ATE144043T1 - Elektrooptisches messgerät - Google Patents

Elektrooptisches messgerät

Info

Publication number
ATE144043T1
ATE144043T1 AT92302864T AT92302864T ATE144043T1 AT E144043 T1 ATE144043 T1 AT E144043T1 AT 92302864 T AT92302864 T AT 92302864T AT 92302864 T AT92302864 T AT 92302864T AT E144043 T1 ATE144043 T1 AT E144043T1
Authority
AT
Austria
Prior art keywords
measurement station
screen
optical path
arrays
measurement
Prior art date
Application number
AT92302864T
Other languages
English (en)
Inventor
Philip James Eric Aldred
Original Assignee
Brown & Sharpe Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Brown & Sharpe Limited filed Critical Brown & Sharpe Limited
Application granted granted Critical
Publication of ATE144043T1 publication Critical patent/ATE144043T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Glass Compositions (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
AT92302864T 1991-04-04 1992-04-01 Elektrooptisches messgerät ATE144043T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB919107037A GB9107037D0 (en) 1991-04-04 1991-04-04 Improvements in or relating to electro-optical measurement apparatus

Publications (1)

Publication Number Publication Date
ATE144043T1 true ATE144043T1 (de) 1996-10-15

Family

ID=10692614

Family Applications (1)

Application Number Title Priority Date Filing Date
AT92302864T ATE144043T1 (de) 1991-04-04 1992-04-01 Elektrooptisches messgerät

Country Status (5)

Country Link
US (1) US5296914A (de)
EP (1) EP0507566B1 (de)
AT (1) ATE144043T1 (de)
DE (1) DE69214340T2 (de)
GB (1) GB9107037D0 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD371084S (en) 1995-05-19 1996-06-25 Sokkia Co., Ltd. Range meter using a laser light wave
AU2003243617A1 (en) * 2002-06-17 2003-12-31 Stanley P. Johnson An inspection system and method
US7745805B2 (en) 2002-06-17 2010-06-29 Johnson Thread-View Systems Product inspection system and a method for implementing same that incorporates a correction factor
US8410466B2 (en) * 2002-06-17 2013-04-02 Quest Metrology Group, Llc Non-contact component inspection system
US8035094B2 (en) 2002-06-17 2011-10-11 Quest Metrology, LLC Methods for measuring at least one physical characteristic of a component
EP2284483B1 (de) 2010-02-25 2016-03-30 Sylvac S.A. Optische Messmethode und Messvorrichtung
CN102770737A (zh) * 2010-02-25 2012-11-07 特莎有限公司 光学测量设备
US8892398B2 (en) 2010-04-21 2014-11-18 Tesa Sa Optical measurement method and apparatus
JP7031559B2 (ja) * 2018-10-29 2022-03-08 オムロン株式会社 ネジ長判定システム、ネジ締めシステムおよびプログラム
CN110926354B (zh) * 2019-12-13 2021-07-20 芜湖市爱三迪电子科技有限公司 一种3d打印耗材生产用线材测径装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3749500A (en) * 1970-12-23 1973-07-31 Gen Electric Optical caliper and edge detector-follower for automatic gaging
US3734620A (en) * 1971-04-01 1973-05-22 Ibm Multiple band atomic absorption apparatus for simultaneously measuring different physical parameters of a material
US3737237A (en) * 1971-11-18 1973-06-05 Nasa Monitoring deposition of films
US3856412A (en) * 1973-06-08 1974-12-24 Zygo Corp Optical noncontacting gauge
DE2501015C2 (de) * 1975-01-13 1976-08-19 Siemens Ag Beruehrungsfreies Dickenmessverfahren
US4043673A (en) * 1975-04-09 1977-08-23 Autech Corporation Reticle calibrated diameter gauge
US4061427A (en) * 1976-10-15 1977-12-06 Nasa Laser extensometer
US4182259A (en) * 1978-10-04 1980-01-08 The Dow Chemical Company Apparatus for measuring coating thickness on an applicator roll
GB2058344B (en) * 1979-09-07 1984-01-25 Diffracto Ltd Electro-optical inspection of workpieces
JPS5654307A (en) * 1979-10-09 1981-05-14 Inoue Japax Res Inc Measuring instrument for work precision
US4490617A (en) * 1979-11-26 1984-12-25 European Electronic Systems Limited Optical width measuring system using two cameras
US4394683A (en) * 1980-06-26 1983-07-19 Diffracto Ltd. New photodetector array based optical measurement systems
US4498778A (en) * 1981-03-30 1985-02-12 Technical Arts Corporation High speed scanning method and apparatus
JPS58111705A (ja) * 1981-12-25 1983-07-02 Mitsutoyo Mfg Co Ltd 光学式測定装置
JPS60249006A (ja) * 1984-05-24 1985-12-09 Matsushita Electric Works Ltd イメ−ジセンサ装置
GB2180337A (en) * 1985-09-13 1987-03-25 Tesa Metrology Ltd Optical measurement apparatus
GB2180640A (en) * 1985-09-13 1987-04-01 Tesa Metrology Ltd Optical measurement apparatus
JPS62287109A (ja) * 1986-06-05 1987-12-14 Amao Seisakusho:Kk 位置決め付間隔測定装置

Also Published As

Publication number Publication date
DE69214340D1 (de) 1996-11-14
US5296914A (en) 1994-03-22
EP0507566A3 (en) 1993-04-21
DE69214340T2 (de) 1997-02-20
EP0507566A2 (de) 1992-10-07
GB9107037D0 (en) 1991-05-22
EP0507566B1 (de) 1996-10-09

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties