KR20160108423A - 3-위상 시그널링을 위한 아날로그 거동 모델링 - Google Patents

3-위상 시그널링을 위한 아날로그 거동 모델링 Download PDF

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Publication number
KR20160108423A
KR20160108423A KR1020167021576A KR20167021576A KR20160108423A KR 20160108423 A KR20160108423 A KR 20160108423A KR 1020167021576 A KR1020167021576 A KR 1020167021576A KR 20167021576 A KR20167021576 A KR 20167021576A KR 20160108423 A KR20160108423 A KR 20160108423A
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KR
South Korea
Prior art keywords
voltage level
state
voltage
physical connection
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020167021576A
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English (en)
Korean (ko)
Inventor
샹 리
나쿨 미다
바룬 라다크리쉬난
철규 이
Original Assignee
퀄컴 인코포레이티드
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Application filed by 퀄컴 인코포레이티드 filed Critical 퀄컴 인코포레이티드
Publication of KR20160108423A publication Critical patent/KR20160108423A/ko
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G01R31/2848—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms using simulation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
    • H04L25/0264—Arrangements for coupling to transmission lines
    • H04L25/0272—Arrangements for coupling to multiple lines, e.g. for differential transmission
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/38—Synchronous or start-stop systems, e.g. for Baudot code
    • H04L25/40—Transmitting circuits; Receiving circuits
    • H04L25/49—Transmitting circuits; Receiving circuits using code conversion at the transmitter; using predistortion; using insertion of idle bits for obtaining a desired frequency spectrum; using three or more amplitude levels ; Baseband coding techniques specific to data transmission systems
    • H04L25/4917—Transmitting circuits; Receiving circuits using code conversion at the transmitter; using predistortion; using insertion of idle bits for obtaining a desired frequency spectrum; using three or more amplitude levels ; Baseband coding techniques specific to data transmission systems using multilevel codes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/02—Constructional features of telephone sets
    • H04M1/0202—Portable telephone sets, e.g. cordless phones, mobile phones or bar type handsets
    • H04M1/026—Details of the structure or mounting of specific components
    • H04M1/0266—Details of the structure or mounting of specific components for a display module assembly

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  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Dc Digital Transmission (AREA)
KR1020167021576A 2014-01-15 2015-01-13 3-위상 시그널링을 위한 아날로그 거동 모델링 Withdrawn KR20160108423A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/156,329 2014-01-15
US14/156,329 US9961174B2 (en) 2014-01-15 2014-01-15 Analog behavior modeling for 3-phase signaling
PCT/US2015/011142 WO2015108847A1 (en) 2014-01-15 2015-01-13 Analog behavior modeling for 3-phase signaling

Publications (1)

Publication Number Publication Date
KR20160108423A true KR20160108423A (ko) 2016-09-19

Family

ID=52450578

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167021576A Withdrawn KR20160108423A (ko) 2014-01-15 2015-01-13 3-위상 시그널링을 위한 아날로그 거동 모델링

Country Status (6)

Country Link
US (2) US9961174B2 (enExample)
EP (1) EP3095218A1 (enExample)
JP (1) JP2017507556A (enExample)
KR (1) KR20160108423A (enExample)
CN (1) CN106416159B (enExample)
WO (1) WO2015108847A1 (enExample)

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US10705894B2 (en) 2016-05-30 2020-07-07 Samsung Electronics Co., Ltd. Electronic device for authenticating application and operating method thereof
US10419246B2 (en) * 2016-08-31 2019-09-17 Qualcomm Incorporated C-PHY training pattern for adaptive equalization, adaptive edge tracking and delay calibration
KR102784755B1 (ko) 2016-11-29 2025-03-24 삼성전자주식회사 통신 환경에 의존하여 지연을 조절하는 전자 회로
US11748539B1 (en) * 2017-09-28 2023-09-05 Cadence Design Systems, Inc. Converting analog variable delay in real number modeling code to cycle-driven simulation interface code
US11442098B2 (en) * 2019-06-20 2022-09-13 Teradyne, Inc. Generating a waveform based on digital pulses
AU2020317375A1 (en) * 2019-07-25 2022-02-17 Augmented Haptics Ltd System for simulating physical systems of interconnected elements
US11108604B2 (en) * 2019-08-19 2021-08-31 Qualcomm Incorporated Driver architecture for multiphase and amplitude encoding transmitters
KR102808517B1 (ko) * 2020-01-08 2025-05-19 삼성전자주식회사 외부 신호에 기초하여, 전력 모드의 변경을 감지하는 전자 장치
US11757611B2 (en) 2021-04-11 2023-09-12 Litrinium, Inc. PAM4 threshold phase engine

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US5452231A (en) 1988-10-05 1995-09-19 Quickturn Design Systems, Inc. Hierarchically connected reconfigurable logic assembly
US6675328B1 (en) * 1999-10-08 2004-01-06 Vigilant Networks, Llc System and method to determine data throughput in a communication network
US6980644B1 (en) * 2000-05-12 2005-12-27 National Semiconductor Corporation System and method for adapting an analog echo canceller in a transceiver front end
US6725404B1 (en) * 2000-05-26 2004-04-20 International Business Machines Corporation Evaluation of interconnect reliability using propagation delay through interconnect
US6760882B1 (en) * 2000-09-19 2004-07-06 Intel Corporation Mode selection for data transmission in wireless communication channels based on statistical parameters
US7145411B1 (en) * 2002-03-18 2006-12-05 Applied Micro Circuits Corporation Flexible differential interconnect cable with isolated high frequency electrical transmission line
JP4604627B2 (ja) * 2004-09-22 2011-01-05 ソニー株式会社 エンコーダ装置およびデコーダ装置
JP4610380B2 (ja) * 2005-03-16 2011-01-12 三菱電機株式会社 電力変換装置
US20070099586A1 (en) * 2005-11-01 2007-05-03 Silicon Laboratories Inc. System and method for reducing spurious emissions in a wireless communication device including a testing apparatus
US20070129926A1 (en) 2005-12-01 2007-06-07 Verheyen Henry T Hardware acceleration system for simulation of logic and memory
US20120191440A1 (en) 2011-01-25 2012-07-26 Power Analytics Corporation Systems and methods for real-time dc microgrid power analytics for mission-critical power systems
EP1936773A1 (en) * 2006-12-22 2008-06-25 Abb Research Ltd. System and method to detect a forgotten safety ground of an electrical facility
US9711041B2 (en) * 2012-03-16 2017-07-18 Qualcomm Incorporated N-phase polarity data transfer
US7492287B2 (en) * 2007-05-23 2009-02-17 Micron Technology, Inc. Two-bit tri-level forced transition encoding
US8848810B2 (en) * 2008-03-05 2014-09-30 Qualcomm Incorporated Multiple transmitter system and method
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US8352793B2 (en) * 2008-08-15 2013-01-08 Apple Inc. Device testing method and architecture
US9638742B2 (en) 2008-11-14 2017-05-02 Teradyne, Inc. Method and apparatus for testing electrical connections on a printed circuit board
US7978110B2 (en) * 2009-05-11 2011-07-12 Taiwan Semiconductor Manufacturing Company, Ltd. Digital-to-analog converter
KR20110052205A (ko) * 2009-11-12 2011-05-18 삼성전자주식회사 외부 루프백 테스트 기능을 갖는 전송 전용 집적회로 칩 및 그에 따른 외부 루프백 테스트 방법
EP2509314B1 (en) * 2011-04-04 2019-12-04 Interlemo Holding S.A. Installation for conveying signals between a video camera equipment and a remote equipment
CN202403774U (zh) 2011-12-29 2012-08-29 兰州海默科技股份有限公司 多相流模拟实验信号发生装置
US8996740B2 (en) * 2012-06-29 2015-03-31 Qualcomm Incorporated N-phase polarity output pin mode multiplexer
US9317353B2 (en) * 2013-12-26 2016-04-19 Intel Corporation Method, apparatus and system for performing voltage margining

Also Published As

Publication number Publication date
EP3095218A1 (en) 2016-11-23
JP2017507556A (ja) 2017-03-16
US20150201052A1 (en) 2015-07-16
US9961174B2 (en) 2018-05-01
WO2015108847A1 (en) 2015-07-23
CN106416159B (zh) 2020-03-03
US20180115637A1 (en) 2018-04-26
CN106416159A (zh) 2017-02-15

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Date Code Title Description
PA0105 International application

Patent event date: 20160805

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid