DE3575016D1 - Mikrodimensionsmessapparat. - Google Patents

Mikrodimensionsmessapparat.

Info

Publication number
DE3575016D1
DE3575016D1 DE8585301847T DE3575016T DE3575016D1 DE 3575016 D1 DE3575016 D1 DE 3575016D1 DE 8585301847 T DE8585301847 T DE 8585301847T DE 3575016 T DE3575016 T DE 3575016T DE 3575016 D1 DE3575016 D1 DE 3575016D1
Authority
DE
Germany
Prior art keywords
microdimension
measuring apparatus
measuring
microdimension measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585301847T
Other languages
English (en)
Inventor
Hiroo Fujita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Citizen Watch Co Ltd
Original Assignee
Citizen Watch Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Citizen Watch Co Ltd filed Critical Citizen Watch Co Ltd
Application granted granted Critical
Publication of DE3575016D1 publication Critical patent/DE3575016D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
DE8585301847T 1984-04-20 1985-03-15 Mikrodimensionsmessapparat. Expired - Fee Related DE3575016D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7977284A JPS60224001A (ja) 1984-04-20 1984-04-20 微小寸法測定装置

Publications (1)

Publication Number Publication Date
DE3575016D1 true DE3575016D1 (de) 1990-02-01

Family

ID=13699491

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585301847T Expired - Fee Related DE3575016D1 (de) 1984-04-20 1985-03-15 Mikrodimensionsmessapparat.

Country Status (3)

Country Link
EP (1) EP0159800B1 (de)
JP (1) JPS60224001A (de)
DE (1) DE3575016D1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6358826A (ja) * 1986-08-29 1988-03-14 Toshiba Corp 位置検出方法
CN111189395A (zh) * 2018-11-14 2020-05-22 苏州能讯高能半导体有限公司 底切结构测量系统和底切结构测量方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3907439A (en) * 1973-08-14 1975-09-23 Zygo Corp Edge-sensing with a scanning laser beam
FR2327513A1 (fr) * 1974-01-10 1977-05-06 Cilas Dispositif pour determiner le profil d'une surface
US4125317A (en) * 1977-11-26 1978-11-14 United Technologies Corporation Optical inspection system employing dual path pickup system with single spherical mirror
US4385837A (en) * 1978-05-22 1983-05-31 Irvine Optical Corporation Apparatus and system for linewidth measurements
JPS5587904A (en) * 1978-12-29 1980-07-03 Ibm Scanning type optical apparatus for micromeasurement
JPS5821505A (ja) * 1981-07-31 1983-02-08 Anritsu Corp 寸法測定装置
JPS58106415A (ja) * 1981-12-18 1983-06-24 Mitsutoyo Mfg Co Ltd デジタル表示型測定器

Also Published As

Publication number Publication date
JPH0574762B2 (de) 1993-10-19
JPS60224001A (ja) 1985-11-08
EP0159800A3 (en) 1987-05-27
EP0159800B1 (de) 1989-12-27
EP0159800A2 (de) 1985-10-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee