KR20130079140A - 조명 장치, 조명 방법 및 검사 장치 - Google Patents

조명 장치, 조명 방법 및 검사 장치 Download PDF

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Publication number
KR20130079140A
KR20130079140A KR1020120127264A KR20120127264A KR20130079140A KR 20130079140 A KR20130079140 A KR 20130079140A KR 1020120127264 A KR1020120127264 A KR 1020120127264A KR 20120127264 A KR20120127264 A KR 20120127264A KR 20130079140 A KR20130079140 A KR 20130079140A
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KR
South Korea
Prior art keywords
illumination
light
unit
amount
lighting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1020120127264A
Other languages
English (en)
Korean (ko)
Inventor
요시노리 하야시
오사무 이즈츠
가츠토시 세키
히로시 와카바
요코 오노
다카노리 곤도
아키히코 다키자와
Original Assignee
시바우라 메카트로닉스 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 시바우라 메카트로닉스 가부시끼가이샤 filed Critical 시바우라 메카트로닉스 가부시끼가이샤
Publication of KR20130079140A publication Critical patent/KR20130079140A/ko
Ceased legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B41/00—Circuit arrangements or apparatus for igniting or operating discharge lamps
    • H05B41/14—Circuit arrangements
    • H05B41/36—Controlling
    • H05B41/38—Controlling the intensity of light
    • H05B41/39—Controlling the intensity of light continuously
    • H05B41/392—Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor
    • H05B41/3921—Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor with possibility of light intensity variations
    • H05B41/3927—Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor with possibility of light intensity variations by pulse width modulation
    • H05B41/3928—Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor with possibility of light intensity variations by pulse width modulation for high-pressure lamps, e.g. high-intensity discharge lamps, high-pressure mercury or sodium lamps
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B47/00—Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
    • H05B47/10—Controlling the light source
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
    • Y02B20/40—Control techniques providing energy savings, e.g. smart controller or presence detection

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020120127264A 2011-12-31 2012-11-12 조명 장치, 조명 방법 및 검사 장치 Ceased KR20130079140A (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JPJP-P-2011-290496 2011-12-31
JP2011290496 2011-12-31
JP2012026008A JP2013152206A (ja) 2011-12-31 2012-02-09 照明装置、照明方法及び検査装置
JPJP-P-2012-026008 2012-02-09

Publications (1)

Publication Number Publication Date
KR20130079140A true KR20130079140A (ko) 2013-07-10

Family

ID=48677008

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020120127264A Ceased KR20130079140A (ko) 2011-12-31 2012-11-12 조명 장치, 조명 방법 및 검사 장치

Country Status (5)

Country Link
US (1) US20130169795A1 (enExample)
JP (1) JP2013152206A (enExample)
KR (1) KR20130079140A (enExample)
CN (1) CN103185726B (enExample)
TW (1) TW201329437A (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6547270B2 (ja) * 2014-10-10 2019-07-24 株式会社リコー 光源装置及びこの光源装置を有する画像投影装置
JP6961394B2 (ja) * 2017-05-31 2021-11-05 株式会社キーエンス 画像検査装置、画像検査方法、画像検査装置の設定方法、画像検査プログラム、画像装置の設定検査プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器
EP3657926B1 (en) * 2017-07-18 2025-12-24 Fuji Corporation Component-mounting machine and method for adjusting illumination light amount thereof
JP2020085587A (ja) * 2018-11-21 2020-06-04 日本電気硝子株式会社 ガラス板の製造方法、及びガラス板の製造装置
CN110261395A (zh) * 2019-06-28 2019-09-20 苏州精濑光电有限公司 一种检测装置
CN110243832A (zh) * 2019-06-29 2019-09-17 苏州精濑光电有限公司 一种检测装置
CN110865033A (zh) * 2019-11-29 2020-03-06 成都天鹰锐视科技有限公司 一种基于通光量自适应调控的成像探测装置及其控制方法
CN114994071A (zh) * 2021-03-01 2022-09-02 镭亚电子(苏州)有限公司 导光板检测方法和导光板检测治具

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6345541A (ja) * 1986-08-13 1988-02-26 Hitachi Ltd 検査方法および装置
JPH01245137A (ja) * 1988-03-28 1989-09-29 Hitachi Electron Eng Co Ltd ガラスディスク表面検査装置におけるレーザビーム投光方式
JP2001141662A (ja) * 1999-11-18 2001-05-25 Central Glass Co Ltd 透明板状体の欠点検出方法および検出装置
KR100471084B1 (ko) * 2002-12-16 2005-03-10 삼성전자주식회사 영상처리시스템 및 영상처리방법
JP2009222611A (ja) * 2008-03-18 2009-10-01 Hitachi High-Technologies Corp 検査装置及び検査方法

Also Published As

Publication number Publication date
CN103185726A (zh) 2013-07-03
JP2013152206A (ja) 2013-08-08
CN103185726B (zh) 2015-04-08
US20130169795A1 (en) 2013-07-04
TW201329437A (zh) 2013-07-16

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