ES2076083B1 - Aparato y metodo de medida y control de la densidad de reticulacion de los tratamientos en caliente y frio del vidrio aligerado. - Google Patents

Aparato y metodo de medida y control de la densidad de reticulacion de los tratamientos en caliente y frio del vidrio aligerado.

Info

Publication number
ES2076083B1
ES2076083B1 ES09301237A ES9301237A ES2076083B1 ES 2076083 B1 ES2076083 B1 ES 2076083B1 ES 09301237 A ES09301237 A ES 09301237A ES 9301237 A ES9301237 A ES 9301237A ES 2076083 B1 ES2076083 B1 ES 2076083B1
Authority
ES
Spain
Prior art keywords
measuring
hot
density
reticulation
controlling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES09301237A
Other languages
English (en)
Other versions
ES2076083A1 (es
Inventor
La Fuente Escandon Fernando De
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuesca SL
Original Assignee
Fuesca SL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to ES09301237A priority Critical patent/ES2076083B1/es
Application filed by Fuesca SL filed Critical Fuesca SL
Priority to DE69431340T priority patent/DE69431340T2/de
Priority to PCT/ES1994/000056 priority patent/WO1994029697A2/es
Priority to AT94916992T priority patent/ATE224052T1/de
Priority to EP94916992A priority patent/EP0661534B1/en
Priority to AU68453/94A priority patent/AU6845394A/en
Publication of ES2076083A1 publication Critical patent/ES2076083A1/es
Application granted granted Critical
Publication of ES2076083B1 publication Critical patent/ES2076083B1/es
Priority to US08/802,528 priority patent/US6046463A/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • General Factory Administration (AREA)
  • Surface Treatment Of Glass (AREA)

Abstract

APARATO Y METODO DE MEDIDA Y CONTROL DE LA DENSIDAD DE RETICULACION DE LOS TRATAMIENTOS EN CALIENTE Y FRIO DEL VIDRIO ALIGERADO, BASADO EN LA MEDIDA DE LA REFLEXION DE LA RADIACION POLARIZADA EMITIDA POR EL TRATAMIENTO. EL APARATO CONSTA DE: ZOCALO PARA FIJAR ANGULOS Y PLANOS DE POLARIZACION E INCIDENCIA, CON CABEZAL CON EMISOR Y RECEPTOR DE RADIACION POLARIZADA; UNIDAD CENTRAL PARA AMPLIFICAR Y PROCESAR LA SEÑAL RECIBIDA, CON CONTROL DE DOSIFICACION DEL TRATAMIENTO; E IMPRESORA PARA EL REGISTRO DE LAS LECTURAS OBTENIDAS.
ES09301237A 1993-06-04 1993-06-04 Aparato y metodo de medida y control de la densidad de reticulacion de los tratamientos en caliente y frio del vidrio aligerado. Expired - Fee Related ES2076083B1 (es)

Priority Applications (7)

Application Number Priority Date Filing Date Title
ES09301237A ES2076083B1 (es) 1993-06-04 1993-06-04 Aparato y metodo de medida y control de la densidad de reticulacion de los tratamientos en caliente y frio del vidrio aligerado.
PCT/ES1994/000056 WO1994029697A2 (es) 1993-06-04 1994-06-03 Aparato y metodo de control de la densidad de reticulacion de los recubrimientos del vidrio
AT94916992T ATE224052T1 (de) 1993-06-04 1994-06-03 Vorrichtung und methode zur regelung der vernetzungsdichte von glasbeschichtungen
EP94916992A EP0661534B1 (en) 1993-06-04 1994-06-03 Apparatus and method for regulating the cross-linking density of glass coatings
DE69431340T DE69431340T2 (de) 1993-06-04 1994-06-03 Vorrichtung und methode zur regelung der vernetzungsdichte von glasbeschichtungen
AU68453/94A AU6845394A (en) 1993-06-04 1994-06-03 Apparatus and method for regulating the cross-linking density of glass coatings
US08/802,528 US6046463A (en) 1993-06-04 1997-02-20 Apparatus and method for regulating the cross-linking density of glass coatings

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES09301237A ES2076083B1 (es) 1993-06-04 1993-06-04 Aparato y metodo de medida y control de la densidad de reticulacion de los tratamientos en caliente y frio del vidrio aligerado.

Publications (2)

Publication Number Publication Date
ES2076083A1 ES2076083A1 (es) 1995-10-16
ES2076083B1 true ES2076083B1 (es) 1996-06-01

Family

ID=8282082

Family Applications (1)

Application Number Title Priority Date Filing Date
ES09301237A Expired - Fee Related ES2076083B1 (es) 1993-06-04 1993-06-04 Aparato y metodo de medida y control de la densidad de reticulacion de los tratamientos en caliente y frio del vidrio aligerado.

Country Status (7)

Country Link
US (1) US6046463A (es)
EP (1) EP0661534B1 (es)
AT (1) ATE224052T1 (es)
AU (1) AU6845394A (es)
DE (1) DE69431340T2 (es)
ES (1) ES2076083B1 (es)
WO (1) WO1994029697A2 (es)

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3734624A (en) * 1971-05-06 1973-05-22 Eastman Kodak Co Apparatus using reflected polarized light to inspect a moving web
US4021122A (en) * 1973-01-02 1977-05-03 Emhart Zurich S.A. Glass container inspection machine
US4030836A (en) * 1975-10-28 1977-06-21 The United States Of America As Represented By The Secretary Of The Air Force Method for mapping surfaces with respect to ellipsometric parameters
US4015127A (en) * 1975-10-30 1977-03-29 Aluminum Company Of America Monitoring film parameters using polarimetry of optical radiation
US4129781A (en) * 1976-05-17 1978-12-12 Doyle W Film thickness measuring apparatus and method
JPS608725B2 (ja) * 1978-09-02 1985-03-05 石塚硝子株式会社 ガラス等の表面に施された金属あるいは酸化金属の被膜の厚さ測定装置
US4469442A (en) * 1982-01-11 1984-09-04 Japan Crown Cork Co., Ltd. Detecting irregularities in a coating on a substrate
US4538912A (en) * 1982-09-29 1985-09-03 Ppg Industries, Inc. Method of and apparatus for inspection of coatings on surfaces
JPS6052706A (ja) * 1983-08-31 1985-03-26 Nippon Kokan Kk <Nkk> 膜厚測定装置
JPS60122333A (ja) * 1983-12-07 1985-06-29 Univ Tohoku 偏光解析装置
FR2558259B1 (fr) * 1984-01-17 1986-12-12 Saint Gobain Cinematique Contr Emetteur a balayage pour l'inspection optique d'articles transparents
US4668268A (en) * 1984-12-20 1987-05-26 M&T Chemicals Inc. Coating hood with air flow guide for minimizing deposition of coating compound on finish of containers
US4651011A (en) * 1985-06-03 1987-03-17 At&T Technologies, Inc. Non-destructive method for determining the extent of cure of a polymer
SU1363029A1 (ru) * 1986-05-26 1987-12-30 Ленинградский Институт Авиационного Приборостроения Способ определени неоднородности диэлектрической пленки на диэлектрической подложке
DE3728210A1 (de) * 1987-08-24 1989-03-16 Sick Optik Elektronik Erwin Optische abtastvorrichtung fuer transparentes bahnmaterial
US4857738A (en) * 1987-12-18 1989-08-15 General Signal Corporation Absorption measurements of materials
US5073026A (en) * 1988-02-05 1991-12-17 Ricoh Company, Ltd. Method for measuring refractive index of thin film layer
US4826321A (en) * 1988-03-14 1989-05-02 Nanometrics, Incorporated Thin dielectric film measuring system
US4919534A (en) * 1988-09-30 1990-04-24 Environmental Products Corp. Sensing of material of construction and color of containers
NL8802920A (nl) * 1988-11-28 1990-06-18 Hoogovens Groep Bv Laagdiktemeter.
US5136976A (en) * 1989-10-27 1992-08-11 Atochem North America, Inc. Method and means for controlled-profile coating of glass containers
US5091320A (en) * 1990-06-15 1992-02-25 Bell Communications Research, Inc. Ellipsometric control of material growth
US5131752A (en) * 1990-06-28 1992-07-21 Tamarack Scientific Co., Inc. Method for film thickness endpoint control
DE4035168A1 (de) * 1990-11-06 1992-05-07 Flachglas Ag Verfahren und vorrichtung zur bestimmung der optischen qualitaet einer transparenten platte
JP2671241B2 (ja) * 1990-12-27 1997-10-29 日立電子エンジニアリング株式会社 ガラス板の異物検出装置
WO1992014119A1 (en) * 1991-01-30 1992-08-20 Nkk Corporation Ellipsometer and method of controlling coating thickness by use of ellipsometer
US5162660A (en) * 1991-06-27 1992-11-10 Macmillan Bloedel Limited Paper roughness or glass sensor using polarized light reflection
JP2847458B2 (ja) * 1993-03-26 1999-01-20 三井金属鉱業株式会社 欠陥評価装置

Also Published As

Publication number Publication date
DE69431340D1 (de) 2002-10-17
AU6845394A (en) 1995-01-03
US6046463A (en) 2000-04-04
WO1994029697A3 (es) 1995-02-02
EP0661534B1 (en) 2002-09-11
ATE224052T1 (de) 2002-09-15
EP0661534A1 (en) 1995-07-05
ES2076083A1 (es) 1995-10-16
WO1994029697A2 (es) 1994-12-22
DE69431340T2 (de) 2003-07-31

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 20040605