KR20190098142A - 연마용 조성물 - Google Patents
연마용 조성물 Download PDFInfo
- Publication number
- KR20190098142A KR20190098142A KR1020197017169A KR20197017169A KR20190098142A KR 20190098142 A KR20190098142 A KR 20190098142A KR 1020197017169 A KR1020197017169 A KR 1020197017169A KR 20197017169 A KR20197017169 A KR 20197017169A KR 20190098142 A KR20190098142 A KR 20190098142A
- Authority
- KR
- South Korea
- Prior art keywords
- water
- polishing
- polishing composition
- soluble polymers
- soluble polymer
- Prior art date
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016255099 | 2016-12-28 | ||
JPJP-P-2016-255099 | 2016-12-28 | ||
PCT/JP2017/047089 WO2018124230A1 (ja) | 2016-12-28 | 2017-12-27 | 研磨用組成物 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20190098142A true KR20190098142A (ko) | 2019-08-21 |
Family
ID=62709419
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020197017169A KR20190098142A (ko) | 2016-12-28 | 2017-12-27 | 연마용 조성물 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7077236B2 (zh) |
KR (1) | KR20190098142A (zh) |
CN (1) | CN110036086B (zh) |
TW (1) | TWI755467B (zh) |
WO (1) | WO2018124230A1 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020035870A (ja) * | 2018-08-29 | 2020-03-05 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
CN111378379B (zh) * | 2018-12-29 | 2022-08-05 | 安集微电子(上海)有限公司 | 一种化学机械抛光液及其应用 |
JP7433042B2 (ja) * | 2019-12-24 | 2024-02-19 | ニッタ・デュポン株式会社 | 研磨用組成物 |
JP2022155523A (ja) | 2021-03-30 | 2022-10-13 | 株式会社フジミインコーポレーテッド | 研磨用組成物、及び窒化ケイ素を選択的に除去する方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7524347B2 (en) * | 2004-10-28 | 2009-04-28 | Cabot Microelectronics Corporation | CMP composition comprising surfactant |
FR2917440B1 (fr) * | 2007-06-12 | 2010-09-24 | Comptoir Hydro Electro Thermiq | Cabine modulaire pour fumeurs et espaces fumeurs modulables resultant de l'assemblage de telles cabines. |
DE112008002628B4 (de) | 2007-09-28 | 2018-07-19 | Nitta Haas Inc. | Polierzusammensetzung |
JP5371416B2 (ja) | 2008-12-25 | 2013-12-18 | 富士フイルム株式会社 | 研磨液及び研磨方法 |
JP2015205348A (ja) | 2012-08-30 | 2015-11-19 | 日立化成株式会社 | 研磨剤、研磨剤セット及び基体の研磨方法 |
US9505950B2 (en) * | 2012-08-31 | 2016-11-29 | Fujimi Incorporated | Polishing composition and method for producing substrate |
EP2826827B1 (en) | 2013-07-18 | 2019-06-12 | Basf Se | CMP composition comprising abrasive particles containing ceria |
JP6559936B2 (ja) * | 2014-09-05 | 2019-08-14 | 日本キャボット・マイクロエレクトロニクス株式会社 | スラリー組成物、リンス組成物、基板研磨方法およびリンス方法 |
-
2017
- 2017-12-27 JP JP2018559610A patent/JP7077236B2/ja active Active
- 2017-12-27 CN CN201780075054.6A patent/CN110036086B/zh active Active
- 2017-12-27 KR KR1020197017169A patent/KR20190098142A/ko not_active Application Discontinuation
- 2017-12-27 WO PCT/JP2017/047089 patent/WO2018124230A1/ja active Application Filing
- 2017-12-28 TW TW106146202A patent/TWI755467B/zh active
Also Published As
Publication number | Publication date |
---|---|
CN110036086B (zh) | 2022-04-26 |
CN110036086A (zh) | 2019-07-19 |
TW201829717A (zh) | 2018-08-16 |
JP7077236B2 (ja) | 2022-05-30 |
WO2018124230A1 (ja) | 2018-07-05 |
TWI755467B (zh) | 2022-02-21 |
JPWO2018124230A1 (ja) | 2019-10-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR20190098142A (ko) | 연마용 조성물 | |
JP5781287B2 (ja) | 研磨組成物 | |
KR102524838B1 (ko) | 슬러리 조성물, 린스 조성물, 기판 연마 방법 및 린스 방법 | |
KR102508180B1 (ko) | 연마용 조성물 및 연마 방법 | |
WO2017069202A1 (ja) | 研磨用組成物 | |
JP6856535B2 (ja) | 研磨用組成物 | |
CN111527589A (zh) | 研磨用组合物 | |
KR20110099627A (ko) | 연마용 조성물 및 그것을 사용한 연마 방법 | |
JP2016124943A (ja) | 研磨用組成物 | |
JP2015174938A (ja) | スラリー組成物および基板研磨方法 | |
KR20140019327A (ko) | 연마용 조성물 및 그것을 이용한 연마 방법 | |
WO2010005103A1 (ja) | 研磨組成物 | |
JP7002354B2 (ja) | 研磨用組成物 | |
JP7166819B2 (ja) | 化学機械研磨組成物、リンス組成物、化学機械研磨方法及びリンス方法 | |
KR102508181B1 (ko) | 연마용 조성물 및 연마 방법 | |
JP7157651B2 (ja) | 研磨用組成物 | |
JP6360694B2 (ja) | 研磨用組成物 | |
CN111512419A (zh) | 研磨用组合物 | |
CN112400005B (zh) | 研磨用组合物 | |
EP4074792A1 (en) | Chemical-mechanical polishing composition and chemical-mechanical polishing method in which same is used | |
TW202240683A (zh) | 研磨用組合物及矽晶圓之研磨方法 | |
JP2021100085A (ja) | 研磨用組成物 | |
TW202033689A (zh) | 研磨用組合物 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application | ||
J201 | Request for trial against refusal decision |