DE69328079D1 - Winkelmessverfahren und -gerät - Google Patents

Winkelmessverfahren und -gerät

Info

Publication number
DE69328079D1
DE69328079D1 DE69328079T DE69328079T DE69328079D1 DE 69328079 D1 DE69328079 D1 DE 69328079D1 DE 69328079 T DE69328079 T DE 69328079T DE 69328079 T DE69328079 T DE 69328079T DE 69328079 D1 DE69328079 D1 DE 69328079D1
Authority
DE
Germany
Prior art keywords
measuring method
angle measuring
angle
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69328079T
Other languages
English (en)
Other versions
DE69328079T2 (de
Inventor
Satoshi Hirotsune
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Application granted granted Critical
Publication of DE69328079D1 publication Critical patent/DE69328079D1/de
Publication of DE69328079T2 publication Critical patent/DE69328079T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N9/00—Details of colour television systems
    • H04N9/12—Picture reproducers
    • H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
    • H04N9/3179—Video signal processing therefor
    • H04N9/3185—Geometric adjustment, e.g. keystone or convergence

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Electric Information Into Light Information (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Projection Apparatus (AREA)
  • Closed-Circuit Television Systems (AREA)
DE69328079T 1993-01-19 1993-12-21 Winkelmessverfahren und -gerät Expired - Fee Related DE69328079T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5006400A JPH06217310A (ja) 1993-01-19 1993-01-19 角度測定方法および角度測定装置

Publications (2)

Publication Number Publication Date
DE69328079D1 true DE69328079D1 (de) 2000-04-20
DE69328079T2 DE69328079T2 (de) 2000-11-23

Family

ID=11637321

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69328079T Expired - Fee Related DE69328079T2 (de) 1993-01-19 1993-12-21 Winkelmessverfahren und -gerät

Country Status (4)

Country Link
US (1) US5471295A (de)
EP (1) EP0607596B1 (de)
JP (1) JPH06217310A (de)
DE (1) DE69328079T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200632415A (en) * 2005-03-08 2006-09-16 Quanta Display Inc Method for detecting a cell gap of a LCD panel and equipment thereof
JP4826608B2 (ja) * 2008-08-06 2011-11-30 カシオ計算機株式会社 プロジェクタ及びプログラム
US9264627B2 (en) * 2012-01-09 2016-02-16 Lifetouch Inc. Video photography system
JP6237018B2 (ja) * 2013-09-11 2017-11-29 セイコーエプソン株式会社 プロジェクター及びその制御方法
US9298072B2 (en) * 2012-12-19 2016-03-29 Seiko Epson Corporation Projector having inclination detection section for detecting inclination of projector enclosure and method for controlling the same
JPWO2015068585A1 (ja) * 2013-11-07 2017-03-09 ダイセル・エボニック株式会社 封止部材、この封止部材で封止された封止基板及びその製造方法
JP2023027523A (ja) * 2021-08-17 2023-03-02 セイコーエプソン株式会社 表示方法、表示システム、及び表示装置
CN114518080A (zh) * 2022-02-17 2022-05-20 上海复诺视觉智能科技有限公司 一种测试设备与待测屏幕垂直度矫正装置及矫正方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4721386A (en) * 1986-07-18 1988-01-26 Barnes Engineering Company Three-axis angular monitoring system
JPH043042A (ja) * 1990-04-19 1992-01-08 Ricoh Co Ltd 画像投影方法および画像投影装置
JP2653899B2 (ja) * 1990-06-07 1997-09-17 松下電器産業株式会社 画像補正装置
JPH0442679A (ja) * 1990-06-08 1992-02-13 Sony Corp 投射型表示装置
JP2925777B2 (ja) * 1991-04-23 1999-07-28 三洋電機株式会社 液晶プロジェクタの歪み補正回路

Also Published As

Publication number Publication date
EP0607596A3 (de) 1995-03-29
DE69328079T2 (de) 2000-11-23
JPH06217310A (ja) 1994-08-05
EP0607596B1 (de) 2000-03-15
EP0607596A2 (de) 1994-07-27
US5471295A (en) 1995-11-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee