KR880700258A - 중합체 경도 비파괴 측정 방법 - Google Patents
중합체 경도 비파괴 측정 방법Info
- Publication number
- KR880700258A KR880700258A KR870700082A KR870700082A KR880700258A KR 880700258 A KR880700258 A KR 880700258A KR 870700082 A KR870700082 A KR 870700082A KR 870700082 A KR870700082 A KR 870700082A KR 880700258 A KR880700258 A KR 880700258A
- Authority
- KR
- South Korea
- Prior art keywords
- measurement method
- destructive measurement
- hardness non
- polymer hardness
- polymer
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6445—Measuring fluorescence polarisation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4644—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
- H05K3/4673—Application methods or materials of intermediate insulating layers not specially adapted to any one of the previous methods of adding a circuit layer
- H05K3/4676—Single layer compositions
Landscapes
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Polymerisation Methods In General (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/740,155 US4651011A (en) | 1985-06-03 | 1985-06-03 | Non-destructive method for determining the extent of cure of a polymer |
US740155 | 1985-06-03 | ||
PCT/US1986/001112 WO1986007456A1 (en) | 1985-06-03 | 1986-05-19 | Non-destructive method for determining the extent of cure of a polymer |
Publications (2)
Publication Number | Publication Date |
---|---|
KR880700258A true KR880700258A (ko) | 1988-02-22 |
KR890004075B1 KR890004075B1 (ko) | 1989-10-18 |
Family
ID=24975276
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019870700082A KR890004075B1 (ko) | 1985-06-03 | 1986-05-19 | 중합체 경도 비파괴 측정방법 |
Country Status (8)
Country | Link |
---|---|
US (1) | US4651011A (ko) |
EP (1) | EP0225917B1 (ko) |
JP (1) | JPH0610655B2 (ko) |
KR (1) | KR890004075B1 (ko) |
CN (1) | CN1010431B (ko) |
CA (1) | CA1269862A (ko) |
DE (1) | DE3678114D1 (ko) |
WO (1) | WO1986007456A1 (ko) |
Families Citing this family (50)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4833332A (en) * | 1987-06-12 | 1989-05-23 | E. I. Du Pont De Nemours And Company | Scanning fluorescent detection system |
ATE84149T1 (de) * | 1987-08-04 | 1993-01-15 | Sohrab Darougar | Photographische fluoreszenzimmunanalyse. |
CA2012263C (en) * | 1989-03-30 | 1996-07-16 | James R. Petisce | Article coated with cured material and methods of making |
US5047444A (en) * | 1989-05-31 | 1991-09-10 | Minnesota Mining And Manufacturing Company | Fluorescent degree of cure monitors |
US5182316A (en) * | 1989-05-31 | 1993-01-26 | Minnesota Mining And Manufacturing Company | Fluorescent degree of cure monitors |
US5118559A (en) * | 1989-05-31 | 1992-06-02 | Minnesota Mining And Manufacturing Company | Fluorescent degree of cure monitors |
US5100802A (en) * | 1989-12-05 | 1992-03-31 | The Dow Chemical Company | Fluorescent monitoring method for polymerization reactions |
US5151748A (en) * | 1990-08-07 | 1992-09-29 | The United States Of America As Represented By The Secretary Of Commerce | Optical sensor for the measurement of molecular orientation and viscosity of polymeric materials based on fluorescence radiation |
US5384079A (en) * | 1993-01-06 | 1995-01-24 | The United States Of America As Represented By The Secretary Of Commerce | Method for detecting thermodynamic phase transitions during polymer injection molding |
ES2076083B1 (es) * | 1993-06-04 | 1996-06-01 | Fuesca Sl | Aparato y metodo de medida y control de la densidad de reticulacion de los tratamientos en caliente y frio del vidrio aligerado. |
DE4343058A1 (de) * | 1993-12-19 | 1995-06-22 | Robert Prof Dr Ing Massen | Multisensorielle Kamera für die Qualitätssicherung |
US5717217A (en) * | 1994-05-05 | 1998-02-10 | Spectra Group Limited, Inc. | Method for determining thickness, degree of cure and other properties of a polymeric coating |
US5519211A (en) * | 1994-06-14 | 1996-05-21 | United States Of America As Represented By The Secretary Of Commerce | Method and apparatus for monitoring resin crystallization and shrinkage during polymer molding |
US5532817A (en) * | 1994-10-03 | 1996-07-02 | The Dow Chemical Company | Method of optical inspection |
US5556663A (en) * | 1994-12-30 | 1996-09-17 | Avery Dennison Corporation | Excimer fluorescence method for determining cure of coatings |
US5598005A (en) * | 1995-02-15 | 1997-01-28 | The United States Of America As Represented By The Secretary Of The Commerce | Non-destructive method for determining the extent of cure of a polymerizing material and the solidification of a thermoplastic polymer based on wavelength shift of fluroescence |
US5788374A (en) * | 1996-06-12 | 1998-08-04 | The United States Of America As Represented By The Secretary Of Commerce | Method and apparatus for measuring the temperature of a liquid medium |
US20020158212A1 (en) * | 1998-04-17 | 2002-10-31 | French Todd E. | Apparatus and methods for time-resolved optical spectroscopy |
USH1843H (en) * | 1997-10-17 | 2000-03-07 | Bur; Anthony J. | Optical sensor for measuring fluorescence anisotropy during polymer processing |
US5955002A (en) * | 1997-11-12 | 1999-09-21 | Spectra Group Limited, Inc. | Method for determining properties of a polymer coating or film cured by cationic polymerization |
US6867421B1 (en) | 1998-12-29 | 2005-03-15 | Bayer Materialscience Llc | In-line process for monitoring binder dosage and distribution on a surface and apparatus useful therefor |
US6410926B1 (en) * | 1999-10-01 | 2002-06-25 | Ppg Industries Ohio, Inc. | Coating with optical taggent |
IT1314323B1 (it) | 1999-12-27 | 2002-12-09 | Consiglio Nazionale Ricerche | Apparato e metodo non-distruttivo per rilevare l'orientazionemolecolare in films sottili |
US6704113B1 (en) * | 2000-03-28 | 2004-03-09 | Juliusz W. Adamczuk | Non-destructive surface inspection and profiling |
US6598663B1 (en) * | 2000-04-06 | 2003-07-29 | The Ohio State University Research Foundation | Method for detecting density gradients |
EP1279169A1 (de) | 2000-05-04 | 2003-01-29 | Basf Aktiengesellschaft | Verwendung von strahlenvernetzbaren polymer-zusammensetzungen als daten-aufzeichnungsmedium |
DE10058879A1 (de) * | 2000-11-27 | 2002-06-06 | Bayer Ag | Testverfahren zur Optimierung von filmbildenden Polymeren |
US6593155B2 (en) | 2000-12-28 | 2003-07-15 | Dow Global Technologies Inc. | Method for determination of cure and oxidation of spin-on dielectric polymers |
US6836362B2 (en) | 2001-05-14 | 2004-12-28 | General Electric Company | Method for the rapid determination of the optical quality of combinatorial libraries |
AU2002340203A1 (en) | 2001-10-16 | 2003-04-28 | Valspar Sourcing, Inc. | Method of monitoring extent of cure of a coating |
DE10328075B9 (de) * | 2001-12-21 | 2008-10-02 | Osram Opto Semiconductors Gmbh | Vorrichtung und Verfahren zur in-situ-Messung von auf Trägern aufgedruckten Polymermengen |
DE10163463B9 (de) * | 2001-12-21 | 2008-07-17 | Osram Opto Semiconductors Gmbh | Vorrichtung und Verfahren zu in-situ-Messung von auf Trägern aufgedruckten Polymermengen |
JP3695407B2 (ja) * | 2002-02-25 | 2005-09-14 | ソニーケミカル株式会社 | 硬化性接着剤組成物の硬化物の硬化レベルの非破壊検査方法及び電子装置の製造方法 |
US7585681B2 (en) * | 2003-10-02 | 2009-09-08 | Bayer Materialscience Llc | Method for evaluating binder distribution on a surface |
US7902682B2 (en) * | 2003-11-18 | 2011-03-08 | International Business Machines Corporation | Ultraviolet energy curable tape and method of making a semiconductor chip using the tape |
JP5040380B2 (ja) * | 2007-03-13 | 2012-10-03 | オムロン株式会社 | 紫外線照射システム、それに用いられる硬化反応検知装置およびそれを用いた紫外線硬化樹脂の硬化方法 |
DE102009021677A1 (de) * | 2008-06-19 | 2009-12-24 | Hochschule für angewandte Wissenschaften München | Bestimmen des Aushärtungsgrades mittels einer Nachweissubstanz |
WO2012071304A2 (en) * | 2010-11-22 | 2012-05-31 | Henkel Corporation | Methods for measuring degree cure or solidification of a composition |
KR101507336B1 (ko) * | 2011-05-24 | 2015-03-31 | 파나소닉 주식회사 | 발광소자 제조방법 및 발광소자 제조장치 |
GB201111312D0 (en) * | 2011-07-04 | 2011-08-17 | Rolls Royce Plc | Adhesive fastening elements for holding a workpiece and methods of de-bonding a workpiece from an adhesive fastening element |
JP5900000B2 (ja) * | 2012-02-16 | 2016-04-06 | 富士通株式会社 | 樹脂硬化状態モニタリング装置及び樹脂硬化状態モニタリング方法 |
CN103258756B (zh) * | 2013-04-26 | 2015-09-09 | 京东方科技集团股份有限公司 | 一种剥离设备的剥离能力的评定方法及评定系统 |
JP6141150B2 (ja) * | 2013-08-28 | 2017-06-07 | 三菱電機株式会社 | 皮膜の管理方法 |
DE102013224949A1 (de) * | 2013-12-05 | 2015-06-11 | Krones Ag | Messung des Aushärtegrades der Bedruckung oder Beschichtung eines Behälters |
CN105092537B (zh) * | 2014-04-28 | 2021-07-13 | 深圳迈瑞生物医疗电子股份有限公司 | 样本涂片涂层干燥度检测方法、装置、样本涂片干燥装置 |
US9360427B2 (en) | 2014-10-29 | 2016-06-07 | Eastman Kodak Company | Fluorescent detection of curing difference between surfaces |
JP6417906B2 (ja) * | 2014-12-05 | 2018-11-07 | Nok株式会社 | 硬化度測定装置及び硬化度測定方法 |
EP3568689A1 (en) | 2017-01-10 | 2019-11-20 | Sun Chemical Corporation | In-line coating weight and radiant energy exposure measurement |
DE102020203343B4 (de) * | 2019-12-18 | 2023-05-17 | Continental Automotive Technologies GmbH | Verfahren und Vorrichtung zur Qualitätssicherung industriell beschichteter metallischer Substrate aufweisend eine KTL-Beschichtung, einschließlich Fahrzeug(bremsen)komponente |
CN112903622B (zh) * | 2021-01-25 | 2023-01-20 | 中国科学院上海光学精密机械研究所 | 一种多光子聚合物的局部聚合度测量方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3445656A (en) * | 1966-12-23 | 1969-05-20 | Morton Int Inc | Curing vinyl material using rhodamine as a cure indicator |
US3679309A (en) * | 1970-05-04 | 1972-07-25 | Japan Spectroacopic Co Ltd | Instruments for measuring molecular orientations with the aid of fluorescence |
US3912928A (en) * | 1974-05-06 | 1975-10-14 | Dayco Corp | Permanently coded polymeric compound and method of coding and identifying same |
FI64243C (fi) * | 1982-06-17 | 1983-10-10 | Mauri Luukkala | Foerfarande och apparat foer maetning av tvaerbundenhetsgradeni plast |
US4521111A (en) * | 1982-07-23 | 1985-06-04 | E. I. Du Pont De Nemours And Company | Apparatus for measurement of molecular orientation |
US4582520A (en) * | 1982-09-30 | 1986-04-15 | Owens-Corning Fiberglas Corporation | Methods and apparatus for measuring and controlling curing of polymeric materials |
JPS59182341A (ja) * | 1983-03-31 | 1984-10-17 | Horiba Ltd | 試料発光の異方性測定装置 |
US4511757A (en) * | 1983-07-13 | 1985-04-16 | At&T Technologies, Inc. | Circuit board fabrication leading to increased capacity |
-
1985
- 1985-06-03 US US06/740,155 patent/US4651011A/en not_active Expired - Fee Related
-
1986
- 1986-05-19 JP JP61502992A patent/JPH0610655B2/ja not_active Expired - Lifetime
- 1986-05-19 WO PCT/US1986/001112 patent/WO1986007456A1/en active IP Right Grant
- 1986-05-19 KR KR1019870700082A patent/KR890004075B1/ko not_active IP Right Cessation
- 1986-05-19 EP EP86903873A patent/EP0225917B1/en not_active Expired - Lifetime
- 1986-05-19 DE DE8686903873T patent/DE3678114D1/de not_active Expired - Fee Related
- 1986-06-02 CA CA000510548A patent/CA1269862A/en not_active Expired - Fee Related
- 1986-06-02 CN CN86103711A patent/CN1010431B/zh not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPH0610655B2 (ja) | 1994-02-09 |
EP0225917A1 (en) | 1987-06-24 |
CN86103711A (zh) | 1987-05-13 |
US4651011A (en) | 1987-03-17 |
CN1010431B (zh) | 1990-11-14 |
DE3678114D1 (de) | 1991-04-18 |
EP0225917B1 (en) | 1991-03-13 |
CA1269862A (en) | 1990-06-05 |
WO1986007456A1 (en) | 1986-12-18 |
JPS62503120A (ja) | 1987-12-10 |
KR890004075B1 (ko) | 1989-10-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 19940913 Year of fee payment: 6 |
|
LAPS | Lapse due to unpaid annual fee |