DE69431614D1 - Magnetfeldmessverfahren und -vorrichtung - Google Patents

Magnetfeldmessverfahren und -vorrichtung

Info

Publication number
DE69431614D1
DE69431614D1 DE69431614T DE69431614T DE69431614D1 DE 69431614 D1 DE69431614 D1 DE 69431614D1 DE 69431614 T DE69431614 T DE 69431614T DE 69431614 T DE69431614 T DE 69431614T DE 69431614 D1 DE69431614 D1 DE 69431614D1
Authority
DE
Germany
Prior art keywords
magnetic field
measuring method
field measuring
magnetic
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69431614T
Other languages
English (en)
Other versions
DE69431614T2 (de
Inventor
Masakatsu Senda
Osamu Ishii
Yasuhiro Koshimoto
Tomoyuki Toshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP5210052A external-priority patent/JPH0763832A/ja
Priority claimed from JP30154493A external-priority patent/JPH07153032A/ja
Priority claimed from JP7669494A external-priority patent/JPH07262523A/ja
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Publication of DE69431614D1 publication Critical patent/DE69431614D1/de
Application granted granted Critical
Publication of DE69431614T2 publication Critical patent/DE69431614T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/332—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using thin films

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
DE69431614T 1993-08-25 1994-08-24 Magnetfeldmessverfahren und -vorrichtung Expired - Fee Related DE69431614T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP5210052A JPH0763832A (ja) 1993-08-25 1993-08-25 磁気センサおよび磁界検出方法
JP30154493A JPH07153032A (ja) 1993-12-01 1993-12-01 磁気ヘッド及び磁気記録再生方法
JP7669494A JPH07262523A (ja) 1994-03-22 1994-03-22 磁気ヘッド

Publications (2)

Publication Number Publication Date
DE69431614D1 true DE69431614D1 (de) 2002-12-05
DE69431614T2 DE69431614T2 (de) 2003-06-12

Family

ID=27302220

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69431614T Expired - Fee Related DE69431614T2 (de) 1993-08-25 1994-08-24 Magnetfeldmessverfahren und -vorrichtung

Country Status (3)

Country Link
US (3) US5734267A (de)
EP (1) EP0640840B1 (de)
DE (1) DE69431614T2 (de)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5889403A (en) * 1995-03-31 1999-03-30 Canon Denshi Kabushiki Kaisha Magnetic detecting element utilizing magnetic impedance effect
JP3091398B2 (ja) * 1995-09-14 2000-09-25 科学技術振興事業団 磁気−インピーダンス素子及びその製造方法
JPH09320224A (ja) * 1996-06-04 1997-12-12 Matsushita Electric Ind Co Ltd 磁気ヘッドユニット、その製造方法並びに磁気記録再生装置
JP3091413B2 (ja) * 1996-06-11 2000-09-25 科学技術振興事業団 磁気センサ
US6069475A (en) * 1996-09-17 2000-05-30 Tokin Corporation Magnetic sensor utilizing impedance variation of a soft magnetic element in dependence upon a magnetic field strength and a method of manufacturing the same
KR100481497B1 (ko) * 1996-09-17 2005-05-16 엔이씨 도낀 가부시끼가이샤 자계세기에따른연성자기엘리먼트의임피던스변화를이용하는자기센서및그제조방법
JP3157770B2 (ja) * 1997-09-17 2001-04-16 アルプス電気株式会社 薄膜磁気ヘッド
US6188549B1 (en) * 1997-12-10 2001-02-13 Read-Rite Corporation Magnetoresistive read/write head with high-performance gap layers
EP1045375A3 (de) * 1999-04-15 2006-03-08 Matsushita Electric Industrial Co., Ltd. Magnetwiedergabevorrichtung, Magnetkopf unter Verwendung dieser Vorrichtung und dessen Herstellungsverfahren
US6538843B1 (en) * 1999-11-09 2003-03-25 Matsushita Electric Industrial Co., Ltd. Magnetic head
WO2001043122A2 (en) 1999-12-10 2001-06-14 Seagate Technology Llc Magnetic disc having physical servo patterns with a magnetic carrier, and method of making and using the same
US20030060765A1 (en) * 2000-02-16 2003-03-27 Arthur Campbell Infusion device menu structure and method of using the same
JP2002056510A (ja) * 2000-08-07 2002-02-22 Matsushita Electric Ind Co Ltd シールド型磁気ヘッド並びに磁気再生装置
EP1408562A4 (de) * 2001-07-19 2009-12-23 Panasonic Corp Magnetsensor und verfahren zu seiner herstellung
US7196514B2 (en) * 2002-01-15 2007-03-27 National University Of Singapore Multi-conductive ferromagnetic core, variable permeability field sensor and method
US6853186B2 (en) 2002-01-15 2005-02-08 National University Of Singapore Variable permeability magnetic field sensor and method
US7365408B2 (en) * 2002-04-30 2008-04-29 International Business Machines Corporation Structure for photolithographic applications using a multi-layer anti-reflection coating
KR100487611B1 (ko) * 2002-07-24 2005-05-24 (주) 아모센스 박막형 자계센서 제조방법
EP1733245B1 (de) * 2004-03-29 2008-05-14 Koninklijke Philips Electronics N.V. System zur magnetresonanzabbildung
DE102006034579A1 (de) * 2006-07-26 2008-01-31 Siemens Ag Stromerfassungsvorrichtung und Verfahren zur Stromerfassung
US8416076B2 (en) * 2008-04-02 2013-04-09 The Trustees Of Dartmouth College Magnetic proximity sensor system and associated methods of sensing a magnetic field
US20090262636A1 (en) * 2008-04-18 2009-10-22 Seagate Technology Llc Wire-assisted magnetic write device including multiple wire assist conductors
US8432644B2 (en) * 2009-06-25 2013-04-30 HGST Netherlands B.V. Spin torque oscillator sensor enhanced by magnetic anisotropy
US8259409B2 (en) * 2009-06-25 2012-09-04 Hitachi Global Storage Technologies Netherlands B.V. Spin torque oscillator sensor
GB201118994D0 (en) * 2010-11-18 2011-12-14 Xyratex Tech Ltd A method and device for mapping the magnetic field or magnetic field sensitivity of a recording head
US20180001269A1 (en) * 2016-06-30 2018-01-04 L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude Metallopolyimide precursor fibers for aging-resistant carbon molecular sieve hollow fiber membranes with enhanced selectivity
CN113036379B (zh) * 2021-03-17 2022-06-14 成都挚信电子技术有限责任公司 一种压控磁性阻抗变换器
CN113341351A (zh) * 2021-06-08 2021-09-03 广东技术师范大学 全向磁感应强度测试仪器标定与时频测试方法及装置
JP2023002228A (ja) * 2021-06-22 2023-01-10 昭和電工株式会社 情報処理装置および磁気センサシステム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3421075A (en) * 1966-05-27 1969-01-07 Us Navy Thin film magnetometer using thin film coated conductors
US3703681A (en) * 1971-05-14 1972-11-21 Honeywell Inc Thin film line sensor for measuring magnetic fields, pressure, vibration or physical displacement
DE3032708C2 (de) * 1980-08-30 1987-01-22 Philips Patentverwaltung Gmbh, 2000 Hamburg Verfahren zur Herstellung eines Dünnschicht-Magnetfeld-Sensors
JPH06103521B2 (ja) * 1983-07-29 1994-12-14 株式会社東芝 磁気的再生装置
US4635152A (en) * 1983-07-29 1987-01-06 Kabushiki Kaisha Toshiba Magnetic resonance-type playback apparatus including a magnetic material having magnetic anisotropy
JPH01184709A (ja) * 1988-01-20 1989-07-24 Toshiba Corp 薄膜磁気ヘッド
JPH04102215A (ja) * 1990-08-21 1992-04-03 Sony Corp 磁気ヘッド
JP3082377B2 (ja) * 1991-02-28 2000-08-28 ソニー株式会社 分布定数回路型磁界検出装置
JP2692719B2 (ja) * 1992-01-09 1997-12-17 日本電信電話株式会社 磁気抵抗効果型磁気ヘッド
JP3765514B2 (ja) * 1997-09-04 2006-04-12 株式会社リコー 転写シート及びそれを用いた転写画像形成方法

Also Published As

Publication number Publication date
EP0640840A2 (de) 1995-03-01
EP0640840B1 (de) 2002-10-30
DE69431614T2 (de) 2003-06-12
US5734267A (en) 1998-03-31
EP0640840A3 (de) 1996-04-17
US5811971A (en) 1998-09-22
US5705926A (en) 1998-01-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee