JP2017507556A - ３相シグナリングのためのアナログビヘイビアモデリング - Google Patents

３相シグナリングのためのアナログビヘイビアモデリング Download PDF

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Publication number
JP2017507556A
JP2017507556A JP2016546088A JP2016546088A JP2017507556A JP 2017507556 A JP2017507556 A JP 2017507556A JP 2016546088 A JP2016546088 A JP 2016546088A JP 2016546088 A JP2016546088 A JP 2016546088A JP 2017507556 A JP2017507556 A JP 2017507556A
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Japan
Prior art keywords
voltage level
state
voltage
physical connection
signal
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JP2016546088A
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English (en)
Japanese (ja)
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JP2017507556A5 (enExample
Inventor
シアン・リ
ナクル・ミダ
ヴァルン・ラダクリシュナン
チュルキュ・リー
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クアルコム，インコーポレイテッド
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Publication of JP2017507556A publication Critical patent/JP2017507556A/ja
Publication of JP2017507556A5 publication Critical patent/JP2017507556A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/02—Constructional features of telephone sets
    • H04M1/0202—Portable telephone sets, e.g. cordless phones, mobile phones or bar type handsets
    • H04M1/026—Details of the structure or mounting of specific components
    • H04M1/0266—Details of the structure or mounting of specific components for a display module assembly
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
    • H04L25/0264—Arrangements for coupling to transmission lines
    • H04L25/0272—Arrangements for coupling to multiple lines, e.g. for differential transmission
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/38—Synchronous or start-stop systems, e.g. for Baudot code
    • H04L25/40—Transmitting circuits; Receiving circuits
    • H04L25/49—Transmitting circuits; Receiving circuits using code conversion at the transmitter; using predistortion; using insertion of idle bits for obtaining a desired frequency spectrum; using three or more amplitude levels ; Baseband coding techniques specific to data transmission systems
    • H04L25/4917—Transmitting circuits; Receiving circuits using code conversion at the transmitter; using predistortion; using insertion of idle bits for obtaining a desired frequency spectrum; using three or more amplitude levels ; Baseband coding techniques specific to data transmission systems using multilevel codes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G01R31/2848—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms using simulation

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  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Dc Digital Transmission (AREA)
JP2016546088A 2014-01-15 2015-01-13 ３相シグナリングのためのアナログビヘイビアモデリング Pending JP2017507556A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/156,329 2014-01-15
US14/156,329 US9961174B2 (en) 2014-01-15 2014-01-15 Analog behavior modeling for 3-phase signaling
PCT/US2015/011142 WO2015108847A1 (en) 2014-01-15 2015-01-13 Analog behavior modeling for 3-phase signaling

Publications (2)

Publication Number Publication Date
JP2017507556A true JP2017507556A (ja) 2017-03-16
JP2017507556A5 JP2017507556A5 (enExample) 2018-02-08

Family

ID=52450578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016546088A Pending JP2017507556A (ja) 2014-01-15 2015-01-13 ３相シグナリングのためのアナログビヘイビアモデリング

Country Status (6)

Country Link
US (2) US9961174B2 (enExample)
EP (1) EP3095218A1 (enExample)
JP (1) JP2017507556A (enExample)
KR (1) KR20160108423A (enExample)
CN (1) CN106416159B (enExample)
WO (1) WO2015108847A1 (enExample)

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US9584227B2 (en) * 2015-07-17 2017-02-28 Qualcomm Incorporated Low-power mode signal bridge for optical media
WO2017159074A1 (ja) * 2016-03-14 2017-09-21 ソニー株式会社 送信装置、送信方法、および通信システム
US10705894B2 (en) 2016-05-30 2020-07-07 Samsung Electronics Co., Ltd. Electronic device for authenticating application and operating method thereof
US10419246B2 (en) * 2016-08-31 2019-09-17 Qualcomm Incorporated C-PHY training pattern for adaptive equalization, adaptive edge tracking and delay calibration
KR102784755B1 (ko) 2016-11-29 2025-03-24 삼성전자주식회사 통신 환경에 의존하여 지연을 조절하는 전자 회로
US11748539B1 (en) * 2017-09-28 2023-09-05 Cadence Design Systems, Inc. Converting analog variable delay in real number modeling code to cycle-driven simulation interface code
US11442098B2 (en) * 2019-06-20 2022-09-13 Teradyne, Inc. Generating a waveform based on digital pulses
AU2020317375A1 (en) * 2019-07-25 2022-02-17 Augmented Haptics Ltd System for simulating physical systems of interconnected elements
US11108604B2 (en) * 2019-08-19 2021-08-31 Qualcomm Incorporated Driver architecture for multiphase and amplitude encoding transmitters
KR102808517B1 (ko) * 2020-01-08 2025-05-19 삼성전자주식회사 외부 신호에 기초하여, 전력 모드의 변경을 감지하는 전자 장치
US11757611B2 (en) 2021-04-11 2023-09-12 Litrinium, Inc. PAM4 threshold phase engine

Citations (4)

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JP2006093988A (ja) * 2004-09-22 2006-04-06 Sony Corp エンコーダ装置およびデコーダ装置
JP2010021789A (ja) * 2008-07-10 2010-01-28 Toshiba Corp スキュー故障検出回路およびスキュー故障検出方法
JP2011517159A (ja) * 2008-03-05 2011-05-26 クゥアルコム・インコーポレイテッド 多元送信機システム及び方法
WO2014005117A1 (en) * 2012-06-29 2014-01-03 Qualcomm Incorporated N-phase polarity output pin mode multiplexer

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US5452231A (en) 1988-10-05 1995-09-19 Quickturn Design Systems, Inc. Hierarchically connected reconfigurable logic assembly
US6675328B1 (en) * 1999-10-08 2004-01-06 Vigilant Networks, Llc System and method to determine data throughput in a communication network
US6980644B1 (en) * 2000-05-12 2005-12-27 National Semiconductor Corporation System and method for adapting an analog echo canceller in a transceiver front end
US6725404B1 (en) * 2000-05-26 2004-04-20 International Business Machines Corporation Evaluation of interconnect reliability using propagation delay through interconnect
US6760882B1 (en) * 2000-09-19 2004-07-06 Intel Corporation Mode selection for data transmission in wireless communication channels based on statistical parameters
US7145411B1 (en) * 2002-03-18 2006-12-05 Applied Micro Circuits Corporation Flexible differential interconnect cable with isolated high frequency electrical transmission line
JP4610380B2 (ja) * 2005-03-16 2011-01-12 三菱電機株式会社 電力変換装置
US20070099586A1 (en) * 2005-11-01 2007-05-03 Silicon Laboratories Inc. System and method for reducing spurious emissions in a wireless communication device including a testing apparatus
US20070129926A1 (en) 2005-12-01 2007-06-07 Verheyen Henry T Hardware acceleration system for simulation of logic and memory
US20120191440A1 (en) 2011-01-25 2012-07-26 Power Analytics Corporation Systems and methods for real-time dc microgrid power analytics for mission-critical power systems
EP1936773A1 (en) * 2006-12-22 2008-06-25 Abb Research Ltd. System and method to detect a forgotten safety ground of an electrical facility
US9711041B2 (en) * 2012-03-16 2017-07-18 Qualcomm Incorporated N-phase polarity data transfer
US7492287B2 (en) * 2007-05-23 2009-02-17 Micron Technology, Inc. Two-bit tri-level forced transition encoding
US8352793B2 (en) * 2008-08-15 2013-01-08 Apple Inc. Device testing method and architecture
US9638742B2 (en) 2008-11-14 2017-05-02 Teradyne, Inc. Method and apparatus for testing electrical connections on a printed circuit board
US7978110B2 (en) * 2009-05-11 2011-07-12 Taiwan Semiconductor Manufacturing Company, Ltd. Digital-to-analog converter
KR20110052205A (ko) * 2009-11-12 2011-05-18 삼성전자주식회사 외부 루프백 테스트 기능을 갖는 전송 전용 집적회로 칩 및 그에 따른 외부 루프백 테스트 방법
EP2509314B1 (en) * 2011-04-04 2019-12-04 Interlemo Holding S.A. Installation for conveying signals between a video camera equipment and a remote equipment
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006093988A (ja) * 2004-09-22 2006-04-06 Sony Corp エンコーダ装置およびデコーダ装置
JP2011517159A (ja) * 2008-03-05 2011-05-26 クゥアルコム・インコーポレイテッド 多元送信機システム及び方法
JP2010021789A (ja) * 2008-07-10 2010-01-28 Toshiba Corp スキュー故障検出回路およびスキュー故障検出方法
WO2014005117A1 (en) * 2012-06-29 2014-01-03 Qualcomm Incorporated N-phase polarity output pin mode multiplexer

Also Published As

Publication number Publication date
EP3095218A1 (en) 2016-11-23
US20150201052A1 (en) 2015-07-16
US9961174B2 (en) 2018-05-01
WO2015108847A1 (en) 2015-07-23
KR20160108423A (ko) 2016-09-19
CN106416159B (zh) 2020-03-03
US20180115637A1 (en) 2018-04-26
CN106416159A (zh) 2017-02-15

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