KR20240046516A - 연마 장치 - Google Patents
연마 장치 Download PDFInfo
- Publication number
- KR20240046516A KR20240046516A KR1020247005887A KR20247005887A KR20240046516A KR 20240046516 A KR20240046516 A KR 20240046516A KR 1020247005887 A KR1020247005887 A KR 1020247005887A KR 20247005887 A KR20247005887 A KR 20247005887A KR 20240046516 A KR20240046516 A KR 20240046516A
- Authority
- KR
- South Korea
- Prior art keywords
- polishing
- substrate
- infrared radiation
- polishing pad
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/14—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the temperature during grinding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/06—Dust extraction equipment on grinding or polishing machines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- H01L21/304—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2021-136064 | 2021-08-24 | ||
| JP2021136064A JP2023030756A (ja) | 2021-08-24 | 2021-08-24 | 研磨装置 |
| PCT/JP2022/027983 WO2023026723A1 (ja) | 2021-08-24 | 2022-07-19 | 研磨装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20240046516A true KR20240046516A (ko) | 2024-04-09 |
Family
ID=85322987
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020247005887A Ceased KR20240046516A (ko) | 2021-08-24 | 2022-07-19 | 연마 장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20260115856A1 (https=) |
| JP (1) | JP2023030756A (https=) |
| KR (1) | KR20240046516A (https=) |
| WO (1) | WO2023026723A1 (https=) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019084614A (ja) | 2017-11-06 | 2019-06-06 | 株式会社荏原製作所 | 研磨方法および研磨装置 |
| JP2020110859A (ja) | 2019-01-10 | 2020-07-27 | 株式会社荏原製作所 | 研磨装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001009699A (ja) * | 1999-07-05 | 2001-01-16 | Nichiden Mach Ltd | 平面研磨装置 |
| JP2004106174A (ja) * | 2002-08-30 | 2004-04-08 | Toray Ind Inc | 研磨パッド、定盤ホールカバー及び研磨装置並びに研磨方法及び半導体デバイスの製造方法 |
| JP2008145133A (ja) * | 2006-12-06 | 2008-06-26 | Horiba Ltd | 放射温度計 |
| JP2009060044A (ja) * | 2007-09-03 | 2009-03-19 | Tokyo Seimitsu Co Ltd | Cmp装置の研磨モニタ窓 |
| JP2009224384A (ja) * | 2008-03-13 | 2009-10-01 | Toyo Tire & Rubber Co Ltd | 研磨パッド及び半導体デバイスの製造方法 |
| KR102626038B1 (ko) * | 2016-11-16 | 2024-01-17 | 주식회사 케이씨텍 | 화학 기계적 연마장치 |
-
2021
- 2021-08-24 JP JP2021136064A patent/JP2023030756A/ja not_active Ceased
-
2022
- 2022-07-19 US US18/684,739 patent/US20260115856A1/en active Pending
- 2022-07-19 KR KR1020247005887A patent/KR20240046516A/ko not_active Ceased
- 2022-07-19 WO PCT/JP2022/027983 patent/WO2023026723A1/ja not_active Ceased
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019084614A (ja) | 2017-11-06 | 2019-06-06 | 株式会社荏原製作所 | 研磨方法および研磨装置 |
| JP2020110859A (ja) | 2019-01-10 | 2020-07-27 | 株式会社荏原製作所 | 研磨装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20260115856A1 (en) | 2026-04-30 |
| WO2023026723A1 (ja) | 2023-03-02 |
| JP2023030756A (ja) | 2023-03-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| D21 | Rejection of application intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D21-EXM-PE0902 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| B15 | Application refused following examination |
Free format text: ST27 STATUS EVENT CODE: N-2-6-B10-B15-EXM-PE0601 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |