IT1314323B1 - Apparato e metodo non-distruttivo per rilevare l'orientazionemolecolare in films sottili - Google Patents

Apparato e metodo non-distruttivo per rilevare l'orientazionemolecolare in films sottili

Info

Publication number
IT1314323B1
IT1314323B1 IT1999MI002718A ITMI992718A IT1314323B1 IT 1314323 B1 IT1314323 B1 IT 1314323B1 IT 1999MI002718 A IT1999MI002718 A IT 1999MI002718A IT MI992718 A ITMI992718 A IT MI992718A IT 1314323 B1 IT1314323 B1 IT 1314323B1
Authority
IT
Italy
Prior art keywords
detect
thin films
molecular orientation
destructive method
destructive
Prior art date
Application number
IT1999MI002718A
Other languages
English (en)
Inventor
Michele Muccini
Carlo Taliani
Original Assignee
Consiglio Nazionale Ricerche
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Consiglio Nazionale Ricerche filed Critical Consiglio Nazionale Ricerche
Priority to IT1999MI002718A priority Critical patent/IT1314323B1/it
Publication of ITMI992718A0 publication Critical patent/ITMI992718A0/it
Priority to EP00991614A priority patent/EP1244924A2/en
Priority to PCT/EP2000/013023 priority patent/WO2001048515A2/en
Priority to AU33647/01A priority patent/AU3364701A/en
Priority to US09/741,353 priority patent/US6552791B2/en
Publication of ITMI992718A1 publication Critical patent/ITMI992718A1/it
Application granted granted Critical
Publication of IT1314323B1 publication Critical patent/IT1314323B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6495—Miscellaneous methods

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Mathematical Physics (AREA)
  • Electroluminescent Light Sources (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
IT1999MI002718A 1999-12-27 1999-12-27 Apparato e metodo non-distruttivo per rilevare l'orientazionemolecolare in films sottili IT1314323B1 (it)

Priority Applications (5)

Application Number Priority Date Filing Date Title
IT1999MI002718A IT1314323B1 (it) 1999-12-27 1999-12-27 Apparato e metodo non-distruttivo per rilevare l'orientazionemolecolare in films sottili
EP00991614A EP1244924A2 (en) 1999-12-27 2000-12-20 Nondestructive apparatus and method for detecting molecular orientation in thin films
PCT/EP2000/013023 WO2001048515A2 (en) 1999-12-27 2000-12-20 Nondestructive apparatus and method for detecting molecular orientation in thin films
AU33647/01A AU3364701A (en) 1999-12-27 2000-12-20 Nondestructive apparatus and method for detecting molecular orientation in thin films
US09/741,353 US6552791B2 (en) 1999-12-27 2000-12-21 Nondestructive apparatus and method for detecting molecular orientation in thin films

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT1999MI002718A IT1314323B1 (it) 1999-12-27 1999-12-27 Apparato e metodo non-distruttivo per rilevare l'orientazionemolecolare in films sottili

Publications (3)

Publication Number Publication Date
ITMI992718A0 ITMI992718A0 (it) 1999-12-27
ITMI992718A1 ITMI992718A1 (it) 2001-06-27
IT1314323B1 true IT1314323B1 (it) 2002-12-09

Family

ID=11384202

Family Applications (1)

Application Number Title Priority Date Filing Date
IT1999MI002718A IT1314323B1 (it) 1999-12-27 1999-12-27 Apparato e metodo non-distruttivo per rilevare l'orientazionemolecolare in films sottili

Country Status (5)

Country Link
US (1) US6552791B2 (it)
EP (1) EP1244924A2 (it)
AU (1) AU3364701A (it)
IT (1) IT1314323B1 (it)
WO (1) WO2001048515A2 (it)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6379413B1 (en) 1999-11-29 2002-04-30 Agroqualita' S.R.L, Micro granular fertilizer for the prevention and treatment of iron chlorosis
JP6765121B2 (ja) * 2017-05-01 2020-10-07 国立大学法人九州大学 配向指数の導出方法、コンピュータープログラムおよび装置
RU2658121C1 (ru) * 2017-05-10 2018-06-19 Федеральное государственное бюджетное учреждение науки Институт лазерной физики Сибирского отделения Российской академии наук Способ определения ориентации квантовых систем в кристаллах

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4264207A (en) * 1979-05-04 1981-04-28 Batyrev Ruslan I Method and apparatus for determining the quality of oriented polymeric materials
US4521111A (en) * 1982-07-23 1985-06-04 E. I. Du Pont De Nemours And Company Apparatus for measurement of molecular orientation
US4651011A (en) * 1985-06-03 1987-03-17 At&T Technologies, Inc. Non-destructive method for determining the extent of cure of a polymer
US5215883A (en) * 1990-07-09 1993-06-01 The Research Foundation Electrophoretic mobility of fluorophore labeled particles in gels by fluorophore movement after photobleaching
US5365067A (en) * 1993-06-30 1994-11-15 National Research Council Of Canada Method and device for evaluation of surface properties, especially molecular orientation, in non-transparent layers
KR0171637B1 (ko) * 1993-09-13 1999-03-20 사또오 후미오 배향막 평가 장치
US5598005A (en) * 1995-02-15 1997-01-28 The United States Of America As Represented By The Secretary Of The Commerce Non-destructive method for determining the extent of cure of a polymerizing material and the solidification of a thermoplastic polymer based on wavelength shift of fluroescence
US6151115A (en) * 1999-07-26 2000-11-21 Naulleau; Patrick Phase-shifting point diffraction interferometer focus-aid enhanced mask

Also Published As

Publication number Publication date
AU3364701A (en) 2001-07-09
US6552791B2 (en) 2003-04-22
WO2001048515A2 (en) 2001-07-05
WO2001048515A3 (en) 2002-06-06
US20010007500A1 (en) 2001-07-12
ITMI992718A1 (it) 2001-06-27
ITMI992718A0 (it) 1999-12-27
EP1244924A2 (en) 2002-10-02

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