source |
US5270616A (en) * | 1989-09-25 | 1993-12-14 | Ryohei Itatani | Microwave plasma generating apparatus |
JPH03110798A (ja) * | 1989-09-25 | 1991-05-10 | Ryohei Itaya | マイクロ波プラズマ発生装置 |
EP0434933B1 (de) * | 1989-12-23 | 1995-05-24 | Leybold Aktiengesellschaft | Einrichtung für die Erzeugung eines Plasmas durch Mikrowellen |
JPH0440764U (ko) * | 1990-08-06 | 1992-04-07 | ||
JP3056772B2 (ja) * | 1990-08-20 | 2000-06-26 | 株式会社日立製作所 | プラズマの制御方法ならびにプラズマ処理方法およびその装置 |
JP2613313B2 (ja) * | 1990-09-26 | 1997-05-28 | 株式会社日立製作所 | マイクロ波プラズマ処理装置 |
US5111111A (en) * | 1990-09-27 | 1992-05-05 | Consortium For Surface Processing, Inc. | Method and apparatus for coupling a microwave source in an electron cyclotron resonance system |
US5480533A (en) * | 1991-08-09 | 1996-01-02 | Matsushita Electric Industrial Co., Ltd. | Microwave plasma source |
JPH0567586A (ja) * | 1991-09-09 | 1993-03-19 | Nec Corp | Ecrプラズマエツチング装置 |
US5302803A (en) * | 1991-12-23 | 1994-04-12 | Consortium For Surface Processing, Inc. | Apparatus and method for uniform microwave plasma processing using TE1101 modes |
DE69306007T2 (de) * | 1992-01-30 | 1997-05-22 | Hitachi Ltd | Verfahren und Vorrichtung zur Plasmaerzeugung und Verfahren zur Halbleiter-Bearbeitung |
WO1994006150A1 (en) * | 1992-09-02 | 1994-03-17 | The University Of North Carolina At Chapel Hill | Method for plasma processing at high pressures |
KR960043012A (ko) * | 1995-05-19 | 1996-12-21 | 가나이 쯔도무 | 플라즈마 처리방법 및 처리장치 |
US6132550A (en) * | 1995-08-11 | 2000-10-17 | Sumitomo Electric Industries, Ltd. | Apparatuses for desposition or etching |
JP3368159B2 (ja) * | 1996-11-20 | 2003-01-20 | 東京エレクトロン株式会社 | プラズマ処理装置 |
JPH11102799A (ja) * | 1997-09-26 | 1999-04-13 | Mitsubishi Electric Corp | プラズマ発生装置 |
US6016766A (en) * | 1997-12-29 | 2000-01-25 | Lam Research Corporation | Microwave plasma processor |
US6362449B1 (en) | 1998-08-12 | 2002-03-26 | Massachusetts Institute Of Technology | Very high power microwave-induced plasma |
JP3668079B2 (ja) * | 1999-05-31 | 2005-07-06 | 忠弘 大見 | プラズマプロセス装置 |
JP3739637B2 (ja) * | 2000-07-27 | 2006-01-25 | アルプス電気株式会社 | 一次放射器 |
KR100362602B1 (ko) * | 2001-02-26 | 2002-11-29 | 학교법인 호서학원 | 챔버 특성 측정 및 매처 성능 평가를 위한 어댑터 |
JP4727057B2 (ja) | 2001-03-28 | 2011-07-20 | 忠弘 大見 | プラズマ処理装置 |
JP5138131B2 (ja) * | 2001-03-28 | 2013-02-06 | 忠弘 大見 | マイクロ波プラズマプロセス装置及びプラズマプロセス制御方法 |
DE10156615B4 (de) * | 2001-11-17 | 2004-10-07 | Forschungszentrum Karlsruhe Gmbh | Einrichtung zur Erzeugung eines örtlich variierbaren Elektron-Zyklotron-Resonanz-Mikrowellen-Niederdruckplasmas |
JP4157718B2 (ja) * | 2002-04-22 | 2008-10-01 | キヤノンアネルバ株式会社 | 窒化シリコン膜作製方法及び窒化シリコン膜作製装置 |
EP1361437A1 (en) * | 2002-05-07 | 2003-11-12 | Centre National De La Recherche Scientifique (Cnrs) | A novel biological cancer marker and methods for determining the cancerous or non-cancerous phenotype of cells |
US20060057016A1 (en) * | 2002-05-08 | 2006-03-16 | Devendra Kumar | Plasma-assisted sintering |
JP4163681B2 (ja) * | 2002-05-08 | 2008-10-08 | レオナード クルツ シュティフトゥング ウント コンパニー カーゲー | 大型のプラスチック製三次元物体の装飾方法 |
US7638727B2 (en) * | 2002-05-08 | 2009-12-29 | Btu International Inc. | Plasma-assisted heat treatment |
US7432470B2 (en) | 2002-05-08 | 2008-10-07 | Btu International, Inc. | Surface cleaning and sterilization |
US20050233091A1 (en) * | 2002-05-08 | 2005-10-20 | Devendra Kumar | Plasma-assisted coating |
US7497922B2 (en) * | 2002-05-08 | 2009-03-03 | Btu International, Inc. | Plasma-assisted gas production |
US20060228497A1 (en) * | 2002-05-08 | 2006-10-12 | Satyendra Kumar | Plasma-assisted coating |
US7465362B2 (en) * | 2002-05-08 | 2008-12-16 | Btu International, Inc. | Plasma-assisted nitrogen surface-treatment |
US7498066B2 (en) * | 2002-05-08 | 2009-03-03 | Btu International Inc. | Plasma-assisted enhanced coating |
US7560657B2 (en) * | 2002-05-08 | 2009-07-14 | Btu International Inc. | Plasma-assisted processing in a manufacturing line |
US20060233682A1 (en) * | 2002-05-08 | 2006-10-19 | Cherian Kuruvilla A | Plasma-assisted engine exhaust treatment |
US7445817B2 (en) * | 2002-05-08 | 2008-11-04 | Btu International Inc. | Plasma-assisted formation of carbon structures |
US7494904B2 (en) * | 2002-05-08 | 2009-02-24 | Btu International, Inc. | Plasma-assisted doping |
US6870124B2 (en) * | 2002-05-08 | 2005-03-22 | Dana Corporation | Plasma-assisted joining |
US20060237398A1 (en) * | 2002-05-08 | 2006-10-26 | Dougherty Mike L Sr | Plasma-assisted processing in a manufacturing line |
US20060062930A1 (en) * | 2002-05-08 | 2006-03-23 | Devendra Kumar | Plasma-assisted carburizing |
US7189940B2 (en) | 2002-12-04 | 2007-03-13 | Btu International Inc. | Plasma-assisted melting |
JP2004239412A (ja) * | 2003-02-07 | 2004-08-26 | Tokai Rubber Ind Ltd | 樹脂チューブの接続構造及び樹脂チューブの接続方法 |
JP4381001B2 (ja) * | 2003-02-25 | 2009-12-09 | シャープ株式会社 | プラズマプロセス装置 |
RU2324305C2 (ru) * | 2003-05-20 | 2008-05-10 | Байотэйдж Аб | Сверхвысокочастотное нагревательное устройство |
WO2006127037A2 (en) * | 2004-11-05 | 2006-11-30 | Dana Corporation | Atmospheric pressure processing using microwave-generated plasmas |
US20060236935A1 (en) * | 2005-04-25 | 2006-10-26 | Von Ardenne Anlagentechnik Gmbh | Coating installation with coolable diaphragm |
JP2010050046A (ja) * | 2008-08-25 | 2010-03-04 | Hitachi High-Technologies Corp | プラズマ処理装置 |
KR20130041120A (ko) * | 2010-07-21 | 2013-04-24 | 도쿄엘렉트론가부시키가이샤 | 층간 절연층 형성 방법 및 반도체 장치 |
US20120160837A1 (en) * | 2010-12-23 | 2012-06-28 | Eastman Chemical Company | Wood heater with enhanced microwave launch efficiency |
US9397380B2 (en) * | 2011-01-28 | 2016-07-19 | Applied Materials, Inc. | Guided wave applicator with non-gaseous dielectric for plasma chamber |
MX2023014273A (es) * | 2021-06-02 | 2024-06-05 | Rimere Llc | Sistemas y metodos para la generacion de plasma con microondas. |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3740514A (en) * | 1970-07-01 | 1973-06-19 | Litter Syst Inc | Mode-shifting system for microwave ovens |
BE776652A (fr) * | 1970-12-31 | 1972-04-04 | Soulier Joel H A | Dispositif pour l'uniformisation de l'energie d'hyperfrequence appliquee a une bande ou feuille a traiter a partir d'un cavite resonnante |
CA1159012A (en) * | 1980-05-02 | 1983-12-20 | Seitaro Matsuo | Plasma deposition apparatus |
DE3376921D1 (en) * | 1982-09-10 | 1988-07-07 | Nippon Telegraph & Telephone | Ion shower apparatus |
EP0103461B1 (en) * | 1982-09-10 | 1988-11-17 | Nippon Telegraph And Telephone Corporation | Plasma deposition method and apparatus |
AU549376B2 (en) * | 1983-02-25 | 1986-01-23 | Toyota Jidosha Kabushiki Kaisha | Plasma treatment |
JPS60120525A (ja) * | 1983-12-02 | 1985-06-28 | Nippon Telegr & Teleph Corp <Ntt> | 反応性イオンエツチング方法 |
JPS61225902A (ja) * | 1985-03-30 | 1986-10-07 | Toshiba Corp | アンテナ給電装置 |
JPS61284098A (ja) * | 1985-06-07 | 1986-12-15 | 住友金属工業株式会社 | 横磁場型マイクロ波プラズマ発生装置 |
GB8516083D0 (en) * | 1985-06-25 | 1985-07-31 | Glaxo Group Ltd | Heterocyclic compounds |
JPH0658909B2 (ja) * | 1985-07-15 | 1994-08-03 | 株式会社日立製作所 | 低温プラズマによる成膜方法及び装置 |
EP0264913B1 (en) * | 1986-10-20 | 1994-06-22 | Hitachi, Ltd. | Plasma processing apparatus |
US4778561A (en) * | 1987-10-30 | 1988-10-18 | Veeco Instruments, Inc. | Electron cyclotron resonance plasma source |
JPH0216732A (ja) * | 1988-07-05 | 1990-01-19 | Mitsubishi Electric Corp | プラズマ反応装置 |
-
1988
- 1988-04-22 JP JP63098330A patent/JPH0754759B2/ja not_active Expired - Lifetime
- 1988-04-25 EP EP88903398A patent/EP0311696B1/en not_active Expired - Lifetime
- 1988-04-25 US US07/273,518 patent/US5003152A/en not_active Expired - Lifetime
- 1988-04-25 DE DE3854111T patent/DE3854111T2/de not_active Expired - Lifetime
- 1988-04-25 WO PCT/JP1988/000401 patent/WO1988008659A1/ja active IP Right Grant
- 1988-04-25 KR KR1019880701635A patent/KR920003018B1/ko not_active IP Right Cessation
- 1988-04-26 CA CA000565165A patent/CA1299773C/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
WO1988008659A1 (en) | 1988-11-03 |
EP0311696A4 (en) | 1989-11-27 |
EP0311696B1 (en) | 1995-07-05 |
DE3854111D1 (de) | 1995-08-10 |
JPH0197399A (ja) | 1989-04-14 |
EP0311696A1 (en) | 1989-04-19 |
JPH0754759B2 (ja) | 1995-06-07 |
KR920003018B1 (ko) | 1992-04-13 |
DE3854111T2 (de) | 1995-11-30 |
US5003152A (en) | 1991-03-26 |
CA1299773C (en) | 1992-04-28 |
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Legal Events
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A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20080320 Year of fee payment: 17 |
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EXPY | Expiration of term |